| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/18/1995 | US5434385 Dual channel D.C. low noise measurement system and test methodology |
| 07/18/1995 | US5434089 Method for testing the sheet resistivity of diffused layers |
| 07/13/1995 | WO1995019011A2 Apparatus and method for testing integrated circuits |
| 07/13/1995 | WO1995019007A1 Method and system for predicting steady state conditions from transient monotonic or cyclic data |
| 07/13/1995 | WO1995018976A1 Process for testing electronic controllers |
| 07/13/1995 | WO1995018975A1 Reversible chip contacting device |
| 07/13/1995 | DE4406510C1 Integrated circuit with integrated test device |
| 07/12/1995 | EP0662709A2 Method of testing semiconductor circuit layers |
| 07/12/1995 | EP0662661A1 Circuit device to prepare analog signals for a boundary scan test procedure |
| 07/12/1995 | EP0662616A2 Boundary-scan-compliant multi-chip module |
| 07/12/1995 | EP0662615A1 Method for detecting short circuits in railway networks |
| 07/12/1995 | EP0662614A2 Printed circuit board test fixture and method |
| 07/12/1995 | EP0662220A1 Decoupling of a high-frequency error signal from a high-frequency electromagnetic field in a large electric machine. |
| 07/12/1995 | CN2203459Y Ampere-hour meter |
| 07/11/1995 | US5432932 System and method for dynamically controlling remote processes from a performance monitor |
| 07/11/1995 | US5432797 IC tester having a pattern selector capable of selecting pins of a device under test |
| 07/11/1995 | US5432793 Response expander board |
| 07/11/1995 | US5432548 Apparatus for testing and adjusting audio/video signal waveforms in color television |
| 07/11/1995 | US5432461 Method of testing active matrix liquid crystal display substrates |
| 07/11/1995 | US5432460 Apparatus and method for opens and shorts testing of a circuit board |
| 07/11/1995 | US5432457 Capacitive disk probe |
| 07/11/1995 | US5432456 Connector installation GO/NO-GO test fixture |
| 07/11/1995 | US5432455 Method and apparatus for detecting arcing in alternating current power systems by monitoring high-frequency noise |
| 07/11/1995 | US5432452 Device for detecting failure of battery cells by comparing the second derivative of battery voltage overtime with a preset threshold |
| 07/11/1995 | US5432441 Testability architecture and techniques for programmable interconnect architecture |
| 07/11/1995 | US5432440 Detection of tri-state logic signals |
| 07/11/1995 | US5432429 System for charging/monitoring batteries for a microprocessor based system |
| 07/11/1995 | US5431491 Insertion and ejection apparatus for environmental test chambers |
| 07/06/1995 | WO1995018385A1 High voltage dc-biased ac test system |
| 07/06/1995 | WO1995018369A1 Device for detecting wiring defect of wiring substrate |
| 07/06/1995 | DE4400097A1 Semiconductor material lifetime testing |
| 07/05/1995 | EP0661551A2 Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing |
| 07/05/1995 | EP0661550A2 Method for burning-in semiconductor chips |
| 07/05/1995 | EP0661545A2 Apparatus for probing circuit boards |
| 07/05/1995 | EP0606283B1 Process and appropriate measuring arrangement for assessing the arc on sliding contacts of electric machines |
| 07/05/1995 | EP0414795B1 Voltage controlling and indicating device |
| 07/05/1995 | CN2202930Y Leakage electric voltage detector |
| 07/05/1995 | CN2202929Y Checking and testing apparatus for electric fittings of motor vehicles |
| 07/05/1995 | CN1104775A Fast inline inspection of capacitors |
| 07/04/1995 | US5430737 Apparatus for testing function of integrated circuit |
| 07/04/1995 | US5430736 Method and apparatus for generating test pattern for sequential logic circuit of integrated circuit |
| 07/04/1995 | US5430735 Testing integrated circuits provided on a carrier |
| 07/04/1995 | US5430668 Floating point multiplier capable of easily performing a failure detection test |
| 07/04/1995 | US5430604 Hand-held electrostatic discharge generator |
| 07/04/1995 | US5430456 Electromagnetic interference testing apparatus |
| 07/04/1995 | US5430438 Method and device for functional monitoring of an electrical load |
| 07/04/1995 | US5430400 Driver circuits for IC tester |
| 07/04/1995 | US5430394 Configuration and method for testing a delay chain within a microprocessor clock generator |
| 07/04/1995 | US5430386 Method and apparatus for evaluating semiconductor wafers by irradiation with microwave and excitation light |
| 07/04/1995 | US5430383 Method for measuring capacitive loads |
| 07/04/1995 | US5430305 Light-induced voltage alteration for integrated circuit analysis |
| 07/04/1995 | US5429889 Measurement apparatus and process for sorting used batteries and accumulators |
| 07/04/1995 | US5429519 Connector examining device |
| 07/04/1995 | US5429510 High-density interconnect technique |
| 06/29/1995 | WO1995017682A1 Device for testing connections provided with pulling resistors |
| 06/29/1995 | DE4422992C1 Battery supply testing for esp. electronic hand-held remote control for vehicle locking system |
| 06/29/1995 | DE4344785A1 System for testing HV constructional element esp. HV capacitors |
| 06/28/1995 | EP0660387A2 Method and apparatus for measuring oxide charge on a semiconductor wafer |
| 06/28/1995 | EP0660386A1 Test structure for integrated circuit |
| 06/28/1995 | EP0660385A2 Intelligent test line system |
| 06/28/1995 | EP0660241A2 Diagnostic interface circuit |
| 06/28/1995 | EP0660125A2 Method for checking the operation of a plug-in surge arrester for electrical installations |
| 06/28/1995 | EP0660105A1 Method and system for determining the two-dimensional characteristic function for a photosensitive cell |
| 06/28/1995 | EP0604470B1 Process for detecting mechanical parameters of an electric switching device |
| 06/28/1995 | EP0583348B1 Method for blocking smart card |
| 06/28/1995 | EP0417173B1 Electronic battery testing device with automatic voltage scaling |
| 06/28/1995 | CN1104355A Inter-section cross cable detection system |
| 06/27/1995 | US5428626 Timing analyzer for embedded testing |
| 06/27/1995 | US5428625 Method of controlling a self-test in a data processing system and data processing system suitable for this method |
| 06/27/1995 | US5428624 Fault injection using boundary scan |
| 06/27/1995 | US5428622 Testing architecture with independent scan paths |
| 06/27/1995 | US5428621 Latent defect handling in EEPROM devices |
| 06/27/1995 | US5428560 Simulator, in particular of thermal batteries |
| 06/27/1995 | US5428549 Transmission line fault location system |
| 06/27/1995 | US5428298 Probe structure for testing a semiconductor chip and a press member for same |
| 06/27/1995 | US5428297 For measuring current by applying a test voltage to a pin |
| 06/27/1995 | US5428295 Fault-locator for use in locating high-resistance ground faults in or on concentric-ground electrical power cables |
| 06/27/1995 | US5428294 Reverse/forward bias tester for relay and diode packages |
| 06/27/1995 | US5427536 Socket for tab testing |
| 06/27/1995 | US5427110 Circuit arrangement for the processing of physiological measurement signals |
| 06/23/1995 | CA2138704A1 Diagnostic interface circuit |
| 06/22/1995 | WO1995016924A1 Device for testing the connection between an output of a means which outputs a fixed logic value and the input of a circuit |
| 06/22/1995 | WO1995016923A1 Separate iddq-testing of signal path and bias path in an ic |
| 06/22/1995 | WO1995016922A1 Method and apparatus for the verification of an electrical insulator device based on the analysis of the electric field along the insulator |
| 06/22/1995 | DE4422261C1 Automobile immobiliser cooperating with engine control |
| 06/21/1995 | EP0658771A2 Display for electric control devices |
| 06/21/1995 | EP0658748A2 Capacitive threshold detector test circuit |
| 06/21/1995 | EP0578688B1 Used battery sorting method and apparatus |
| 06/21/1995 | EP0506655B1 Device for automatically ascertaining capacitor breakdown voltage |
| 06/21/1995 | EP0287302B1 Cross-coupled checking circuit |
| 06/21/1995 | CN2201675Y Double-comparision guide wire monitoring device |
| 06/21/1995 | CN2201674Y Line checking device |
| 06/21/1995 | CN1103985A Method and apparatus for testing a static ram |
| 06/21/1995 | CN1029035C Method for tracking temp. raising for operated motor |
| 06/21/1995 | CN1029034C Instrument for testing semiconductor diffusion length |
| 06/21/1995 | CN1029033C Method and arrangement for testing state of insulation |
| 06/20/1995 | US5426770 System for automatically determining the logical function of a circuit |
| 06/20/1995 | US5426651 Method for the automatic generation of test sequences |
| 06/20/1995 | US5426650 Full scan optimization technique using drive one/drive zero elements and multiple capture clocking |
| 06/20/1995 | US5426649 Test interface for a digital circuit |