| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/23/1995 | DE4344013C1 Electrical circuit arrangement |
| 03/23/1995 | DE4331766A1 Arrangement for earthing items under test |
| 03/23/1995 | CA2169722A1 Field transmitter built-in test equipment |
| 03/22/1995 | EP0644579A2 Semiconductor device burn-in apparatus |
| 03/22/1995 | EP0644496A2 Method and system for dividing analyzing region in device simulator |
| 03/22/1995 | CN2192893Y Wrist belt base with display device |
| 03/22/1995 | CN2192892Y Test pencil for vehicle |
| 03/22/1995 | CN2192891Y Control detector for electric circuit plate |
| 03/22/1995 | CN2192890Y Simple indicate alarm device for protecting motor |
| 03/22/1995 | CN1100576A Device for driving brushless DC motor and method of identification of falt thereof |
| 03/21/1995 | US5400406 Aircraft communication headset tester |
| 03/21/1995 | US5400345 Communications system to boundary-scan logic interface |
| 03/21/1995 | US5400344 Semiconductor device with function of testing insulation defect between bit lines and testing method therefor |
| 03/21/1995 | US5400297 Method and a system for testing capacitive, acoustic transducers |
| 03/21/1995 | US5400290 Semiconductor device allowing accurate characteristics test |
| 03/21/1995 | US5400282 Detector circuit for testing semiconductor memory device |
| 03/21/1995 | US5400270 Simulator for conducting timing analysis of a circuit |
| 03/21/1995 | US5400263 Apparatus and method for specifying the flow of test execution and the binning for a testing system |
| 03/21/1995 | US5400262 Universal interconnect matrix array |
| 03/21/1995 | US5399978 Probe apparatus and method for measuring high-frequency signals |
| 03/21/1995 | US5399975 Method of testing continuity of a connection between an integrated circuit and a printed circuit board by current probing integrated circuit |
| 03/21/1995 | US5399973 Method and apparatus for detecting a reduction in the degree of vacuum of a vacuum valve while in operation |
| 03/21/1995 | US5399972 Spark intensity transient peak voltmeter for secondary ignition circuit testing mounted in dashboard |
| 03/21/1995 | US5399505 Method and apparatus for performing wafer level testing of integrated circuit dice |
| 03/17/1995 | CA2106324A1 Continuity tester |
| 03/16/1995 | WO1995007469A1 Non-contact linewidth measurement of semiconductor conductors |
| 03/16/1995 | DE4417580A1 Testen von elektronischen Anordnungen unter Verwendung der Rotortechnik zum Anordnen der Fühler Testing electronic devices using the rotor technology for locating the sensor |
| 03/16/1995 | DE4331379A1 Operation of a load circuit with load recognition |
| 03/16/1995 | DE4223436C2 Vorrichtung zum automatischen Prüfen von elektrische und/oder elektronische Bauelemente bzw. Baugruppen aufweisenden Prüfobjekten The apparatus for automatically testing of electrical and / or electronic components or assemblies having DUTs |
| 03/15/1995 | EP0643310A1 Device for monitoring the discharge of a plurality of series connected batteries |
| 03/15/1995 | EP0643309A1 Method for detecting ground faults on the conductors of an electric machine |
| 03/15/1995 | EP0643308A1 Electronic test head manipulator |
| 03/15/1995 | EP0642708A1 Automatic calibration system for a ramp voltage generator |
| 03/15/1995 | CN2192041Y Arrangement for testing gapless metal oxidate arrester impedance current fundamental wave |
| 03/14/1995 | US5398291 Method and apparatus for detecting neck disconnection between land and line of wiring pattern on printed board |
| 03/14/1995 | US5398252 Integrated circuit tester |
| 03/14/1995 | US5398197 Method of creating debug specification and test program creating specification |
| 03/14/1995 | US5397999 Evaluation apparatus for power supply system |
| 03/14/1995 | US5397998 Burn-in apparatus |
| 03/14/1995 | US5397997 Burn-in technologies for unpackaged integrated circuits |
| 03/14/1995 | US5397996 Continuity tester using a brush tipped probe |
| 03/14/1995 | US5397991 Multi-battery charging system for reduced fuel consumption and emissions in automotive vehicles |
| 03/14/1995 | US5397984 Integrated circuit for protecting internal circuitry from high voltage input test signals |
| 03/14/1995 | US5397983 Vibration based deenergized cable detector and method |
| 03/14/1995 | US5397980 Current probe calibration fixture |
| 03/09/1995 | WO1995006928A1 Device for triggering a warning device |
| 03/09/1995 | DE4430243A1 Magnetoresistive sensor |
| 03/09/1995 | DE4417573A1 System und Verfahren zum Erfassen von Kurzschlüssen, Leerläufen und verbundenen Anschlußstiften auf einer gedruckten Leiterplatte unter der Verwendung eines automatischen Testgeräts System and method for detecting short-circuiting, no-loads and associated connecting pins on a printed circuit board using an automatic test equipment |
| 03/09/1995 | DE4331640C1 Method and device for turning off or reversing a drive arrangement for a motor vehicle part which can be moved |
| 03/09/1995 | DE4329577A1 Device for simplifying the measurement of thick film resistors |
| 03/09/1995 | DE4202623C2 Abtastpfadeinrichtung und integrierte Halbleiterschaltkreiseinrichtung mit dieser und Betriebsverfahren für eine solche Abtastpfadeinrichtung and semiconductor integrated circuit device with this and operational procedures for such |
| 03/08/1995 | EP0642136A2 Apparatus for generating address data |
| 03/08/1995 | EP0642134A2 Test of a static random access memory |
| 03/08/1995 | EP0642085A1 Sampling circuits |
| 03/08/1995 | EP0642084A1 Testable integrated logic circuit |
| 03/08/1995 | EP0642083A1 Test circuit and method for interconnect testing of chips |
| 03/08/1995 | EP0642028A1 Measuring and experimenting system for sensing EMP susceptibility of electrical appliances and circuits |
| 03/08/1995 | EP0642027A1 Method and device for detecting earth faults of the conductors in a electrical machine |
| 03/08/1995 | EP0641688A1 Diagnostic circuit for a supplemental inflatable restraint system |
| 03/08/1995 | EP0641446A1 Testing process for the quality control of electromagnetically actuated switching devices. |
| 03/08/1995 | CN1027837C Checker in situs for electricity leakage protector |
| 03/07/1995 | US5396501 Test access port controller with a gate for controlling a shift data register signal |
| 03/07/1995 | US5396500 Semiconductor integrated circuit device with fault detecting function |
| 03/07/1995 | US5396498 Integrated circuit with peripheral test controller |
| 03/07/1995 | US5396464 Semiconductor memory with inverted write-back capability and method of testing a memory using inverted write-back |
| 03/07/1995 | US5396422 Method for detecting malfunctions in a motor vehicle |
| 03/07/1995 | US5396334 Bonding wire inspection apparatus |
| 03/07/1995 | US5396280 Analog video processing apparatus and method for eliminating background levels in the analog signal |
| 03/07/1995 | US5396182 Low signal margin detect circuit |
| 03/07/1995 | US5396181 Cardiac catheter testing apparatus |
| 03/07/1995 | US5396180 Diagnostic measurement system for gas insulated electrical substances |
| 03/07/1995 | US5396179 High frequency surge tester methods and apparatus |
| 03/07/1995 | US5396177 Battery with electrochemical tester |
| 03/07/1995 | US5396172 Transformer fault analyzer |
| 03/07/1995 | US5396170 Single chip IC tester architecture |
| 03/07/1995 | US5396118 Pressure detector circuit |
| 03/07/1995 | US5396068 Method of making a semiconductor device including infrared imaging, and apparatus for use in the imaging |
| 03/07/1995 | US5395253 Membrane connector with stretch induced micro scrub |
| 03/07/1995 | CA2053811C Arc detection circuit breaker |
| 03/02/1995 | WO1995006260A1 Measuring burst/sinusoidal waveform time span |
| 03/01/1995 | EP0641080A2 Method and apparatus for reducing jitter and improving testability of an oscillator |
| 03/01/1995 | EP0641058A1 Power source supplying method of electronic apparatus |
| 03/01/1995 | EP0641055A1 Modular,distributed equipment leakage circuit interrupter |
| 03/01/1995 | EP0641020A2 Multiple-scan method for wafer particle analysis |
| 03/01/1995 | EP0640986A1 Semiconductor memory device and method for testing the same |
| 03/01/1995 | EP0640920A1 Boundary-scan-based system and method for test and diagnosis |
| 03/01/1995 | EP0640919A2 Processor circuit with a test device |
| 03/01/1995 | EP0640218A1 High-speed, high-impedance external photoconductive-type sampling probe/pulser |
| 03/01/1995 | EP0575399A4 Interactive diagnostic system for an automotive vehicle, and method. |
| 03/01/1995 | CN2190790Y High or low pressure induction acousto-optic alarm badge |
| 03/01/1995 | CN1099484A Intelligent high-voltage megohmmeter |
| 03/01/1995 | CN1099481A Method and device for monitering rotor break-rod of cage asynchronous motor |
| 02/28/1995 | US5394405 Universal weight generator |
| 02/28/1995 | US5394404 Flip-flop circuit having diagnostic function |
| 02/28/1995 | US5394403 Fully testable chip having self-timed memory arrays |
| 02/28/1995 | US5394348 Control system for semiconductor circuit testing system |
| 02/28/1995 | US5394347 Method and apparatus for generating tests for structures expressed as extended finite state machines |
| 02/28/1995 | US5394246 Bonding wire inspection apparatus and method |
| 02/28/1995 | US5394120 Device for testing an amplifier |
| 02/28/1995 | US5394101 Method for detecting mobile ions in a semiconductor device |