| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/10/1995 | DE4403899A1 Series transmission system for transmitting data between two stations |
| 08/10/1995 | DE19502828A1 Pattern generator for semiconductor test unit with address generator section |
| 08/10/1995 | CA2182519A1 Battery with strength indicator |
| 08/09/1995 | EP0666706A2 Burn-in socket |
| 08/09/1995 | EP0666630A1 Overcurrent preventing circuit |
| 08/09/1995 | EP0666629A2 Test method and apparatus for testing a protective relay system |
| 08/09/1995 | EP0666537A1 Digital processing circuit with test registers |
| 08/09/1995 | EP0666481A1 Analog voltage output circuit |
| 08/08/1995 | US5440724 Central processing unit using dual basic processing units and combined result bus and incorporating means for obtaining access to internal BPU test signals |
| 08/08/1995 | US5440611 Method of determining the physical length of a telephone line |
| 08/08/1995 | US5440592 Method and apparatus for measuring frequency and high/low time of a digital signal |
| 08/08/1995 | US5440569 Flip-flop circuits for testing LSI gate arrays |
| 08/08/1995 | US5440568 System for determining the operations of an integrated circuit and processor for use therein |
| 08/08/1995 | US5440567 Complementary boundary-scan cell |
| 08/08/1995 | US5440566 Fault detection and diagnosis for printed circuit boards |
| 08/08/1995 | US5440384 Methods of inspecting wafers for manufacturing light emitting elements |
| 08/08/1995 | US5440313 GPS synchronized frequency/time source |
| 08/08/1995 | US5440251 Phase differential measurement circuit |
| 08/08/1995 | US5440241 Method for testing, burning-in, and manufacturing wafer scale integrated circuits and a packaged wafer assembly produced thereby |
| 08/08/1995 | US5440240 Z-axis interconnect for discrete die burn-in for nonpackaged die |
| 08/08/1995 | US5440239 Transferable solder bumps for interconnect and assembly of MCM substrates |
| 08/08/1995 | US5440231 Method and apparatus for coupling a semiconductor device with a tester |
| 08/08/1995 | US5440230 Combinatorial signature for component identification |
| 08/08/1995 | US5440229 Fundamental voltmeter |
| 08/08/1995 | US5440227 Multi-channel electromagnetically transparent voltage waveform monitor link |
| 08/08/1995 | US5440221 Method and apparatus for monitoring batttery capacity with charge control |
| 08/08/1995 | US5438970 High tension cord connector with misfire detecting capacitor for internal combustion engine |
| 08/03/1995 | WO1995020767A1 Capacitive open-circuit test employing an improved threshold determination |
| 08/03/1995 | WO1995020766A1 Process and device for testing printed circuit boards |
| 08/03/1995 | DE19502842A1 Determining remaining battery capacity of battery in set of batteries |
| 08/03/1995 | DE19500113A1 Cable test adaptor with complementary plug connector for motor vehicle |
| 08/03/1995 | CA2114813A1 Transmission power testing bar of cable television system |
| 08/02/1995 | EP0665625A2 Method for obtaining an impedance value and for processing in a distance protection device |
| 08/02/1995 | EP0665567A1 Device for measuring the wear of a circuit breaker |
| 08/02/1995 | EP0665498A2 Method and apparatus for partial-scan testing of a device using its boundary scan port |
| 08/02/1995 | EP0665444A1 Battery capacity detector |
| 08/02/1995 | EP0665443A1 System for supplying power to an apparatus and method for the assessment of the lifetime and capacity of a power-storage device |
| 08/02/1995 | EP0665442A1 Method and apparatus for testing a codec |
| 08/02/1995 | EP0665441A2 A method of locating the position of a fault on a power transmission line |
| 08/02/1995 | EP0664933A1 Sensor for registration of leak current |
| 08/02/1995 | EP0664925A1 Interconnection structure for integrated circuits and method for making same |
| 08/02/1995 | EP0664889A1 Method for accelerated degradation testing of semiconductor devices |
| 08/02/1995 | CN2204424Y Electric potential, voltage type multi-purpose test pencil |
| 08/01/1995 | US5438528 Method and apparatus for testing an interactive network board in a local area network (LAN). |
| 08/01/1995 | US5438513 Automotive electronics test system |
| 08/01/1995 | US5438276 Apparatus for measuring the life time of minority carriers of a semiconductor wafer |
| 08/01/1995 | US5438273 System for testing the voice coil element of a disk drive rotary actuator |
| 08/01/1995 | US5438272 Voltage-stressing and testing of networks using moving probes |
| 08/01/1995 | US5438270 Low battery tester comparing load and no-load battery voltage |
| 08/01/1995 | US5438269 Sparking voltage detecting device having an embedded conductive member |
| 08/01/1995 | US5438259 Digital circuitry apparatus |
| 08/01/1995 | US5438254 Phase difference measuring device |
| 08/01/1995 | US5438252 Power supply control module for a battery control system of an appliance, and a battery equipped with such a module |
| 08/01/1995 | US5438248 Method and apparatus for recognizing different types of batteries |
| 08/01/1995 | CA2141401A1 Battery capacity detector |
| 07/27/1995 | WO1995019011A3 Apparatus and method for testing integrated circuits |
| 07/27/1995 | DE4446988A1 High-speed test pattern generator for semiconductor test system |
| 07/27/1995 | CA2140381A1 Method of locating the position of a fault on a power transmission line |
| 07/26/1995 | EP0664512A1 Design for testability technique of CMOS and BiCMOS ICs |
| 07/26/1995 | EP0664461A1 Procedure and device for checking an electronic sensor in an automobile equipped with AB |
| 07/26/1995 | EP0664446A2 Inspection system and method for cross-sectional imaging |
| 07/26/1995 | EP0664006A1 Method for estimating the remaining charge in a storage battery |
| 07/26/1995 | EP0664005A1 Method for recalibrating a battery power control processor |
| 07/26/1995 | EP0388784B1 Method and apparatus for high speed integrated circuit testing |
| 07/25/1995 | US5437040 Electronic system with variable threshold power failure signaling |
| 07/25/1995 | US5436927 Method and apparatus for testing frequency symmetry of digital signals |
| 07/25/1995 | US5436912 Circuit arrangement for testing a semiconductor memory by means of parallel tests using various test bit patterns |
| 07/25/1995 | US5436854 Microcomputer-controlled electronic device |
| 07/25/1995 | US5436846 Method of facilitating construction of a microwave system by appropriate measurements or determination of parameters of selected individual microwave components to obtain overall system power response |
| 07/25/1995 | US5436581 Circuit arrangement for monitoring the drain current of a metal oxide semiconductor field effect transistor |
| 07/25/1995 | US5436571 Probing test method of contacting a plurality of probes of a probe card with pads on a chip on a semiconductor wafer |
| 07/25/1995 | US5436570 Burn-in test probe for fine-pitch packages with side contacts |
| 07/25/1995 | US5436569 Electronic component testing oven |
| 07/25/1995 | US5436568 Pivotable self-centering elastomer pressure-wafer probe |
| 07/25/1995 | US5436559 Method for testing semiconductor device |
| 07/25/1995 | US5436558 Testing integrated circuit using an A/D converter built in a semiconductor chip |
| 07/25/1995 | US5436555 LAN cable identifier for testing local area network cables |
| 07/25/1995 | US5436554 Computer controlled cable tester |
| 07/25/1995 | US5435182 Method and apparatus for determining at least one physical parameter of accumulator electrode plates |
| 07/20/1995 | WO1995019677A1 Subscriber line impedance measurement device and method |
| 07/20/1995 | WO1995019574A1 Antenna amplifier for receiving frequencies |
| 07/20/1995 | WO1995019564A1 Battery capacity indicator |
| 07/20/1995 | DE4408740C1 Schaltungsanordnung zur Überprüfung einer mehrzelligen Batterie Circuit arrangement for testing a multi-cell battery |
| 07/20/1995 | DE4401439A1 Uninterrupted power supply for environmentally friendly computer |
| 07/19/1995 | EP0663596A2 Electro-optic voltage probe with fibre optic plate |
| 07/19/1995 | EP0663092A1 Robust delay fault built-in self-testing method and apparatus |
| 07/19/1995 | EP0607207B1 Process and device for checking the wiring between an electrical cubicle and field devices connected thereto |
| 07/19/1995 | EP0412119B1 Static-free interrogating connector for electric components |
| 07/19/1995 | CN1105492A Synchronizing circuit |
| 07/18/1995 | US5434869 Test pattern generating apparatus |
| 07/18/1995 | US5434805 Test timing program automatic generator |
| 07/18/1995 | US5434804 Method and apparatus for synchronizing a JTAG test control signal to an on-chip clock signal |
| 07/18/1995 | US5434512 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| 07/18/1995 | US5434510 Mini light bulb tool |
| 07/18/1995 | US5434509 Method and apparatus for detecting arcing in alternating-current power systems by monitoring high-frequency noise |
| 07/18/1995 | US5434508 Battery capacity monitoring using consumed current as measured and through a mode table |
| 07/18/1995 | US5434505 Method and apparatus for low temperature HEMT-like material testing |
| 07/18/1995 | US5434502 Calibration device for hyper-frequency adjustment of the reference planes of an apparatus for measuring the dispersion parameters of elements of integrated circuits |
| 07/18/1995 | US5434495 Cognition device for battery residual capacity |
| 07/18/1995 | US5434389 For creating a current signal |