Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/1996
03/28/1996DE19515154A1 Sensing head measurement handling device for integrated circuit testing
03/28/1996DE19509778A1 Line circuit-breaker or fault current circuit-breaker for cutting off current exceeding threshold value
03/27/1996EP0703668A2 Self-resetting CMOS multiplexer with static output driver
03/27/1996EP0703462A1 Charge estimation process for an energy generating element, using distance control
03/27/1996EP0702868A1 Fading simulator
03/27/1996EP0605604A4 Automatic motor testing method and apparatus.
03/27/1996EP0529290B1 Hybrid pattern self-testing of integrated circuits
03/27/1996CN2223498Y Multi-purpose safety device for electric appliances
03/27/1996CN2223497Y Alarm metering instrument for short-circuits and discontinuities
03/26/1996US5502731 Delay test coverage without additional dummy latches in a scan-based test design
03/26/1996US5502730 Partial scan testability utilizing reconvergence through sequential elements
03/26/1996US5502729 Method of testing for stuck-at fault in a synchronous circuit
03/26/1996US5502661 Checking design for testability rules with a VHDL simulator
03/26/1996US5502647 Resynthesis and retiming for optimum partial scan testing
03/26/1996US5502646 Selection of partial scan flip-flops to break feedback cycles
03/26/1996US5502643 Method of and an apparatus for setting up parameters which are used to manufacture a semiconductor device
03/26/1996US5502399 Power semiconductor device with a gate withstand-voltage test terminal
03/26/1996US5502398 Semiconductor device burn-in apparatus
03/26/1996US5502397 Integrated circuit testing apparatus and method
03/26/1996US5502392 Methods for the measurement of the frequency dependent complex propagation matrix, impedance matrix and admittance matrix of coupled transmission lines
03/26/1996US5502391 Apparatus for measuring the crosstalk in a cable
03/26/1996US5502390 For locating constrictions in electrical conductors
03/26/1996US5502375 Method and apparatus for determining orientation of polarized capacitors
03/26/1996US5502306 Electron beam inspection system and method
03/21/1996WO1996008846A1 A battery cell having an internal circuit for controlling its operation
03/21/1996WO1996008728A1 A surface mount test point enabling hands free diagnostic testing of electronical circuits
03/21/1996DE19534735A1 Clock pulse edge forming circuit for semiconductor integrated circuit testing system
03/21/1996DE19534141A1 Control assembly for sensors and actuators of IC engined vehicle
03/21/1996DE19502149C1 Control device testing system
03/20/1996EP0702402A1 Manufacturing method for integrated circuits and semiconductor wafer so obtained
03/20/1996EP0702373A1 Redundant address memory and test method therefor
03/20/1996EP0702304A2 Method for identifying untestable faults in logic circuits
03/20/1996EP0702303A1 Prescaler IC test method capable of executing alternate current test by the use of IC tester for direct current test
03/20/1996EP0702243A2 Scan testable double edge triggered scan cell
03/20/1996EP0702242A2 Single clock scan latch
03/20/1996EP0702241A2 Structural and performance scan test
03/20/1996EP0702240A2 Scan latch and its operation for structural and performance testing
03/20/1996EP0702239A2 A controller for implementing scan testing
03/20/1996EP0702238A1 On-chip oscillator and test method therefor
03/20/1996EP0702237A2 Peak current detection in a test instrument for ensuring validity of component test output
03/20/1996EP0702236A2 Voltage measurement system
03/20/1996EP0702227A1 Terminated cable portion inspection device for stripped terminal crimping machine
03/20/1996EP0701928A1 Testing of an airbag squib resistor
03/20/1996EP0482169B1 Automatic harness testing apparatus
03/20/1996CN1118934A Method and apparatus for processing wafers and substrates, and apparatus for transferring the wafers and substrates
03/19/1996US5500862 Multi-layer digital circuit board with a test pattern section
03/19/1996US5500861 Scanning, circuits, systems and methods
03/19/1996US5500607 Probe-oxide-semiconductor method and apparatus for measuring oxide charge on a semiconductor wafer
03/19/1996US5500603 Methodology to quickly isolate functional failures associated with integrated circuit manufacturing defects
03/19/1996US5500598 Apparatus for testing electrical components which have windings
03/19/1996US5500588 Method and apparatus for testing integrated circuit devices
03/19/1996US5500280 Elastomer-based connector sheet
03/19/1996US5499933 Probe pins for inspection and slip-on sockets thereof
03/19/1996US5499526 Semiconductor sensor self-checking circuit
03/19/1996CA2120174C Device for testing an amplifier
03/19/1996CA2064031C Method and apparatus for monitoring fuel cell performance
03/14/1996WO1996008056A1 Ball grid array socket
03/14/1996WO1996007975A1 Reader using moving averages to break the (n,k) code barrier for upc, ean, and others
03/14/1996WO1996007925A1 Detection of partial discharges in power transformers
03/14/1996DE19533103A1 Gas discharge lamp switch-on circuit e.g. for motor vehicle
03/14/1996DE19520630A1 Wafer burn-in test circuit for sensing defective cell of semiconductor memory device
03/13/1996EP0701312A2 Arcing fault detector
03/13/1996EP0701261A1 Circuit and method of detecting actuator movement
03/13/1996EP0701140A2 Checking apparatus for array electrode substrate
03/13/1996EP0701136A2 Electrical probe apparatus
03/13/1996EP0700527A1 Gps synchronized frequency/time source
03/13/1996CN2222363Y Underground line fault detector
03/13/1996CN2222362Y Instantaneous switching off time tester
03/13/1996CN1118519A Semiconductor memory device
03/12/1996US5499250 System having multiple subsystems and test signal source resident upon common substrate
03/12/1996US5499249 Method and apparatus for test generation and fault simulation for sequential circuits with embedded random access memories (RAMs)
03/12/1996US5499248 Test vector generator comprising a decompression control unit and a conditional vector processing unit and method for generating a test vector
03/12/1996US5499190 System for measuring timing relationship between two signals
03/12/1996US5499189 Signal processing method and apparatus for discriminating between periodic and random noise pulses
03/12/1996US5499023 Method of and apparatus for automated sensor diagnosis through quantitative measurement of one of sensor-to-earth conductance or loop resistance
03/12/1996US5498983 Device for checking the skew between two clock signals
03/12/1996US5498980 Ternary/binary converter circuit
03/12/1996US5498974 Contactless corona-oxide-semiconductor Q-V mobile charge measurement method and apparatus
03/12/1996US5498973 Apparatus for testing semiconductor laser devices
03/12/1996US5498972 Device for monitoring the supply voltage on integrated circuits
03/12/1996US5498971 Method and control circuit for measuring the temperature of an integrated circuit
03/12/1996US5498970 Top load socket for ball grid array devices
03/12/1996US5498968 Method and a device to measure electromagnetic radiation from or reception of from outside coming electromagnetic radiation in a circuit card
03/12/1996US5498967 System and methods of use for conducting a neutral corrosion survey
03/12/1996US5498966 Inspection device for inspecting continuity of terminal in a connector
03/12/1996US5498965 Driving point reference plane time domain reflectometry method for measuring characteristic impedance
03/12/1996US5498964 Capacitive electrode system for detecting open solder joints in printed circuit assemblies
03/12/1996US5498955 Apparatus for detecting the amplitude and phase of an a.c. signal
03/12/1996US5498874 Defect detecting apparatus and method
03/12/1996US5498871 Method for analyzing the defectiveness of semiconductor device
03/07/1996DE19511442C1 Electrostatic separator operating method for removing dust from flue gases
03/06/1996EP0700112A1 High-frequency integrated circuit
03/06/1996EP0699999A2 Memory architecture for automatic test equipment using vector module table
03/06/1996EP0699998A1 Semiconductor integrated circuit
03/06/1996EP0699920A2 Semiconductor integrated circuit with a testable block
03/06/1996EP0699919A1 Acquisition route for voltage pulse and measuring procedure and system for partial discharges using such a route
03/06/1996EP0699918A1 A partial discharge sensing device for a gas insulated apparatus
03/06/1996EP0699917A2 A system for testing the voice coil element of a disk drive rotary actuator
03/06/1996EP0699916A1 Process and appliance for testing the efficiency of lighting arresters
03/06/1996EP0699913A2 Interface apparatus for automatic test equipment
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