| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/06/1996 | EP0699912A2 An apparatus, method, and wafer used for testing integrated circuits formed on a product wafer |
| 03/06/1996 | EP0413817B1 Substrate examining apparatus |
| 03/05/1996 | US5497500 Method and apparatus for more efficient function synchronization in a data flow program |
| 03/05/1996 | US5497478 Memory access system and method modifying a memory interleaving scheme so that data can be read in any sequence without inserting wait cycles |
| 03/05/1996 | US5497379 Method and apparatus for selectable parallel execution of test operations |
| 03/05/1996 | US5497378 System and method for testing a circuit network having elements testable by different boundary scan standards |
| 03/05/1996 | US5497350 Integrated semiconductor memory device capable of switching from a memory mode to an internal test mode |
| 03/05/1996 | US5497332 Method and apparatus for metering and monitoring AC generators |
| 03/05/1996 | US5497322 Monitoring the characteristics of a load driver controlled by a microcontroller |
| 03/05/1996 | US5497117 Input sense circuit having selectable thresholds |
| 03/05/1996 | US5497112 Power-out reset system |
| 03/05/1996 | US5497110 Frequency monitor and error detector circuit |
| 03/05/1996 | US5497104 Flexible interface IC test clip |
| 03/05/1996 | US5497095 Apparatus for inspecting electric component for inverter circuit |
| 03/05/1996 | US5497094 Electrical circuit identification means |
| 03/05/1996 | US5497093 Method and apparatus for diagnosing a twin-coil, bi-stable, magnetically latched solenoid |
| 03/05/1996 | US5497079 Semiconductor testing apparatus, semiconductor testing circuit chip, and probe card |
| 03/05/1996 | US5497076 Determination of failure criteria based upon grain boundary electromigration in metal alloy films |
| 03/05/1996 | US5497075 Apparatus for measuring pulse energy |
| 03/05/1996 | US5495667 Method for forming contact pins for semiconductor dice and interconnects |
| 03/02/1996 | CA2157334A1 Process and device for testing the effectiveness of a lightning conductor |
| 02/29/1996 | WO1996006476A1 Apparatus comprising transient voltage suppression means |
| 02/29/1996 | WO1996006362A1 Cable fault location |
| 02/29/1996 | WO1996006360A1 Method and device for monitoring power-supply networks |
| 02/29/1996 | DE4430246A1 Verfahren und Anordnung zum Überwachen von Stromversorgungsnetzen Method and apparatus for monitoring of power supply systems |
| 02/29/1996 | DE19530669A1 Verfahren zum automatischen Auswählen eines taktsteuernden Signalpfads in umprogrammierbaren Systemen zur Hardware-Emulation A method for automatically selecting a clock-controlled signal path in reprogrammable hardware emulation systems |
| 02/28/1996 | EP0699018A1 Socket apparatus |
| 02/28/1996 | EP0698900A1 Test device for push button switches |
| 02/28/1996 | EP0698890A1 Testing an integrated circuit device |
| 02/28/1996 | EP0698889A1 Memory device |
| 02/28/1996 | EP0698850A2 Integrated circuit clocking technique and circuit therefor |
| 02/28/1996 | EP0698849A1 Semiconductor integrated circuit which can be tested by an LSI tester having a reduced number of pins |
| 02/28/1996 | EP0698848A1 Method and apparatus for testing an integrated circuit |
| 02/28/1996 | EP0698795A2 Method and apparatus for determining mechanical performance of polyphase electrical motor system |
| 02/28/1996 | EP0698794A1 Under voltage detection circuit |
| 02/28/1996 | EP0698302A1 Temperature responsive battery tester |
| 02/28/1996 | EP0698273A1 Memory iddq-testable through cumulative word line activation |
| 02/28/1996 | EP0638185B1 Process for testing modules fitted with a plurality of different components |
| 02/28/1996 | EP0578540B1 Method of testing the functionality of an ASIC and related ASIC |
| 02/28/1996 | EP0569354A4 Battery with strength indicator |
| 02/28/1996 | EP0396660B1 Method and apparatus for sensing defects in integrated circuit elements |
| 02/28/1996 | CN2221217Y Determinant and digital code signal forming board detector |
| 02/28/1996 | CN1117696A Connector cable testing apparatus and method |
| 02/28/1996 | CN1117654A Temporary package for bare die test and burn-in |
| 02/27/1996 | US5495578 Apparatus and method for changing the behavior of a computer program while retaining control of program execution |
| 02/27/1996 | US5495487 Testing buffer/register |
| 02/27/1996 | US5495486 Method and apparatus for testing integrated circuits |
| 02/27/1996 | US5495448 Memory testing through cumulative word line activation |
| 02/27/1996 | US5495384 Apparatus and method for detecting a fault in a distributed line network |
| 02/27/1996 | US5495337 Method of visualizing minute particles |
| 02/27/1996 | US5495180 DC biasing and AC loading of high gain frequency transistors |
| 02/27/1996 | US5495179 Carrier having interchangeable substrate used for testing of semiconductor dies |
| 02/27/1996 | US5495178 Method and apparatus for measuring film thickness |
| 02/27/1996 | US5495173 Method and apparatus for characterizing a differential circuit |
| 02/27/1996 | US5495170 Time varying electrical conductivity tester using frequency discrimination and power detector and methods thereof |
| 02/27/1996 | US5495155 Device in a power delivery circuit |
| 02/27/1996 | US5495154 Method and apparatus for Kelvin current sensing in a multi-phase driver for a polyphase DC motor |
| 02/27/1996 | US5494856 Apparatus and method for creating detachable solder connections |
| 02/27/1996 | US5494496 Battery voltage tester for end of cell |
| 02/27/1996 | US5494343 Method of detecting an inoperable pump motor in an anti-lock braking system |
| 02/27/1996 | US5493775 Pressure contact open-circuit detector |
| 02/22/1996 | WO1996005714A1 Method and apparatus for soldering inspection of circuit board |
| 02/22/1996 | WO1996005553A1 A high speed iddq monitor circuit |
| 02/22/1996 | WO1996005517A1 Trouble monitor device for bridge circuit |
| 02/22/1996 | WO1996005516A1 System for monitoring a dual voltage ungrounded system |
| 02/22/1996 | WO1996005508A1 Electronic battery tester with very high noise immunity |
| 02/22/1996 | EP0717837A4 Corrosion resistant cable |
| 02/22/1996 | DE4443351C1 Electrical load monitoring circuit for motor vehicle |
| 02/22/1996 | DE4429421A1 Electronic component test rig for testing resilience in different climatic conditions e.g. hot or cold temp. |
| 02/22/1996 | DE4429191A1 Algorithm for modelling status changes e.g. in electrical power transmission networks |
| 02/22/1996 | DE4429048A1 Multi-filament cable characteristics evaluation method |
| 02/22/1996 | DE19506007C1 Digital phase difference measurement circuit |
| 02/21/1996 | EP0697668A1 Apparatus and method for identifying false timing paths in digital circuits |
| 02/21/1996 | EP0697601A2 Safety test equipment for printed circuit board |
| 02/21/1996 | CN1117167A Apparatus for generating address data |
| 02/21/1996 | CN1117138A Testing fixture and method for circuit traces on a flexible substrate |
| 02/20/1996 | US5493572 Semiconductor integrated circuit with voltage limiter having different output ranges for normal operation and performing of aging tests |
| 02/20/1996 | US5493519 High voltage driver circuit with fast current limiting for testing of integrated circuits |
| 02/20/1996 | US5493507 Digital circuit design assist system for designing hardware units and software units in a desired digital circuit, and method thereof |
| 02/20/1996 | US5493504 System and method for processing logic function and fault diagnosis using binary tree representation |
| 02/20/1996 | US5493242 Status register with asynchronous read and reset and method for providing same |
| 02/20/1996 | US5493238 Parameter extraction apparatus using MISFET devices of different gate lengths |
| 02/20/1996 | US5493236 Test analysis apparatus and analysis method for semiconductor wafer using OBIC analysis |
| 02/20/1996 | US5493231 Method and apparatus for measuring the barrier height distribution in an insulated gate field effect transistor |
| 02/20/1996 | US5493210 Combined signal level meter and leakage detector |
| 02/20/1996 | US5493208 Waveform displaying method and waveform analyzing apparatus |
| 02/20/1996 | US5493199 In a battery conditioning system |
| 02/20/1996 | US5493070 Measuring cable and measuring system |
| 02/20/1996 | US5492009 Method and apparatus for testing a valve actuated by an electromagnet having an armature |
| 02/20/1996 | US5492008 Method and system for testing vehicular antilock brake system components |
| 02/20/1996 | CA2156343A1 Automatic safety test equipment for printed circuit board |
| 02/16/1996 | CA2155255A1 Low voltage sensing circuits for battery powered devices having a micro-processor |
| 02/15/1996 | WO1996004630A1 High reliability instrument system |
| 02/15/1996 | WO1996004563A1 Method of and apparatus for determining a response characteristic |
| 02/15/1996 | WO1996004562A1 A method and a system for moving a measuring means above a test object |
| 02/15/1996 | DE4428797A1 PCB and/or flat electric circuit assembly test appts. |
| 02/15/1996 | DE19528972A1 Kabeldämpfungssimulator mit einem passiven Netzwerk für serielle digitale Signalquellen Cable loss simulator with a passive network for serial digital signal sources |
| 02/14/1996 | EP0696851A1 High-performance dynamic logic compatible and scannable transparent latch |
| 02/14/1996 | EP0696742A2 Direct digital synthesis component test |
| 02/14/1996 | EP0696740A2 Multimeter-like user interface for a graphical instrument |