| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/01/2007 | CN101008664A Device for measuring static parameter of integrated circuit |
| 08/01/2007 | CN101008663A Method for detecting electric leakage failure point of electronic devices |
| 08/01/2007 | CN101008662A Portable time signal source of low frequency time code BPC code |
| 08/01/2007 | CN101008658A Insulating puncturing grounding ring |
| 08/01/2007 | CN101008657A Regenerator probe |
| 07/31/2007 | US7251766 Test method and test circuit for electronic device |
| 07/31/2007 | US7251765 Semiconductor integrated circuit and method for testing a semiconductor integrated circuit |
| 07/31/2007 | US7251764 Serializer/deserializer circuit for jitter sensitivity characterization |
| 07/31/2007 | US7251763 Boundary scan testing system |
| 07/31/2007 | US7251762 On-chip sampling circuit and method |
| 07/31/2007 | US7251761 Assembly for LSI test and method for the test |
| 07/31/2007 | US7251742 Method and apparatus for determining mis-wired addressable loops |
| 07/31/2007 | US7251576 System and method for testing CMOS image sensor |
| 07/31/2007 | US7251527 Method for monitoring end of life for battery |
| 07/31/2007 | US7251354 Electronic component inspection apparatus |
| 07/31/2007 | US7251302 Method, system and apparatus for quantifying the contribution of inter-symbol interference jitter on timing skew budget |
| 07/31/2007 | US7251284 QAM receiver |
| 07/31/2007 | US7251216 Methods and systems for configuring voice over internet protocol network quality of service |
| 07/31/2007 | US7250872 Method and device for testing at least one LED strip |
| 07/31/2007 | US7250785 Method and apparatus for inspecting printed circuit boards |
| 07/31/2007 | US7250784 Integrated systems testing |
| 07/31/2007 | US7250783 Current mirror multi-channel leakage current monitor circuit and method |
| 07/31/2007 | US7250782 Method for testing non-componented circuit boards |
| 07/31/2007 | US7250781 Circuit board inspection device |
| 07/31/2007 | US7250780 Probe card for semiconductor wafers having mounting plate and socket |
| 07/31/2007 | US7250779 Probe station with low inductance path |
| 07/31/2007 | US7250778 Wafer test apparatus including optical elements and method of using the test apparatus |
| 07/31/2007 | US7250772 Method and apparatus for characterizing a signal path carrying an operational signal |
| 07/31/2007 | US7250771 Cable tester |
| 07/31/2007 | US7250770 Semiconductor integrated circuit device |
| 07/31/2007 | US7250769 Methods and apparatus for detecting leaks in fluorescent lamps |
| 07/31/2007 | US7250752 Probe station having multiple enclosures |
| 07/31/2007 | US7250751 Integrated systems testing |
| 07/31/2007 | US7250750 System and method for testing and orientation of components for assembly |
| 07/31/2007 | US7250741 Method and system for calculating available power of a battery |
| 07/31/2007 | US7250739 Method for estimating the rotor time constant of an induction machine |
| 07/31/2007 | US7250626 Probe testing structure |
| 07/31/2007 | US7250372 Method for BARC over-etch time adjust with real-time process feedback |
| 07/31/2007 | US7250312 Doping method and method for fabricating thin film transistor |
| 07/31/2007 | US7250310 Process for forming and analyzing stacked die |
| 07/31/2007 | US7250309 Integrated phase angle and optical critical dimension measurement metrology for feed forward and feedback process control |
| 07/26/2007 | WO2007084597A2 System, network and methods for provisioning optical circuits in a multi-network, multi vendor environment |
| 07/26/2007 | WO2007084206A1 Methods and apparatuses for improved positioning in a probing system |
| 07/26/2007 | WO2007084205A1 Methods and apparatuses for improved stabilization in a probing system |
| 07/26/2007 | WO2007084204A1 Methods and apparatuses for dynamic probe adjustment |
| 07/26/2007 | WO2007083433A1 Semiconductor device and semiconductor inspecting method |
| 07/26/2007 | WO2007083381A1 Circuit element, scan circuit, boundary scan circuit, scan test method and method for detecting fault location in scan circuit |
| 07/26/2007 | WO2007083357A1 Electronic component testing apparatus and electronic component testing method |
| 07/26/2007 | WO2007083356A1 Electronic component testing apparatus and electronic component testing method |
| 07/26/2007 | WO2007083001A1 A test apparatus and a method for testing an apparatus |
| 07/26/2007 | WO2007082778A1 Sensing an operating state of a system |
| 07/26/2007 | WO2007062850A3 Docking device for coupling a handling device to a test head for electronic components |
| 07/26/2007 | WO2007049210A3 Analog ic having test arrangement and test method for such an ic |
| 07/26/2007 | WO2006117779B1 Augmenting semiconductor's devices quality and reliability |
| 07/26/2007 | WO2006029340A3 Method and apparatus for remotely buffering test channels |
| 07/26/2007 | US20070174751 Method of using virtual inputs and outputs to automate testing of application software and hardware |
| 07/26/2007 | US20070174750 Apparatus and method for software-based control flow checking for soft error detection to improve microprocessor reliability |
| 07/26/2007 | US20070174749 Diagnostics unit using boundary scan techniques for vehicles |
| 07/26/2007 | US20070174748 Method and system for backplane testing using generic boundary-scan units |
| 07/26/2007 | US20070174747 Scan chain extracting method, test apparatus, circuit device, and scan chain extracting program |
| 07/26/2007 | US20070174745 Error checking using a field of a frame |
| 07/26/2007 | US20070172708 Fuel cell system failure diagnosis method, failure diagnosis device using same, and fuel cell system |
| 07/26/2007 | US20070172012 Timing recovery system for a multi-pair gigabit transceiver |
| 07/26/2007 | US20070170951 Control system and method of semiconductor inspection system |
| 07/26/2007 | US20070170950 Plasma display panel and manufacturing method of plasma display panel |
| 07/26/2007 | US20070170949 Display device, liquid crystal display panel assembly, and testing method of display device |
| 07/26/2007 | US20070170948 Active device array substrate, liquid crystal display panel and examining methods thereof |
| 07/26/2007 | US20070170947 Method and an apparatus for measuring FET properties |
| 07/26/2007 | US20070170946 Pilot signal detection circuit and semiconductor integrated circuit equipping the circuit |
| 07/26/2007 | US20070170945 Printed circuit board and method of use thereof |
| 07/26/2007 | US20070170944 Boundary-scan system architecture for remote environmental testing |
| 07/26/2007 | US20070170943 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes |
| 07/26/2007 | US20070170942 Methods for fabricating fences on interposer substrates |
| 07/26/2007 | US20070170941 Composite Motion Probing |
| 07/26/2007 | US20070170940 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes |
| 07/26/2007 | US20070170939 Apparatus for testing semiconductor test system and method thereof |
| 07/26/2007 | US20070170938 Test fixture and method for testing a semi-finished chip package |
| 07/26/2007 | US20070170937 Evaluation method of probe mark of probe needle of probe card |
| 07/26/2007 | US20070170936 Regenerator probe |
| 07/26/2007 | US20070170935 Test module for wafer |
| 07/26/2007 | US20070170934 Method and Apparatus for Nondestructive Evaluation of Semiconductor Wafers |
| 07/26/2007 | US20070170933 Method and Apparatus for Nondestructively Evaluating Light-Emitting Materials |
| 07/26/2007 | US20070170927 Semiconductor testing system and testing method |
| 07/26/2007 | US20070170911 Wired-circuit-board assembly sheet |
| 07/26/2007 | US20070170910 Spectral resistor, spectral capacitor, order-infinity resonant tank, EM wave absorbing material, and applications thereof |
| 07/26/2007 | US20070170892 Method and apparatus for estimating remaining capacity of electric storage |
| 07/26/2007 | US20070169535 Inspection device for humidity sensor and method for adjusting sensor characteristics of humidity sensor |
| 07/26/2007 | DE112005002084T5 Nicht-802.11-Wellenformen bei Vorhandensein von 802.11 Non-802.11 waveforms at presence of 802.11 |
| 07/26/2007 | DE102006057419A1 Verfahren und Apparatur zum Messen von FET-Eigenschaften Method and apparatus for measuring FET characteristics |
| 07/26/2007 | DE102006002245A1 Verfahren zur Überwachung eines abschaltbaren Kabels in einem elektrischen Netz, dafür geeignete Überwachungsvorrichtung sowie Überwachungssystem Method for monitoring a turn-off cord into an electrical network, for appropriate monitoring device and monitoring system |
| 07/25/2007 | EP1811313A2 Electrical regenerator easurement probe |
| 07/25/2007 | EP1811312A1 Electrostatic discharge monitoring and manufacturing process control system |
| 07/25/2007 | EP1810142A2 Content status provision related to volatile memories |
| 07/25/2007 | EP1810097A1 Method for diagnosing faults |
| 07/25/2007 | EP1810044A1 Circuit interconnect testing arrangement and approach therefor |
| 07/25/2007 | EP1810043A2 System and method to decrease the route convergence time and find optimal routes in a wireless communication network |
| 07/25/2007 | EP1810042A1 In-situ wafer and probe desorption using closed loop heating |
| 07/25/2007 | EP1766632A4 System and method for testing a data storage device without revealing memory content |
| 07/25/2007 | EP1521973B1 Control device of an optoelectronic device having improved testing properties |
| 07/25/2007 | EP1509323B1 Fischer-tropsch catalyst prepared with a high purity iron precursor method of preparation |