| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/13/1995 | WO1995010047A1 Device for regulating operating parameters and/or conditions in electrical factory equipment |
| 04/13/1995 | WO1995009716A1 Slide actuated holding clamp |
| 04/13/1995 | DE4433512A1 Device for waveform formatting |
| 04/13/1995 | DE4334338A1 Circuit for monitoring a supply voltage |
| 04/13/1995 | CA2149040A1 Slide actuated holding clamp |
| 04/12/1995 | EP0648018A1 Circuit indicating the phase relations between plural signals of the same frequency and its application in a circuit for adjusting the phase differences between these signals |
| 04/12/1995 | EP0648017A1 Device for monitoring phase skew between two clock signals |
| 04/12/1995 | EP0648008A1 Pulse width modulation inverter current detection method |
| 04/12/1995 | EP0647951A2 Electrical cables |
| 04/12/1995 | EP0647905A1 Integrated circuit having current monitoring cells for testing |
| 04/12/1995 | EP0647855A1 Pay-per-use access to multiple electronic test capabilities |
| 04/12/1995 | EP0647312A1 Inspection of a dynamo-electric machine in a gap between a stator and a rotor. |
| 04/12/1995 | EP0532521B1 Process for testing devices |
| 04/12/1995 | CN2194516Y DC power source system on-line monitoring and measuring apparatus |
| 04/12/1995 | CN2194515Y Multi-function automobile fault detector |
| 04/11/1995 | US5406567 Off-line test circuit of a semiconnector integrated logic circuit |
| 04/11/1995 | US5406566 Semiconductor memory device having diagnostic circuit for comparing multi-bit read-out test data signal with multi-bit write-in test data signal stored in serial-input shift register |
| 04/11/1995 | US5406266 For indicating deteoriation of a battery |
| 04/11/1995 | US5406217 Method of measuring the current-voltage characteristics of a DUT |
| 04/11/1995 | US5406216 Technique and method for asynchronous scan design |
| 04/11/1995 | US5406214 Method and apparatus for measuring minority carrier lifetime in semiconductor materials |
| 04/11/1995 | US5406213 Instrument for testing liquid crystal display base plates |
| 04/11/1995 | US5406212 Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors |
| 04/11/1995 | US5406211 Jigs for burn-in test |
| 04/11/1995 | US5406210 Apparatus and method for testing bare dies with low contact resistance between the die and testing station |
| 04/11/1995 | US5406209 Methods and apparatus for testing circuit boards |
| 04/11/1995 | US5406208 Method and apparatus for eliminating chips in a chip detection circuit and for determining chip size |
| 04/11/1995 | US5406207 Electrical continuity tester combined with flashlight and/or lantern |
| 04/11/1995 | US5406199 Test fixture carrying a channel card for logic level translation |
| 04/11/1995 | US5406198 Digital circuitry apparatus |
| 04/11/1995 | US5406197 Apparatus for controlling test inputs of circuits on an electronic module |
| 04/11/1995 | US5406132 Waveform shaper for semiconductor testing devices |
| 04/11/1995 | US5406127 Passenger protecting apparatus |
| 04/11/1995 | US5406116 Semiconductor device |
| 04/11/1995 | US5406071 Optically isolated pulse width modulation metering |
| 04/06/1995 | WO1995009481A1 Amplifier calibration apparatus and method therefor |
| 04/06/1995 | WO1995009463A1 Method of generating a fault-indication signal |
| 04/06/1995 | WO1995009459A1 Tab testing of area array interconnected chips |
| 04/05/1995 | EP0646867A2 Method and apparatus for field testing field programmable logic arrays |
| 04/05/1995 | EP0646804A2 Compact noncontact excess carrier lifetime characterization apparatus |
| 04/05/1995 | EP0646803A1 Semiconductor device having a boundary scan test circuit |
| 04/05/1995 | EP0646802A1 High-throughput testing apparatus |
| 04/05/1995 | EP0646801A1 Testing apparatus for testing and handling a multiplicity of devices |
| 04/05/1995 | EP0646800A1 Probe for testing semi-conductor chips |
| 04/05/1995 | EP0646249A1 Process for detecting abnormalities in a line to be examined. |
| 04/05/1995 | EP0596879B1 Process and arrangement for recognizing defects in power converters |
| 04/05/1995 | CN1101168A Method and apparatus for ageing of emitter coupled logic circuit |
| 04/05/1995 | CN1028127C Searching method for earth fault of armoured cable |
| 04/04/1995 | US5404584 Printed circuit board having modularized circuit functions designed for early diagnostics |
| 04/04/1995 | US5404359 Fail safe, fault tolerant circuit for manufacturing test logic on application specific integrated circuits |
| 04/04/1995 | US5404358 Boundary scan architecture analog extension |
| 04/04/1995 | US5404332 Apparatus for and a method of detecting a malfunction of a FIFO memory |
| 04/04/1995 | US5404331 Redundancy element check in IC memory without programming substitution of redundant elements |
| 04/04/1995 | US5404112 Test method and device for diodes with exposed junction assembled in parallel |
| 04/04/1995 | US5404111 Probe apparatus with a swinging holder for an object of examination |
| 04/04/1995 | US5404110 System using induced current for contactless testing of wiring networks |
| 04/04/1995 | US5404109 Method and apparatus for testing circuits containing active devices |
| 04/04/1995 | US5404108 Method and apparatus for testing electric motor rotors |
| 04/04/1995 | US5404106 Battery capacity estimating system and method |
| 04/04/1995 | US5404105 Multipurpose hearing aid maintenance device |
| 04/04/1995 | US5404099 Semiconductor device |
| 03/30/1995 | WO1995008910A1 Compliant electrical connectors |
| 03/30/1995 | WO1995008893A1 Method of predicting voltages in telephone line measurement |
| 03/30/1995 | WO1995008804A1 A versatile reconfigurable matrix based built-in self-test processor for minimizing fault grading |
| 03/30/1995 | WO1995008453A1 Process and arrangement for detecting and reporting the electrical condition of voltage flashover fuses |
| 03/30/1995 | DE4432909A1 Object-arranging device |
| 03/30/1995 | DE4333269A1 Method and device for continuous production of stranded material with a constant, predetermined resistance |
| 03/30/1995 | DE4333168A1 Method for monitoring the height of bonding wires |
| 03/30/1995 | DE4333009A1 Method and circuit arrangement for testing an engine control device |
| 03/30/1995 | DE4332649A1 Method for safety testing of an electrical device, in particular for measuring the earth-conductor resistance |
| 03/29/1995 | EP0645776A2 Semiconductor memory device executing a memory test |
| 03/29/1995 | EP0645639A1 Semiconductor integrated circuit apparatus having self testing function |
| 03/29/1995 | EP0645638A1 Method of measuring delay time in semiconductor device |
| 03/29/1995 | EP0645635A2 Electro-optic voltage detector |
| 03/29/1995 | EP0645278A1 Generator controller and controlling method for hybrid vehicle |
| 03/29/1995 | EP0645018A1 A method and apparatus for battery testing |
| 03/29/1995 | EP0554403B1 Method and apparatus for measuring minority carrier lifetime in semiconductor materials |
| 03/29/1995 | EP0297719B1 Device for synchronizing the output pulses of a circuit with an input clock |
| 03/29/1995 | CN2193554Y 实用测电笔 Practical test pencil |
| 03/29/1995 | CN1100811A Method for measuring pulse width modulated power for dc motor and converting device |
| 03/28/1995 | US5402458 For testing in a test mode a counter |
| 03/28/1995 | US5402427 Circuit tester with coincident sequencing of independently compressed test data matrix segments |
| 03/28/1995 | US5402380 Nonvolatile semiconductor memory device having a status register and test method for the same |
| 03/28/1995 | US5402082 Voltage and resistance synthesizer using pulse width modulation |
| 03/28/1995 | US5402080 Method of measuring unsaturated inductances of an equivalent circuit of a synchronous machine |
| 03/28/1995 | US5402079 Integrated circuit relay control system |
| 03/28/1995 | US5402078 Interconnection system for burn-in boards |
| 03/28/1995 | US5402077 For use in testing semiconductor integrated circuits |
| 03/28/1995 | US5402072 System and method for testing and fault isolation of high density passive boards and substrates |
| 03/28/1995 | US5402070 Fault-tolerant elective replacement indication for implantable medical device |
| 03/28/1995 | US5402063 Momentary test mode enabling circuit |
| 03/28/1995 | US5402018 Semiconductor integrated circuit |
| 03/28/1995 | US5402001 Method of checking for foreign matter on a substrate with light of maximum reflectivity for that substrate |
| 03/28/1995 | US5401972 Layout overlay for FIB operations |
| 03/23/1995 | WO1995008153A1 Scan test circuit using fast transmission gate switch |
| 03/23/1995 | WO1995008125A1 Printed circuit board tester |
| 03/23/1995 | WO1995008124A1 Electrostatic discharge generator |
| 03/23/1995 | WO1995008123A1 Field transmitter built-in test equipment |
| 03/23/1995 | DE4433906A1 Testing instrument for integrated semiconductor circuits |
| 03/23/1995 | DE4433745A1 Self-test system for a control device for electronic components and self-test method |