Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1994
12/13/1994US5372898 Universal inexpensive battery state-of-charge indicator
12/12/1994CA2120557A1 Method and apparatus for testing of integrated circuit chips
12/08/1994WO1994028566A1 Partial discharge passive monitor
12/08/1994WO1994028433A1 Gps synchronized frequency/time source
12/08/1994DE4416490A1 Verfahren und Vorrichtung zum Testen integrierter Schaltungen in einer Mischsignalumgebung Method and device for testing integrated circuits in a mixed signal environment
12/08/1994DE4337020C1 Method for monitoring the battery of a hybrid vehicle
12/08/1994DE4318422A1 Integrierte Schaltung mit Registerstufen Integrated circuit with register stages
12/07/1994EP0627685A1 Method and device for testing the components of a system for transmission of data
12/07/1994EP0627631A2 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
12/07/1994EP0627622A2 An ion current detector device for use in an internal combustion engine
12/07/1994EP0627134A1 Method and apparatus for monitoring battery capacity with charge control
12/07/1994EP0627085A1 Detection of location of faults in cables
12/07/1994EP0627083A1 Method and apparatus for electronic meter testing
12/07/1994CN2184934Y Cable break point tester
12/07/1994CN1096104A Output coupling to high frequency breakdown signals from middle high frequency electric magnetic field of large motor
12/06/1994US5371851 Graphical data base editor
12/06/1994US5371749 Apparatus for preventing an error operation during part withdrawal
12/06/1994US5371712 Semiconductor memory device having detection circuitry for sensing faults in word lines
12/06/1994US5371682 Method and apparatus for predicting battery reserve time to a specified end-voltage
12/06/1994US5371654 Three dimensional high performance interconnection package
12/06/1994US5371487 In a diagnostic system
12/06/1994US5371459 Method for particle beam testing of substrates for liquid crystal displays using parasitic currents
12/06/1994US5371458 Method for determining the stator flux of an asynchronous machine
12/06/1994US5371457 Method and apparatus to test for current in an integrated circuit
12/06/1994US5371390 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits
12/06/1994US5371375 Method for obtaining three-dimensional data from multiple parts or devices in a multi-pocketed tray
12/06/1994US5371352 Photodetector comprising a test element group of PN junctions and including a mask having at least one window spaced apart from the PN junctions
12/06/1994US5370841 Microwave leakage detector
12/06/1994US5370668 Fault-tolerant elective replacement indication for implantable medical device
12/06/1994US5369991 Automative diagnostic testing apparatus
12/01/1994DE4418892A1 Microcomputer
12/01/1994DE4418439A1 Scanning electron microscope
12/01/1994DE4418124A1 Device for recognising insulation deterioration on power-supply cables
12/01/1994DE4334859A1 Apparatus for testing and/or programming electronic control devices in a motor vehicle
12/01/1994DE4317243A1 Coupling circuit
11/1994
11/30/1994EP0626735A1 Battery with tester label and method for producing it
11/30/1994EP0626586A1 Method and apparatus for testing an immunity to electromagnetic interference and apparatus for irradiating radio waves for immunity test
11/30/1994EP0626585A1 Programmable and fully electronic transistor measuring apparatus
11/30/1994EP0350943B1 Semiconductor integrated circuit including output buffer
11/30/1994CN1095872A 自动测试时钟选择设备 Automatic Test Equipment Clock Selection
11/30/1994CN1026839C Automatic protector for automobile electrical appliance
11/29/1994USRE34802 Non-linear photosite response in CCD imagers
11/29/1994US5369648 Built-in self-test circuit
11/29/1994US5369646 Semiconductor integrated circuit device having test circuit
11/29/1994US5369645 Testing integrated circuit pad input and output structures
11/29/1994US5369643 Method and apparatus for mapping test signals of an integrated circuit
11/29/1994US5369604 Method of using a computer to automatically generate a test plan
11/29/1994US5369593 System for and method of connecting a hardware modeling element to a hardware modeling system
11/29/1994US5369492 Bonding wire inspection apparatus
11/29/1994US5369491 Method for measuring the reciprocal displacement of the layers of a multilayer arrangement and apparatus for performing this method
11/29/1994US5369431 Verification and repair station of PCBS
11/29/1994US5369392 Method and apparatus for indicating faults in switch-type inputs
11/29/1994US5369373 Comb data generation
11/29/1994US5369372 Method for resistance measurements on a semiconductor element with controlled probe pressure
11/29/1994US5369367 Microwave testing system
11/29/1994US5369366 Method of finding faults in a branched electrical distribution circuit
11/29/1994US5369364 Battery state of charge determination with plural periodic measurements to determine its internal impedance and geometric capacitance
11/29/1994US5369363 Implement for removing and installing and testing Christmas light bulbs
11/29/1994US5369359 Particle beam testing method with countervoltage or retarding voltage follow-up or feedback
11/29/1994US5369358 Method of ensuring electrical contact between test probes and chip pads through the use of vibration and nondestructive deformation
11/29/1994US5367763 TAB testing of area array interconnected chips
11/24/1994WO1994027336A1 Temperature responsive battery tester
11/24/1994DE4316471A1 Device and method for determining the charging state of a rechargeable battery
11/24/1994CA2162290A1 Temperature responsive battery tester
11/23/1994EP0625710A2 Method of inspecting solenoid valves and associated measuring device
11/23/1994EP0594830A4 System for monitoring circuit breaker operations and alerting need of preventative maintenance.
11/23/1994EP0521860B1 Process for monitoring faults in inductive loads
11/23/1994CN2183628Y Digital-display phase-loose protecting relay
11/23/1994CN2183573Y Electric-leakage testing plug
11/23/1994CN2183572Y Drain voltage inductor
11/23/1994CN2183571Y Electricity-leakage alarm for domestic electric appliance
11/23/1994CN1026727C Scan test circuit for use with multiple frequency circuits
11/22/1994US5367551 Integrated circuit containing scan circuit
11/22/1994US5367492 Semiconductor memory device providing reduced test time
11/22/1994US5367491 Apparatus for automatically initiating a stress mode of a semiconductor memory device
11/22/1994US5367455 Running performance control apparatus and method for an electric vehicle
11/22/1994US5367436 Probe terminating apparatus for an in-circuit emulator
11/22/1994US5367263 Semiconductor integrated circuit device and test method therefor
11/22/1994US5367253 Clamped carrier for testing of semiconductor dies
11/22/1994US5367208 Reconfigurable programmable interconnect architecture
11/22/1994US5367207 Structure and method for programming antifuses in an integrated circuit array
11/22/1994US5367174 Defect detecting device for two-layer parts, in particular for solar cells
11/22/1994US5366906 Wafer level integration and testing
11/17/1994EP0624915A1 Method for securing a tester device to a battery and the battery so produced
11/17/1994EP0624914A1 Battery with tester label and method for producing it
11/17/1994EP0624803A1 Circuit tester for electrical protection device
11/17/1994EP0624801A1 Inspection apparatus, inspection method and semiconductor device
11/17/1994DE4331954C1 Method and device for testing the correct seating of metallic mounting elements on a printed circuit board, as well as a printed circuit board which can be tested by means of the method and the device
11/17/1994DE4316239A1 Method for arc identification
11/17/1994DE4316111A1 Integrated circuit test board suitable for high-temperature measurements
11/17/1994DE4313333C1 Device for connecting electronic printed circuit boards
11/16/1994CN2183000Y Arrangement for quick-testing circuit breaker
11/16/1994CN2182999Y Multi function instrument for testing electric circuit of automobile
11/16/1994CN1095163A High-intelligent cable fault scintillation detector
11/15/1994US5365587 Data processing system
11/15/1994US5365528 Method for testing delay faults in non-scan sequential circuits
11/15/1994US5365527 Logical comparison circuit
11/15/1994US5365463 Method for evaluating the timing of digital machines with statistical variability in their delays
11/15/1994US5365453 System for indicating a low battery condition
11/15/1994US5365438 Audible and visual feedback for user stimulated self-test diagnostics