Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1995
10/24/1995US5460901 Battery identification
10/24/1995US5460538 Socket
10/19/1995WO1995028009A1 Semiconductor element with a passivated surface and method of producing it
10/19/1995WO1995027905A1 Cable testing device
10/19/1995WO1995027904A1 Device for checking the insulation condition of alternating-current-carrying lines or cables
10/19/1995WO1995024774A3 Memory iddq-testable through cumulative word line activation
10/19/1995WO1995024014A3 One-terminal data fault location system
10/19/1995DE4413257A1 Integrierte Schaltungsanordnung mit einem EEPROM, Halbleiterscheibe mit solchen integrierten Schaltungen sowie Verfahren zur Verwendung einer solchen Halbleiterscheibe Integrated circuit arrangement having an EEPROM, the semiconductor wafer having such integrated circuits as well as methods of using such a semiconductor wafer
10/19/1995DE4413110A1 Verfahren und Prüfflüssigkeit zur Kontrolle der Funktionsfähigkeit elektrischer Kraftwerkskomponenten Procedures and test fluid to control the operation of electric power plant components
10/18/1995EP0677874A1 Default indicator for a protection component
10/18/1995EP0677749A2 Abnormality detection method, abnormality detection apparatus, and power generating system using the same
10/18/1995EP0677748A1 Optical fiber laying structure for electric power cable line trouble occurence location detecting system
10/18/1995EP0677745A1 Probe card assembly
10/18/1995EP0609261B1 Device for testing an electrical drive unit
10/18/1995CN2210400Y Testing desk for non-contact switch control panel and energy consumption panel
10/18/1995CN1030108C Chopper testing table for underground railway
10/17/1995US5459795 Wiring pattern inspection apparatus for printed circuit board
10/17/1995US5459738 Apparatus and method for digital circuit testing
10/17/1995US5459737 Test access port controlled built in current monitor for IC devices
10/17/1995US5459736 Scan path circuit for testing multi-phase clocks from sequential circuits
10/17/1995US5459735 Logic integrated circuit with a sequential circuit having edge trigger flip-flops
10/17/1995US5459734 Test circuit for signal input circuit having threshold
10/17/1995US5459671 Programmable battery controller
10/17/1995US5459660 Circuit and method for interfacing with vehicle computer
10/17/1995US5459630 Self testing circuit breaker ground fault and sputtering arc trip unit
10/17/1995US5459409 Testing device for liquid crystal display base plate
10/17/1995US5459408 Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe to form a MIS device
10/17/1995US5459407 Apparatus and method of correcting loss of test contact continuity
10/17/1995US5459404 Apparatus and method for detecting floating nodes
10/17/1995US5459402 For evaluating an operation speed of an evaluated circuit
10/17/1995US5459396 In an electronic apparatus
10/17/1995US5459394 Electro-optic measurement device for the measurement of an electric signal in an electronic component
10/17/1995US5459390 Method of determining the charging state of a zinc-bromine battery and method of charging such battery
10/17/1995US5458992 Electrochromic thin film state-of-charge detector for on-the-cell application
10/17/1995US5458500 Probe tester for electrical connector assembly
10/12/1995DE4412297A1 Halbleiterelement mit passivierter Oberfläche und Verfahren zu seiner Herstellung Semiconductor element with a passivated surface and method for its preparation
10/12/1995DE4412250A1 Anordnung zur Prüfung des Isolationszustandes von an Wechselspannung liegenden Leitungen oder Kabeln Arrangement for testing the insulation level of lying to AC voltage lines or cables
10/12/1995DE19513309A1 Ion beam integrated circuit test appts.
10/11/1995EP0676835A2 Hand held compression tool
10/11/1995EP0676823A1 Air cooled power load and fictive antenna
10/11/1995EP0676645A2 Method and apparatus for electrically testing multi-core cable
10/11/1995EP0676091A1 Tab testing of area array interconnected chips
10/11/1995EP0676073A1 System for checking the validity of a data carrier.
10/11/1995EP0676055A1 Circuit arrangement for monitoring a plurality of coils.
10/11/1995EP0676054A1 Process and device for finding the real output of an electric drive.
10/11/1995EP0664925A4 Interconnection structure for integrated circuits and method for making same.
10/10/1995US5457699 Electronic component with a shift register test architecture (boundary scan)
10/10/1995US5457698 Test circuit having a plurality of scan latch circuits
10/10/1995US5457697 Pseudo-exhaustive self-test technique
10/10/1995US5457638 Computer-implemented process
10/10/1995US5457620 Current estimating circuit for switch mode power supply
10/10/1995US5457492 Light source device for an image processor
10/10/1995US5457441 Inductive amplifier having two-terminal auto-on function
10/10/1995US5457402 Armature resistance measuring apparatus and method
10/10/1995US5457401 Semiconductor device testing apparatus
10/10/1995US5457400 Semiconductor array having built-in test circuit for wafer level testing
10/10/1995US5457399 Microwave monolithic integrated circuit fabrication, test method and test probes
10/10/1995US5457398 Wafer probe station having full guarding
10/10/1995US5457391 Load short-circuit detection using AWH-bridge driving circuit and an exclusive-OR gate
10/10/1995US5457390 Circuit board manufacture
10/10/1995US5457381 Method for testing the electrical parameters of inputs and outputs of integrated circuits without direct physical contact
10/10/1995US5457380 Circuit-test fixture that includes shorted-together probes
10/10/1995US5457377 Method of monitoring the internal impedance of an accumulator battery in an uninterruptible power supply, and an uninterruptible power supply
10/09/1995CA2146199A1 Air-cooled power load
10/05/1995WO1995026588A1 A method and apparatus for processing batteries
10/05/1995WO1995026533A1 Timing model and characterization system for logic simulation of integrated circuits which takes into account process, temperature and power supply variations
10/05/1995DE4409563A1 Electric vehicle electrical components initialisation and self-test
10/05/1995DE19512131A1 Tester for semiconductor device characteristics
10/05/1995DE19511119A1 Light to photoresist layer directing method for thin film mask mfr.
10/05/1995CA2186452A1 A method and apparatus for processing batteries
10/05/1995CA2146280A1 Distributed light delivery system
10/04/1995EP0675607A2 Cable crosstalk measurement system
10/04/1995EP0675369A2 Online diagnostic system for rotating electrical apparatus
10/04/1995EP0675366A2 Probe system and probe method
10/04/1995EP0674768A1 Die carrier and test socket for leadless semiconductor die
10/04/1995CN2209393Y Leak alarm terminal
10/04/1995CN2209337Y Electric transmission and distribution network short-circuit failure indicator
10/04/1995CN1109555A Device and method for judging deterioration of silicon control
10/03/1995US5455832 Method and system for testing a sonet network element
10/03/1995US5455776 Automatic fault location system
10/03/1995US5455518 Test apparatus for integrated circuit die
10/03/1995US5455517 Data output impedance control
10/03/1995US5455515 Connector inspecting device
10/03/1995US5455506 Method and portable testing apparatus for safely testing an autotransformer for power distribution lines
10/03/1995US5455502 High speed, large-current power control circuit
10/03/1995US5454710 Display system for a battery monitoring circuit
09/1995
09/28/1995WO1995025963A1 System for calibrating a line isolation monitor
09/28/1995WO1995025962A1 Monitor for an ungrounded system
09/28/1995WO1995025961A1 System for measuring line to ground impedance
09/28/1995WO1995025654A1 Method and system for testing vehicular antilock brake system components
09/28/1995DE19510990A1 Fault analyser for integrated circuit testing appts. for analysing output data of unit under test
09/28/1995DE19510043A1 Monitoring system for equipotential tubing for installation in connection with water pipes in buildings
09/28/1995DE19501537A1 Multi-bit test circuit for solid state memory circuits
09/27/1995EP0674388A1 Scannable latch and method of using the same
09/27/1995EP0674265A1 Method and apparatus to generate tests for electronic boards
09/27/1995EP0673512A1 Charge-status indicator.
09/27/1995EP0673511A1 Method for determining the characteristics of an insulator and associated electronic microscope
09/27/1995EP0673299A1 Slide actuated holding clamp
09/27/1995EP0611452B1 Device and process for testing the charge of a nickel-cadmium battery
09/27/1995EP0527366B1 Variable delay circuit