| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/17/1996 | CN1115175A Slide actuated holding clamp |
| 01/16/1996 | US5485491 Online diagnostic system for rotating electrical apparatus |
| 01/16/1996 | US5485473 Method and system for testing an integrated circuit featuring scan design |
| 01/16/1996 | US5485471 System for testing of digital integrated circuits |
| 01/16/1996 | US5485467 Versatile reconfigurable matrix based built-in self-test processor for minimizing fault grading |
| 01/16/1996 | US5485466 Method and apparatus for performing dual scan path testing of an array in a data processing system |
| 01/16/1996 | US5485398 Method and apparatus for inspecting bent portions in wire loops |
| 01/16/1996 | US5485351 Socket assembly for integrated circuit chip package |
| 01/16/1996 | US5485246 Control device for collectively supervising a plurality of image forming apparatuses |
| 01/16/1996 | US5485199 Digital audio waveform display on a video waveform display instrument |
| 01/16/1996 | US5485101 For measuring settling time of frequency changes in (vco) output signal |
| 01/16/1996 | US5485097 Method of electrically measuring a thin oxide thickness by tunnel voltage |
| 01/16/1996 | US5485095 Fabrication test circuit and method for signalling out-of-spec resistance in integrated circuit structure |
| 01/16/1996 | US5485094 Method for testing printed wiring boards for short circuits |
| 01/16/1996 | US5485093 Randomness fault detection system |
| 01/16/1996 | US5485091 On a semiconductor substrate |
| 01/16/1996 | US5485090 Method and apparatus for differentiating battery types |
| 01/16/1996 | US5485081 Test point reduction system for a printed circuit board test system |
| 01/16/1996 | US5485080 Non-contact measurement of linewidths of conductors in semiconductor device structures |
| 01/16/1996 | US5483817 Short circuit detector for sensors |
| 01/11/1996 | WO1996000908A1 Process for checking the voltage supply of battery-operated electronic equipment |
| 01/11/1996 | WO1996000907A1 Shield integrity monitor |
| 01/11/1996 | DE4423007A1 Generation of test program for checking solder pad data on circuit boards |
| 01/11/1996 | DE19513275A1 Probe adaptor for connecting integrated circuit components to electronic test-measurement appts. |
| 01/11/1996 | DE19512144A1 Automatic integrated circuit transport appts. for circuit test system |
| 01/10/1996 | EP0691669A1 Auxiliary block, in particular condition indicator for circuit breakers |
| 01/10/1996 | EP0691612A1 A test circuit of embedded arrays in mixed logic and memory chips |
| 01/10/1996 | EP0691546A2 Time-domain reflectometer for testing coaxial cables |
| 01/10/1996 | EP0691028A1 Switching component, especially safety or power switch |
| 01/10/1996 | EP0558516B1 Spark-plug simulator |
| 01/10/1996 | CN2217225Y Portable universal arrangement for testing electric properties of voltage-resistant type |
| 01/09/1996 | US5483603 System and method for automatic optical inspection |
| 01/09/1996 | US5483544 Vector-specific testability circuitry |
| 01/09/1996 | US5483543 Test sequence generation method |
| 01/09/1996 | US5483518 Addressable shadow port and protocol for serial bus networks |
| 01/09/1996 | US5483493 Multi-bit test circuit of semiconductor memory device |
| 01/09/1996 | US5483488 Semiconductor static random access memory device capable of simultaneously carrying disturb test in a plurality of memory cell blocks |
| 01/09/1996 | US5483467 Patching panel scanner |
| 01/09/1996 | US5483237 Method and apparatus for testing a CODEC |
| 01/09/1996 | US5483232 Method and apparatus for predicting peak voltage of a cable conveyed tool |
| 01/09/1996 | US5483175 Method for circuits connection for wafer level burning and testing of individual dies on semiconductor wafer |
| 01/09/1996 | US5483174 Temporary connection of semiconductor die using optical alignment techniques |
| 01/09/1996 | US5483173 Current measuring structure for testing integrated circuits |
| 01/09/1996 | US5483170 Integrated circuit fault testing implementing voltage supply rail pulsing and corresponding instantaneous current response analysis |
| 01/09/1996 | US5483165 Battery system and method for determining a battery condition |
| 01/09/1996 | US5482471 Socket apparatus for IC package testing |
| 01/09/1996 | US5481929 Instrument holder and method for inspection of a dynamo-electric machine in a gap between a stator and a rotor and dynamo-electric machine having the instrument holder |
| 01/09/1996 | CA2127649A1 Indicating device for load current and source voltage |
| 01/04/1996 | WO1996000463A1 Fault detector for voltage source self-commutated power converter |
| 01/04/1996 | DE4422149A1 Verfahren zur Auswertung von Signalen A process for the evaluation of signals |
| 01/04/1996 | DE4422039A1 Monitoring unit of electric part esp. relay for measuring operating parameters in varying environmental conditions |
| 01/04/1996 | DE19523969A1 Component transport system for integrated circuit testing unit |
| 01/03/1996 | EP0690542A1 Latent fault detection in a redundant power supply |
| 01/03/1996 | EP0690492A2 Contactless sheet resistance measurement method and apparatus |
| 01/03/1996 | EP0690479A1 Method and apparatus for processing substrates, and apparatus for transferring the substrates |
| 01/03/1996 | EP0690395A2 Method and apparatus for generating conformance test data sequences |
| 01/03/1996 | EP0690311A2 Reliability test method for semiconductor trench devices |
| 01/03/1996 | EP0689854A1 Indicating device for implants |
| 01/03/1996 | EP0689733A1 A method for determining a stator flux estimate for an asynchronous machine |
| 01/03/1996 | EP0550432B1 Electrical connector structure and method for obtaining an electrical interconnection assembly |
| 01/03/1996 | EP0355128B1 Automated laminography system for inspection of electronics |
| 01/03/1996 | CN2216681Y Voltage indicator for battery of vehicle |
| 01/02/1996 | US5481741 Method and apparatus for providing attribute nodes in a graphical data flow environment |
| 01/02/1996 | US5481740 For debugging of a data flow diagram in a computer system |
| 01/02/1996 | US5481580 Method and apparatus for testing long counters |
| 01/02/1996 | US5481563 Jitter measurement using a statistically locked loop |
| 01/02/1996 | US5481551 IC element testing device |
| 01/02/1996 | US5481550 Apparatus for maintaining stimulation to a device under test after a test stops |
| 01/02/1996 | US5481549 Apparatus for testing an integrated circuit in which an input test pattern can be changed with an selected application timing |
| 01/02/1996 | US5481484 Mixed mode simulation method and simulator |
| 01/02/1996 | US5481471 Mixed signal integrated circuit architecture and test methodology |
| 01/02/1996 | US5481469 Automatic power vector generation for sequential circuits |
| 01/02/1996 | US5481463 Pay-per-use access to multiple electronic test capabilities |
| 01/02/1996 | US5481217 High current test signal converter circuit |
| 01/02/1996 | US5481205 Temporary connections for fast electrical access to electronic devices |
| 01/02/1996 | US5481204 Connector terminal checking device and method of checking connector terminal |
| 01/02/1996 | US5481202 Optical scan and alignment of devices under test |
| 01/02/1996 | US5481200 Field transmitter built-in test equipment |
| 01/02/1996 | US5481198 Method and device for measuring corrosion on a portion of a metallic path carrying an undetermined load current |
| 01/02/1996 | US5481195 Method for finding a fault on an electrical transmission line |
| 01/02/1996 | US5481194 Fault detection circuit for sensing leakage currents between power source and chassis |
| 01/02/1996 | US5481186 Method and apparatus for integrated testing of a system containing digital and radio frequency circuits |
| 01/02/1996 | US5481185 Solenoid, type voltage, polarity and continuity tester |
| 01/02/1996 | US5480734 Rechargeable accumulator |
| 12/31/1995 | CA2151684A1 System for switching power and scrubbing for faults |
| 12/28/1995 | WO1995035228A1 Anti-theft battery |
| 12/28/1995 | WO1995030230A3 Scannable d-flip-flop with system independent clocking |
| 12/27/1995 | EP0689306A2 Computer controlled radio tester and method |
| 12/27/1995 | EP0689061A1 Device for measuring the state of charge of an electrochemical generator |
| 12/27/1995 | EP0689060A1 Audio amplifier switching noise measuring method and device |
| 12/27/1995 | EP0689059A1 Partial discharge detector for electric equipment |
| 12/27/1995 | EP0689058A2 Circuit for monitoring a switching point regarding a leaking resistance |
| 12/27/1995 | EP0689056A2 Measuring means for sensing high frequency signals inside closed high voltage switch gear |
| 12/27/1995 | EP0688451A1 Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays |
| 12/27/1995 | EP0466939B1 Ic testing device |
| 12/27/1995 | CN2216298Y Outlet (plug) |
| 12/27/1995 | CN2216254Y Microcomputerized multiplex cable and conductor tester |
| 12/27/1995 | CN2216253Y Multicored cable core order and fault detector |
| 12/27/1995 | CN2216252Y Non-fuse switch trip tester |
| 12/26/1995 | US5479652 Microprocessor with an external command mode for diagnosis and debugging |