Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/27/1995 | CN2208709Y Single-board microcomputer controlled positioning device for grounding problems |
09/27/1995 | CN2208708Y Wire number checking device |
09/26/1995 | US5453995 Apparatus for generating test signals |
09/26/1995 | US5453994 Semiconductor test system, semiconductor test method, method of wiring pattern formation and semiconductor integrated circuit |
09/26/1995 | US5453993 Semiconductor integrated circuit with clock selecting function |
09/26/1995 | US5453992 Method and apparatus for selectable parallel execution of test operations |
09/26/1995 | US5453990 Switching circuit having error detection capability |
09/26/1995 | US5453703 Method for determining the minority carrier surface recombination lifetime constant (ts of a specimen of semiconductor material |
09/26/1995 | US5453701 Bare die test and burn-in device |
09/26/1995 | US5453700 Test clip contact arrangement |
09/26/1995 | US5453698 Method and system for testing an implantable defibrillator output stage and high voltage lead integrity |
09/26/1995 | US5453695 Apparatus for rapidly and accurately testing encapsulated relays and similar devices |
09/26/1995 | US5453694 Snap-in type sparkplug voltage probe device for use in internal combustion engine |
09/26/1995 | US5453683 Continuity tester |
09/26/1995 | US5453404 Method for making an interconnection structure for integrated circuits |
09/25/1995 | CA2143018A1 Scannable latch and method of using same |
09/21/1995 | WO1995025377A1 Stator manufacturing and testing method and apparatus |
09/21/1995 | WO1995025374A1 Method of protecting electrical equipment, in particular direct current equipment, e.g. photo-voltaic equipment, and a detection unit for said equipment |
09/21/1995 | WO1995025285A1 Circuit arrangement for testing a multiple-cell battery |
09/21/1995 | WO1995025271A1 Optical corona monitoring system |
09/21/1995 | DE4409011A1 Prodn. of test pattern for identifying transit time faults in logic circuit |
09/21/1995 | DE4408709A1 Short circuit indicator with current transformers and indicating elements |
09/21/1995 | CA2185042A1 Optical corona monitoring system |
09/21/1995 | CA2183879A1 Stator manufacturing and testing method and apparatus |
09/20/1995 | EP0673143A2 Method and device for connecting a subscriber set to a telephone line monitoring apparatus in a telecommunication jack box |
09/20/1995 | EP0673098A1 Control and operation device for an electric metal-clad power transmission line |
09/20/1995 | EP0672933A1 Apparatus and method for display panel inspection |
09/20/1995 | EP0672912A1 Indicator for a monophase asynchronous motor |
09/20/1995 | EP0672911A1 Quiescent supply current test device |
09/20/1995 | EP0672910A1 System testing device and method using JTAG circuit |
09/20/1995 | EP0672909A1 Testing device for electric connectors |
09/20/1995 | EP0672257A1 Method and apparatus for determining characteristic electrical properties of semi-conducting materials |
09/20/1995 | EP0672248A1 Electronic battery tester with automatic compensation for low state-of-charge |
09/19/1995 | US5452368 Method of detecting defects in semiconductor package leads |
09/19/1995 | US5452309 Apparatus and method for forcing hardware errors via scan |
09/19/1995 | US5452253 Burn-in test circuit for semiconductor memory device |
09/19/1995 | US5452227 Method and apparatus for converting a programmable logic device designed into a selectable target gate array design |
09/19/1995 | US5452223 Arc detection using current variation |
09/19/1995 | US5452222 Fast-risetime magnetically coupled current injector and methods for using same |
09/19/1995 | US5452198 Apparatus and method for A/C voltage sensing |
09/19/1995 | US5452173 Diagnostic circuit protection device |
09/19/1995 | US5451887 Programmable logic module and architecture for field programmable gate array device |
09/19/1995 | US5451886 Method of evaluating lifetime of semiconductor material and apparatus for the same |
09/19/1995 | US5451885 Interconnect stress test coupon |
09/19/1995 | US5451884 Electronic component temperature test system with flat ring revolving carriage |
09/19/1995 | US5451881 Method and means for adjusting battery monitor based on rate of current drawn from the battery |
09/19/1995 | US5451879 Electromechanical relay monitoring system with status clocking |
09/19/1995 | US5451863 Fiber optic probe with a magneto-optic film on an end surface for detecting a current in an integrated circuit |
09/19/1995 | US5451862 System and method of use for conducting a neutral corrosion survey |
09/19/1995 | US5451489 Multilayer element wafers with photoresist layers treated with light |
09/19/1995 | US5451165 Temporary package for bare die test and burn-in |
09/19/1995 | US5450766 Test head manipulator |
09/17/1995 | CA2144671A1 Shielded electrical transmission line monitoring and control device |
09/14/1995 | WO1995024774A2 Memory iddq-testable through cumulative word line activation |
09/14/1995 | WO1995024725A1 Device for monitoring the operation safety of power switches (diagnosis apparatus) |
09/14/1995 | DE4408468A1 Test technique for detecting wire breaks by capacitance |
09/14/1995 | DE4408090A1 Communications cable with test wires |
09/14/1995 | DE4407870A1 Switch chamber under vacuum functional reliability evaluation method |
09/14/1995 | CA2185017A1 Device for monitoring the operational safety of power switches (diagnostic apparatus) |
09/13/1995 | EP0671789A1 Connector, connector examining device and connector moving mechanism |
09/13/1995 | EP0671763A2 Ultrasonically welded plastic support ring for handling and testing semiconductor devices |
09/13/1995 | EP0671689A2 Interconnect testing through utilization of board topology data |
09/13/1995 | EP0671688A2 Configuration and method for testing a delay chain within a microprocessor clock generator |
09/13/1995 | EP0671633A2 Testing variably controllable delay units |
09/13/1995 | EP0671632A2 Field winding ground fault detector and relay |
09/13/1995 | EP0671630A1 Jig for measuring the characteristics of a semiconductor, manufacturing method therefor and use thereof |
09/13/1995 | EP0671012A1 A method and a device for checking the condition of semiconductor valves |
09/13/1995 | EP0671011A1 A method and a device for determining the distance from a measuring station to a fault on a transmission line |
09/13/1995 | EP0604444B1 Circuit arrangement to detect a voltage |
09/13/1995 | EP0543851B1 Battery with charge indicator |
09/13/1995 | EP0477228B1 Object detection and analysis with transmission lines |
09/13/1995 | CN2207587Y Power line anti-theft alarm |
09/12/1995 | US5450624 Method and apparatus for diagnosing amp to speaker connections |
09/12/1995 | US5450455 Method and apparatus for including the states of nonscannable parts in a scan chain |
09/12/1995 | US5450418 Pseudo master slave capture mechanism for scan elements |
09/12/1995 | US5450415 Boundary scan cell circuit and boundary scan test circuit |
09/12/1995 | US5450414 Partial-scan built-in self-testing circuit having improved testability |
09/12/1995 | US5450328 System for measuring line to ground impedance |
09/12/1995 | US5450204 Inspecting device for inspecting printed state of cream solder |
09/12/1995 | US5450018 Device for testing electrical modules |
09/12/1995 | US5450016 Method of quickly evaluating contact resistance of semiconductor device |
09/12/1995 | US5450014 Test apparatus for detecting reverse insertion of a capacitor on a test board |
09/12/1995 | EP0694169A4 Relay tester |
09/08/1995 | WO1995024014A2 One-terminal data fault location system |
09/08/1995 | CA2184091A1 One-terminal data fault location system |
09/07/1995 | DE4412982C1 Wheatstone bridge error test appts. for particularly reusable sensors |
09/06/1995 | EP0670596A2 Tape carrier for integrated circuit |
09/06/1995 | EP0670552A1 Design automation method for digital electronic circuits |
09/06/1995 | EP0670500A1 Connector and connector testing apparatus |
09/06/1995 | EP0438477B1 Automotive battery status monitor |
09/06/1995 | EP0319187B1 Scan data path coupling |
09/06/1995 | CN2206967Y Electrical property comprehensive test instrument of electrical equipment |
09/06/1995 | CN1107975A Circuit arrangement for current measurement via a switching transistor |
09/05/1995 | US5448576 Boundary scan architecture extension |
09/05/1995 | US5448575 Bypass scan path and integrated circuit device using the same |
09/05/1995 | US5448574 Detection system for abnormal cable connections in communication apparatuses |
09/05/1995 | US5448526 Semiconductor integrated circuit device |
09/05/1995 | US5448525 Apparatus for configuring a subset of an integrated circuit having boundary scan circuitry connected in series and a method thereof |
09/05/1995 | US5448492 Monitoring the characteristics of a load driver controlled by a microcontroller |
09/05/1995 | US5448491 Monitor for an ungrounded system |