Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1995
12/06/1995CN1113036A High speed sorting apparatus for semiconductor device equipped with rotatable sorting drum
12/05/1995US5473760 Device and method for interface effective/ineffective state judging by varying threshold voltage to an input receiver circuit
12/05/1995US5473666 Method and apparatus for digitally controlling gain in a talking path
12/05/1995US5473651 Method and apparatus for testing large embedded counters
12/05/1995US5473619 Method and apparatus for testing a driving circuit
12/05/1995US5473618 Semiconductor integrated circuit having a built-in test circuit
12/05/1995US5473617 High impedance technique for testing interconnections in digital systems
12/05/1995US5473616 Address pattern generator
12/05/1995US5473548 Apparatus for computing power consumption of MOS transistor logic function block
12/05/1995US5473309 Apparatus for testing an irrigation system controller and method of testing irrigation systems
12/05/1995US5473262 Power source residual capacity measuring apparatus and power source apparatus having power source capacity measuring circuit
12/05/1995US5473260 Method and circuit arrangement for measuring the depletion layer temperature of a GTO thyristor
12/05/1995US5473259 Semiconductor device tester capable of simultaneously testing a plurality of integrated circuits at the same temperature
12/05/1995US5473255 Apparatus for estimating natural frequency of distribution system
12/05/1995US5473254 Test probe assembly provides precise and repeatable contact forces
12/05/1995US5473241 Method and apparatus for RMS measurements in induction motor without sampling
12/05/1995US5471877 Environmental stress screening process with liquid coupled vibration
11/1995
11/30/1995WO1995032534A1 Removable coupling module for mechanically multiplexing conductors
11/30/1995WO1995032507A1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid
11/30/1995WO1995032435A1 Phase noise detector
11/30/1995WO1995032432A1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device
11/30/1995DE4432963C1 Detection of current distribution in conductor of electric machine
11/30/1995DE4416755A1 Production line circuit board tester station
11/30/1995DE4243910C2 Aufgeteiltes Boundary-Scan-Testen zum Vermindern des durch Testen hervorgerufenen Schadens Split boundary scan testing for reducing the damage caused by assaying
11/30/1995DE19519624A1 Low dissipation driver circuit for semiconductor device testing
11/30/1995DE19519453A1 Semiconductor memory test appts. for integrated logic circuit with multiple RAM, ROM
11/30/1995DE19517555A1 Semiconductor memory matrix appts. with redundant memory cells for e.g. SRAM
11/30/1995DE19517141A1 Resistive element fault diagnosis appts. for airbag actuator in vehicle
11/30/1995CA2191232A1 Phase noise detector
11/29/1995EP0684657A1 TEM waveguide device
11/29/1995EP0684483A2 An apparatus and troubleshooting method for monitoring the operability of rotating electric generators such as turboalternators
11/29/1995CN2214003Y Load checking device for electromagnetic governing electrical machinery
11/29/1995CN2214002Y Trouble surveying instrument of low-voltage power cable
11/29/1995CN1112796A Apparatus and method for detecting alignment of contacts in a multi-substrate electronic assembly
11/29/1995CN1112683A Clamp for detecting characteristic of semiconductor and manufacture and application of same
11/29/1995CN1112682A Exciting ground detector and ground relay in which grounding is detected by DC
11/28/1995US5471484 Method and apparatus for testing digital signals
11/28/1995US5471481 Testing method for electronic apparatus
11/28/1995US5471480 Parallel test circuit for use in a semiconductor memory device
11/28/1995US5471429 Burn-in circuit and method therefor of semiconductor memory device
11/28/1995US5471397 Identifying subsets of noise violators and contributors in package wiring
11/28/1995US5471293 Method and device for determining defects within a crystallographic substrate
11/28/1995US5471246 Apparatus for determining charge/voltage conversion ratios in charge coupled devices
11/28/1995US5471160 Sense amplifier including comparator
11/28/1995US5471159 Method for producing a trigger signal
11/28/1995US5471153 Methods and circuits for testing open collectors and open drains
11/28/1995US5471152 Storage element for delay testing
11/28/1995US5471146 Method and apparatus for measuring return loss
11/28/1995US5471145 Calibrating transition dependent timing errors in automatic test equipment using a precise pulse width generator
11/28/1995US5471144 System for monitoring the insulation quality of step graded insulated high voltage apparatus
11/28/1995US5471136 Test system for calculating the propagation delays in signal paths leading to a plurality of pins associated with a circuit
11/28/1995US5471135 Tester and method for testing a rectifier-regulator
11/28/1995US5471129 Rechargeable light curing apparatus
11/28/1995US5471066 Defect inspection apparatus of rotary type
11/28/1995US5471045 Smart card locking process
11/28/1995US5470417 Method of making multi-layer female component for refastenable fastening device
11/28/1995US5470247 Burn-in socket apparatus
11/28/1995US5469953 Transport mechanism for IC handlers
11/28/1995CA2149484A1 Tem waveguide arrangement
11/24/1995CA2149970A1 Automotive electronic circuit analyzer
11/23/1995WO1995031846A1 Circuitry for detecting earth leakages in energy transmission cables
11/23/1995WO1995031734A1 Apparatus and method for determining a charge of a battery
11/23/1995WO1995031733A2 Method and apparatus for monitoring discharge of a battery device
11/23/1995DE4438316A1 Circuit board position checking system
11/23/1995DE4417694A1 Measuring switching time of switching device contg. electromagnetic trigger
11/23/1995DE4417351A1 Continuity tester for multiple electrical lines
11/23/1995DE4417129A1 Verification test method for overvoltage protection devices
11/23/1995DE4416966A1 Schaltungsanordnung zur Ermittlung eines Erdschlusses in einem Energieübertragungskabel Circuitry for detecting a ground fault in a power transmission cable
11/23/1995DE4416781A1 Method for monitoring and displaying arc control in circuit breaker
11/22/1995EP0683616A2 Signal processing circuit for vector scope
11/22/1995EP0683565A1 Programmable logic module and architecture for field programmable gate array device
11/22/1995EP0653072A4 Apparatus for automatic testing of complex devices.
11/22/1995EP0380161B1 Method of testing a circuit, and circuit suitable for such a method
11/22/1995EP0299060B1 High impedance fault analyzer in electric power distribution
11/22/1995CN2213344Y Electrical equipment line fault alarm controller for car
11/22/1995CN2213343Y Distribution equipment and electric energy calculating safety monitor
11/22/1995CN1112299A Slide actuated holding clamp
11/22/1995CN1112205A Hinge structures
11/21/1995US5469445 Transparent testing of integrated circuits
11/21/1995US5469394 Nonvolatile semiconductor memory device having a status register and test method for the same
11/21/1995US5469365 Power monitor unit
11/21/1995US5469086 Floating detection circuit
11/21/1995US5469076 Static current testing apparatus and method for current steering logic (CSL)
11/21/1995US5469067 Detecting partial discharge using a detection coil and analysis of output signal and noise frequency spectrums
11/21/1995US5469066 Method and apparatus for measuring deterioration of power cable insulation
11/21/1995US5469064 Electrical assembly testing using robotic positioning of probes
11/21/1995US5469063 Method and apparatus for testing for a high voltage on the chassis of an electronic apparatus
11/21/1995US5469051 Electrical defect detector for circuit lines
11/21/1995US5468655 Method for forming a temporary attachment between a semiconductor die and a substrate using a metal paste comprising spherical modules
11/21/1995US5468157 Non-destructive interconnect system for semiconductor devices
11/17/1995CA2158916A1 Method and apparatus for detecting faults in buried conductors
11/16/1995WO1995031028A1 Detector for monitoring the integrity of a ground connection to an electrical appliance
11/16/1995WO1995030905A1 Monitory system for a battery
11/16/1995DE4425463C1 Test adapter for testing electrical plug contacts
11/15/1995EP0682264A2 Procedure for determining the emi-qualities of integrated circuits and appliance for executing the procedure
11/15/1995EP0682259A1 Circuit-test fixture that includes shorted-together probes
11/15/1995EP0566604B1 Process for testing a store arranged on a semiconductor component as a macrocell on the self-testing principle
11/15/1995CN1111845A System for supplying power to an apparatus and method for the assessment of the lifetime and capacity of a power-storage device
11/15/1995CN1111754A Method and apparatus for electrically testing multi-core cable
11/14/1995US5467354 Test control circuit for controlling a setting and resetting of a flipflop
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