Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2007
08/02/2007US20070180340 Semiconductor integrated circuit
08/02/2007US20070180339 Handling mixed-mode content in a stream of test results
08/02/2007US20070180338 Antenna reconfiguration verification and validation
08/02/2007US20070179743 Methods and apparatus for data analysis
08/02/2007US20070179732 Method and apparatus for handling a user-defined event that is generated during test of a device
08/02/2007US20070179731 System and method for determining probing locations on ic
08/02/2007US20070179724 Isolated operation detecting method, control apparatus for detecting isolated operation for distributed power supply
08/02/2007US20070179721 System and method for detecting noise source in a power line communications system
08/02/2007US20070179720 Method for converting direct voltage into three-phase alternating voltage
08/02/2007US20070179719 Circuit arrangement for the overload protection of a controllable switching event
08/02/2007US20070178814 Method of cleaning a probe
08/02/2007US20070178727 Probe apparatus,wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
08/02/2007US20070178613 Method of manufacturing semiconductor device and cleaning apparatus
08/02/2007US20070177325 Method and safety device for ground fault circuit
08/02/2007US20070176807 Electronic Test Circuit For An Integrated Circuit And Methods For Testing The Driver Strength And For Testing The Input Sensitivity Of A Receiver Of The Integrated Circuit
08/02/2007US20070176626 Method and apparatus for current and temperature measurement in an electronic power circuit
08/02/2007US20070176625 Methods And Apparatus For Managing Defective Processors Through Power Gating
08/02/2007US20070176624 Load measurement for a thermal microwave power sensor
08/02/2007US20070176623 Method and apparatus for testing a TFT array for a liquid crystal panel
08/02/2007US20070176622 Id chip and ic card
08/02/2007US20070176621 Semiconductor wafer testing apparatus and method of testing semiconductor wafer
08/02/2007US20070176620 Test Handler and Loading Method Thereof
08/02/2007US20070176619 Probe For Semiconductor Devices
08/02/2007US20070176618 Universal contactor for use with multiple handlers and method therefor
08/02/2007US20070176617 Temperature compensation circuit and testing apparatus
08/02/2007US20070176616 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same
08/02/2007US20070176615 Active probe contact array management
08/02/2007US20070176614 Probe card
08/02/2007US20070176613 Printed circuit board assembly and method of manufacturing the same
08/02/2007US20070176612 Method and Apparatus for Pad Aligned Multiprobe Wafer Testing
08/02/2007US20070176611 Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket
08/02/2007US20070176605 System and method for guided tdr/tdt computerized tomography
08/02/2007US20070176604 Ground-fault resistance measurement circuit and ground-fault detection circuit
08/02/2007US20070175268 Apparatus for processing sensor signal from knock sensor of internal combustion engine
08/02/2007US20070175019 Electrical component, method for the manufacture thereof and employment thereof
08/02/2007DE19828058B4 Schaltung zur Erkennung einer Leitungsunterbrechung für ein digitales Signal Circuit for detecting a line disconnection for a digital signal
08/02/2007DE19612891B4 Verfahren zum Testen von einem oder mehreren untereinander verbundenen elektronischen Verbrauchern A method of testing one or more electronic consumers interconnected
08/02/2007DE112005002118T5 Variable Verzögerungsschaltung, Makrozellendaten, logisches Verifizierungsverfahren, Prüfverfahren und elektronische Vorrichtung Variable delay circuit macro cell data, logic verification procedures, test methods and electronic device
08/02/2007DE112005002099T5 Prüfvorrichtung und Prüfverfahren Tester and test methods
08/02/2007DE10252106B4 Schnappverschließvorrichtung für einen KGD-Träger Schnappverschließvorrichtung for a KGD-carrier
08/02/2007DE10233617B4 Ableitung eines zusammengesetzten Stufenfunktionsverhaltens Deriving a composite step function behavior
08/02/2007DE10233616B4 Messung des Abstandes zum Fehler von einem Störimpuls Measurement of the distance to the fault of a glitch
08/02/2007DE102007005751A1 Prüfvorrichtung und Prüfverfahren Tester and test methods
08/02/2007DE102007005231A1 Messvorrichtung, Prüfvorrichtung und Messverfahren Measuring device, test device and methods of measurement
08/02/2007DE102006004387A1 Verfahren zum Betreiben eines Haushaltsgeräts und Schaltung für das Haushaltsgerät Method for operating a household appliance and circuit for the household appliance
08/02/2007DE102006004337A1 Stromverbindungsvorrichtung für eine Batteriepolklemme Power connection device for a battery pole
08/02/2007DE10109554B4 Verfahren zur Bestimmung der elektrischen Eigenschaften einer Anordnung von Leiterelementen einer integrierten Schaltung oder Hochfrequenzspule Method for determining the electrical characteristics of an array of conductor elements of an integrated circuit or radio frequency coil
08/02/2007DE10066065B4 Delay device for delaying incoming transmission signals in electronic instrument, has delay elements operating on power supply voltages, connected in series, and with a switch unit that outputs one of outputs of delay elements
08/01/2007EP1814214A1 Discharge lamp lighting device, and lighting equipment and lighting system using the device
08/01/2007EP1814206A1 Battery balancing apparatus
08/01/2007EP1814204A2 Electrical apparatus, electrical apparatus system, and power supply apparatus
08/01/2007EP1814056A1 Connector ports for anti-tamper
08/01/2007EP1813952A1 Scan Test
08/01/2007EP1813004A2 Method for measuring vcsel reverse bias leakage in an optical module
08/01/2007EP1812804A1 Adaptive memory calibration using bins
08/01/2007EP1812803A1 Testable integrated circuit
08/01/2007EP1812802A1 Method and system for monitoring and improving the quality of interconnecting cabling systems
08/01/2007EP1663721B1 Detection of short circuits in a vehicle
08/01/2007EP1612572B1 Test device and setting method
08/01/2007EP1573346B1 Method and circuit arrangement for the measurement of electrochemical cells in a serial circuit
08/01/2007EP1559304A4 Vision inspection apparatus using a full reflection mirror
08/01/2007EP1509778B1 Cell with fixed output voltage for integrated circuit
08/01/2007EP1499903B1 Method and system for monitoring winding insulation resistance
08/01/2007EP1485700B1 Battery monitoring method and apparatus
08/01/2007CN2930181Y Live detection interface of voltage limiting transport and discharging circuit eath wire of electric water heater control chip
08/01/2007CN2930180Y Live detection interface of current limiting transport and discharging circuit earth wire of electric water heater control chip
08/01/2007CN2930102Y Automatic compensation low zero float integrator
08/01/2007CN2929737Y Comprehensive test table for lithium ion cell
08/01/2007CN2929736Y Abnormal warning device for motor
08/01/2007CN2929735Y Circuit board detector
08/01/2007CN2929734Y Theft detector for live cable
08/01/2007CN2929733Y 测试板 Test Board
08/01/2007CN2929732Y Assembling detector for attached lock joint point module
08/01/2007CN2929731Y One-chip computer complex tester
08/01/2007CN2929730Y Quick detector for transformer capacity and loss
08/01/2007CN2929729Y Output power measuring device for power supply device
08/01/2007CN1330087C Damping control in a three-phase motor with a single current sensor
08/01/2007CN1329985C Method of manufacturing an integrated circuit, integrated circuit obtained in accordance with said method, wafer provided with an integrated circuit obtained in accordance with the method, and system
08/01/2007CN1329970C Semiconductor device manufacturing method
08/01/2007CN1329833C Method and apparatus for fault tolerant and flexible test signature generator
08/01/2007CN1329740C Heater-equipped pusher, electronic component handling apparatus, and temperature control method for electronic component
08/01/2007CN1329739C Recognition method of power cable
08/01/2007CN1329738C Electron device having brightness indicating driving circuit
08/01/2007CN101010880A Forward error correction in packet networks
08/01/2007CN101010855A Arrangement in an electrical machine
08/01/2007CN101010596A Internal impedance detector, internal impedance detecting method, degradation degree detector, and degradation degree detecting method
08/01/2007CN101010595A Turning device for heavy object
08/01/2007CN101010594A Semiconductor integrated circuit having jitter measuring function
08/01/2007CN101009978A Method for manufacturing electronic device
08/01/2007CN101009883A Mobile terminal and its information prompt method
08/01/2007CN101009488A Clock and data recovery circuit, and SERDES circuit
08/01/2007CN101009414A Novel current leakage protection jack
08/01/2007CN101009268A Base board and its electric test method
08/01/2007CN101009237A Insert with support for semiconductor package and assembly
08/01/2007CN101009192A Photoncounting methods and devices
08/01/2007CN101009074A A LED scanning board with the self-testing function and its testing method
08/01/2007CN101008668A High accuracy detecting system of lithium batteries
08/01/2007CN101008667A Method and system for measuring remaining capacity of a battery with open circuit voltage detection
08/01/2007CN101008666A Circuit for testing action of relay contact
08/01/2007CN101008665A Parallel connection burning testing system