| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/18/2007 | CN1327236C Multi-channel surface stick welding spot fatigue state real-time monitoring system |
| 07/18/2007 | CN1327235C Method for detecting ground fault in DC system |
| 07/18/2007 | CN101002363A Mechanically reconfigurable vertical tester interface for IC probing |
| 07/18/2007 | CN101002311A Method and apparatus for producing co-planar bonding pads on a substrate |
| 07/18/2007 | CN101002204A Method and apparatus for locating short circuit faults in anintegrated circuit layout |
| 07/18/2007 | CN101001521A Printing state detection method and device, printing equipment, installation processing method and installation system |
| 07/18/2007 | CN101001436A 马达电流测试方法 Motor current testing methods |
| 07/18/2007 | CN101000973A Cavity filter and test system and method thereof |
| 07/18/2007 | CN101000881A Image sensor testing method and apparatus |
| 07/18/2007 | CN101000736A Short-circuit detecting device and picture element unit and display panel using the device |
| 07/18/2007 | CN101000368A Optical fibre sensor for on-line measuring lead-acid battery capacity |
| 07/18/2007 | CN101000367A System chip test data compression method of block mark |
| 07/18/2007 | CN101000366A Testing device for ability of preventing electromagnetic wave interference of CVT speed variater and its method |
| 07/18/2007 | CN101000365A Testing system of resistance reversible change of electric pulse induced and its application |
| 07/18/2007 | CN101000362A Circuit board test platform |
| 07/18/2007 | CN101000281A Bench test device for power assembly of mixed power electric vehicle |
| 07/18/2007 | CN101000280A Bench test device for mixed power vehicle |
| 07/18/2007 | CN101000272A Method for measuring inner running state of vaccum arc-chutes based on X-ray capacity |
| 07/18/2007 | CN101000266A Temp. measuring device for battery of mixed power |
| 07/17/2007 | US7246303 Error detection and recovery of data in striped channels |
| 07/17/2007 | US7246291 Method for localization and generation of short critical sequence |
| 07/17/2007 | US7246290 Determining the health of a desired node in a multi-level system |
| 07/17/2007 | US7246289 Memory integrity self checking in VT/TU cross-connect |
| 07/17/2007 | US7246288 Integrated device with an improved BIST circuit for executing a structured test |
| 07/17/2007 | US7246287 Full scan solution for latched-based design |
| 07/17/2007 | US7246286 Testing methods and chips for preventing asnchronous sampling errors |
| 07/17/2007 | US7246285 Method of automatic fault isolation in a programmable logic device |
| 07/17/2007 | US7246284 Integration type input circuit and method of testing it |
| 07/17/2007 | US7246283 Method and apparatus for managing testing in a production flow |
| 07/17/2007 | US7246282 Bypassing a device in a scan chain |
| 07/17/2007 | US7246280 Memory module with parallel testing |
| 07/17/2007 | US7246276 Error tolerant modular testing of services |
| 07/17/2007 | US7246026 Multi-domain execution of tests on electronic devices |
| 07/17/2007 | US7246025 Method and apparatus for synchronizing signals in a testing system |
| 07/17/2007 | US7246015 Alternator tester |
| 07/17/2007 | US7245976 Field apparatus |
| 07/17/2007 | US7245945 Portable computing device adapted to update display information while in a low power mode |
| 07/17/2007 | US7245758 Whole-wafer photoemission analysis |
| 07/17/2007 | US7245143 Electro-optical device, electronic apparatus, and mounting structure |
| 07/17/2007 | US7245142 Liquid crystal substrate inspection apparatus |
| 07/17/2007 | US7245141 Shared bond pad for testing a memory within a packaged semiconductor device |
| 07/17/2007 | US7245140 Parameter measurement of semiconductor device from pin with on die termination circuit |
| 07/17/2007 | US7245139 Tester channel to multiple IC terminals |
| 07/17/2007 | US7245138 POGO pin and test socket including the same |
| 07/17/2007 | US7245137 Test head assembly having paired contact structures |
| 07/17/2007 | US7245136 Methods of processing a workpiece, methods of communicating signals with respect to a wafer, and methods of communicating signals within a workpiece processing apparatus |
| 07/17/2007 | US7245135 Post and tip design for a probe contact |
| 07/17/2007 | US7245134 Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes |
| 07/17/2007 | US7245133 Integration of photon emission microscope and focused ion beam |
| 07/17/2007 | US7245130 Method and apparatus for diagnosing motor damping network integrity |
| 07/17/2007 | US7245129 Apparatus for and method of cable diagnostics utilizing time domain reflectometry |
| 07/17/2007 | US7245120 Predictive, adaptive power supply for an integrated circuit under test |
| 07/17/2007 | US7245119 fixture for manual functional testing of wireless devices |
| 07/17/2007 | US7245118 Test head manipulator |
| 07/17/2007 | US7244623 Method of manufacturing semiconductor device and apparatus of automatically adjusting semiconductor pattern |
| 07/17/2007 | US7244385 Process for production of three-dimensional photonic crystal as well as probe used therefor |
| 07/17/2007 | CA2340380C A method and an arrangement relating to temperature sensing in electric circuitry |
| 07/12/2007 | WO2007079006A2 Connection verification technique |
| 07/12/2007 | WO2007078721A2 Test equipment positional control manipulator |
| 07/12/2007 | WO2007078530A2 System and method for radio frequency identification tag direct connection test |
| 07/12/2007 | WO2007077849A1 Semiconductor chip and semiconductor integrated circuit |
| 07/12/2007 | WO2007077839A1 Test device, test method, and program |
| 07/12/2007 | WO2007077807A1 Detachably attaching device, test head, and electronic part test device |
| 07/12/2007 | WO2007077621A1 Tcp handling apparatus |
| 07/12/2007 | WO2007077495A1 Device and method for evaluating electrostatic discharge protection capabilities |
| 07/12/2007 | WO2007077264A1 Dynamic estimation of the lifetime of a semiconductor device |
| 07/12/2007 | WO2007076846A1 Test apparatus and test method for a pv concentrator module |
| 07/12/2007 | WO2007057343B1 Apparatus and method for testing the reading reliability of smart labels |
| 07/12/2007 | WO2007047990A3 Data security achieved by use of gigabit ethernet and standard ethernet filtering |
| 07/12/2007 | WO2007047479A3 Control plane to data plane binding |
| 07/12/2007 | WO2007017839A3 Testing of an integrated circuit that contains secret information |
| 07/12/2007 | WO2007015952A3 Portable manipulator for stackable semiconductor test system |
| 07/12/2007 | WO2006044647A3 Corrective device protection |
| 07/12/2007 | US20070162808 Semiconductor Device Testing |
| 07/12/2007 | US20070162807 High-speed serial transfer device test method, program, and device |
| 07/12/2007 | US20070162806 Random number test circuit |
| 07/12/2007 | US20070162805 Automatable scan partitioning for low power using external control |
| 07/12/2007 | US20070162804 Method of generating test patterns to efficiently screen inline resistance delay defects in complex asics |
| 07/12/2007 | US20070162803 Accelerated Scan Circuitry and Method for Reducing Scan Test Data Volume and Execution Time |
| 07/12/2007 | US20070162802 Scan flip-flop circuit and semiconductor integrated circuit device |
| 07/12/2007 | US20070162801 Wireless radio frequency technique design and method for testing of integrated circuits and wafers |
| 07/12/2007 | US20070162800 Semiconductor test system |
| 07/12/2007 | US20070162799 Burn-in test signal generating circuit and burn-in testing method |
| 07/12/2007 | US20070162798 Single event upset error detection within an integrated circuit |
| 07/12/2007 | US20070162797 Test device and method for testing electronic devices |
| 07/12/2007 | US20070162796 Method and portable device for testing electronic device |
| 07/12/2007 | US20070162792 Method for increasing the manufacturing yield of programmable logic devices |
| 07/12/2007 | US20070162247 On circuit finalization of configuration data in a reconfigurable circuit |
| 07/12/2007 | US20070162242 System and method for estimating reliability of components for testing and quality optimization |
| 07/12/2007 | US20070161285 Electrically-conductive-contact holder, electrically-conductive-contact unit, and method for manufacturing electrically-conductive-contact holder |
| 07/12/2007 | US20070161152 Method for fabricating semiconductor device and apparatus for fabricating the same |
| 07/12/2007 | US20070161132 System and Method for Detection of Spatial Signature Yield Loss |
| 07/12/2007 | US20070159532 Image sensor test apparatus |
| 07/12/2007 | US20070159244 Gain control methods and systems in an amplifier assembly |
| 07/12/2007 | US20070159234 Integrated circuit with bit error test capability |
| 07/12/2007 | US20070159211 Circuit for inspecting semiconductor device and inspecting method |
| 07/12/2007 | US20070159209 Method of measuring capacitance characteristics of a gate oxide in a mos transistor device |
| 07/12/2007 | US20070159208 Apparatus for detecting a current and temperature for an integrated circuit |
| 07/12/2007 | US20070159207 Device and method for analyzing a sample plate |
| 07/12/2007 | US20070159206 Method and testing apparatus for testing integrated circuits |