Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1995
11/14/1995US5467315 Semiconductor memory device facilitated with plural self-refresh modes
11/14/1995US5467314 Method of testing an address multiplexed dynamic RAM
11/14/1995US5467294 For generating programmable digital sine and cosine waves
11/14/1995US5467292 Logical operation method employing parallel arithmetic unit
11/14/1995US5467026 Method for minimizing current flow through a logic gate
11/14/1995US5467024 Integrated circuit test with programmable source for both AC and DC modes of operation
11/14/1995US5467023 Connector inspecting apparatus having size regulating member for retainer test fitting probes external to the connetor for retainer integrity detection
11/14/1995US5467020 Testing fixture and method for circuit traces on a flexible substrate
11/14/1995US5467011 System for detection of the phase of an electrical signal on an alternating circuit power line
11/14/1995US5465850 Integrated circuit test system
11/09/1995WO1995030307A1 Method and apparatus to detect capillary indentations
11/09/1995WO1995030230A2 Scannable d-flip-flop with system independent clocking
11/09/1995WO1995030155A1 Testable solid state switch and related method
11/09/1995DE4415398A1 Interface test device e.g. for X=ray diagnostic unit
11/08/1995EP0681295A1 Burn-in method for nonvolatile flash - EPROM memory devices
11/08/1995EP0681272A2 Apparatus and method for determining a time that a system's main power was inactive
11/08/1995EP0681187A2 Instrument and method for testing local area network cables
11/08/1995EP0681186A2 Method for probing a semiconductor wafer
11/08/1995EP0680672A1 Retriggered oscillator for jitter-free phase locked loop frequency synthesis
11/08/1995EP0680613A1 Method of determining the charge status of a battery, in particular a vehicle starter battery
11/08/1995EP0680612A1 Current surge indicator.
11/08/1995EP0653073A4 Electric arc detector.
11/08/1995EP0596895B1 Process and device for testing and locating electrical short circuits for lines, especially for electric railway catenaries
11/08/1995CN2212298Y Testing type wrist band seat
11/08/1995CN2212281Y Cell metering charger
11/08/1995CN2212209Y Circuit fault detector of motor vehicle
11/08/1995CN2212208Y Computer controlled relay protective detector
11/08/1995CN1111357A Printed circuit board test fixture and method
11/08/1995CN1111356A Controller for automatic detecting status of emergency lamp
11/07/1995US5465383 System for forming test patterns for large scale integrated circuits
11/07/1995US5465287 In a telephone system
11/07/1995US5465259 LSI system with a plurality of LSIs having different scan systems and provided on a printed circuit board
11/07/1995US5465257 Test signal output circuit in LSI
11/07/1995US5465112 Testing apparatus for detecting an image signal in radio waves leaking from an information processing system
11/07/1995US5465066 Waveform formatter
11/07/1995US5465065 Coupled to a transmitting device
11/07/1995US5465053 Electronic drive circuits for active matrix devices, and a method of self-testing and programming such circuits
11/07/1995US5465052 Method of testing liquid crystal display substrates
11/07/1995US5465050 Signal-to-noise generator for evaluating the dynamic range of a system
11/07/1995US5465043 Non-contact type probe and non-contact type voltage measuring apparatus, wherein the probe's irradiation surface is coated with a conductive film having a pinhole
11/02/1995WO1995029553A1 Self-powered powerline sensor
11/02/1995WO1995029406A1 Test system for equipped and unequipped printed circuit boards
11/02/1995EP0680050A1 Flash EEPROM with auto-function for automatically writing or erasing data
11/02/1995EP0680044A2 Method for analysis and equalisation of signals
11/02/1995EP0679899A1 Detector comprising a plurality of local detectors, in particular photodiodes
11/02/1995EP0679898A2 Insulation state measurement method for decentralized power generating system
11/02/1995EP0679295A1 Load analysis system for fault detection
11/02/1995EP0679262A1 Non-contact current injection apparatus and method for use with linear bipolar circuits.
11/02/1995EP0679261A1 Method and apparatus for measuring partial discharges in cables.
11/02/1995EP0460352B1 System for test data storage reduction
11/02/1995DE4414933A1 Signalling sticking relay contacts in DC motor controller
11/02/1995DE4414770A1 Testsystem für bestückte und unbestückte Leiterplatten Test system for loaded and bare boards
11/02/1995DE4411137A1 Test device for waterproof plug-connector
11/02/1995CA2188273A1 Test system for equipped and unequipped printed circuit boards
11/01/1995CN1111017A Multi-bit test circuit of semiconductor memory device
10/1995
10/31/1995US5463638 Control device for interface control between a test machine and multi-channel electronic circuitry, in particular according to boundary test standard
10/31/1995US5463636 Semiconductor memory device with built-in confirmation unit for accelerating test
10/31/1995US5463635 Semiconductor memory device including means for checking the operation of an internal address generator
10/31/1995US5463563 Automatic logic model generation from schematic data base
10/31/1995US5463562 Design automation method for digital electronic circuits
10/31/1995US5463545 Functional redundancy control system
10/31/1995US5463459 Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
10/31/1995US5463325 Apparatus for measuring characteristics of electronic parts
10/31/1995US5463324 Probe with contacts that interdigitate with and wedge between adjacent legs of an IC or the like
10/31/1995US5463317 Shield integrity monitor
10/31/1995US5463315 Spike suppression for a tester circuit for integrated circuits
10/31/1995US5463305 Fast battery charging system and method
10/31/1995US5463227 Method for obtaining three-dimensional data from multiple parts or devices in a multi-pocketed tray
10/31/1995US5461908 For testing the operation of an automotive idle air control motor
10/31/1995CA2013559C Intelligent battery system
10/26/1995WO1995028737A1 Method and apparatus for automatically positioning electronic die within component packages
10/26/1995WO1995028648A1 Process and test liquid for checking the efficiency of an electric power station component
10/26/1995WO1995028647A1 Test liquid for checking the efficiency of electric power station components
10/26/1995WO1995028617A1 Programmable cable adaptor
10/26/1995DE4413649A1 Location of permanent earth shorts
10/26/1995DE4413585A1 Circuit for dielectric diagnosis of electrical insulation
10/26/1995CA2185913A1 Programmable cable adaptor
10/25/1995EP0678915A2 Integrated semiconductor device with an EEPROM, semiconductor substrate with such integrated circuits and method for use of such a semiconductor substrate
10/25/1995EP0678911A2 System and method for inspecting semiconducter wafers
10/25/1995EP0678910A2 Inspection system for semiconductor wafers
10/25/1995EP0678813A1 Floating point multiplier
10/25/1995EP0678753A1 Measuring circuit for electric cells mounted in series
10/25/1995EP0678752A1 Method for opens/shorts testing of capacity coupled networks in substrates using electron beams
10/25/1995EP0678750A1 Appliance and method for measuring current
10/25/1995EP0678749A2 High frequency switch and method of testing H-F apparatus
10/25/1995CN1110788A Testing device of a.c. frequency-change governing system
10/24/1995US5461575 Simulation of sequential circuits for calculating timing characteristics to design/manufacture a logic network
10/24/1995US5461573 VLSI circuits designed for testability and methods for producing them
10/24/1995US5461572 Layout pattern verification apparatus
10/24/1995US5461358 Resistance measurement circuit for external deployment path of sir system
10/24/1995US5461329 Method and apparatus for generating motor current spectra to enhance motor system fault detection
10/24/1995US5461328 Fixture for burn-in testing of semiconductor wafers
10/24/1995US5461326 Self leveling and self tensioning membrane test probe
10/24/1995US5461324 Split-fixture configuration and method for testing circuit traces on a flexible substrate
10/24/1995US5461323 Method and apparatus of testing both surfaces of printed circuit board simultaneously
10/24/1995US5461318 Apparatus and method for improving a time domain reflectometer
10/24/1995US5461317 Device for testing for a high voltage on the chassis of a piece of electronic apparatus
10/24/1995US5461310 Automatic test equipment system using pin slice architecture
10/24/1995US5461258 Semiconductor device socket
10/24/1995US5460902 Temperature responsive battery tester
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