Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/1996
02/14/1996EP0663092A4 Robust delay fault built-in self-testing method and apparatus.
02/14/1996CN2220074Y Light fault detector for motor-driven vehicle
02/14/1996CN1116880A Current surge indicator
02/14/1996CN1116710A Wafer burn-in test circuit of a semiconductor memory device
02/13/1996US5491699 Register stage having at least two memory stages for coordinating disparate clock signals for use in boundary scan
02/13/1996US5491673 Timing signal generation circuit
02/13/1996US5491666 Apparatus for configuring a subset of an integrated circuit having boundary scan circuitry connected in series and a method thereof
02/13/1996US5491425 Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same
02/13/1996US5491424 System for measuring contamination resistance
02/13/1996US5491420 Battery tester with stacked thermochromic elements
02/13/1996US5491419 Assembly for rapid and accurate testing of encapsulated devices
02/13/1996US5491418 Automotive diagnostic communications interface
02/13/1996US5491417 Sparkplug voltage probe device having a capacitance compensating function for an internal combustion engine
02/13/1996US5490798 Used to check an electrical connector
02/13/1996US5490663 Slide actuated holding clamp
02/12/1996CA2149848A1 Direct digital synthesis component test
02/09/1996CA2153742A1 Multimeter-like user interface for a graphical instrument
02/08/1996WO1996003844A2 Antenna and feeder cable tester
02/08/1996WO1996003660A1 Method and portable testing apparatus for safely testing an autotransformer for power distribution lines
02/08/1996DE4431397C1 Output current and voltage detection system for pulsed current regulator
02/07/1996EP0696031A1 Programmable integrated memory with emulation means
02/07/1996EP0695946A2 Methods and apparatus for armature testing
02/07/1996EP0695943A2 Temporary package for bare die test and-burn-in
02/07/1996EP0695918A1 Safety apparatus
02/07/1996CN1030940C Battery charge monitor for personal computer
02/06/1996US5490254 MIL-STD-1553 interface device having autonomous operation in all modes
02/06/1996US5490151 Boundary scan cell
02/06/1996US5490117 IC card with dual level power supply interface and method for operating the IC card
02/06/1996US5490090 Two tone test method for determining frequency domain transfer
02/06/1996US5490065 Method and apparatus for testing automotive control units
02/06/1996US5490064 Control unit for vehicle and total control system therefor
02/06/1996US5489985 Apparatus for inspection of packaged printed circuit boards
02/06/1996US5489852 System for interfacing wafer sort prober apparatus and packaged IC handler apparatus to a common test computer
02/06/1996US5489851 Identification of pin-open faults by measuring current or voltage change resulting from temperature change
02/06/1996US5489843 Apparatus and method for testing the calibration of electronic package lead inspection system
02/06/1996US5489835 Cell type determination of battery under charge conditions
02/06/1996US5489834 Battery type and temperature identification circuit
02/06/1996US5489793 Semiconductor device having an evaluation device and method of fabricating same
02/06/1996US5489538 Method of die burn-in
02/06/1996US5488859 Vehicle testing device and method
02/02/1996CA2154736A1 Methods and apparatus for armature testing
02/01/1996WO1996002916A1 Memory with stress circuitry for detecting defects
02/01/1996WO1996002846A1 Test adapter
02/01/1996WO1996002845A1 Methods and apparatus for test and burn-in of integrated circuit devices
02/01/1996DE4426307A1 Integrated circuit with gate oxide and ESD protection for DMOS transistor
02/01/1996DE4425551A1 Monitoring system for leak detection via characteristic impedance
02/01/1996DE4425169A1 Federkontaktstift für Prüfadapter Spring pin for test adapter
02/01/1996DE19526194A1 Method for detecting an IC defect using charged particle beam.
02/01/1996DE19525229A1 Determining position of part of multiple plug connector using multistep method, for testing cable harness connections
01/1996
01/31/1996EP0694961A1 Method and apparatus for detecting short circuit point between wiring patterns
01/31/1996EP0694787A2 System level IC testing arrangement and method
01/31/1996EP0694169A1 Relay tester
01/31/1996EP0612412B1 Polarity testing process and device for electrolytic capacitors
01/31/1996EP0444023B1 System and method for depassivating a passivated lithium battery in a battery powered microprocessor control device
01/31/1996CN2218931Y Remote sensing small current system earthing line selecting device
01/30/1996US5488614 Integrated logic circuit
01/30/1996US5488613 Scan test circuits for use with multiple frequency circuits
01/30/1996US5488612 Method and apparatus for field testing field programmable logic arrays
01/30/1996US5488334 Air-cooled power load
01/30/1996US5488325 Timing generator intended for semiconductor testing apparatus
01/30/1996US5488324 Detection circuit for detecting a state of a control system with improved accuracy
01/30/1996US5488323 True hysteresis window comparator for use in monitoring changes in switch resistance
01/30/1996US5488318 Multifunction register
01/30/1996US5488314 Buckling beam test probe assembly
01/30/1996US5488313 Test probe and circuit board arrangement for the circuit under test for microstrip circuitry
01/30/1996US5488310 Return-loss detection for serial digital source
01/30/1996US5488309 Method of testing the output propagation delay of digital devices
01/30/1996US5488306 Open and short fault detector for a differential interface
01/30/1996US5488300 Method and apparatus for monitoring the state of charge of a battery
01/30/1996US5488292 Wafer inspecting system
01/30/1996US5487999 Method for fabricating a penetration limited contact having a rough textured surface
01/30/1996US5487956 Adaptive backup battery management for vehicular based electronic modules
01/30/1996CA2110056C Advanced cable fault locator
01/25/1996WO1996002039A1 Hardware design verification system and method
01/25/1996DE4426066A1 Method for determining residual current of electrolytic capacitor
01/24/1996EP0693784A1 Safeguard for integrated output power stages employing multiple bond-wires
01/24/1996EP0693692A2 Voltage and resistance synthesizer using pulse width modulation
01/24/1996EP0693691A2 Battery charge indicators
01/23/1996US5487154 Host selectively determines whether a task should be performed by digital signal processor or DMA controller according to processing time and I/O data period
01/23/1996US5487074 Boundary scan testing using clocked signal
01/23/1996US5487042 Semiconductor integrated circuit device equipped with answer system for teaching optional functions to diagnostic system
01/23/1996US5486772 Reliability test method for semiconductor trench devices
01/23/1996US5486771 Burn-in socket testing apparatus
01/23/1996US5486769 Method and apparatus for measuring quantitative voltage contrast
01/23/1996US5486753 Simultaneous capacitive open-circuit testing
01/23/1996US5486656 Printed circuit board having an extra plate connected to a product portion
01/18/1996WO1996010189A1 Fault sensor device with radio transceiver
01/18/1996WO1996001434A1 A method of testing and an electronic circuit comprising a flipflop with a master and a slave
01/18/1996WO1996001433A1 Characterizing a differential circuit
01/18/1996DE4423511A1 Cable tree testing device for cable wrapping system
01/18/1996DE19525536A1 Integrated circuit fault analysis testing method
01/17/1996EP0692876A2 Power-out reset system
01/17/1996EP0692864A1 Drive circuit for a bidirectional flow control valve
01/17/1996EP0692718A1 A method and a device for testing an electric connector
01/17/1996EP0692413A1 Connection of a control circuit for an anti-theft battery
01/17/1996EP0692126A1 Method and system for predicting steady state conditions from transient monotonic or cyclic data
01/17/1996EP0692124A1 Virtual wires for reconfigurable logic systems
01/17/1996EP0692116A1 Power line communications analyzer
01/17/1996EP0533422B1 Method for inspecting stripped condition of electric wire
01/17/1996EP0507782B1 Electric arc and radio frequency spectrum detection