Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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12/13/1994 | US5372898 Universal inexpensive battery state-of-charge indicator |
12/12/1994 | CA2120557A1 Method and apparatus for testing of integrated circuit chips |
12/08/1994 | WO1994028566A1 Partial discharge passive monitor |
12/08/1994 | WO1994028433A1 Gps synchronized frequency/time source |
12/08/1994 | DE4416490A1 Verfahren und Vorrichtung zum Testen integrierter Schaltungen in einer Mischsignalumgebung Method and device for testing integrated circuits in a mixed signal environment |
12/08/1994 | DE4337020C1 Method for monitoring the battery of a hybrid vehicle |
12/08/1994 | DE4318422A1 Integrierte Schaltung mit Registerstufen Integrated circuit with register stages |
12/07/1994 | EP0627685A1 Method and device for testing the components of a system for transmission of data |
12/07/1994 | EP0627631A2 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
12/07/1994 | EP0627622A2 An ion current detector device for use in an internal combustion engine |
12/07/1994 | EP0627134A1 Method and apparatus for monitoring battery capacity with charge control |
12/07/1994 | EP0627085A1 Detection of location of faults in cables |
12/07/1994 | EP0627083A1 Method and apparatus for electronic meter testing |
12/07/1994 | CN2184934Y Cable break point tester |
12/07/1994 | CN1096104A Output coupling to high frequency breakdown signals from middle high frequency electric magnetic field of large motor |
12/06/1994 | US5371851 Graphical data base editor |
12/06/1994 | US5371749 Apparatus for preventing an error operation during part withdrawal |
12/06/1994 | US5371712 Semiconductor memory device having detection circuitry for sensing faults in word lines |
12/06/1994 | US5371682 Method and apparatus for predicting battery reserve time to a specified end-voltage |
12/06/1994 | US5371654 Three dimensional high performance interconnection package |
12/06/1994 | US5371487 In a diagnostic system |
12/06/1994 | US5371459 Method for particle beam testing of substrates for liquid crystal displays using parasitic currents |
12/06/1994 | US5371458 Method for determining the stator flux of an asynchronous machine |
12/06/1994 | US5371457 Method and apparatus to test for current in an integrated circuit |
12/06/1994 | US5371390 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits |
12/06/1994 | US5371375 Method for obtaining three-dimensional data from multiple parts or devices in a multi-pocketed tray |
12/06/1994 | US5371352 Photodetector comprising a test element group of PN junctions and including a mask having at least one window spaced apart from the PN junctions |
12/06/1994 | US5370841 Microwave leakage detector |
12/06/1994 | US5370668 Fault-tolerant elective replacement indication for implantable medical device |
12/06/1994 | US5369991 Automative diagnostic testing apparatus |
12/01/1994 | DE4418892A1 Microcomputer |
12/01/1994 | DE4418439A1 Scanning electron microscope |
12/01/1994 | DE4418124A1 Device for recognising insulation deterioration on power-supply cables |
12/01/1994 | DE4334859A1 Apparatus for testing and/or programming electronic control devices in a motor vehicle |
12/01/1994 | DE4317243A1 Coupling circuit |
11/30/1994 | EP0626735A1 Battery with tester label and method for producing it |
11/30/1994 | EP0626586A1 Method and apparatus for testing an immunity to electromagnetic interference and apparatus for irradiating radio waves for immunity test |
11/30/1994 | EP0626585A1 Programmable and fully electronic transistor measuring apparatus |
11/30/1994 | EP0350943B1 Semiconductor integrated circuit including output buffer |
11/30/1994 | CN1095872A 自动测试时钟选择设备 Automatic Test Equipment Clock Selection |
11/30/1994 | CN1026839C Automatic protector for automobile electrical appliance |
11/29/1994 | USRE34802 Non-linear photosite response in CCD imagers |
11/29/1994 | US5369648 Built-in self-test circuit |
11/29/1994 | US5369646 Semiconductor integrated circuit device having test circuit |
11/29/1994 | US5369645 Testing integrated circuit pad input and output structures |
11/29/1994 | US5369643 Method and apparatus for mapping test signals of an integrated circuit |
11/29/1994 | US5369604 Method of using a computer to automatically generate a test plan |
11/29/1994 | US5369593 System for and method of connecting a hardware modeling element to a hardware modeling system |
11/29/1994 | US5369492 Bonding wire inspection apparatus |
11/29/1994 | US5369491 Method for measuring the reciprocal displacement of the layers of a multilayer arrangement and apparatus for performing this method |
11/29/1994 | US5369431 Verification and repair station of PCBS |
11/29/1994 | US5369392 Method and apparatus for indicating faults in switch-type inputs |
11/29/1994 | US5369373 Comb data generation |
11/29/1994 | US5369372 Method for resistance measurements on a semiconductor element with controlled probe pressure |
11/29/1994 | US5369367 Microwave testing system |
11/29/1994 | US5369366 Method of finding faults in a branched electrical distribution circuit |
11/29/1994 | US5369364 Battery state of charge determination with plural periodic measurements to determine its internal impedance and geometric capacitance |
11/29/1994 | US5369363 Implement for removing and installing and testing Christmas light bulbs |
11/29/1994 | US5369359 Particle beam testing method with countervoltage or retarding voltage follow-up or feedback |
11/29/1994 | US5369358 Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation |
11/29/1994 | US5367763 TAB testing of area array interconnected chips |
11/24/1994 | WO1994027336A1 Temperature responsive battery tester |
11/24/1994 | DE4316471A1 Device and method for determining the charging state of a rechargeable battery |
11/24/1994 | CA2162290A1 Temperature responsive battery tester |
11/23/1994 | EP0625710A2 Method of inspecting solenoid valves and associated measuring device |
11/23/1994 | EP0594830A4 System for monitoring circuit breaker operations and alerting need of preventative maintenance. |
11/23/1994 | EP0521860B1 Process for monitoring faults in inductive loads |
11/23/1994 | CN2183628Y Digital-display phase-loose protecting relay |
11/23/1994 | CN2183573Y Electric-leakage testing plug |
11/23/1994 | CN2183572Y Drain voltage inductor |
11/23/1994 | CN2183571Y Electricity-leakage alarm for domestic electric appliance |
11/23/1994 | CN1026727C Scan test circuit for use with multiple frequency circuits |
11/22/1994 | US5367551 Integrated circuit containing scan circuit |
11/22/1994 | US5367492 Semiconductor memory device providing reduced test time |
11/22/1994 | US5367491 Apparatus for automatically initiating a stress mode of a semiconductor memory device |
11/22/1994 | US5367455 Running performance control apparatus and method for an electric vehicle |
11/22/1994 | US5367436 Probe terminating apparatus for an in-circuit emulator |
11/22/1994 | US5367263 Semiconductor integrated circuit device and test method therefor |
11/22/1994 | US5367253 Clamped carrier for testing of semiconductor dies |
11/22/1994 | US5367208 Reconfigurable programmable interconnect architecture |
11/22/1994 | US5367207 Structure and method for programming antifuses in an integrated circuit array |
11/22/1994 | US5367174 Defect detecting device for two-layer parts, in particular for solar cells |
11/22/1994 | US5366906 Wafer level integration and testing |
11/17/1994 | EP0624915A1 Method for securing a tester device to a battery and the battery so produced |
11/17/1994 | EP0624914A1 Battery with tester label and method for producing it |
11/17/1994 | EP0624803A1 Circuit tester for electrical protection device |
11/17/1994 | EP0624801A1 Inspection apparatus, inspection method and semiconductor device |
11/17/1994 | DE4331954C1 Method and device for testing the correct seating of metallic mounting elements on a printed circuit board, as well as a printed circuit board which can be tested by means of the method and the device |
11/17/1994 | DE4316239A1 Method for arc identification |
11/17/1994 | DE4316111A1 Integrated circuit test board suitable for high-temperature measurements |
11/17/1994 | DE4313333C1 Device for connecting electronic printed circuit boards |
11/16/1994 | CN2183000Y Arrangement for quick-testing circuit breaker |
11/16/1994 | CN2182999Y Multi function instrument for testing electric circuit of automobile |
11/16/1994 | CN1095163A High-intelligent cable fault scintillation detector |
11/15/1994 | US5365587 Data processing system |
11/15/1994 | US5365528 Method for testing delay faults in non-scan sequential circuits |
11/15/1994 | US5365527 Logical comparison circuit |
11/15/1994 | US5365463 Method for evaluating the timing of digital machines with statistical variability in their delays |
11/15/1994 | US5365453 System for indicating a low battery condition |
11/15/1994 | US5365438 Audible and visual feedback for user stimulated self-test diagnostics |