| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/20/1995 | US5426589 Method of and apparatus for limiting electrical loads on an electric vehicle |
| 06/20/1995 | US5426416 Automotive current sensor |
| 06/20/1995 | US5426375 Method and apparatus for optimizing high speed performance and hot carrier lifetime in a MOS integrated circuit |
| 06/20/1995 | US5426372 For testing on a circuit board |
| 06/20/1995 | US5426371 Automatic battery and charging system tester with motor-driven carbon pile loading |
| 06/20/1995 | US5426370 Spark plug voltage probe device for detecting a burning condition and reducing noise level in an internal combustion engine |
| 06/18/1995 | CA2137531A1 Capacitive threshold detector test circuit |
| 06/15/1995 | WO1995016226A1 Measuring value judging method |
| 06/15/1995 | WO1995016200A1 Battery monitor adjusted by rate of current |
| 06/14/1995 | EP0658068A2 Device for monitoring induction coils |
| 06/14/1995 | EP0657815A1 Boundary scan test system and method for testing a circuit network having analog and digital devices |
| 06/14/1995 | EP0657745A1 Measuring circuit for modular assembly of electrically series connected cells, especially for electric accumulator battery |
| 06/14/1995 | EP0657744A2 Determination of surface, insulation resistnace of printed circuit boards |
| 06/14/1995 | EP0657743A2 Testing of semiconductor devices |
| 06/14/1995 | EP0657742A2 Detection of arcs in power cables |
| 06/14/1995 | EP0657033A1 Detecting faults in power lines. |
| 06/14/1995 | EP0419734B1 Method for testing a hierarchically organised integrated circuit device, and integrated circuit device suitable for being so tested |
| 06/14/1995 | DE4410603C1 Detecting faults during inspection of masks, LCDs, circuit boards and semiconductor wafers |
| 06/14/1995 | DE4400949C1 Contactless measurement of voltages in integrated circuit |
| 06/14/1995 | DE4342389A1 Circuit for determining characteristics of solar modules |
| 06/14/1995 | DE4341924A1 Circuit for generating pulse currents in lightning simulations |
| 06/14/1995 | CN2200825Y Storage bettery tester |
| 06/14/1995 | CN1103726A Versatile production system |
| 06/14/1995 | CN1028933C Device to determine state of equipment, especially on-off state of electric equipment, by means of auxiliary contact |
| 06/14/1995 | CN1028909C Apparatus for monitoring degradation of insulation of electrical installation |
| 06/14/1995 | CA2135953A1 Circuit board manufacture |
| 06/13/1995 | US5425035 Enhanced data analyzer for use in bist circuitry |
| 06/13/1995 | US5425034 Semiconductor integrated logic circuit with internal circuit to be examined by scan path test method |
| 06/13/1995 | US5424990 Semiconductor memory having built-in voltage stress test mode |
| 06/13/1995 | US5424988 Stress test for memory arrays in integrated circuits |
| 06/13/1995 | US5424984 Semiconductor memory incorporating a plurality of data input buffers for multi-bit operation |
| 06/13/1995 | US5424962 Method and system for projecting steady state conditions of a product from transient monotonic or cyclic data |
| 06/13/1995 | US5424960 Apparatus for measuring torque, inertia moment, output and backlash using stepping motor |
| 06/13/1995 | US5424722 Device for displaying remaining electric energy of battery |
| 06/13/1995 | US5424721 Method and arrangement for advising when radio pager battery requires replacement |
| 06/13/1995 | US5424652 Method and apparatus for testing an unpackaged semiconductor die |
| 06/13/1995 | US5424651 Fixture for burn-in testing of semiconductor wafers, and a semiconductor wafer |
| 06/13/1995 | US5424634 Non-destructive flex testing method and means |
| 06/13/1995 | US5424633 Contactless test method and system for testing printed circuit boards |
| 06/13/1995 | US5424588 Self-contained, portable compact load bank and testing method; compact load bank with improved power handling capability |
| 06/08/1995 | WO1995015595A1 High-density interconnect technique |
| 06/08/1995 | DE4405527C1 Semiconductor wafer testing appts. |
| 06/08/1995 | DE4340899A1 Meßvorrichtung zum Testen der Verbindungen zwischen wenigstens zwei Baugruppen Measuring device for testing the connections between at least two modules |
| 06/08/1995 | DE4340831A1 Electric continuity tester |
| 06/07/1995 | EP0656650A1 Method of evaluating current-driven conductive material |
| 06/07/1995 | EP0656643A1 Method for determining the minority carrier surface recombination lifetime constant(ts) of a specimen of semiconductor material |
| 06/07/1995 | EP0656635A1 Device for measuring pulse energy |
| 06/07/1995 | EP0656590A2 Measuring device to test the connection between at least two subassemblies |
| 06/07/1995 | EP0656544A2 Technique and method for asynchronous scan design |
| 06/07/1995 | EP0656543A2 Withstand voltage-testing apparatus |
| 06/07/1995 | EP0461191B1 Method and apparatus for automatically calculating the integrity of an electrical coil |
| 06/07/1995 | CN2200270Y Electrothermal blanket capable of preventing electromagnetic induction |
| 06/07/1995 | CN2200190Y Apparatus for testing capacitivity of accumulator |
| 06/07/1995 | CN2200189Y Cable selector |
| 06/07/1995 | CN2200188Y Quick-acting line fault test meter |
| 06/06/1995 | US5423050 Intermodule test across system bus utilizing serial test bus |
| 06/06/1995 | US5422896 Timing check circuit for a functional macro |
| 06/06/1995 | US5422892 Integrated circuit test arrangement and method for maximizing the use of tester comparator circuitry to economically test wide data I/O memory devices |
| 06/06/1995 | US5422891 Robust delay fault built-in self-testing method and apparatus |
| 06/06/1995 | US5422824 Computerized diagnostic system for microprocessor-based, portable machinery |
| 06/06/1995 | US5422822 Apparatus for detecting remanent stored energy in storage battery and apparatus for warning of reduction in remanent stored energy in storage battery |
| 06/06/1995 | US5422724 Multiple-scan method for wafer particle analysis |
| 06/06/1995 | US5422630 Continuous monitoring electrostatic discharge system |
| 06/06/1995 | US5422595 Miniature, low cost power amplifier monitor |
| 06/06/1995 | US5422579 Method of identifying probe position and probing method in prober |
| 06/06/1995 | US5422575 Test fixture with adjustable bearings and optical alignment system |
| 06/06/1995 | US5422564 Testing apparatus |
| 06/06/1995 | US5422498 Apparatus for diagnosing interconnections of semiconductor integrated circuits |
| 06/01/1995 | DE4400194C1 Schaltungsanordnung zum Aufbereiten analoger Signale für ein Boundary-Scan-Prüfverfahren Circuit arrangement for conditioning analog signals for a boundary scan test procedure |
| 06/01/1995 | DE4340514A1 Electromagnetic compatibility characteristics test system |
| 06/01/1995 | DE4340448A1 Charge indicator for hand-held transmitter of remotely operated vehicle security system |
| 05/31/1995 | EP0655744A1 Multibit semiconductor memory device |
| 05/31/1995 | EP0655683A1 Circuit architecture and corresponding method for testing a programmable logic matrix |
| 05/31/1995 | EP0655553A1 Generation of a diagnostic signal when the current through a power transistor reaches a level close to a limit current |
| 05/31/1995 | EP0655172A1 Method for battery charging and a battery system |
| 05/31/1995 | CN2199545Y In-line tester for loose contact of CT apparatus cable |
| 05/31/1995 | CN2199544Y Optical fibre and language digit-reporting type isolator detector |
| 05/30/1995 | US5420871 Method for maintaining bus integrity during testing |
| 05/30/1995 | US5420870 Non-fully-decoded test address generator |
| 05/30/1995 | US5420869 Semiconductor integrated circuit device |
| 05/30/1995 | US5420689 High speed illumination system for microelectronics inspection |
| 05/30/1995 | US5420523 Apparatus and method for measuring performance parameters of electric motors |
| 05/30/1995 | US5420522 Method and system for fault testing integrated circuits using a light source |
| 05/30/1995 | US5420521 Burn-in module |
| 05/30/1995 | US5420520 Method and apparatus for testing of integrated circuit chips |
| 05/30/1995 | US5420513 Dielectric breakdown prediction and dielectric breakdown life-time prediction using iterative voltage step stressing |
| 05/30/1995 | US5420512 Electronic cable testing system |
| 05/30/1995 | US5420505 Direct current booster with test circuit |
| 05/30/1995 | US5420502 Fault indicator with optically-isolated remote readout circuit |
| 05/30/1995 | US5420500 Test probe |
| 05/30/1995 | US5419711 Connector inspecting apparatus |
| 05/30/1995 | US5419197 Monitoring diagnostic apparatus using neural network |
| 05/30/1995 | EP0672248A4 Electronic battery tester with automatic compensation for low state-of-charge. |
| 05/26/1995 | WO1995014314A1 Contact structure for interconnections, interposer, semiconductor assembly and method |
| 05/26/1995 | WO1995014263A1 Atg test station |
| 05/26/1995 | WO1995014239A1 Method of determining the charge status of a battery, in particular a vehicle starter battery |
| 05/26/1995 | WO1995014237A1 Device for electrically testing an electrical connection member |
| 05/26/1995 | CA2176748A1 Atg test station |
| 05/24/1995 | EP0654739A1 Automatic repair data editing system associated with repairing system for semiconductor integrated circuit device |
| 05/24/1995 | EP0654738A1 Diagnostic system |