| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/05/1995 | WO1995000857A1 Optical scan and alignment of devices under test |
| 01/05/1995 | DE4335924C1 Method and device for locating cable faults |
| 01/04/1995 | EP0632689A1 Method and apparatus for inspection of circuit boards |
| 01/04/1995 | EP0632496A2 Method of packaging electronic circuit components and packaged circuit arrangement |
| 01/04/1995 | EP0632387A2 Method and apparatus for including the states of nonscannable parts in a scan chain |
| 01/04/1995 | EP0632386A2 System and method for performing improved pseudo-random testing of systems having multi-driver buses |
| 01/04/1995 | EP0632385A1 Semiconductor integrated circuit including test circuit |
| 01/04/1995 | EP0632384A1 High speed and programmable array clock generator circuit for abist semiconductor memory chips |
| 01/04/1995 | EP0632283A1 Method and apparatus for analysis of polyphase electrical motor systems |
| 01/04/1995 | EP0632282A2 Semiconductor integrated circuit device with test mode switching |
| 01/04/1995 | EP0632281A2 Bare die testing |
| 01/04/1995 | EP0632280A2 Inter-section cross cable detection system |
| 01/04/1995 | EP0631681A1 Process for monitoring and/or detecting changes under load of the operating state of an electrical power machine |
| 01/04/1995 | EP0532616B1 Electronic circuitry for detecting leakage of chemical substance |
| 01/04/1995 | EP0364577B1 Disconnection detection apparatus for lamps |
| 01/04/1995 | CN1097081A Device for improving the current output of a chargeable battery at low outside temperatures |
| 01/03/1995 | US5379308 Apparatus for a bus-based integrated circuit test architecture |
| 01/03/1995 | US5379302 ECL test access port with low power control |
| 01/03/1995 | US5379300 Test signal output circuit for LSI |
| 01/03/1995 | US5378992 Method and apparatus for measuring the loop self impedance of shielded wiring non-intrusively utilizing the current transformer ratio of a sense current probe and the current transformer ratio of a drive current probe |
| 01/03/1995 | US5378990 Dynamic fuse testing device having test probes and fuse condition indicator carried on pivotal head |
| 01/03/1995 | US5378984 EB type IC tester |
| 01/03/1995 | US5378981 Method for testing a semiconductor device on a universal test circuit substrate |
| 01/03/1995 | US5378977 Device for making current measurements used in determining the charging of a vehicle storage battery |
| 01/03/1995 | US5378970 IC carrier capable of loading ICs of different sizes thereon |
| 01/03/1995 | US5378934 Semiconductor integrated circuit |
| 01/03/1995 | CA2127234A1 Bare die testing |
| 01/03/1995 | CA2125339A1 Inter-section cross cable detection system |
| 01/03/1995 | CA2032549C Drop testing in fiber to the home systems |
| 12/30/1994 | CA2126811A1 Method and apparatus for analysis of polyphase electrical motor systems |
| 12/29/1994 | CA2124991A1 System and method for performing improved pseudo-random testing of systems having multi driver buses |
| 12/28/1994 | EP0631235A1 Partial-scan built-in selftesting sequential circuit |
| 12/28/1994 | EP0631149A1 Method and apparatus for testing of integrated circuit chips |
| 12/28/1994 | EP0631148A1 Method for contactless testing of soldering |
| 12/28/1994 | EP0631147A1 Eddy current test method and apparatus |
| 12/28/1994 | EP0631146A1 Testing circuit and method of determining the current flowing through a sensor |
| 12/28/1994 | EP0630529A1 Electromagnetic interference testing apparatus |
| 12/28/1994 | EP0484341B1 A power supply |
| 12/28/1994 | CN1096877A Universal small current grounding system single-phase grounding selecting and locating apparatus |
| 12/28/1994 | CN1027210C Battery voltage alarm apparatus |
| 12/28/1994 | CN1027192C Device for determing the charge condition of a battery |
| 12/27/1994 | US5377278 Method and apparatus for inspecting a solderless terminal by image processing |
| 12/27/1994 | US5377203 Test data formatter |
| 12/27/1994 | US5377202 Method and apparatus for limiting pin driver offset voltages |
| 12/27/1994 | US5377201 Transitive closure based process for generating test vectors for VLSI circuit |
| 12/27/1994 | US5377200 Power saving feature for components having built-in testing logic |
| 12/27/1994 | US5377199 Boundary test scheme for an intelligent device |
| 12/27/1994 | US5377198 JTAG instruction error detection |
| 12/27/1994 | US5377197 Method for automatically generating test vectors for digital integrated circuits |
| 12/27/1994 | US5377158 Memory circuit having a plurality of input signals |
| 12/27/1994 | US5377124 Field programmable printed circuit board |
| 12/27/1994 | US5376887 Battery tester with apertures for plural types and sizes of cells |
| 12/27/1994 | US5376883 Analysis of integrated circuit operability using a focused ion beam |
| 12/27/1994 | US5376882 Method and apparatus for positioning an integrated circuit device in a test fixture |
| 12/27/1994 | US5376881 Method and apparatus for testing self-commutative electric power conversion device |
| 12/27/1994 | US5376879 Method and apparatus for evaluating electrostatic discharge conditions |
| 12/27/1994 | US5376876 Phase winding detector and alternator charging system |
| 12/27/1994 | US5376849 High resolution programmable pulse generator employing controllable delay |
| 12/27/1994 | US5376010 Burn-in socket |
| 12/22/1994 | WO1994029975A1 Fading simulator |
| 12/22/1994 | WO1994029816A1 Integrated circuit probe card inspection system |
| 12/22/1994 | WO1994029738A1 Process and device for testing an integrated circuit soldered on a board |
| 12/22/1994 | WO1994029737A1 Method and apparatus for non-intrusive testing of electromagnetic shielding of coaxial wiring |
| 12/22/1994 | WO1994029736A1 Method and device for identifying individual electric conductors |
| 12/22/1994 | CA2164415A1 Process and device for testing an integrated circuit soldered on a baord |
| 12/22/1994 | CA2164409A1 Fading simulator |
| 12/21/1994 | EP0630048A1 Method of testing dice |
| 12/21/1994 | EP0629951A1 Semiconductor integrated circuit with a test mode |
| 12/21/1994 | EP0629868A1 Flat panel display device and method of inspection of same |
| 12/21/1994 | EP0629867A1 Probe structure |
| 12/21/1994 | EP0629866A1 Method for locating faults in an electric power cable line |
| 12/21/1994 | EP0629773A1 Vehicle diagnostic method for testing electronically controlled systems |
| 12/21/1994 | CN2185900Y Intelligence news projection lamp |
| 12/21/1994 | CN2185899Y Generator rotor winding dynamic short-circuit in line testing device |
| 12/21/1994 | CN2185898Y Testing instrument for short-circuit |
| 12/21/1994 | CN1096587A Testing apparatus |
| 12/20/1994 | US5375075 Semiconductor measuring apparatus and method of preparing debugging program |
| 12/20/1994 | US5374934 Antenna mirror-surface measuring system |
| 12/20/1994 | US5374922 Device for determining the state of an apparatus, and in particular the open or closed state of an electrical apparatus by means of auxiliary contacts |
| 12/20/1994 | US5374900 Phase window test circuit |
| 12/20/1994 | US5374893 Apparatus for testing, burn-in, and/or programming of integrated circuit chips, and for placing solder bumps thereon |
| 12/20/1994 | US5374888 Electrical characteristics measurement method and measurement apparatus therefor |
| 12/20/1994 | US5374158 Probe and inverting apparatus |
| 12/20/1994 | US5373893 Method and apparatus for cooling thermally massive parts in a continuous furnace |
| 12/14/1994 | EP0628834A1 Battery operated apparatus with charge monitor |
| 12/14/1994 | EP0628833A1 System for monitoring residual capacity of battery |
| 12/14/1994 | EP0628832A2 Integrated circuit with register stages |
| 12/14/1994 | EP0628831A1 Bidirectional boundary scan test cell |
| 12/14/1994 | EP0628830A2 Reliability tester of semiconductor lasers |
| 12/14/1994 | EP0628829A1 Use of magnetic core to measure partial discharge |
| 12/14/1994 | EP0628827A1 IC device including a level detection circuit of an operating voltage |
| 12/14/1994 | EP0605419A4 Battery voltage measurement system. |
| 12/14/1994 | EP0521990B1 Measurement device and method for sorting used batteries and accumulators |
| 12/14/1994 | CN2185442Y Grounding point tester for DC system |
| 12/13/1994 | US5373514 Three-state bus structure and method for generating test vectors while avoiding contention and/or floating outputs on the three-state bus |
| 12/13/1994 | US5373510 Test circuit of input architecture of erasable and programmable logic device |
| 12/13/1994 | US5373472 Semiconductor memory apparatus |
| 12/13/1994 | US5373241 Electric arc and radio frequency spectrum detection |
| 12/13/1994 | US5373233 Method for the recognition of testing errors in the test of microwirings |
| 12/13/1994 | US5373232 Method of and articles for accurately determining relative positions of lithographic artifacts |