| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 07/19/2007 | US20070168850 Connection verification apparatus for verifying interconnection between multiple logic blocks |
| 07/19/2007 | US20070168818 Semiconductor test device with heating circuit |
| 07/19/2007 | US20070168817 Data capture in automatic test equipment |
| 07/19/2007 | US20070168816 Testing apparatus and testing method for an integrated circuit, and integrated circuit |
| 07/19/2007 | US20070168815 Compositions and methods for use in three dimensional model printing |
| 07/19/2007 | US20070168814 Device and method for testing and for diagnosing digital circuits |
| 07/19/2007 | US20070168813 System and methods for authoring domain specific rule-driven data generators |
| 07/19/2007 | US20070168812 Fully-buffered dual in-line memory module with fault correction |
| 07/19/2007 | US20070168811 Fully-buffered dual in-line memory module with fault correction |
| 07/19/2007 | US20070168810 Fully-buffered dual in-line memory module with fault correction |
| 07/19/2007 | US20070168809 Systems and methods for LBIST testing using commonly controlled LBIST satellites |
| 07/19/2007 | US20070168808 Integrated circuit testing module including data compression |
| 07/19/2007 | US20070168807 Start/stop circuit for performance counter |
| 07/19/2007 | US20070168806 Scan path circuit and semiconductor integrated circuit comprising the scan path circuit |
| 07/19/2007 | US20070168805 Scan chain diagnostics using logic paths |
| 07/19/2007 | US20070168804 Burn-in test circuit, burn-in test method, burn-in test apparatus, and a burn-in pattern generation program product |
| 07/19/2007 | US20070168803 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques |
| 07/19/2007 | US20070168802 Semiconductor integrated circuit with test circuit |
| 07/19/2007 | US20070168801 Adapting scan architectures for low power operation |
| 07/19/2007 | US20070168800 Sequential Scan Technique Providing Enhanced Fault Coverage in an Integrated Circuit |
| 07/19/2007 | US20070168799 Dynamically configurable scan chain testing |
| 07/19/2007 | US20070168798 Scan string segmentation for digital test compression |
| 07/19/2007 | US20070168797 Method, apparatus and computer program product for designing logic scan chains for matching gated portions of a clock tree |
| 07/19/2007 | US20070168796 On-chip sampling circuit and method |
| 07/19/2007 | US20070168795 On-chip sampling circuit and method |
| 07/19/2007 | US20070168794 Memory with element redundancy |
| 07/19/2007 | US20070168793 Device and method capable of verifying program operation of non-volatile memory and method card including the same |
| 07/19/2007 | US20070168792 Method to Reduce Leakage Within a Sequential Network and Latch Circuit |
| 07/19/2007 | US20070168791 Circuit and method for testing embedded phase-locked loop circuit |
| 07/19/2007 | US20070168790 Apparatus and method for reducing test resources in testing drams |
| 07/19/2007 | US20070168789 Queuing methods for distributing programs for producing test data |
| 07/19/2007 | US20070168788 Detector in parallel with a logic component |
| 07/19/2007 | US20070168787 Interace circuit for using a low voltage logic tester to test a high voltage IC |
| 07/19/2007 | US20070168786 Method and apparatus for soft-error immune and self-correcting latches |
| 07/19/2007 | US20070168785 Virtual concatenation sequence mismatch defect detection |
| 07/19/2007 | US20070168767 Flexible scan architecture |
| 07/19/2007 | US20070168158 Delay fault test circuitry and related method |
| 07/19/2007 | US20070168148 Test method of embedded capacitor and test system thereof |
| 07/19/2007 | US20070168147 Acquiring test data from an electronic circuit |
| 07/19/2007 | US20070168141 Method for measuring the operating state of a synchronous motor using composite power angle meter |
| 07/19/2007 | US20070166847 Boxes for Soft Error Rate Calculation |
| 07/19/2007 | US20070166846 Plasma doping method |
| 07/19/2007 | US20070165939 Reduction of false alarms in pcb inspection |
| 07/19/2007 | US20070165759 Plural circuit selection using role reversing control inputs |
| 07/19/2007 | US20070165681 Electronic stream processing circuit with test access |
| 07/19/2007 | US20070165472 Method and apparatus for evaluating and optimizing a signaling system |
| 07/19/2007 | US20070165437 Method and apparatus for testing integrated circuits for susceptibility to latch-up |
| 07/19/2007 | US20070164778 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 07/19/2007 | US20070164776 Device and method for measuring gray to gray transition response time |
| 07/19/2007 | US20070164775 Method of Kelvin current sense in a semiconductor package |
| 07/19/2007 | US20070164774 Method and apparatus for detection and prevention of bulk CMOS latchup |
| 07/19/2007 | US20070164773 Surface electron emission device array and thin film transistor inspection system using the same |
| 07/19/2007 | US20070164772 Micro-array inertia sensing system based single chip device |
| 07/19/2007 | US20070164771 Apparatus for testing a chip and methods of making and using the same |
| 07/19/2007 | US20070164770 Methods and apparatuses for dynamic probe adjustment |
| 07/19/2007 | US20070164769 Active cancellation matrix for process parameter measurements |
| 07/19/2007 | US20070164768 On-chip electromigration monitoring system |
| 07/19/2007 | US20070164767 Optoelectronic sensor and device for 3d distance measurement |
| 07/19/2007 | US20070164766 Circuit device |
| 07/19/2007 | US20070164765 Semiconductor device having a connection inspecting circuit for inspecting connections of power source terminals and grounding terminals, and inspection method for the same |
| 07/19/2007 | US20070164764 Method of kelvin current sense in a semiconductor package |
| 07/19/2007 | US20070164763 Method for detecting abnormality of probe card |
| 07/19/2007 | US20070164762 Methods and apparatuses for improved positioning in a probing system |
| 07/19/2007 | US20070164761 Dual tip probe |
| 07/19/2007 | US20070164760 Methods and apparatuses for improved stabilization in a probing system |
| 07/19/2007 | US20070164750 Intelligent life testing methods and apparatus for leakage current protection |
| 07/19/2007 | US20070164731 Wide Bandwidth Attenuator Input Circuit for a Measurement Probe |
| 07/19/2007 | US20070164730 Wide Bandwidth Attenuator Input Circuit for a Measurement Probe |
| 07/19/2007 | US20070164729 Verification of Performance Attributes of Packaged Integrated Circuits |
| 07/19/2007 | US20070164728 Systems and methods for measuring signal propagation delay between circuits |
| 07/19/2007 | US20070164707 Nickel-hydride battery life determining method and life determining apparatus |
| 07/19/2007 | US20070164419 Device package and methods for the fabrication and testing thereof |
| 07/19/2007 | US20070163832 Automotive passenger restraint and protection apparatus |
| 07/19/2007 | DE202007007095U1 Federkontaktstift, insbesondere Schaltstift Spring pin, in particular switch pin |
| 07/19/2007 | DE10392974B4 Sensoranordnung für die Strom- und Temperaturverteilung vor Ort für eine Brennstoffzelle Sensor array for the current and temperature distribution site for a fuel cell |
| 07/19/2007 | DE10296952B4 Vorrichtung und Verfahren zum Prüfen einer Halbleitervorrichtung Apparatus and method for testing a semiconductor device |
| 07/19/2007 | DE102006011138A1 Verfahren zur Funktionsprüfung Method for functional testing |
| 07/19/2007 | DE102006001874A1 Verfahren und Vorrichtung zur Strom- und Temperaturmessung in einer leistungselektronischen Schaltung Method and apparatus for current and temperature measurement in a power electronic circuit |
| 07/19/2007 | DE102005061683A1 Vorrichtung, Tastkopf und Verfahren zur galvanisch entkoppelten Übertragung eines Messsignals Device, probe and method for galvanically decoupled transmission of a measuring signal |
| 07/19/2007 | DE102005059968A1 Vorrichtung und Verfahren zur Prüfung von Befestigungselementen an einem Kabelstrang Apparatus and method for testing of fastening elements on a cable strand |
| 07/19/2007 | DE102005027446B4 Treiber- und Empfängerschaltung Schaltung und Verfahren zur Überwachung einer an eine Treiber- und Empfängerschaltung angeschlossenen Leitungsverbindung Driver and receiver circuit and method for monitoring a circuit connected to a driver and receiver circuit line connection |
| 07/18/2007 | EP1808946A2 Method for monitoring a cable which can be disconnected in a network, appropriate monitoring device and monitoring system therefor |
| 07/18/2007 | EP1808860A1 Testing storage system electronics using loopback |
| 07/18/2007 | EP1808703A1 Electronic device test box |
| 07/18/2007 | EP1808027A1 Arrangement for monitoring patch fields at distribution points in data networks |
| 07/18/2007 | EP1807710A1 Kelvin connector including temperature sensor |
| 07/18/2007 | EP1553623B1 Anisotropic conductivity probe |
| 07/18/2007 | CN2924553Y Electronic pressure gauge energy detecting instrument |
| 07/18/2007 | CN2924552Y Sunlight simulation and solar cell performance determing combination device |
| 07/18/2007 | CN2924551Y Device for detecting power battery management system |
| 07/18/2007 | CN2924550Y Testelectrode contact device for leakage circuit breaker comprehensive test table |
| 07/18/2007 | CN2924549Y Lighting cable power-off stealing detection device |
| 07/18/2007 | CN2924548Y Multifunctional cable testing instrument |
| 07/18/2007 | CN2924547Y Photo multiplier tube experimental instrument |
| 07/18/2007 | CN2924541Y Multi-serial high-power battery overcurrent protection value detecting device |
| 07/18/2007 | CN2924537Y Presstype probe |
| 07/18/2007 | CN1327575C Socket for inspection |
| 07/18/2007 | CN1327522C Semiconductor device with unloading circuit for removing defect part |
| 07/18/2007 | CN1327502C Inspection device and method for manufacturing the same |
| 07/18/2007 | CN1327237C Magneto rotor magnetizing and detecting apparatus |