| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/01/1995 | EP0636895A1 Test grid for tester of unpopulated printed circuits |
| 02/01/1995 | EP0636894A1 Circuit and method for inspecting the tracks of an interconnect circuit |
| 02/01/1995 | EP0636893A2 Circuit device for visually signalling leakage currents from an electric system to earth |
| 02/01/1995 | EP0636890A1 Method for comparing frequency spectrums |
| 02/01/1995 | EP0636889A1 Current estimating circuit for switch mode power supply |
| 02/01/1995 | EP0636887A1 Probe for capacitive open-circuit tests |
| 02/01/1995 | EP0636867A2 A thermocouple testing method and apparatus for detecting an open circuit |
| 02/01/1995 | EP0636866A2 Method and circuit arrangement for measuring the temperature of a barrier layer of a GTO thyristor |
| 02/01/1995 | CN1098226A Known good die array and a manufacturing method thereof |
| 01/31/1995 | US5386550 Pseudo-LSI device and debugging system incorporating same |
| 01/31/1995 | US5386423 Ordering shift register latches in a scan ring to facilitate diagnosis, testing and isolation |
| 01/31/1995 | US5386392 Programmable high speed array clock generator circuit for array built-in self test memory chips |
| 01/31/1995 | US5386197 Slidable adapter for simultaneous connection of a plurality of contacts of a backboard test module to conductors of a backboard |
| 01/31/1995 | US5386195 Method and apparatus for monitoring an electrical property of a conductive coating |
| 01/31/1995 | US5386193 Partial discharge detecting device for resin-molded transformer |
| 01/31/1995 | US5386192 Apparatus for checking the contamination condition of electric insulators |
| 01/31/1995 | US5386189 IC measuring method |
| 01/31/1995 | US5386188 In-circuit current measurement |
| 01/31/1995 | US5385487 Apparatus for electrically operating devices in a controlled environment |
| 01/31/1995 | US5385126 Engine starting system with energy management subsystem |
| 01/31/1995 | CA2020698C Intermittent fault detection system |
| 01/26/1995 | WO1995002829A1 Adapter with solid body |
| 01/26/1995 | DE4331520C1 Evaluation unit for determining the resistance of a semiconducting metal oxide sensor and use thereof |
| 01/25/1995 | EP0635789A1 Microcontroller integrated circuit with read only memory containing test program, test station and corresponding manufacturing process |
| 01/25/1995 | EP0635723A1 Buckling beam test probe assembly |
| 01/25/1995 | EP0449967B1 Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors |
| 01/25/1995 | EP0440764B1 Microcomputer based electronic trip system for circuit breakers |
| 01/25/1995 | CN2188214Y Cable fault positioning meter |
| 01/24/1995 | US5384741 Semiconductor memory device adapted for preventing a test mode operation from undesirably occurring |
| 01/24/1995 | US5384638 Sampling-type optical voltage detector utilizing movement of interference fringe |
| 01/24/1995 | US5384541 Precision timed delay measurement using phaselocked CW technique |
| 01/24/1995 | US5384540 Wire presence and identification system |
| 01/24/1995 | US5384539 Process for monitoring inductive loads for faults on the control line using sampling techniques |
| 01/24/1995 | US5384533 Testing method, testing circuit and semiconductor integrated circuit having testing circuit |
| 01/24/1995 | US5384531 Apparatus for inspecting characteristics of semiconductor chips |
| 01/24/1995 | US5384494 Programmable hold-off for integrated circuit I/O pins |
| 01/21/1995 | CA2128272A1 Transformer fault analyzer |
| 01/19/1995 | WO1995002196A1 Reusable die carrier for burn-in and burn-in process |
| 01/19/1995 | DE4423186A1 Verfahren und Einrichtung zum Testen von integrierten Schaltungen Method and device for testing integrated circuits |
| 01/19/1995 | DE4422986A1 Test equipment for electromagnetic disturbances |
| 01/19/1995 | DE4422329A1 Method and device for operating an electrical system of an electrical vehicle |
| 01/19/1995 | DE4402230C1 Method for testing whether terminal pins (posts) of an integrated circuit are electrically conductively soldered into a printed circuit and circuit arrangement for carrying out the method |
| 01/18/1995 | EP0634892A1 Light source device for an image processor |
| 01/18/1995 | EP0634020A1 Auto-self test of ac motor system |
| 01/18/1995 | CN2187798Y Rectifier on-line trouble monitoring alarm device for multi-phase rectifier |
| 01/18/1995 | CN2187797Y Digital display and automatic speech sound multimeter |
| 01/18/1995 | CN2187795Y Multi-function electricity tester |
| 01/17/1995 | US5383195 BIST circuit with halt signal |
| 01/17/1995 | US5383194 Integrated logic circuit including impedance fault detection |
| 01/17/1995 | US5383143 Self re-seeding linear feedback shift register (LFSR) data processing system for generating a pseudo-random test bit stream and method of operation |
| 01/17/1995 | US5383137 Emulation system and method for development of a low power data processor |
| 01/17/1995 | US5383136 Electrical test structure and method for measuring the relative locations of conducting features on an insulating substrate |
| 01/17/1995 | US5382946 Method and apparatus for detecting leakage resistance in an electric vehicle |
| 01/17/1995 | US5382912 Resistance monitors |
| 01/17/1995 | US5382909 Method for detecting and obtaining information about changes in variables |
| 01/17/1995 | US5382907 Data input module for inputting data by means of electrical contact for a monitoring/control installation |
| 01/17/1995 | US5382906 Method for determining an actual tripping characteristic of a relay |
| 01/17/1995 | US5381946 Method of forming differing volume solder bumps |
| 01/17/1995 | US5381701 Dust particle exposure chamber |
| 01/17/1995 | US5381585 For providing orthogonal movements of first and second levers |
| 01/17/1995 | CA2022963C Electronic control for an automatic washing machine with a reversing psc motor |
| 01/12/1995 | WO1995001573A1 Electrical test instrument |
| 01/12/1995 | WO1995001205A1 Fault-tolerant elective replacement indication for implantable medical device |
| 01/12/1995 | DE4423362A1 Vorrichtung zur Überprüfung der Kopfhörer einer Kopfhöreranordnung Device for checking the headphones a headphone device |
| 01/12/1995 | DE4322845A1 Arrangement for measuring fault currents in load circuits or the like |
| 01/12/1995 | CA2164425A1 Fault-tolerant elective replacement indication for implantable medical device |
| 01/11/1995 | EP0633666A2 Testing method and apparatus for detecting the presence of all codes |
| 01/11/1995 | EP0633530A2 Testing sequential logic circuit upon changing into combinatorial logic circuit |
| 01/11/1995 | EP0633478A2 Method and device for testing electronic circuit boards |
| 01/11/1995 | EP0633474A1 Short circuit detector for sensors |
| 01/11/1995 | EP0632901A1 Process for testing terminal resistances in ecl networks. |
| 01/11/1995 | CN2187313Y Safety power supply detector |
| 01/11/1995 | CN2187312Y Portable electric-shocking protector and leak detector |
| 01/11/1995 | CN1097253A Fault-testing method for cable |
| 01/10/1995 | US5381453 Efficient functional test scheme incorporated in a programmable duration binary counter |
| 01/10/1995 | US5381421 Per pin circuit test system having N-bit pin interface providing speed improvement with frequency multiplexing |
| 01/10/1995 | US5381420 Decoupled scan path interface |
| 01/10/1995 | US5381419 Method and apparatus for detecting retention faults in memories |
| 01/10/1995 | US5381418 For verifying correct operation of storage device |
| 01/10/1995 | US5381417 Circuit testing system |
| 01/10/1995 | US5381372 Semiconductor memory device |
| 01/10/1995 | US5381350 Process for determining the backup time of a battery |
| 01/10/1995 | US5381348 Token ring local area network testing apparatus using time delay reflectory |
| 01/10/1995 | US5381345 Logic-circuit layout pattern inspection method and logical simulation |
| 01/10/1995 | US5381344 Apparatus and method for obtaining a list of numbers of wafers for integrated circuit testing |
| 01/10/1995 | US5381131 Smoke detecting apparatus for fire alarm |
| 01/10/1995 | US5381105 Method of testing a semiconductor device having a first circuit electrically isolated from a second circuit |
| 01/10/1995 | US5381104 Method for the inspection of circuit board |
| 01/10/1995 | US5381103 System and method for accelerated degradation testing of semiconductor devices |
| 01/10/1995 | US5381100 Pulse signal measuring instrument |
| 01/10/1995 | US5381098 For detecting electromagnetic radiation emanating from power lines |
| 01/10/1995 | US5381096 Method and apparatus for measuring the state-of-charge of a battery system |
| 01/10/1995 | US5381088 Change-over type of testing equipment for non-utility power generators or the like |
| 01/10/1995 | US5381087 LSI with built-in test circuit and testing method therefor |
| 01/10/1995 | US5381085 Phase lock loop with self test circuitry and method for using the same |
| 01/10/1995 | US5381045 Circuit for AC voltage application in synchronism with pattern signal generator |
| 01/05/1995 | WO1995001087A1 Method and apparatus for non-conductively interconnecting integrated circuits |
| 01/05/1995 | WO1995001011A1 Method and apparatus for testing telecommunications equipment using a reduced redundancy test signal |
| 01/05/1995 | WO1995000971A1 Method of evaluating current-driven conductive material |
| 01/05/1995 | WO1995000864A1 Magnetic screen |