Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2007
07/25/2007EP1396063B1 Circuit for monitoring cells of a multi-cell battery during charge
07/25/2007EP1390820B1 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer
07/25/2007EP1171982B1 Gigabit ethernet with timing offsets between twisted-pair conductors
07/25/2007CN2927456Y Manual chargeable safety power supply and audio-frequency player with manual charging function
07/25/2007CN2927334Y Battery and wireless electric device
07/25/2007CN2927202Y Safety electric cable device of streetlight
07/25/2007CN2927068Y RS232 series wire inspector
07/25/2007CN2927067Y Mast test platform
07/25/2007CN2927066Y Power-frequency magnetic-field generator
07/25/2007CN2927058Y Four-wired clamp for inspecting battery
07/25/2007CN2927024Y Optical inspector of LED beam-splitting machine
07/25/2007CN1328779C Detecting clamp and its top cover
07/25/2007CN1328777C Probe card transporting apparatus and to-be-connected body moving mechanism
07/25/2007CN1328775C Shadow-creating apparatus
07/25/2007CN1328592C Battery state phonetic alarming method for wireless communication apparatus
07/25/2007CN1328591C Earth-fault circuit breaker life termination detecting-protecting method and its circuit
07/25/2007CN1328590C Testing arrangement for universal type semiconductor detector
07/25/2007CN1328589C Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc
07/25/2007CN1328588C Life-stopping intelligent inspection and inspector for leakage protector
07/25/2007CN1328587C Life-stopping intelligent inspection and inspector for leakage protector
07/25/2007CN101006521A Test device and test method
07/25/2007CN101006354A Dischargeable capacitance determining method
07/25/2007CN101006353A Test emulator, emulation program, and semiconductor device manufacturing method
07/25/2007CN101006352A Substrate with patterned conductive layer
07/25/2007CN101005209A Method of adjusting soc for battery and battery management system using the same
07/25/2007CN101005202A Method and system for detecting DC over current protector
07/25/2007CN101005191A Method and its device for detecting high energy semiconductor laser divergence angle
07/25/2007CN101005140A Gasket being capable of measuring voltage and fuel cell system having the same
07/25/2007CN101005055A Film type semiconductor package, test device and semiconductor device and method thereof
07/25/2007CN101004879A Method and device for testing display screen
07/25/2007CN101004878A Instrument for detecting bad spot on panel display faceplate, and detection method
07/25/2007CN101004608A Fast plant test for model-based control
07/25/2007CN101004440A Device and method for measuring internal resistance of accumulator based on 485 bus mode
07/25/2007CN101004439A Method for predicting impulse over voltage of generator
07/25/2007CN101004438A Excitation test system based on virtual instrument
07/25/2007CN101004437A System and method for testing chip
07/25/2007CN101004436A High senitive system for detecting local discharging of high voltage electric power equipment with large capacity
07/25/2007CN101004435A Device for testing wiring of appliance inlet
07/25/2007CN101004434A Method and device for detecting electrodes of flat panel display parts
07/25/2007CN101004433A Method and system for measuring trap parameter of insulating material of polymer
07/25/2007CN101004432A Method for testing electronic components
07/25/2007CN101004427A Electrical contacting device and test apparatus for testing an electrical test piece
07/25/2007CN101004424A Device and method for detecting jam of sample needle of biochemical analyser
07/25/2007CN101004364A Supervisory controller capable of integrating information of image and field intensity synchronistically
07/24/2007US7249340 Adaptable circuit blocks for use in multi-block chip design
07/24/2007US7249302 Integrated test-on-chip system and method and apparatus for manufacturing and operating same
07/24/2007US7249301 Semiconductor circuit and method for testing, monitoring and application-near setting of a semiconductor circuit
07/24/2007US7249300 Integrated circuit device including a scan test circuit and methods of testing the same
07/24/2007US7249299 Bidirectional horizontal scan circuit with sub-sampling and horizontal adding functions
07/24/2007US7249298 Multiple scan chains with pin sharing
07/24/2007US7249297 Test method for a semiconductor integrated circuit having a multi-cycle path and a semiconductor integrated circuit
07/24/2007US7249296 Semiconductor integrated circuit
07/24/2007US7249295 Test circuit for semiconductor device
07/24/2007US7249294 Semiconductor memory device with reduced package test time
07/24/2007US7249293 Method and device for testing for the occurrence of bit errors
07/24/2007US7249203 Programmatic time-gap defect detection apparatus and method
07/24/2007US7249172 System for remotely loading and remotely maintaining an electronic card
07/24/2007US7249010 Methods of estimating susceptibility to single event upsets for a design implemented in an FPGA
07/24/2007US7248988 System and method for reducing temperature variation during burn in
07/24/2007US7248986 Programmable system for device testing and control
07/24/2007US7248976 Method and system for the validation of fault symptoms
07/24/2007US7248660 Transition tracking
07/24/2007US7248629 Efficient FIR filter for high-speed communication
07/24/2007US7248560 Method and system for router redundancy in a wide area network
07/24/2007US7248367 Characterization of ultra shallow junctions in semiconductor wafers
07/24/2007US7248068 Semiconductor device and method for testing semiconductor device
07/24/2007US7248067 Semiconductor device with test circuit disconnected from power supply connection
07/24/2007US7248066 On-chip analysis and computation of transition behavior of embedded nets in integrated circuits
07/24/2007US7248065 Arcuate blade probe
07/24/2007US7248064 Probe card and method for producing the same
07/24/2007US7248063 Plasma probe systems
07/24/2007US7248062 Contactless charge measurement of product wafers and control of corona generation and deposition
07/24/2007US7248058 Testing and calibration device with diagnostics
07/24/2007US7248057 Method, apparatus and computer-readable code for detecting on the fly an incipient ground fault in an electrical propulsion system of a locomotive
07/24/2007US7248056 Three-phase electrical receptacle tester
07/24/2007US7248036 Method and apparatus to probe bus signals using repeaters
07/24/2007US7248035 Automatic test equipment pin channel with T-coil compensation
07/24/2007US7248032 Low capacitance measurement probe
07/24/2007US7248022 Method and apparatus for determining the available energy of a lithium ion battery
07/24/2007US7247956 Performance test board
07/24/2007US7247879 Semiconductor integrated circuit device having particular testing pad arrangement
07/19/2007WO2007081522A2 A probe array structure and a method of making a probe array structure
07/19/2007WO2007081421A1 Automatic testing equipment instrument card and probe cabling system and apparatus
07/19/2007WO2007081324A1 Apparatus, method and system for testing electronic components
07/19/2007WO2007080802A1 Battery discharge ability judging method, battery discharge ability judging device, and power supply system
07/19/2007WO2007080771A1 Contact probe
07/19/2007WO2007080644A1 Connector housing block, interface member, and electronic part tester
07/19/2007WO2007080634A1 Intruding object detection system, intruding object detection method, and failure detection method
07/19/2007WO2007080527A2 Testable integrated circuit and ic test method
07/19/2007WO2007080307A1 Storage battery circuit breaker
07/19/2007WO2007080163A2 Method and electronic regulator with a current measuring circuit for measuring the current by sense-fet and sigma-delta modulation
07/19/2007WO2007080004A1 Method and device for measuring current
07/19/2007WO2007079990A1 Method and device for fault location in a two-terminal transmission or distribution power line
07/19/2007WO2007079868A1 Discharge state indicator
07/19/2007WO2007079702A1 Method and arrangement for testing a protective device processing digital sampling data
07/19/2007WO2007041717A3 System and method for resetting a light source counter
07/19/2007WO2007035644A3 System and method for validating radio frequency identification tags
07/19/2007WO2007023458A3 Controlling embedded memory access
07/19/2007WO2006041743A3 Response system and method with dynamic personality assignment
07/19/2007WO2005116674A3 Method and apparatus for pipelined scan compression