| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/05/1995 | US5448399 Optical system for scanning microscope |
| 09/05/1995 | US5448199 Internal supply voltage generation circuit |
| 09/05/1995 | US5448179 Screening of conductors and contacts on microelectronic devices |
| 09/05/1995 | US5448176 Cable fault detection using a high voltage alternating polarity DC signal superposed with a system frequency AC signal |
| 09/05/1995 | US5448166 Powered testing of mixed conventional/boundary-scan logic |
| 09/05/1995 | US5448164 Electrical test apparatus and method of checking the apparatus |
| 09/05/1995 | US5448064 Scanning electron microscope |
| 09/05/1995 | US5447442 Compliant electrical connectors |
| 08/31/1995 | WO1995023341A1 Translator fixture with module for expanding test points |
| 08/31/1995 | WO1995023340A1 Printed circuit board test set with test adapter and method for setting the latter |
| 08/31/1995 | WO1995023326A1 Method and device for checking the integrity of the electrical insulating means of an object comprising conductors |
| 08/31/1995 | DE4406538A1 Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben The same PCB tester with test adapter and method for adjusting |
| 08/31/1995 | DE4406193A1 Attachment for vehicle starter battery |
| 08/31/1995 | DE19507826A1 Verfahren zur Feststellung einer Unregelmäßigkeit für elektrische Ausrüstungen, insbesondere für eine rotierende elektrische Maschine, und eine Vorrichtung zur Durchführung des Verfahrens A method for detecting an irregularity for electrical equipment, in particular for a rotating electric machine, and a device for carrying out the method |
| 08/31/1995 | DE19506759A1 Halbleitervorrichtung, zugehöriges Herstellungsverfahren, Verfahren zum Testen von Halbleiterelementen, Testsubstrat für das Verfahren sowie Verfahren zur Herstellung des Testsubstrats A semiconductor device manufacturing method thereof, method for testing semiconductor devices, the test substrate for the process and method of manufacturing the test substrate |
| 08/31/1995 | DE19505462A1 Switching current supply |
| 08/31/1995 | CA2366420A1 Patient care and communication system |
| 08/31/1995 | CA2180642A1 Printed circuit board test set with test adapter and method for setting the latter |
| 08/30/1995 | EP0669691A1 Circuit for devices for measuring and monitoring electrical currents |
| 08/30/1995 | EP0669623A1 Test circuit of semiconductor memory device having data scramble function |
| 08/30/1995 | EP0669537A1 Integrated semiconductor device |
| 08/30/1995 | EP0375919B1 Calculating AC chip performance using the LSSD scan path |
| 08/30/1995 | CN2206464Y Single end electric wire test device |
| 08/29/1995 | US5446895 Measurement analysis software system and method |
| 08/29/1995 | US5446748 Apparatus for performing logic simulation |
| 08/29/1995 | US5446742 Techniques for developing integrated circuit test programs and their use in testing actual circuits |
| 08/29/1995 | US5446683 Methods and apparatus for generating pseudo-random binary patterns |
| 08/29/1995 | US5446682 System for calibrating a line isolation monitor |
| 08/29/1995 | US5446674 Crosstalk verification device |
| 08/29/1995 | US5446537 Method of sorting semiconductor lasers |
| 08/29/1995 | US5446444 Capacitive threshold detector test circuit |
| 08/29/1995 | US5446420 Method and apparatus for reducing jitter and improving testability of an oscillator |
| 08/29/1995 | US5446399 Method and structure for a fault-free input configuration control mechanism |
| 08/29/1995 | US5446395 Test circuit for large scale integrated circuits on a wafer |
| 08/29/1995 | US5446394 Test fixture with permanent circuit board extractor thereon |
| 08/29/1995 | US5446392 Submarine equipment and fault locating method for a submarine communication system |
| 08/29/1995 | US5446389 Portable test set for testing operability of a locomotive |
| 08/29/1995 | US5446388 Tool for pulling and testing cartridge-type fuses |
| 08/29/1995 | US5446387 Method and a device for determining a fault on a transmission line |
| 08/29/1995 | US5446354 Drive apparatus for brushless DC motor and failure diagnosing method for the same |
| 08/29/1995 | US5446322 Apparatus and method for determining when the frequency of an alternating signal is below a predetermined threshold |
| 08/24/1995 | WO1995022429A1 Multi-wavelength laser optic system for probe station and laser cutting |
| 08/24/1995 | DE4442636A1 Bezahlung-pro-Anwendung-Zugriff auf vielfache elektronische Testfähigkeiten und Testbetriebsmittel Pay-per-use access to multiple electronic test capabilities and test equipment |
| 08/24/1995 | CA2182358A1 Multi-wavelength laser optic system for probe station and laser cutting |
| 08/23/1995 | EP0667964A1 Fault and splice finding system and method |
| 08/23/1995 | EP0667963A1 Armature connection resistance measuring method and apparatus |
| 08/23/1995 | EP0667962A1 Printed circuit board testing device with foil adapter. |
| 08/22/1995 | US5444759 Method of predicting voltages in telephone line measurement |
| 08/22/1995 | US5444717 Method for providing minimal size test vector sets |
| 08/22/1995 | US5444716 Boundary-scan-based system and method for test and diagnosis |
| 08/22/1995 | US5444715 AC interconnect test of integrated circuit chips |
| 08/22/1995 | US5444392 CMOS input stage |
| 08/22/1995 | US5444391 Tie-up and tie-down circuits with a primary input for testability improvement of logic networks |
| 08/22/1995 | US5444389 Method and apparatus for measuring lifetime of minority carriers in semiconductor |
| 08/22/1995 | US5444388 Apparatus for testing semiconductor devices using a conductive sheet |
| 08/22/1995 | US5444387 Test module hanger for test fixtures |
| 08/22/1995 | US5444386 Probing apparatus having an automatic probe card install mechanism and a semiconductor wafer testing system including the same |
| 08/22/1995 | US5444385 Testing apparatus for liquid crystal display substrates |
| 08/22/1995 | US5444384 Method and device of contactless measurement of electric voltages in a unit under measurement with an insulating surface |
| 08/22/1995 | US5444380 Current surge indicator |
| 08/22/1995 | US5444378 Battery state of charge monitor |
| 08/22/1995 | US5444366 Wafer burn-in and test system |
| 08/22/1995 | US5444365 Voltage measuring apparatus having an electro-optic member |
| 08/22/1995 | US5443404 Socket for electric part |
| 08/22/1995 | CA2025173C Diagnostic apparatus for a vehicle network system and method of diagnosing a vehicle network system |
| 08/17/1995 | WO1995022212A1 Optical time domain reflectometry |
| 08/17/1995 | WO1995022206A1 Delay-locked loop |
| 08/17/1995 | WO1994023366A3 Power line communications analyzer |
| 08/17/1995 | DE4417031C1 Integrated circuit electromagnetic combability measurement method |
| 08/17/1995 | DE19505652A1 Instantaneous phase and amplitude measurement circuit + |
| 08/17/1995 | DE19504468A1 Nickel-Cadmium battery charger circuit with microprocessor and sensors + |
| 08/17/1995 | DE19504287A1 AC motor torque measurement with hum reduction circuit |
| 08/16/1995 | EP0667538A2 Non-contact type wave signal observation apparatus |
| 08/16/1995 | EP0667535A2 Electron beam tester and testing method using the same |
| 08/16/1995 | EP0667534A1 Method for measuring a resistance value |
| 08/16/1995 | EP0627083A4 Method and apparatus for electronic meter testing. |
| 08/16/1995 | CN2205562Y Cable obstacle measuring analyzer |
| 08/16/1995 | CN2205561Y DC electricity tester |
| 08/16/1995 | CN1106957A Self-testing circuit breaker ground fault and sputtering arc trip unit |
| 08/16/1995 | CN1106926A Method for testing electronic devices attached to a leadframe |
| 08/16/1995 | CN1106925A Resistance-measurement based arrangement for monitoring integrity of travel path ground link in electronic components handling apparatus |
| 08/15/1995 | US5442671 Circuit and method of detecting actuator movement |
| 08/15/1995 | US5442644 System for sensing the state of interconnection points |
| 08/15/1995 | US5442643 Integrated circuit chip with testing circuits and method of testing the same |
| 08/15/1995 | US5442642 Test signal generator on substrate to test |
| 08/15/1995 | US5442549 Diagnostic vehicle alignment system |
| 08/15/1995 | US5442391 Method and a system for testing a cathode ray tube or like products |
| 08/15/1995 | US5442305 Active bus termination device |
| 08/15/1995 | US5442302 Method and apparatus for measuring high-frequency C-V characteristics of MIS device |
| 08/15/1995 | US5442301 LSI test circuit |
| 08/15/1995 | US5442300 Ultrafast electrical scanning force microscope probe |
| 08/15/1995 | US5442299 Printed circuit board test fixture and method |
| 08/15/1995 | US5442297 Contactless sheet resistance measurement method and apparatus |
| 08/15/1995 | US5442282 Testing and exercising individual, unsingulated dies on a wafer |
| 08/15/1995 | US5442279 Apparatus and method for detecting power of a three phase alternating current system |
| 08/15/1995 | US5442257 System for and method of lighting discharge lamp having failure detection of discharge lamp, external wiring and lighting circuit |
| 08/15/1995 | US5442170 Programmable cable adaptor for connecting different automobile computers to diagnostic equipment |
| 08/15/1995 | US5440943 Electronic test head manipulator |
| 08/15/1995 | CA2042869C Method and circuit for testing the conductive circuitry of a printed circuit board |
| 08/10/1995 | WO1995021471A1 Battery with strength indicator |