| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/14/2007 | US7256603 Apparatus for measuring the static parameters of integrated circuits |
| 08/14/2007 | US7256602 Electrical circuit and method for testing integrated circuits |
| 08/14/2007 | US7256601 First and second scan distributors, collectors, controllers, and multiplexers |
| 08/14/2007 | US7256600 Method and system for testing semiconductor devices |
| 08/14/2007 | US7256599 Protection circuit for semiconductor device and semiconductor device including the same |
| 08/14/2007 | US7256598 Non-abrasive electrical test contact |
| 08/14/2007 | US7256597 Device design-for-test and burn-in-board with minimal external components and increased testing capacity |
| 08/14/2007 | US7256596 Method and apparatus for adapting a standard flying prober system for reliable testing of printed circuit assemblies |
| 08/14/2007 | US7256595 Test sockets, test systems, and methods for testing microfeature devices |
| 08/14/2007 | US7256594 Method and apparatus for testing semiconductor devices using the back side of a circuit board |
| 08/14/2007 | US7256593 Electrical contact probe with compliant internal interconnect |
| 08/14/2007 | US7256592 Probe with trapezoidal contractor and device based on application thereof, and method of producing them |
| 08/14/2007 | US7256591 Probe card, having cantilever-type probe and method |
| 08/14/2007 | US7256590 Capacitance sensor type measuring apparatus |
| 08/14/2007 | US7256584 Method and system for measuring partial discharge |
| 08/14/2007 | US7256583 Device and method for testing the seal tightness of a fuel tank system of a motor vehicle |
| 08/14/2007 | US7256574 Device for measuring electric current intensity |
| 08/14/2007 | US7256058 Device and method for package warp compensation in an integrated heat spreader |
| 08/14/2007 | US7256056 Method and apparatus for determining the thickness of a dielectric layer |
| 08/14/2007 | US7256055 System and apparatus for using test structures inside of a chip during the fabrication of the chip |
| 08/14/2007 | US7255576 Kelvin contact module for a microcircuit test system |
| 08/14/2007 | US7255575 Electrical connecting apparatus |
| 08/14/2007 | US7254861 Device for cleaning tip and side surfaces of a probe |
| 08/14/2007 | CA2526148C Device and method for evaluating performance of fuel cells, device and method for evaluating specific surface area of fuel-cell electrode catalysts, fuel-cell electrode catalyst, and method of manufacturing the same |
| 08/09/2007 | WO2007090200A2 Battery management |
| 08/09/2007 | WO2007089937A2 High-speed capacitor leakage measurement systems and methods |
| 08/09/2007 | WO2007089543A2 Active probe contact array management |
| 08/09/2007 | WO2007089515A2 System and method for guided tdr/tdt computed tomography |
| 08/09/2007 | WO2007089255A1 Motor drive circuit and winding current sensing |
| 08/09/2007 | WO2007089173A1 A method and a system for cable or subscriber loop investigation performing loop topology identification |
| 08/09/2007 | WO2007089047A1 Secondary cell monitoring device |
| 08/09/2007 | WO2007089037A1 Power source device, electric vehicle mounted with the power source device, and control method for power source device |
| 08/09/2007 | WO2007088672A1 Ring oscillating circuit, delayed time measuring circuit, test circuit, clock signal generating circuit, image sensor, pulse generating circuit, semiconductor integrated circuit and its testing method |
| 08/09/2007 | WO2007088603A1 Semiconductor device and noise measuring method |
| 08/09/2007 | WO2007088552A1 Apparatus and method for imaging integrated circuits and the like |
| 08/09/2007 | WO2007088526A1 An integrated circuit package, and a method for producing an integrated circuit package having two dies with input and output terminals of integrated circuits of the dies directly addressable for testing of the package |
| 08/09/2007 | WO2007088427A1 Device and a method for estimating transistor parameter variations |
| 08/09/2007 | WO2007088176A1 Electrically-modulatable extended light source and a measurement device for characterising a semiconductor including one such source |
| 08/09/2007 | WO2007070439A3 Battery state of charge reset |
| 08/09/2007 | WO2007002297A8 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
| 08/09/2007 | WO2005116673A3 Local area network measurement test device |
| 08/09/2007 | WO2005111801A3 Apparatus and method for improving emulation speed of high-level languages in on-chip emulation systems |
| 08/09/2007 | WO2004079377A3 Apparatus and method for electrical cable identification |
| 08/09/2007 | US20070186195 Method and system for debugging using replicated logic and trigger logic |
| 08/09/2007 | US20070186132 Testing of circuits with multiple clock domains |
| 08/09/2007 | US20070186131 Low cost imbedded load board diagnostic test fixture |
| 08/09/2007 | US20070185700 Safety protective instrumentation system and its handling method |
| 08/09/2007 | US20070184686 Wire harness checker and wire harness checking method |
| 08/09/2007 | US20070183540 Multi-pair gigabit ethernet transceiver having adaptive disabling of circuit elements |
| 08/09/2007 | US20070182603 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 08/09/2007 | US20070182443 Display apparatus |
| 08/09/2007 | US20070182442 Display device and electronic apparatus having the display device |
| 08/09/2007 | US20070182441 Picture quality controlling system |
| 08/09/2007 | US20070182440 Driving chip package, display device including the same, and method of testing driving chip package |
| 08/09/2007 | US20070182439 Method for measuring FET characteristics |
| 08/09/2007 | US20070182438 Wireless Test Cassette |
| 08/09/2007 | US20070182437 Test handler and operation method thereof |
| 08/09/2007 | US20070182436 Technique for offsetting signal lines from the glass weave of resin/glass materials |
| 08/09/2007 | US20070182435 Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests |
| 08/09/2007 | US20070182434 Contact assembly for a chip card |
| 08/09/2007 | US20070182433 Wafer holder, and wafer prober and semiconductor manufacturing apparatus provided therewith |
| 08/09/2007 | US20070182432 Insert with support for semiconductor package |
| 08/09/2007 | US20070182431 Probe card and probe device |
| 08/09/2007 | US20070182430 Probe head with machine mounting pads and method of forming same |
| 08/09/2007 | US20070182429 Triaxial interconnect system |
| 08/09/2007 | US20070182428 Electrical characteristics measurement method and electrical characteristics measurement device |
| 08/09/2007 | US20070182427 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes |
| 08/09/2007 | US20070182424 High frequency circuit analyser |
| 08/09/2007 | US20070182422 Probe for electrical measurement methods, especially eddy current measurements |
| 08/09/2007 | US20070182421 Apparatus for detecting an attack on an electric circuit |
| 08/09/2007 | US20070182420 Method and system for estimating driving point voltage |
| 08/09/2007 | US20070182416 Methods and apparatus for detecting leaks in fluorescent lamps |
| 08/09/2007 | US20070182402 Skew adjusting method, skew adjusting apparatus, and test apparatus |
| 08/09/2007 | US20070182373 Method and Apparatus For Diagnosing The Condition of A Rechargeable Battery |
| 08/09/2007 | DE69835517T2 Schnittstellenabtastungselement und kommunikationsvorrichtung die dieses verwendet Interface scanning element and the communication device that uses |
| 08/09/2007 | DE112005002250T5 Phasenverzögerungsregelkreis, Phasenregelkreis, Synchronisiereinheit, Halbleiterprüfvorrichtung und integrierte Halbleiterschaltung Phase delay locked loop, PLL, synchronizing, semiconductor test and semiconductor integrated circuit |
| 08/09/2007 | DE112005002247T5 Verbrauchsstrom-Ausgleichsschaltung, Verfahren zum Einstellen eines Ausgleichsstrombetrags, Zeitgeber und Halbleitertestgerät Consumption current balance circuit, method for adjusting a compensation current amount, timers, and semiconductor testing device |
| 08/09/2007 | DE112004001276T5 Batteriesatz-Lade-/Entlade-Steuergerät, Verfahren und Programm, und Batteriesteuersystem Battery pack charge / discharge control apparatus, method and program, and battery control system |
| 08/09/2007 | DE102007006128A1 Prüfvorrichtung und Prüfverfahren Tester and test methods |
| 08/09/2007 | DE102007004846A1 Handhaben eines Mischmodus-Inhalts in einem Strom von Testergebnissen Handling a mixed mode contents in a stream of test results |
| 08/09/2007 | DE102007003157A1 Masseschlusswiderstands-Messschaltung und Masseschlussdetektierschaltung Ground fault resistance measurement circuit and Masseschlussdetektierschaltung |
| 08/09/2007 | DE102006004873A1 Circuit configuration testing method involves measuring supply voltage of circuit configuration and error free condition is recognized, if first variable of supply voltage lies outside of valid range, which is smaller than threshold value |
| 08/09/2007 | DE102006004786A1 Verfahren zur Bestimmung einer Systemtemperatur einer elektrochemischen Batterie A method for determining a system temperature of an electrochemical battery |
| 08/09/2007 | DE10120080B4 Ereignisgestütztes Prüfsystem mit einer Einrichtung zur Erzeugung von Prüfabschluß-Mehrfachsignalen Event aided inspection system comprising means for generating multiple signals Inspection |
| 08/09/2007 | CA2638013A1 Power supply monitoring for an implantable device |
| 08/08/2007 | EP1816484A1 Method for detecting a disfunction on a state machine |
| 08/08/2007 | EP1816483A1 Short-circuit and overcurrent detection circuit |
| 08/08/2007 | EP1815262A1 System and method for on-chip jitter injection |
| 08/08/2007 | EP1815261A1 Method and apparatus for controlling variable delays in electronic circuitry |
| 08/08/2007 | EP1815260A1 Method and device for detecting electric arc phenomenon on at least one electric cable |
| 08/08/2007 | EP1815259A1 Method for operating a control device for a motor vehicle, particularly for a safety device of a motor vehicle |
| 08/08/2007 | EP1682912B1 Apparatus and method for fuel cell resistance test |
| 08/08/2007 | EP1629291B1 Automatic test pattern generation |
| 08/08/2007 | EP1574867B1 Semiconductor device and method for testing the same |
| 08/08/2007 | CN2932803Y Energy-saving lamp charging and discharging control device |
| 08/08/2007 | CN2932797Y Sensor amplifier and electronic device |
| 08/08/2007 | CN2932793Y Superconductor quench fault current limiter fault detecting device |
| 08/08/2007 | CN2932630Y Fake battery and fake battery pack that can be loaded into battery slot of electronic products |
| 08/08/2007 | CN2932408Y Flip-plate fixing device of switch for detection of power switching |
| 08/08/2007 | CN2932407Y Steady-state working life test equipment capable of controlling transistor junction temperature |