| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/24/1995 | EP0654673A1 Method and apparatus for insulation monitoring in unearthed DC and AC networks |
| 05/24/1995 | EP0654672A2 Integrated circuit test apparatus |
| 05/24/1995 | DE4439971A1 Fehleranalysesystem für integrierte Schaltkreise Analysis of system for integrated circuits |
| 05/24/1995 | DE4434927A1 Mit Leistung versorgtes Testen einer gemischten Standard-/Boundary-Scan-Logik Furnished with performance testing of a mixed standard / boundary-scan logic |
| 05/24/1995 | DE4339560A1 Checking and monitoring of digital video or audio signal connections |
| 05/24/1995 | CN2198696Y Device for electric drill and lighting in mine |
| 05/24/1995 | CN2198613Y Constant voltage constant current electron loading device |
| 05/24/1995 | CN2198612Y Multifunction alarm for substation |
| 05/23/1995 | US5418879 Distributed light delivery system |
| 05/23/1995 | US5418794 In a data processing system |
| 05/23/1995 | US5418792 Method for the speedup of test vector generation for digital circuits |
| 05/23/1995 | US5418791 Semiconductor integrated circuit having test circuit |
| 05/23/1995 | US5418790 Interference grasping test mode circuit for a semiconductor memory device |
| 05/23/1995 | US5418719 Trouble checking apparatus |
| 05/23/1995 | US5418470 Analog multi-channel probe system |
| 05/23/1995 | US5418464 Thermocouple open circuit detection with tone frequency signal application and spectral analysis |
| 05/23/1995 | US5418463 Detection of arcs in power cables using plasma noise or negtive resistance of the arcs |
| 05/23/1995 | US5418453 Method of measuring wheel speed sensor impedance |
| 05/23/1995 | US5418452 Apparatus for testing integrated circuits using time division multiplexing |
| 05/23/1995 | US5418085 Battery voltage tester for end of cell |
| 05/23/1995 | CA2136267A1 Radio speaker short circuit detection system |
| 05/23/1995 | CA2020733C Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter-wave signals |
| 05/23/1995 | CA1335625C Inspection of multipattern circuit boards |
| 05/18/1995 | DE4441007A1 Multibit testing circuit for semiconductor DRAM |
| 05/18/1995 | DE4339241A1 Circuit for monitoring and detecting the failure of the neutral or phase conductor of a three-phase supply |
| 05/18/1995 | DE4338820A1 Single-chip microcomputer |
| 05/18/1995 | DE4338714A1 Schaltungsanordnung zur Strommessung über einen Schalttransistor Circuit arrangement for measuring the current through a switching transistor |
| 05/18/1995 | DE4338462A1 Monitoring system for electrical loads in motor vehicles |
| 05/18/1995 | DE4244696C2 Variable width current mirror DAC for IC testing in computer test system |
| 05/17/1995 | EP0653826A2 Battery-driven electronic appliance |
| 05/17/1995 | EP0653781A1 Method for co-registering semiconductor wafers undergoing work in one or more blind process modules |
| 05/17/1995 | EP0653642A1 System for measuring the integrity of an electrical contact |
| 05/17/1995 | EP0653626A1 Semiconductor device inspection system |
| 05/17/1995 | EP0653073A1 Electric arc detector |
| 05/17/1995 | EP0653072A1 Apparatus for automatic testing of complex devices |
| 05/17/1995 | CN2197678Y Intellectural tester for battery voltage |
| 05/17/1995 | CN2197677Y Automatic marking station for circuit board |
| 05/17/1995 | CN2197676Y Sounding plug tester |
| 05/16/1995 | US5416919 Semiconductor integrated circuit with functional blocks capable of being individually tested externally |
| 05/16/1995 | US5416784 Built-in self-test flip-flop with asynchronous input |
| 05/16/1995 | US5416783 Method and apparatus for generating pseudorandom numbers or for performing data compression in a data processor |
| 05/16/1995 | US5416741 Semiconductor memory with built-in parallel bit test mode |
| 05/16/1995 | US5416592 Probe apparatus for measuring electrical characteristics of objects |
| 05/16/1995 | US5416512 Automatic threshold level structure for calibrating an inspection tool |
| 05/16/1995 | US5416470 Contact judging circuit and contact judging method for impedance measuring apparatus |
| 05/16/1995 | US5416430 Apparatus and method for identification and location of internal arcing in dynamoelectric machines |
| 05/16/1995 | US5416429 Probe assembly for testing integrated circuits |
| 05/16/1995 | US5416428 Marker probe |
| 05/16/1995 | US5416427 Test and development apparatus for bus-based circuit modules with open side and backplane access features |
| 05/16/1995 | US5416426 Method of measuring a voltage with an electron beam apparatus |
| 05/16/1995 | US5416422 Apparatus and method for determining single sideband noise figure from double sideband measurements |
| 05/16/1995 | US5416421 Trailer lamp testing and lamp storage apparatus |
| 05/16/1995 | US5416420 Method and apparatus for the verification of an electrical insulator device based on the analysis of the electric field along the insulator |
| 05/16/1995 | US5416419 Insulation defect detection by high voltage electrode means |
| 05/16/1995 | US5416418 Method and apparatus for determining partial discharge sites in cables |
| 05/16/1995 | US5416416 Method and apparatus for testing an auxiliary power system |
| 05/16/1995 | US5416409 Apparatus and method for testing circuit board interconnect integrity |
| 05/16/1995 | US5416406 Electric charge metering device and method |
| 05/16/1995 | US5416403 Current stabilizing circuit |
| 05/16/1995 | US5416402 State of charge indicator for deep-cycle application |
| 05/16/1995 | CA2042344C Mdi fault detection apparatus using initial turn-on and noise timers |
| 05/13/1995 | CA2135697A1 Non-intrusive state observation of vlsi circuits using thermal actuation |
| 05/11/1995 | WO1995012952A1 Method and apparatus for inspecting printed circuit boards at different magnifications |
| 05/11/1995 | WO1995012908A1 Apparatus for wiring a connector |
| 05/11/1995 | WO1995012851A1 Process for the analog and/or digital testing of electronic assemblies |
| 05/11/1995 | WO1995012820A1 System interface fault isolator test set |
| 05/11/1995 | DE4439140A1 Method and device for charging a battery having an electrolyte which is free of water |
| 05/11/1995 | DE4344368C1 Charge information system for an electrical or hybrid vehicle |
| 05/11/1995 | DE4338018A1 Circuit arrangement for the transmission of signals |
| 05/11/1995 | DE4337810A1 Test circuit for synthetic testing of high-voltage power circuit-breakers |
| 05/11/1995 | DE4333400A1 Arrangement for detection of an interturn fault in an electrical machine and electrical machine suitable therefor. |
| 05/11/1995 | CA2175696A1 Method and apparatus for inspecting printed circuit boards at different magnifications |
| 05/11/1995 | CA2175365A1 System interface fault isolator test set |
| 05/10/1995 | EP0652697A1 Method and apparatus for the burning-in and testing of electronic, electromechanical and mechanical modules |
| 05/10/1995 | EP0652539A1 A recording system for a production line |
| 05/10/1995 | EP0652516A1 Integrated microprocessor |
| 05/10/1995 | EP0652445A2 Apparatus for inspecting electric components for inverter circuit |
| 05/10/1995 | EP0652444A1 Method and apparatus for forming a potential distribution image of a semiconductor integrated circuit |
| 05/10/1995 | EP0652443A1 Calibrating insulative coatings |
| 05/10/1995 | EP0652442A1 Device for testing an electrical line |
| 05/10/1995 | EP0651886A1 Structure and method for testing wiring segments in an integrated circuit device |
| 05/10/1995 | CN1102479A Microcomputer debugging method with relay protection and device |
| 05/09/1995 | US5414716 Weighting system for testing of circuits utilizing determination of undetected faults |
| 05/09/1995 | US5414715 Method for automatic open-circuit detection |
| 05/09/1995 | US5414714 Method and apparatus for scan testing an array in a data processing system |
| 05/09/1995 | US5414639 Automatic testing method and testing apparatus for devices |
| 05/09/1995 | US5414513 Printed circuit inspection system utilizing interference fringes |
| 05/09/1995 | US5414374 Method for particle beam testing of substrates for liquid crystal displays (LCD) |
| 05/09/1995 | US5414373 Automatic transistor checker |
| 05/09/1995 | US5414372 Reusable test apparatus for integrated circuit chips |
| 05/09/1995 | US5414370 Burn-in apparatus and method which individually controls the temperature of a plurality of semiconductor devices |
| 05/09/1995 | US5414366 Electromagnetic field susceptibility test apparatus and methods |
| 05/09/1995 | US5414365 Diagnostic apparatus for testing an analog circuit |
| 05/09/1995 | US5414364 In an integrated circuit |
| 05/09/1995 | US5414363 Method for the electrical testing of equipotential lines |
| 05/09/1995 | US5414362 Device for verifying the wiring of an electrical receptacle for a towed vehicle |
| 05/09/1995 | US5414352 Parametric test circuit with plural range resistors |
| 05/09/1995 | US5414351 Method and apparatus for testing the reliability of semiconductor terminals |
| 05/09/1995 | US5414345 Apparatus and method for low cost electromagnetic field susceptibility testing |
| 05/09/1995 | US5414343 Permanently installed cable system with integrated multi-cable tester |