Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2007
08/08/2007CN2932406Y Tin soldering test device
08/08/2007CN2932405Y Automobile CAN bus controller capable of troubleshooting turn light and substitution
08/08/2007CN2932404Y Distribution network failure automatic positioning system device
08/08/2007CN2932403Y HV combined electric appliance partial discharge detector
08/08/2007CN2932402Y Host/slave module equipment of DC electronic loader
08/08/2007CN2932401Y Electric working intelligent earthing rod device
08/08/2007CN2932400Y Identifying and analytical device of coating damage during stator coil winding with a winding machine
08/08/2007CN2932399Y Intelligent armature performance combined tester
08/08/2007CN2932398Y Multichannel harmonic monitoring and analyzing device
08/08/2007CN2932391Y A test device of surface-mounted components
08/08/2007CN2932361Y A rear-view mirror electric redirector durability tester
08/08/2007CN1331290C Zero-sequence voltage direction polarizing element for protecting relay
08/08/2007CN1331207C Method for evaluating semiconductor device error and system for supporting the same
08/08/2007CN1331205C Large area silicon carbide devices and manufacturing methods therefor
08/08/2007CN1331157C Semiconductor storage device with testing and redundant function
08/08/2007CN1331156C Semiconductor storage device
08/08/2007CN1331079C Block based design methodology
08/08/2007CN1330973C Experimental installation for failure diagnosis of air conditioner control circuit
08/08/2007CN1330972C Quick integrated circuit testing process optimization method
08/08/2007CN1330971C Ageing testing system
08/08/2007CN1330970C Method for testing power type LED thermal resistance and special purpose chip thereof
08/08/2007CN1330969C Power frequency parameter tester and testing method for high tension transmission line
08/08/2007CN101015123A Optically reconfigurable gate array write state inspection method, write state inspection device, and optically reconfigurable gate array
08/08/2007CN101014876A Ultrahigh-frequency testing device for transponders
08/08/2007CN101014869A Circuit arrangement and method of testing an application circuit provided in said circuit arrangement
08/08/2007CN101014868A Remote bist for high speed test and redundancy calculation
08/08/2007CN101014867A Inverse characteristic measuring instrument, distortion compensator, method, program, and recording medium
08/08/2007CN101014865A A highly resilient cantilever spring probe for testing ics
08/08/2007CN101013822A Method for compensating state of charge of battery and battery management system using the same
08/08/2007CN101013811A Method and apparatus of single-phase fault line selection of duplicate supply looped network
08/08/2007CN101013677A Semiconductor wafer testing apparatus and method of testing semiconductor wafer
08/08/2007CN101013676A Method of inspecting laminated assembly and method of inspecting heat spreader module
08/08/2007CN101013656A Test handler and operation method thereof
08/08/2007CN101013551A Display device and electronic apparatus having the display device
08/08/2007CN101013428A Method and apparatus for configuring a data formatting process
08/08/2007CN101013151A Handling mixed-mode content in a stream of test results
08/08/2007CN101013150A Test method of RF mark
08/08/2007CN101013149A Method and apparatus for detecting a fault section in ungrounded distribution power systems
08/08/2007CN101013148A Dynamic property test analysis system for DC hybrid contactor reliable life experiment
08/08/2007CN101013068A Testing system of frequency changing outdoor air-conditioning
08/07/2007US7254764 Generating test patterns used in testing semiconductor integrated circuit
08/07/2007US7254763 Built-in self test for memory arrays using error correction coding
08/07/2007US7254762 Semiconductor integrated circuit
08/07/2007US7254761 Platform ASIC reliability
08/07/2007US7254760 Methods and apparatus for providing scan patterns to an electronic device
08/07/2007US7254759 Methods and systems for semiconductor defect detection
08/07/2007US7254758 Method and apparatus for testing circuit units to be tested with different test mode data sets
08/07/2007US7254757 Flash memory test system and method capable of test time reduction
08/07/2007US7254755 On-chip receiver sensitivity test mechanism
08/07/2007US7254753 Circuit and method for configuring CAM array margin test and operation
08/07/2007US7254507 Analog circuit automatic calibration system
08/07/2007US7254110 Pots extender for voice fallback in a subscriber line
08/07/2007US7254070 Semiconductor memory device with redundancy circuit
08/07/2007US7253901 Laser-based cleaning device for film analysis tool
08/07/2007US7253680 Amplifier system with current-mode servo feedback
08/07/2007US7253653 Test tray for handler for testing semiconductor devices
08/07/2007US7253652 Integrated systems testing
08/07/2007US7253651 Remote test facility with wireless interface to local test facilities
08/07/2007US7253650 Increase productivity at wafer test using probe retest data analysis
08/07/2007US7253649 Automatic mercury probe for use with a semiconductor wafer
08/07/2007US7253648 Signal acquisition probe having a retractable double cushioned probing tip with EOS/ESD protection capabilities
08/07/2007US7253647 Probe for high electric current
08/07/2007US7253646 Probe card with tunable stage and at least one replaceable probe
08/07/2007US7253645 Detection of defects in patterned substrates
08/07/2007US7253640 Arc fault detector and method for locating an arc fault
08/07/2007US7253638 Apparatus and method for conducting an electrical test on a terminal fitting in a connector
08/07/2007US7253637 Arc fault circuit interrupter system
08/07/2007US7253636 Wire tracer receiver
08/07/2007US7253635 Method for checking the electrical safety of a household appliance and corresponding household appliance
08/07/2007US7253634 Generator protection methods and systems self-tuning to a plurality of characteristics of a machine
08/07/2007US7253633 Threshold adjustment accuracy for ground fault condition determination
08/07/2007US7253630 Electro-optical voltage sensor circuit monitoring leakage or loss of vacuum of a vacuum interrupter and vacuum circuit interrupter including the same
08/07/2007US7253629 Circuit protection device with grounded neutral half cycle self test
08/07/2007US7253608 Planarity diagnostic system, e.g., for microelectronic component test systems
08/07/2007US7253607 Site-aware objects
08/07/2007US7253606 Framework that maximizes the usage of testhead resources in in-circuit test system
08/07/2007US7253604 Assembled capacitor polarity automatic inspecting method and system
08/07/2007US7253587 Method for prediction of electrical characteristics of an electrochemical storage battery
08/07/2007US7253571 Wireless power supply and method of supplying power
08/07/2007US7253436 Resistance defect assessment device, resistance defect assessment method, and method for manufacturing resistance defect assessment device
08/07/2007CA2340572C Method and apparatus for testing image sensing circuit arrays
08/02/2007WO2007087512A2 Apparatus and methods for jointly decoding messages based on apriori knowledge of modified codeword transmission
08/02/2007WO2007087023A1 Battery state of charge voltage hysteresis estimator
08/02/2007WO2007086971A1 Device for monitoring cell voltage
08/02/2007WO2007086841A1 Intrusion detection system and method thereof
08/02/2007WO2007086549A1 Guide member, connection board having guide member, and guide member manufacturing method
08/02/2007WO2007086356A1 Analyzing device and analyzing method
08/02/2007WO2007086275A1 Test device and test method
08/02/2007WO2007086214A1 Tester and selector
08/02/2007WO2007085208A1 Method for a one-time calibration of a multiple branches digital measurement system working in minimum number of branches mode
08/02/2007WO2007085143A1 An electric quantity detecting device for battery of electric vehicle
08/02/2007WO2007085105A1 Battery balancing apparatus
08/02/2007WO2007085075A1 Electrostatic discharge monitoring and manufacturing process control system
08/02/2007WO2007070453A3 Determination of ir-free voltage in hybrid vehicle applications
08/02/2007WO2007063029A3 Nanoscale fault isolation and measurement system
08/02/2007WO2007054845A3 Integrated circuit arrangement and design method
08/02/2007WO2006132734A3 Compensating for loss in a transmission path
08/02/2007WO2006121874A3 Memory device and method having a data bypass path to allow rapid testing and calibration
08/02/2007US20070180342 System, method and apparatus for completing the generation of test records after an abort event
08/02/2007US20070180341 Tap and linking module for scan access of multiple cores with ieee 1149.1 test access ports
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