| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/09/1995 | US5414265 Line-width measurements of metallization coated with insulator on microelectronic circuits using energy dispersive x-ray analysis |
| 05/05/1995 | CA2133689A1 Apparatus and method for engine diagnosis using current waveform analysis |
| 05/04/1995 | WO1995012236A1 Device for measuring the time element of a power switch |
| 05/03/1995 | EP0651343A1 Method of using electronically reconfigurable gate array logic and apparatus formed thereby |
| 05/03/1995 | EP0651342A2 System for modeling an integrated chip package and method of operation |
| 05/03/1995 | EP0651262A2 Portable battery-powered devices with battery testers |
| 05/03/1995 | EP0651261A2 System and method for testing a circuit network having elements testable by different boundary scan standards |
| 05/03/1995 | EP0651260A2 Machine with press assembly for electrically testing a printed circuit board |
| 05/03/1995 | CN2196310Y Multipurpose pen for testing of cutting |
| 05/03/1995 | CN2196309Y Induction type multipurpose electricity tester |
| 05/02/1995 | US5412802 Reasoning method and fault diagnosis method and system implementing the same |
| 05/02/1995 | US5412665 Parallel operation linear feedback shift register |
| 05/02/1995 | US5412664 Integrated circuit and method of testing |
| 05/02/1995 | US5412663 for use in a computer system |
| 05/02/1995 | US5412662 Memory testing device for preventing excessive write and erasure |
| 05/02/1995 | US5412591 Schematic compiler for a multi-format high speed multiplier |
| 05/02/1995 | US5412580 Digital counter circuit fabricated on a semiconductor integrated circuit |
| 05/02/1995 | US5412575 System for testing an electronic circuit |
| 05/02/1995 | US5412477 Apparatus for measuring bend amount of IC leads |
| 05/02/1995 | US5412337 Semiconductor device providing reliable conduction test of all terminals |
| 05/02/1995 | US5412330 Optical module for an optically based measurement system |
| 05/02/1995 | US5412328 Non-contact current injection apparatus and method for use with linear bipolar circuits |
| 05/02/1995 | US5412324 for determining the time of failure of electric bus insulating coatings |
| 05/02/1995 | US5412323 Battery condition detecting apparatus and charge control apparatus for automobile |
| 05/02/1995 | US5412315 Semiconductor integrated circuit adapted for a current-leak test |
| 05/02/1995 | US5412314 Testing apparatus for semiconductor device formed on tape carrier |
| 05/02/1995 | US5412313 Method to reduce test vectors/test time in devices using equivalent blocks |
| 05/02/1995 | US5412260 Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device |
| 05/02/1995 | US5412258 Integrated circuit testing device |
| 05/02/1995 | US5411817 Battery with charge indicator |
| 05/02/1995 | US5410807 High density electronic connector and method of assembly |
| 05/02/1995 | CA2134606A1 Portable lighting device having externally attached voltage tester |
| 05/02/1995 | CA2024488C Method and apparatus for line power monitoring for uninterruptible power supplies |
| 04/27/1995 | WO1995011488A1 Diagnostic monitor system |
| 04/27/1995 | DE4335847A1 Switchable testing device for, for example, private electricity generators |
| 04/26/1995 | EP0650123A1 Integrated logic circuit with scan path |
| 04/26/1995 | EP0650069A2 Analog multi-channel probe system |
| 04/26/1995 | EP0650068A2 Procedure and device for locating cable faults |
| 04/26/1995 | EP0650067A1 Electrooptic instrument |
| 04/26/1995 | EP0650064A2 Method of coupling test equipment to an electrical component |
| 04/26/1995 | EP0650063A2 Connection apparatus |
| 04/26/1995 | EP0650062A2 Connection appartus |
| 04/26/1995 | EP0649582A1 Margin test apparatus for integrated services digital networks |
| 04/26/1995 | EP0649576A1 Method and apparatus for monitoring battery capacity under fast discharge conditions |
| 04/26/1995 | CN2195765Y Line testing apparatus |
| 04/26/1995 | CN2195764Y Source grounding detecting device for electrical equipment |
| 04/26/1995 | CN2195763Y Antijamming local electric discharge detecting instrument |
| 04/26/1995 | CN1101984A High-voltage discharging method for testing disconnection point in cable |
| 04/25/1995 | USRE34916 Method and circuitry for testing a programmable logic device |
| 04/25/1995 | US5410687 Analyzing device for saving semiconductor memory failures |
| 04/25/1995 | US5410686 Methods for scan path debugging |
| 04/25/1995 | US5410678 Fault simulator comprising a signal generating circuit implemented by hardware |
| 04/25/1995 | US5410581 Apparatus and method for determining a time that a system's main power was inactive |
| 04/25/1995 | US5410552 Method and apparatus for generating test sequence |
| 04/25/1995 | US5410548 Test pattern fault equivalence |
| 04/25/1995 | US5410547 Video controller IC with built-in test circuit and method of testing |
| 04/25/1995 | US5410265 Amplifier calibration apparatus and method therefor |
| 04/25/1995 | US5410261 Semiconductor device testing apparatus |
| 04/25/1995 | US5410259 Probing device setting a probe card parallel |
| 04/25/1995 | US5410258 Self-guiding receptacle for a semiconductor test socket |
| 04/25/1995 | US5410254 Method for optimizing the structure of a transistor to withstand electrostatic discharge |
| 04/25/1995 | US5410247 Circuit device having a test function for checking circuit operation |
| 04/25/1995 | US5410163 Semi-conductor integrated circuit device including connection and disconnection mechanisms to connect and disconnect monitor circuit and semiconductor integrated circuit from each other |
| 04/25/1995 | US5410162 Apparatus for and method of rapid testing of semiconductor components at elevated temperature |
| 04/25/1995 | US5409788 Method for securing a tester device to a battery and the battery so produced |
| 04/25/1995 | US5409258 Fault diagnosis apparatus for control circuit of vehicle passenger protecting device |
| 04/22/1995 | CA2118331A1 Process and apparatus for the location of cable defects |
| 04/20/1995 | WO1995010873A1 Load analysis system for fault detection |
| 04/20/1995 | WO1995010785A1 Arrangement for testing a gate oxide |
| 04/20/1995 | WO1995010784A1 Method for determining the characteristics of an insulator and associated electronic microscope |
| 04/20/1995 | WO1995010206A1 Insertion and ejection apparatus for environmental test chambers |
| 04/20/1995 | DE4437069A1 Clock generator for a semiconductor test instrument |
| 04/20/1995 | DE4436494A1 Test apparatus for semiconductor ICs |
| 04/20/1995 | DE4400102C1 IDD measuring device for CMOS ICs |
| 04/20/1995 | DE4400101C1 IDD test device for CMOS ICs |
| 04/20/1995 | DE4339715C1 Method for measuring the position of an object |
| 04/20/1995 | DE4339495C1 Instrument for monitoring the mains voltage supply of electrical loads |
| 04/20/1995 | DE4335879A1 Arrangement for quality control and monitoring of through-plated multilayer printed circuit boards |
| 04/19/1995 | EP0649260A2 Method for expressing and restoring image data |
| 04/19/1995 | EP0649207A1 Self-testing circuit breaker ground fault and sputtering arc trip unit |
| 04/19/1995 | EP0649031A2 Apparatus for and method of testing of semiconductor components |
| 04/19/1995 | EP0649030A1 Connecting element inspecting method and connecting element inspecting device |
| 04/19/1995 | EP0649029A2 Surge discriminating and locating system |
| 04/19/1995 | EP0649028A1 Connector inspecting device |
| 04/19/1995 | EP0649027A2 Resistance-measurement based arrangement for monitoring integrity of travel path ground link in electronic component handling apparatus |
| 04/19/1995 | EP0648645A1 An electric control apparatus for an air-bag system |
| 04/19/1995 | EP0607410A4 Slide actuated holding clamp. |
| 04/19/1995 | EP0344271B1 System and method for testing digital electronic circuits |
| 04/19/1995 | CN2195099Y Cable core break tester |
| 04/18/1995 | US5408538 Method of and apparatus for inspecting the minimum annular width of a land on a printed circuit board |
| 04/18/1995 | US5408537 Mounted connector pin test using image processing |
| 04/18/1995 | US5408190 Testing apparatus having substrate interconnect for discrete die burn-in for nonpackaged die |
| 04/18/1995 | US5408189 Test fixture alignment system for printed circuit boards |
| 04/18/1995 | US5408188 High frequency wafer probe including open end waveguide |
| 04/18/1995 | US5408186 Single-conductor wrist strap monitoring |
| 04/18/1995 | US5407439 Multi-layer female component for refastenable fastening device and method of making the same |
| 04/18/1995 | US5407275 Non-destructive test for inner lead bond of a tab device |
| 04/18/1995 | US5406837 Vehicle testing device and method |
| 04/18/1995 | US5406836 EGR system testing device |
| 04/13/1995 | WO1995010048A1 A method and device for testing of an integrated circuit |