| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/22/2007 | CN1333261C Measurement of fuel cell impedance |
| 08/22/2007 | CN1333259C Test desk for high frequency characteristics of semiconductor laser chip with noncoplanar electrode |
| 08/22/2007 | CN101023670A Apparatus for verifying a low noise block output voltage |
| 08/22/2007 | CN101023528A Self-cleaning lower contact |
| 08/22/2007 | CN101023490A Housings and devices for disk drives |
| 08/22/2007 | CN101023366A A method of monitoring line faults in a medium voltage network |
| 08/22/2007 | CN101023317A Inspection apparatus, inspection method and sensor for inspection apparatus |
| 08/22/2007 | CN101022216A Small earthing current electric network single phase fault wire selecting method and apparatus |
| 08/22/2007 | CN101022180A Battery pack |
| 08/22/2007 | CN101022107A Versatile semiconductor test structure array |
| 08/22/2007 | CN101021808A Universal adapter control method and device |
| 08/22/2007 | CN101021559A Test-blind eliminating instrument and test system for eliminating cable fault test blind zone |
| 08/22/2007 | CN101021556A Distribution network earth insulation parameter measuring and controlling method |
| 08/22/2007 | CN101021554A Neutral-point earth-free distributing network direct-to-ground capacitance current measuring method |
| 08/22/2007 | CN101021553A PWM current measuring method |
| 08/22/2007 | CN101021552A Distribution network earth fault current measuring method |
| 08/22/2007 | CN101021551A 智能综合电子测量仪 Intelligent integrated electronic measuring instrument |
| 08/22/2007 | CN101021550A Integrated circuit test card |
| 08/22/2007 | CN101021549A Integrated circuit test card |
| 08/22/2007 | CN101021548A Integrated circuit test card |
| 08/22/2007 | CN101021547A Bare chip test and aging screening temporary packaging carrier |
| 08/22/2007 | CN101021490A Automatic detecting system and method for planar substrate |
| 08/22/2007 | CN101021489A Visual inspection apparatus |
| 08/22/2007 | CN101021428A Functionality test method |
| 08/21/2007 | US7260798 Compilation of remote procedure calls between a timed HDL model on a reconfigurable hardware platform and an untimed model on a sequential computing platform |
| 08/21/2007 | US7260796 Capacitance measurements for an integrated circuit |
| 08/21/2007 | US7260793 Apparatus and method for test-stimuli compaction |
| 08/21/2007 | US7260760 Method and apparatus to disable compaction of test responses in deterministic test-set embedding-based BIST |
| 08/21/2007 | US7260759 Method and apparatus for an efficient memory built-in self test architecture for high performance microprocessors |
| 08/21/2007 | US7260758 Method and system for performing built-in self-test routines using an accumulator to store fault information |
| 08/21/2007 | US7260757 System and method for testing electronic devices on a microchip |
| 08/21/2007 | US7260756 Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test |
| 08/21/2007 | US7260755 Skewed inverter delay line for use in measuring critical paths in an integrated circuit |
| 08/21/2007 | US7260754 Semiconductor device with speed binning test circuit and test method thereof |
| 08/21/2007 | US7260753 Methods and apparatus for providing test access to asynchronous circuits and systems |
| 08/21/2007 | US7260640 System and method for providing an enhanced enterprise streaming media server capacity and performance |
| 08/21/2007 | US7260517 Synchronization of multiple simulation domains in an EDA simulation environment |
| 08/21/2007 | US7260494 Eclipz wiretest for differential clock/oscillator signals |
| 08/21/2007 | US7260437 Network system using management frames for supervising control units |
| 08/21/2007 | US7260377 Variable-gain low noise amplifier for digital terrestrial applications |
| 08/21/2007 | US7260073 Method for scheduling of plural packet data flows |
| 08/21/2007 | US7260066 Apparatus for link failure detection on high availability Ethernet backplane |
| 08/21/2007 | US7260059 Evolution of a telecommunications network from ring to mesh structure |
| 08/21/2007 | US7259866 Semiconductor fabricating apparatus with function of determining etching processing state |
| 08/21/2007 | US7259802 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof |
| 08/21/2007 | US7259583 Methods and apparatus for testing power generators |
| 08/21/2007 | US7259582 Bonding pads for testing of a semiconductor device |
| 08/21/2007 | US7259581 Method for testing semiconductor components |
| 08/21/2007 | US7259580 Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test |
| 08/21/2007 | US7259579 Method and apparatus for semiconductor testing utilizing dies with integrated circuit |
| 08/21/2007 | US7259578 System for testing semiconductor components having interconnect with variable flexure contacts |
| 08/21/2007 | US7259577 Shielded probe apparatus for probing semiconductor wafer |
| 08/21/2007 | US7259576 Method and apparatus for a twisting fixture probe for probing test access point structures |
| 08/21/2007 | US7259572 Method and apparatus for detecting impedance |
| 08/21/2007 | US7259568 Arc fault detector |
| 08/21/2007 | US7259567 Power tester for electrical outlets |
| 08/21/2007 | US7259565 Testing an electrical switchgear system |
| 08/21/2007 | US7259549 Shield for tester load board |
| 08/21/2007 | US7259548 Testing circuits on substrate |
| 08/21/2007 | US7259490 Synchronous machine |
| 08/21/2007 | US7259027 Low energy dose monitoring of implanter using implanted wafers |
| 08/21/2007 | CA2453601C Integrated testing of serializer/deserializer in fpga |
| 08/21/2007 | CA2340473C Ground fault interrupter |
| 08/16/2007 | WO2007092174A1 Probe head with machined mounting pads and method of forming same |
| 08/16/2007 | WO2007092146A2 Method and apparatus for inspection of multi-junction solar cells |
| 08/16/2007 | WO2007091765A1 System, method, and article of manufacture for determining an estimated combined battery state-parameter vector |
| 08/16/2007 | WO2007091722A1 Secondary cell residual capacity estimating device and residual capacity estimating method |
| 08/16/2007 | WO2007091710A1 Battery life evaluation device for hybrid vehicle |
| 08/16/2007 | WO2007091413A1 Change point detection circuit, jitter measurement device, and test device |
| 08/16/2007 | WO2007091332A1 Connection detecting circuit |
| 08/16/2007 | WO2007091322A1 Signal generating apparatus, periodic signal observing system, integrated circuit, periodic signal observing method, and integrated circuit testing method |
| 08/16/2007 | WO2007090791A2 Method and device for detecting ground faults in a supply cable |
| 08/16/2007 | WO2007090772A2 Circuit and testing device |
| 08/16/2007 | WO2007090528A1 Method and device for testing unequipped circuit boards |
| 08/16/2007 | WO2007090490A1 Test system for a circuit carrier |
| 08/16/2007 | WO2007090484A1 Method and adaptive distance protection relay for power transmission lines |
| 08/16/2007 | WO2007090467A1 Detecting a transmission behavior by sampling a reflection signal |
| 08/16/2007 | WO2007090465A1 Testing devices under test by an automatic test apparatus having a multisite probe card |
| 08/16/2007 | WO2007090462A1 Multi-stage data processor with signal repeater |
| 08/16/2007 | WO2007090460A1 Test time calculator |
| 08/16/2007 | WO2007090447A1 Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards using a finger tester |
| 08/16/2007 | WO2007022238A3 High-availability networking with intelligent failover |
| 08/16/2007 | WO2007011452A3 An apparatus and method for obtaining a device signal value using a ternary search process |
| 08/16/2007 | US20070192661 Automatic Test Equipment (ATE) Realized Through Sharing Same Memory Space by Instruction Data and Vector Data |
| 08/16/2007 | US20070192660 Semiconductor device and method of adding tester circuit for the same |
| 08/16/2007 | US20070192659 Shift register, scan driving circuit and display device having the same |
| 08/16/2007 | US20070192658 Measuring the internal clock speed of an integrated circuit |
| 08/16/2007 | US20070192057 Method and apparatus for repairing shape, and method for manufacturing semiconductor device using those |
| 08/16/2007 | US20070190671 Manufacturing method of semiconductor integrated circuit device and probe card |
| 08/16/2007 | US20070189463 Method for estimating the remaining life span of an X-ray radiator |
| 08/16/2007 | US20070189079 Memory device with page buffer having dual registers and method of using the same |
| 08/16/2007 | US20070188185 Method of inspecgin a leakage current characteristic of a dielectric layer |
| 08/16/2007 | US20070188184 Method and apparatus for measuring die-level integrated circuit power variations |
| 08/16/2007 | US20070188183 Secure memory card with life cycle phases |
| 08/16/2007 | US20070188182 Probe tips and method of making same |
| 08/16/2007 | US20070188160 Detection seat for IC detection device |
| 08/16/2007 | US20070188159 Latch circuit and semiconductor integrated circuit device that has it |
| 08/16/2007 | US20070187679 Technique for evaluating a fabrication of a die and wafer |
| 08/16/2007 | DE19928524B4 IC-Prüfgerät IC tester |
| 08/16/2007 | DE19654045B4 Verfahren zum Vorhersagen der verbleibenden Kapazität einer Batterieeinheit, Batterieeinheit und Vorrichtung zum Vorhersagen der verbleibenden Kapazität einer Batterieeinheit A method for predicting the remaining capacity of a battery pack, battery pack and apparatus for predicting the remaining capacity of a battery unit |