Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
08/16/2007 | DE112005002231T5 Vorrichtung zur Messung einer inversen Charakteristik, Vorrichtung zur Kompensation der Verzerrung, Verfahren, Programm und Aufzeichnungsmedium An apparatus for measuring an inverse characteristic of the distortion compensating apparatus, method, program and recording medium |
08/16/2007 | DE112005001480T5 Gerätefehlermonitor Device Fault Monitor |
08/16/2007 | DE10335930B4 Verfahren zur Bestimmung des Zustands einer elektrochemischen Speicherbatterie A method for determining the condition of an electrochemical storage battery |
08/16/2007 | DE102007007529A1 Testing device consists of workpiece carrier which has a chamber and temperate system for heating and cooling of chamber |
08/16/2007 | DE102007004368A1 Verfahren und Vorrichtung zum Berechnen eines Batteriezustandes sowie Vorrichtung zum Steuern der Versorgungsspannung eines Fahrzeugs Method and apparatus for computing a battery condition as well as means for controlling the supply voltage of a vehicle |
08/16/2007 | DE102006021569A1 Prüfsystem für einen Schaltungsträger Test system for a circuit carrier |
08/16/2007 | DE102006006350A1 Verfahren und Einrichtung zur Erdschlusserfassung in einem Versorgungskabel Method and apparatus for earth fault in a power cable |
08/16/2007 | DE102006005800A1 Verfahren und Vorrichtung zum Testen von unbestückten Leiterplatten A method and apparatus for testing bare printed circuit boards |
08/16/2007 | DE102006005712A1 Glow plug monitoring method for motor vehicle, involves providing time intervals and time points for checking whether parameter characterizing current flowing through plug lies below upper threshold value and above lower threshold value |
08/16/2007 | DE102006005522A1 Elektrische Kontaktiervorrichtung sowie elektrisches Kontaktierverfahren The electrical contactor and electrical contacting method |
08/16/2007 | DE102006005319A1 Heizvorrichtung zum Testen integrierter Bauelemente Heating device for testing integrated components |
08/16/2007 | DE102006005051A1 Schaltungsanordnung und Prüfvorrichtung Circuitry and Tester |
08/16/2007 | DE102005054806B3 Method of testing the control loop of a voltage transformer for a non-earthed alternating voltage network |
08/16/2007 | CA2642510A1 Systems and methods of improving performance of transport protocols |
08/15/2007 | EP1819028A2 Redundant fieldbus system |
08/15/2007 | EP1818677A1 Electronic circuit comprising a test mode secured by breaking a scan chain |
08/15/2007 | EP1818676A1 Test device, test method, electronic device, and device manufacturing method |
08/15/2007 | EP1817599A2 Maximum and minimum power limit calculator for batteries and battery subpacks |
08/15/2007 | EP1817598A2 Probe card with segmented substrate |
08/15/2007 | EP1817597A2 Interface apparatus for semiconductor device tester and test method therefor |
08/15/2007 | EP1817596A1 Integrated circuit and a method for testing a multi-tap integrated circuit |
08/15/2007 | EP1817595A1 Integrated circuit and a method for secure testing |
08/15/2007 | EP1817594A1 Monitoring physical operating parameters of an integrated circuit |
08/15/2007 | EP1601984B1 Automatically detecting and routing of test signals |
08/15/2007 | EP1495405B1 Method, computer-readable medium and node for selecting reliable links between nodes in an ad-hoc communication network |
08/15/2007 | EP1402278B1 Method and apparatus for optimized parallel testing and access of electronic circuits |
08/15/2007 | EP0862099B1 Rechargeable electronic device |
08/15/2007 | CN2935735Y Maintaining device for circuit board |
08/15/2007 | CN2935178Y Apparatus for testing performance of secondary cell |
08/15/2007 | CN2935177Y Testing device for breaker detection with compressing apparatus |
08/15/2007 | CN2935176Y 电路测试装置 Circuit test equipment |
08/15/2007 | CN2935175Y Fault indicator of power supply line |
08/15/2007 | CN2935174Y CAN bus network based high-voltage switch room sulfur hexafluoride warning device |
08/15/2007 | CN2935173Y Connector testing device |
08/15/2007 | CN2935172Y 绝缘子检测器 Insulator detector |
08/15/2007 | CN2935171Y Shunting machine monitoring tester |
08/15/2007 | CN2935168Y L-type test darkroom |
08/15/2007 | CN2935165Y Measuring device for circuit board |
08/15/2007 | CN2935163Y Novel test push-buckle device |
08/15/2007 | CN1332474C Battery apparatus and discharge controlling method of battery apparatus |
08/15/2007 | CN1332433C Test system for testing integrated chips and an adapter element and a presintering board for a test system |
08/15/2007 | CN1332212C Equipment for testing semiconductor integrated circuit |
08/15/2007 | CN1332211C DC power supply system grounded fault detecting method and circuit |
08/15/2007 | CN1332210C Automatic correcting method for electronic ballast automatic testing system |
08/15/2007 | CN1332207C Device for measuring electrical double layer streaming potential in thin-film lubrication |
08/15/2007 | CN101019473A High density interconnect system having rapid fabrication cycle |
08/15/2007 | CN101019355A Storage switch traffic bandwidth control |
08/15/2007 | CN101019303A Ac rotary machine constant measuring apparatus |
08/15/2007 | CN101019102A System verification using one or more automata |
08/15/2007 | CN101019035A Precise time measurement apparatus and method |
08/15/2007 | CN101019034A Test arrangement including anisotropic conductive film for testing power module |
08/15/2007 | CN101018255A Potable mobile terminal capable of indicating be distinguished battery capacity by additional mounted battery and method thereof |
08/15/2007 | CN101017981A Method and apparatus for detecting individual operation, controller and distributed power source for the same |
08/15/2007 | CN101017974A Single phase grounding failure positioning method and device of neutral point non direct grounding power grid |
08/15/2007 | CN101017496A Method and apparatus for automatically formatting data based on a best match test result type |
08/15/2007 | CN101017446A Methods and apparatus using a service to launch and/or monitor data formatting processes |
08/15/2007 | CN101017445A Method and system for managing access to a data store |
08/15/2007 | CN101017262A Flat display apparatus, fabricating method, picture quality controling method and apparatus thereof |
08/15/2007 | CN101017256A Repair device and repair method |
08/15/2007 | CN101017255A Picture quality controling system |
08/15/2007 | CN101017193A Testing method for irradiation of memory and device for implementing method thereof |
08/15/2007 | CN101017192A Method for obtaining Schottky diode junction parameter |
08/15/2007 | CN101017191A On-line fault diagnoses method on rotor winding inter turn short-circuit of turbine generator |
08/15/2007 | CN101017190A Repair method of high-voltage transmission line and failure testing device thereof |
08/15/2007 | CN101017189A Acceleration checking test method of failure rate of electric connector |
08/15/2007 | CN101017188A Detecting method for line breaking and circuit shorting of CT |
08/15/2007 | CN101017187A Confirming method for important parameter of microelectronics |
08/15/2007 | CN101017185A Testing method of capacitance component mounted inside and testing system thereof |
08/15/2007 | CN101017184A Method for surveying generation source of electromagnetic waves, and current probe used therefor |
08/15/2007 | CN101017183A Electrical contact device and electrical contact method |
08/15/2007 | CN101017182A Wafer-level burn-in and test |
08/15/2007 | CN101017153A Method for estimating and monitoring dielectric film quality and reliability |
08/15/2007 | CA2537317A1 Detection seat for ic detection device |
08/14/2007 | US7257840 Preventing network data injection attacks using duplicate-ACK and reassembly gap approaches |
08/14/2007 | US7257802 Method and system for hardware accelerated verification of digital circuit design and its testbench |
08/14/2007 | US7257756 Digital frequency synthesis clocked circuits |
08/14/2007 | US7257755 Driver IC and inspection method for driver IC and output device |
08/14/2007 | US7257754 Semiconductor memory device and test pattern data generating method using the same |
08/14/2007 | US7257753 Semiconductor testing apparatus |
08/14/2007 | US7257752 Circuit and method for performing built-in self test and computer readable recording medium for storing program thereof |
08/14/2007 | US7257751 Apparatus and method for random pattern built in self-test |
08/14/2007 | US7257750 Self-verification of configuration memory in programmable logic devices |
08/14/2007 | US7257749 Probeless testing of pad buffers on wafer |
08/14/2007 | US7257748 Method for programming and/or testing for correct functioning of an electronic circuit |
08/14/2007 | US7257747 Apparatus for testing USB memory and method thereof |
08/14/2007 | US7257746 System for protection link supervision |
08/14/2007 | US7257745 Array self repair using built-in self test techniques |
08/14/2007 | US7257740 Circuit for detecting ground offset of parts of a network |
08/14/2007 | US7257659 Method for signaling PCI/PCI-X standard hot-plug controller (SHPC) command status |
08/14/2007 | US7257509 Measuring device with functional units controllable via a block diagram |
08/14/2007 | US7257409 Centralized cell homing and load balancing in a base station controller |
08/14/2007 | US7257173 Bounding box signal detector |
08/14/2007 | US7257091 Controlling the state of duplexing of coupling facility structures |
08/14/2007 | US7257079 Physical layer and data link interface with adaptive speed |
08/14/2007 | US7256879 Semiconductor array tester |
08/14/2007 | US7256701 Motor driver |
08/14/2007 | US7256620 Selector circuit and semiconductor device |
08/14/2007 | US7256606 Method for testing pixels for LCD TFT displays |
08/14/2007 | US7256605 Diagnostic circuit and method therefor |
08/14/2007 | US7256604 Semiconductor device |