| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/18/1996 | WO1996011392A1 Automatic handler and method of measuring devices using the same |
| 04/18/1996 | DE19537358A1 Integrated circuit holding and transport support |
| 04/18/1996 | CA2201623A1 Bus for sensitive analog signals |
| 04/17/1996 | EP0707367A1 Ground fault detecting apparatus and method for detecting ground fault of field circuit and exciting circuit by detecting ground fault current flowing from ground to neutral point of exciting circuit |
| 04/17/1996 | EP0707214A2 Multiport membrane probe for full-wafer testing |
| 04/17/1996 | EP0707198A1 Position-measuring device |
| 04/17/1996 | EP0706663A1 Electrical test instrument |
| 04/17/1996 | EP0706407A1 Fault-tolerant elective replacement indication for implantable medical device |
| 04/17/1996 | CN2225056Y Monitor for metering electric power |
| 04/17/1996 | CN1120740A Nonlosable semiconductor memory |
| 04/17/1996 | CN1120672A Insulation state measurement method, insulation state judgement apparatus, and dispersion type power generating system using the same |
| 04/17/1996 | CN1120671A On-line monitoring method and device for current leakage of d.c system |
| 04/16/1996 | US5509019 Semiconductor integrated circuit device having test control circuit in input/output area |
| 04/16/1996 | US5508633 Method of and apparatus for testing and adjusting d.c. rotary machines |
| 04/16/1996 | US5508632 Method of simulating hot carrier deterioration of an MOS transistor |
| 04/16/1996 | US5508631 Semiconductor test chip with on wafer switching matrix |
| 04/16/1996 | US5508630 Probe having a power detector for use with microwave or millimeter wave device |
| 04/16/1996 | US5508627 Photon assisted sub-tunneling electrical probe, probe tip, and probing method |
| 04/16/1996 | US5508620 Method and device for determining ground faults on the conductors of an electrical machine |
| 04/16/1996 | US5508619 System for discriminating kinds of surges on power transmission lines |
| 04/16/1996 | US5508610 Electrical conductivity tester and methods thereof for accurately measuring time-varying and steady state conductivity using phase shift detection |
| 04/16/1996 | US5508607 Electronic test instrument for component test |
| 04/16/1996 | US5508599 Battery conditioning system having communication with battery parameter memory means in conjunction with battery conditioning |
| 04/16/1996 | US5508126 Device for improving the current output of a chargeable battery at low outside temperatures |
| 04/16/1996 | US5507924 Method and apparatus for adjusting sectional area ratio of metal-covered electric wire |
| 04/16/1996 | US5507652 Wedge connector for integrated circuits |
| 04/11/1996 | WO1996010858A1 Smart battery algorithm for reporting battery parameters to an external device |
| 04/11/1996 | WO1996010807A1 Method and apparatus for detecting fault conditions in a vehicle data recording device |
| 04/11/1996 | DE19536203A1 Fault diagnosis method for locating error in LSI logic circuit |
| 04/11/1996 | CA2201374A1 Smart battery algorithm for reporting battery parameters to an external device |
| 04/10/1996 | EP0706271A2 Method and apparatus for integrated testing of a system containing digital and radio frequency circuits |
| 04/10/1996 | EP0706209A2 Sheet resistance measurement |
| 04/10/1996 | EP0706056A2 Sensor for detecting partial discharge impulses in high voltage equipment |
| 04/10/1996 | EP0706027A1 Visual inspection support apparatus, substrate inspection apparatus, and soldering inspection and correction methods using the same apparatuses |
| 04/10/1996 | EP0705529A1 Method and apparatus for non-conductively interconnecting integrated circuits |
| 04/10/1996 | EP0705501A1 Method and apparatus for testing telecommunications equipment using a reduced redundancy test signal |
| 04/10/1996 | EP0705439A1 Process and device for testing an integrated circuit soldered on a board |
| 04/10/1996 | CN2224426Y Omnibearing-observation type test pencil |
| 04/10/1996 | CN2224425Y universal test pencil |
| 04/10/1996 | CN1120160A A thermocouple testing method and apparatus for detecting an open circuit |
| 04/09/1996 | US5506852 Testing VLSI circuits for defects |
| 04/09/1996 | US5506851 Analog-digital mixed master including therein a test circuit |
| 04/09/1996 | US5506850 Logic analyzer for high channel count applications |
| 04/09/1996 | US5506793 Method and apparatus for distortion compensation in an automatic optical inspection system |
| 04/09/1996 | US5506772 Trouble-diagnosis multi-function tester |
| 04/09/1996 | US5506676 Defect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform components |
| 04/09/1996 | US5506620 Recording/reproducing apparatus for providing indications of abnormal states |
| 04/09/1996 | US5506573 Remote sensor and method for detecting the on/off status of an automatically controlled appliance |
| 04/09/1996 | US5506512 Transfer apparatus having an elevator and prober using the same |
| 04/09/1996 | US5506511 Method of electrically detecting on-site partial discharges in the insulating medium of an electrical power transformer and apparatus therefor |
| 04/09/1996 | US5506509 Circuit and method of measuring squib resistance |
| 04/09/1996 | US5506508 Apparatus for detecting a shorted winding condition of a solenoid coil |
| 04/09/1996 | US5506499 Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad |
| 04/09/1996 | US5506498 Apparatus for testing semiconductor wafers |
| 04/09/1996 | US5506454 System and method for diagnosing characteristics of acceleration sensor |
| 04/09/1996 | US5506396 Microcomputer for IC card |
| 04/09/1996 | CA2050423C Battery alarm system |
| 04/04/1996 | WO1996010274A1 Electrochemical cell label with integrated tester |
| 04/04/1996 | DE4443350C1 Control and monitoring circuit for automobile electrical loads |
| 04/04/1996 | DE4429310A1 Location of earth leakages in three-phase current |
| 04/04/1996 | DE19534833A1 Electronic control device for automobile |
| 04/04/1996 | DE19527033A1 Vorrichtung zum Messen des Temperaturkoeffizienten eines dielektrischen Resonators An apparatus for measuring the temperature coefficient of a dielectric resonator |
| 04/03/1996 | EP0705008A2 Load termination sensing circuit |
| 04/03/1996 | EP0704954A2 A method and an apparatus for charging a rechargeable battery |
| 04/03/1996 | EP0704890A2 A method of evaluating a mis-type semiconductor device |
| 04/03/1996 | EP0704802A1 Microcomputer and a method of testing the same |
| 04/03/1996 | EP0704709A2 Process for determining the electrical parameters of asynchronous motors |
| 04/03/1996 | EP0704708A2 Testing of analog signals |
| 04/03/1996 | EP0704707A1 Voltage measurement system |
| 04/03/1996 | EP0704706A1 A diagnostic system for a capacitive sensor |
| 04/03/1996 | EP0704365A2 A diagnostic system for railway signalling apparatus |
| 04/03/1996 | EP0704343A2 Electronic control device for motor vehicles |
| 04/03/1996 | EP0704106A1 Method and apparatus for automatically positioning electronic die within component packages |
| 04/03/1996 | EP0704064A1 Magnetic screen |
| 04/03/1996 | EP0704059A1 Circuit arrangement for testing a multiple-cell battery |
| 04/02/1996 | US5504917 Method and apparatus for providing picture generation and control features in a graphical data flow environment |
| 04/02/1996 | US5504862 Logic verification method |
| 04/02/1996 | US5504756 Method and apparatus for multi-frequency, multi-phase scan chain |
| 04/02/1996 | US5504755 Testable programmable logic array |
| 04/02/1996 | US5504670 Method and apparatus for allocating resources in a multiprocessor system |
| 04/02/1996 | US5504617 Optical time domain reflectometry |
| 04/02/1996 | US5504438 Testing method for imaging defects in a liquid crystal display substrate |
| 04/02/1996 | US5504437 Apparatus and method for electrical measurement of semiconductor wafers |
| 04/02/1996 | US5504436 Socket apparatus for member testing |
| 04/02/1996 | US5504433 Electrochemical sensor for monitoring electrolyte content |
| 04/02/1996 | US5504432 System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment |
| 04/02/1996 | US5504431 Device for and method of evaluating semiconductor integrated circuit |
| 04/02/1996 | US5504423 Method for modeling interactions in multilayered electronic packaging structures |
| 04/02/1996 | US5504422 Polarity testing process and device for electrolytic capacitors |
| 04/02/1996 | US5504373 Semiconductor memory module |
| 04/02/1996 | US5504369 Semiconductor wafer |
| 04/02/1996 | US5504354 Interconnect substrate with circuits for field-programmability and testing of multichip modules and hybrid circuits |
| 03/28/1996 | WO1996009644A1 Container for ic trays, and base plate for mounting the container |
| 03/28/1996 | WO1996009556A1 Method and apparatus for automatic inspection of semiconductor device |
| 03/28/1996 | WO1996009191A1 Electronic safety device for motor vehicle passengers |
| 03/28/1996 | DE4447174A1 Elektronische Sicherheitseinrichtung für Fahrzeuginsassen Electronic safety device for vehicle occupants |
| 03/28/1996 | DE4434275A1 Asynchronous motor efficiency measurement method |
| 03/28/1996 | DE19535352A1 Excess current detection and control circuit for power source of semiconductor device test system |
| 03/28/1996 | DE19535137A1 Fault analysis device for electronic circuits with high density components e.g. integrated circuits on wiring board |
| 03/28/1996 | DE19533968A1 Semiconductor power-switching circuit with self-diagnosis function |