Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2007
08/16/2007DE112005002231T5 Vorrichtung zur Messung einer inversen Charakteristik, Vorrichtung zur Kompensation der Verzerrung, Verfahren, Programm und Aufzeichnungsmedium An apparatus for measuring an inverse characteristic of the distortion compensating apparatus, method, program and recording medium
08/16/2007DE112005001480T5 Gerätefehlermonitor Device Fault Monitor
08/16/2007DE10335930B4 Verfahren zur Bestimmung des Zustands einer elektrochemischen Speicherbatterie A method for determining the condition of an electrochemical storage battery
08/16/2007DE102007007529A1 Testing device consists of workpiece carrier which has a chamber and temperate system for heating and cooling of chamber
08/16/2007DE102007004368A1 Verfahren und Vorrichtung zum Berechnen eines Batteriezustandes sowie Vorrichtung zum Steuern der Versorgungsspannung eines Fahrzeugs Method and apparatus for computing a battery condition as well as means for controlling the supply voltage of a vehicle
08/16/2007DE102006021569A1 Prüfsystem für einen Schaltungsträger Test system for a circuit carrier
08/16/2007DE102006006350A1 Verfahren und Einrichtung zur Erdschlusserfassung in einem Versorgungskabel Method and apparatus for earth fault in a power cable
08/16/2007DE102006005800A1 Verfahren und Vorrichtung zum Testen von unbestückten Leiterplatten A method and apparatus for testing bare printed circuit boards
08/16/2007DE102006005712A1 Glow plug monitoring method for motor vehicle, involves providing time intervals and time points for checking whether parameter characterizing current flowing through plug lies below upper threshold value and above lower threshold value
08/16/2007DE102006005522A1 Elektrische Kontaktiervorrichtung sowie elektrisches Kontaktierverfahren The electrical contactor and electrical contacting method
08/16/2007DE102006005319A1 Heizvorrichtung zum Testen integrierter Bauelemente Heating device for testing integrated components
08/16/2007DE102006005051A1 Schaltungsanordnung und Prüfvorrichtung Circuitry and Tester
08/16/2007DE102005054806B3 Method of testing the control loop of a voltage transformer for a non-earthed alternating voltage network
08/16/2007CA2642510A1 Systems and methods of improving performance of transport protocols
08/15/2007EP1819028A2 Redundant fieldbus system
08/15/2007EP1818677A1 Electronic circuit comprising a test mode secured by breaking a scan chain
08/15/2007EP1818676A1 Test device, test method, electronic device, and device manufacturing method
08/15/2007EP1817599A2 Maximum and minimum power limit calculator for batteries and battery subpacks
08/15/2007EP1817598A2 Probe card with segmented substrate
08/15/2007EP1817597A2 Interface apparatus for semiconductor device tester and test method therefor
08/15/2007EP1817596A1 Integrated circuit and a method for testing a multi-tap integrated circuit
08/15/2007EP1817595A1 Integrated circuit and a method for secure testing
08/15/2007EP1817594A1 Monitoring physical operating parameters of an integrated circuit
08/15/2007EP1601984B1 Automatically detecting and routing of test signals
08/15/2007EP1495405B1 Method, computer-readable medium and node for selecting reliable links between nodes in an ad-hoc communication network
08/15/2007EP1402278B1 Method and apparatus for optimized parallel testing and access of electronic circuits
08/15/2007EP0862099B1 Rechargeable electronic device
08/15/2007CN2935735Y Maintaining device for circuit board
08/15/2007CN2935178Y Apparatus for testing performance of secondary cell
08/15/2007CN2935177Y Testing device for breaker detection with compressing apparatus
08/15/2007CN2935176Y 电路测试装置 Circuit test equipment
08/15/2007CN2935175Y Fault indicator of power supply line
08/15/2007CN2935174Y CAN bus network based high-voltage switch room sulfur hexafluoride warning device
08/15/2007CN2935173Y Connector testing device
08/15/2007CN2935172Y 绝缘子检测器 Insulator detector
08/15/2007CN2935171Y Shunting machine monitoring tester
08/15/2007CN2935168Y L-type test darkroom
08/15/2007CN2935165Y Measuring device for circuit board
08/15/2007CN2935163Y Novel test push-buckle device
08/15/2007CN1332474C Battery apparatus and discharge controlling method of battery apparatus
08/15/2007CN1332433C Test system for testing integrated chips and an adapter element and a presintering board for a test system
08/15/2007CN1332212C Equipment for testing semiconductor integrated circuit
08/15/2007CN1332211C DC power supply system grounded fault detecting method and circuit
08/15/2007CN1332210C Automatic correcting method for electronic ballast automatic testing system
08/15/2007CN1332207C Device for measuring electrical double layer streaming potential in thin-film lubrication
08/15/2007CN101019473A High density interconnect system having rapid fabrication cycle
08/15/2007CN101019355A Storage switch traffic bandwidth control
08/15/2007CN101019303A Ac rotary machine constant measuring apparatus
08/15/2007CN101019102A System verification using one or more automata
08/15/2007CN101019035A Precise time measurement apparatus and method
08/15/2007CN101019034A Test arrangement including anisotropic conductive film for testing power module
08/15/2007CN101018255A Potable mobile terminal capable of indicating be distinguished battery capacity by additional mounted battery and method thereof
08/15/2007CN101017981A Method and apparatus for detecting individual operation, controller and distributed power source for the same
08/15/2007CN101017974A Single phase grounding failure positioning method and device of neutral point non direct grounding power grid
08/15/2007CN101017496A Method and apparatus for automatically formatting data based on a best match test result type
08/15/2007CN101017446A Methods and apparatus using a service to launch and/or monitor data formatting processes
08/15/2007CN101017445A Method and system for managing access to a data store
08/15/2007CN101017262A Flat display apparatus, fabricating method, picture quality controling method and apparatus thereof
08/15/2007CN101017256A Repair device and repair method
08/15/2007CN101017255A Picture quality controling system
08/15/2007CN101017193A Testing method for irradiation of memory and device for implementing method thereof
08/15/2007CN101017192A Method for obtaining Schottky diode junction parameter
08/15/2007CN101017191A On-line fault diagnoses method on rotor winding inter turn short-circuit of turbine generator
08/15/2007CN101017190A Repair method of high-voltage transmission line and failure testing device thereof
08/15/2007CN101017189A Acceleration checking test method of failure rate of electric connector
08/15/2007CN101017188A Detecting method for line breaking and circuit shorting of CT
08/15/2007CN101017187A Confirming method for important parameter of microelectronics
08/15/2007CN101017185A Testing method of capacitance component mounted inside and testing system thereof
08/15/2007CN101017184A Method for surveying generation source of electromagnetic waves, and current probe used therefor
08/15/2007CN101017183A Electrical contact device and electrical contact method
08/15/2007CN101017182A Wafer-level burn-in and test
08/15/2007CN101017153A Method for estimating and monitoring dielectric film quality and reliability
08/15/2007CA2537317A1 Detection seat for ic detection device
08/14/2007US7257840 Preventing network data injection attacks using duplicate-ACK and reassembly gap approaches
08/14/2007US7257802 Method and system for hardware accelerated verification of digital circuit design and its testbench
08/14/2007US7257756 Digital frequency synthesis clocked circuits
08/14/2007US7257755 Driver IC and inspection method for driver IC and output device
08/14/2007US7257754 Semiconductor memory device and test pattern data generating method using the same
08/14/2007US7257753 Semiconductor testing apparatus
08/14/2007US7257752 Circuit and method for performing built-in self test and computer readable recording medium for storing program thereof
08/14/2007US7257751 Apparatus and method for random pattern built in self-test
08/14/2007US7257750 Self-verification of configuration memory in programmable logic devices
08/14/2007US7257749 Probeless testing of pad buffers on wafer
08/14/2007US7257748 Method for programming and/or testing for correct functioning of an electronic circuit
08/14/2007US7257747 Apparatus for testing USB memory and method thereof
08/14/2007US7257746 System for protection link supervision
08/14/2007US7257745 Array self repair using built-in self test techniques
08/14/2007US7257740 Circuit for detecting ground offset of parts of a network
08/14/2007US7257659 Method for signaling PCI/PCI-X standard hot-plug controller (SHPC) command status
08/14/2007US7257509 Measuring device with functional units controllable via a block diagram
08/14/2007US7257409 Centralized cell homing and load balancing in a base station controller
08/14/2007US7257173 Bounding box signal detector
08/14/2007US7257091 Controlling the state of duplexing of coupling facility structures
08/14/2007US7257079 Physical layer and data link interface with adaptive speed
08/14/2007US7256879 Semiconductor array tester
08/14/2007US7256701 Motor driver
08/14/2007US7256620 Selector circuit and semiconductor device
08/14/2007US7256606 Method for testing pixels for LCD TFT displays
08/14/2007US7256605 Diagnostic circuit and method therefor
08/14/2007US7256604 Semiconductor device