| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/28/1995 | US5394100 Probe system with automatic control of contact pressure and probe alignment |
| 02/28/1995 | US5394098 Apparatus including electro-optical material for use in testing a circuit having voltage-bearing elements proximate a surface of a body |
| 02/28/1995 | US5394093 Method and apparatus for testing vehicle engine sensors |
| 02/28/1995 | US5394089 Battery monitor which indicates remaining capacity by continuously monitoring instantaneous power consumption relative to expected hyperbolic discharge rates |
| 02/28/1995 | US5394084 Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements |
| 02/28/1995 | US5394025 Power dissipation system |
| 02/28/1995 | US5393991 Hybrid integrated circuit device having burn-in testing means |
| 02/28/1995 | US5393618 Battery with tester label and method for producing it |
| 02/28/1995 | US5393246 Transmission power testing bar of cable television system |
| 02/23/1995 | WO1995005726A1 Edge-connecting printed circuit board |
| 02/23/1995 | WO1995005695A1 Arrangement for detecting stator earth leakages in three-phase current machines |
| 02/23/1995 | DE4429442A1 Connection-terminal testing device and method for testing connection terminals |
| 02/23/1995 | DE4342386C1 Method and device for prefabrication of telephone plugs |
| 02/23/1995 | CA2167065A1 Edge-connecting printed circuit board |
| 02/22/1995 | EP0639879A2 Arc detection using current variation |
| 02/22/1995 | EP0639855A1 Apparatus for recognizing the shape of a semiconductor wafer |
| 02/22/1995 | EP0639812A2 Synchronizing asynchronous circuits for testing operations |
| 02/22/1995 | EP0639778A2 Fault based diagnosis of HBT-based circuits using electroluminescence |
| 02/22/1995 | EP0435636B1 Testing of integrated circuits using clock bursts |
| 02/22/1995 | EP0267271B1 In-system programmable logic device |
| 02/22/1995 | CN1099192A Method and apparatus for battery charging |
| 02/22/1995 | CN1099167A Method and apparatus for including the states of nonscannable parts in a scan chain |
| 02/22/1995 | CN1099166A System and method for performing improved pseudo-random testing of systems having multi driver buses |
| 02/22/1995 | CN1099138A Transformer winding damage testing system and hot-line examination |
| 02/21/1995 | US5392418 Programmable read only memory with output indicating programming state |
| 02/21/1995 | US5392360 Method and apparatus for inspection of matched substrate heatsink and hat assemblies |
| 02/21/1995 | US5392298 Testing apparatus for exactly discriminating defective product from acceptable product and testing method used therein |
| 02/21/1995 | US5392297 Method for automatic isolation of functional blocks within integrated circuits |
| 02/21/1995 | US5392296 Testing circuit provided in digital logic circuits |
| 02/21/1995 | US5392293 Built-in current sensor for IDDQ testing |
| 02/21/1995 | US5392219 Determination of interconnect stress test current |
| 02/21/1995 | US5391993 Capacitive open-circuit test employing threshold determination |
| 02/21/1995 | US5391991 Cable shield resistance test set |
| 02/21/1995 | US5391985 Method and apparatus for measuring high speed logic states using voltage imaging with burst clocking |
| 02/21/1995 | US5391984 Method and apparatus for testing integrated circuit devices |
| 02/21/1995 | US5391909 Detection of electron-beam scanning of a substrate |
| 02/21/1995 | US5391892 Semiconductor wafers having test circuitry for individual dies |
| 02/21/1995 | US5391885 Method of detecting and analyzing defective portion of semiconductor element and apparatus for detecting and analyzing the same |
| 02/21/1995 | US5391082 Conductive wedges for interdigitating with adjacent legs of an IC or the like |
| 02/16/1995 | WO1995004971A1 Voice trouble-shooting system for computer-controlled machines |
| 02/16/1995 | WO1995004938A1 Method for estimating the remaining charge in a storage battery |
| 02/16/1995 | WO1995004937A1 Method for recalibrating a battery power control processor |
| 02/16/1995 | WO1995004936A1 Process and device for monitoring the temperature of an electric generator |
| 02/16/1995 | WO1995004935A1 Method and apparatus for testing frequency-dependent electrical circuits |
| 02/16/1995 | WO1995004674A1 Circuitry for regulating braking systems with an antilocking system and/or a drive slip control |
| 02/16/1995 | DE4326640A1 Measuring device for the travel of a moving part on an electrical switching device, and a method for operating a switching device by means of a measuring device |
| 02/16/1995 | CA2146347A1 Method for recalibrating a battery power control processor |
| 02/16/1995 | CA2146346A1 Method for estimating the remaining charge in a storage battery |
| 02/15/1995 | EP0639006A1 Multiplexed control pins for in-system programming and boundary scan testing using state machines in a high density programmable logic device |
| 02/15/1995 | EP0638981A1 Motor current status sensor |
| 02/15/1995 | EP0638902A2 Selector circuit selecting and outputting voltage applied to one of first and second terminal in response to voltage level applied to first terminal |
| 02/15/1995 | EP0638812A2 Device for monitoring electrical faults in a tripping device of an electrical installation |
| 02/15/1995 | EP0638801A1 Method of inspecting the array of balls of an integrated circuit module |
| 02/15/1995 | EP0638185A1 Process for testing modules fitted with a plurality of different components. |
| 02/15/1995 | EP0560940B1 Apparatus for a minimal memory in-circuit digital tester |
| 02/15/1995 | EP0549602B1 Integrated circuit, system and method for fault insertion |
| 02/15/1995 | EP0336444B1 Semiconductor integrated circuit device having improved input/output interface circuit |
| 02/15/1995 | CN2189749Y Alarm for monitoring far distance condition of SCR unintermittent power supply |
| 02/15/1995 | CN2189748Y Multi-function electroscope |
| 02/14/1995 | US5390194 ATG test station |
| 02/14/1995 | US5390193 Test pattern generation |
| 02/14/1995 | US5390192 High-speed pattern generator |
| 02/14/1995 | US5390191 Apparatus and method for testing the interconnection between integrated circuits |
| 02/14/1995 | US5390190 Inter-domain latch for scan based design |
| 02/14/1995 | US5390189 Semiconductor integrated circuit |
| 02/14/1995 | US5390131 Apparatus and method for displaying wafer test results in real time |
| 02/14/1995 | US5390129 Universal burn-in driver system and method therefor |
| 02/14/1995 | US5389990 Method for measuring DC current/voltage characteristic of semiconductor device |
| 02/14/1995 | US5389882 For measuring physical parameters |
| 02/14/1995 | US5389874 Method for control of ground bounce above an internal ground plane in a short-wire board test fixture |
| 02/14/1995 | US5389873 Pressure contact chip and wafer testing device |
| 02/14/1995 | US5389556 Individually powering-up unsingulated dies on a wafer |
| 02/14/1995 | US5389470 Temperature responsive battery tester |
| 02/14/1995 | US5389458 Test circuit device thermally insulated from battery and activated by depressing selected area of label containing thermally sensitive material |
| 02/14/1995 | US5388998 Method and system for producing electrically interconnected circuits |
| 02/13/1995 | CA2129499A1 Motor current status sensor |
| 02/09/1995 | WO1995004286A1 Apparatus and method for detecting alignment of contacts in a multi-substrate electronic assembly |
| 02/09/1995 | DE4426538A1 Driver circuits for IC testing devices |
| 02/09/1995 | CA2143760A1 Apparatus and method for detecting alignment of contacts in a multi-substrate electronic assembly |
| 02/08/1995 | EP0637754A1 Battery capacity meter |
| 02/07/1995 | US5388136 X-ray inspection apparatus for electronic circuits |
| 02/07/1995 | US5388077 Test device for semiconductor memory device |
| 02/07/1995 | US5388052 Method of operating an induction motor |
| 02/07/1995 | US5387899 Alarm system with monitoring circuit for detecting a cut or short in a pair of wires |
| 02/07/1995 | US5387871 Method of testing characteristics of battery set |
| 02/07/1995 | US5387862 Powered testing of mixed conventional/boundary-scan logic |
| 02/07/1995 | US5387861 Programmable low profile universally selectable burn-in board assembly |
| 02/07/1995 | US5387819 Crash detection apparatus of air bag system |
| 02/07/1995 | US5387788 Method and apparatus for positioning and biasing an electro-optic modulator of an electro-optic imaging system |
| 02/03/1995 | CA2119702A1 Method and apparatus for determining partial discharge sites in cables |
| 02/02/1995 | WO1995003589A1 Robust delay fault built-in self-testing method and apparatus |
| 02/02/1995 | DE4403768A1 Analysis system for integrated circuits, electron-beam measuring sensor system, and associated fault isolation methods |
| 02/02/1995 | DE4325155A1 Supply circuit for a plurality of mutually parallel-operated low-voltage halogen lamps |
| 02/01/1995 | EP0637134A1 Variable impedance delay elements |
| 02/01/1995 | EP0637036A2 Redundancy element check in IC memory without programming substitution of redundant elements |
| 02/01/1995 | EP0637034A1 Method for detecting faulty elements of a redundancy semiconductor memory |
| 02/01/1995 | EP0636976A1 Microcontroller provided with hardware for supporting debugging as based on boundary scan standard-type extensions |
| 02/01/1995 | EP0636955A1 Control unit for vehicle and total control system therefor |
| 02/01/1995 | EP0636897A1 Power managing apparatus and method |
| 02/01/1995 | EP0636896A1 Boundary scan cell |