| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 05/09/1996 | WO1996013730A1 Acoustic optical system for partial discharge detection and location |
| 05/09/1996 | DE4438935A1 Pulse generator for testing electromagnetic compatibility of electronic circuits, components and instruments |
| 05/08/1996 | EP0711016A2 Parameter measuring method, charge/discharge control method and apparatus and life predicting method for secondary batteries and power storage apparatus using the same |
| 05/08/1996 | EP0710931A2 Method and vehicle data logger for checking a vehicle data logger registering and vehicle aggregate actuation, indicating message |
| 05/08/1996 | EP0710910A2 Integrated test and measurement means and method employing a graphical user interface |
| 05/08/1996 | EP0710848A1 Procedure for measuring the voltage decay and the electron mobility of a material |
| 05/08/1996 | EP0710847A2 Tester for testing correct assembly of terminals in connector housings |
| 05/08/1996 | EP0710773A2 Structure and production process for secondary voltage detector for engine |
| 05/08/1996 | EP0446550B1 Per-pin integrated circuit test system having for each pin an N-bit interface |
| 05/08/1996 | CN2226801Y Voltage monitor for accumulator |
| 05/07/1996 | US5515530 Method and apparatus for asynchronous, bi-directional communication between first and second logic elements having a fixed priority arbitrator |
| 05/07/1996 | US5515517 Data processing device with test circuit |
| 05/07/1996 | US5515505 Semiconductor integrated circuit with boundary scan circuit |
| 05/07/1996 | US5515384 Method and system of fault diagnosis of application specific electronic circuits |
| 05/07/1996 | US5515382 Process for testing the operation of an application specific integrated circuit and application specific integrated circuit relating thereto |
| 05/07/1996 | US5515302 Method for identifying excessive power consumption sites within a circuit |
| 05/07/1996 | US5515291 Apparatus for calculating delay time in logic functional blocks |
| 05/07/1996 | US5515218 Ground fault circuit interrupter, circuit, circuit tester and method |
| 05/07/1996 | US5515166 Optical FM characteristics measurement apparatus for laser diode |
| 05/07/1996 | US5515027 Test circuit for detection of malfunctions in an electric triggering device |
| 05/07/1996 | US5514991 Synchronous data row generating circuit |
| 05/07/1996 | US5514978 Stator turn fault detector for AC motor |
| 05/07/1996 | US5514976 Semiconductor test apparatus having improved current load circuit |
| 05/07/1996 | US5514975 Data output impedance control |
| 05/07/1996 | US5514971 Method and apparatus for testing an immunity to electromagnetic interference and apparatus for irradiating radio wave for immunity test |
| 05/07/1996 | US5514967 Automatic insulation test equipment for testing high voltage electrical equipment at the rated voltage level |
| 05/07/1996 | US5514966 Inspection method and an inspection apparatus for a temporarily bundled circuit of a wire harness |
| 05/07/1996 | US5514965 Method and apparatus for testing a communicating line using time domain reflectometry |
| 05/07/1996 | US5514964 System for monitoring a dual voltage ungrounded system for leakage currents |
| 05/07/1996 | US5514946 For providing power to a computer system |
| 05/07/1996 | US5513538 Test chamber with a pull out table that has a brake and stops that limit the movement of the table |
| 05/02/1996 | WO1996013003A1 An efficient method for obtaining usable parts from a partially good memory integrated circuit |
| 05/02/1996 | WO1996012970A1 Process for determining the state of charge of an accumulator |
| 05/02/1996 | WO1996012969A1 Numerical comparator |
| 05/02/1996 | WO1996012939A1 Defect detection in patterned substrates using optical computing |
| 05/02/1996 | DE4439499A1 Verfahren zum Erfassen eines Erdkurzschlusses auf einer elektrischen Energieübertragungsleitung A method for detecting a ground fault on an electric power transmission line |
| 05/02/1996 | DE4438591A1 Interference arcing protection system for power distribution switchgear |
| 05/02/1996 | DE4438039A1 Self-testing personnel safety monitoring system with switch=off detection point |
| 05/02/1996 | DE4437647A1 Verfahren zur Bestimmung des Ladezustandes eines Akkumulators A method for determining the state of charge of an accumulator |
| 05/02/1996 | DE4437355A1 Measuring polarisation characteristics of insulation esp. for characterising ageing conditions of cable insulation |
| 05/02/1996 | DE19540621A1 Function testing apparatus for integrated circuit |
| 05/02/1996 | DE19539695A1 Battery handling device for electric vehicle |
| 05/02/1996 | CA2203166A1 Numerical comparator |
| 05/01/1996 | EP0709943A2 Battery operated information processing apparatus |
| 05/01/1996 | EP0709755A2 Automotive diagnostic communications |
| 05/01/1996 | EP0709688A1 A scan latch and test method therefore |
| 05/01/1996 | EP0709687A2 An apparatus for testing the quality of the logic levels of a digital signal |
| 05/01/1996 | EP0709686A2 Apparatus for measuring an RF parameter |
| 05/01/1996 | EP0708926A1 Adapter with solid body |
| 05/01/1996 | EP0438705B1 Integrated circuit driver inhibit control method for test |
| 05/01/1996 | CN2226310Y Voltage signal acquisition apparatus for testing electric parameter of accumulator |
| 05/01/1996 | CN1121588A Intelligent multiple-line numerical code identification device |
| 04/30/1996 | US5513339 Concurrent fault simulation of circuits with both logic elements and functional circuits |
| 04/30/1996 | US5513189 Boundary scan system with improved error reporting using sentinel bit patterns |
| 04/30/1996 | US5513188 Enhanced interconnect testing through utilization of board topology data |
| 04/30/1996 | US5513187 Process for testing integrated circuits with at least one logic circuit and testable integrated circuit |
| 04/30/1996 | US5513186 Method and apparatus for interconnect testing without speed degradation |
| 04/30/1996 | US5513152 Circuit and method for determining the operating performance of an integrated circuit |
| 04/30/1996 | US5513118 High level synthesis for partial scan testing |
| 04/30/1996 | US5513079 Mass termination of signals from electronic systems to devices under test |
| 04/30/1996 | US5513002 Optical corona monitoring system |
| 04/30/1996 | US5512895 Sample rate converter |
| 04/30/1996 | US5512843 Monitoring method and apparatus using high-frequency carrier |
| 04/30/1996 | US5512842 High accuracy inspection method and apparatus of semiconductor integrated circuits |
| 04/30/1996 | US5512841 Peak current detection in a test instrument for ensuring validity of component test output |
| 04/30/1996 | US5512835 Electrical probe and method for measuring gaps and other discontinuities in enclosures using electrical inductance for RF shielding assessment |
| 04/30/1996 | US5512833 Connector checking device |
| 04/30/1996 | US5512832 Energy analysis fault detection system |
| 04/30/1996 | US5512831 Method and apparatus for testing electrochemical energy conversion devices |
| 04/30/1996 | US5512819 Assembly and associated method for locating a selected wire of a wiremat |
| 04/30/1996 | US5512710 For an electronic device |
| 04/30/1996 | US5512397 Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits |
| 04/30/1996 | US5511434 Variable volume test chamber |
| 04/25/1996 | WO1996012332A1 Overvoltage protection |
| 04/25/1996 | WO1996012198A1 System and method for making electromagnetic measurements using a transverse electromagnetic cell |
| 04/25/1996 | WO1996003844A3 Antenna and feeder cable tester |
| 04/25/1996 | DE4437638A1 Power supply monitoring circuit for electrical appts. |
| 04/25/1996 | DE4436858A1 Überspannungsschutzeinrichtung Overvoltage protection device |
| 04/25/1996 | DE4436354A1 Test equipment for simultaneous assessment of characteristics |
| 04/24/1996 | EP0708408A2 Digital circuits and digital circuit simulation systems |
| 04/24/1996 | EP0708338A2 Probe card for high temperature application |
| 04/24/1996 | EP0667962B1 Printed circuit board testing device with foil adapter |
| 04/24/1996 | CN1121368A Visual inspection support apparatus, substrate inspection apparatus, and soldering inspection and correction methods using the same apparatuses |
| 04/24/1996 | CN1121198A Load detector |
| 04/24/1996 | CN1121179A Computer controlled radio tester and method |
| 04/23/1996 | US5511162 Automatic LSI testing apparatus using expert system |
| 04/23/1996 | US5511126 Method and apparatus for reducing jitter and improving testability of an oscillator |
| 04/23/1996 | US5511010 Method and apparatus of eliminating interference in an undersettled electrical signal |
| 04/23/1996 | US5510876 Control system for controlling the connection of an image forming apparatus through a control device by means of a communication control unit |
| 04/23/1996 | US5510730 Reconfigurable programmable interconnect architecture |
| 04/23/1996 | US5510726 For determining angular alignment between two components |
| 04/23/1996 | US5510725 Method and apparatus for testing a power bridge for an electric vehicle propulsion system |
| 04/23/1996 | US5510724 Probe apparatus and burn-in apparatus |
| 04/23/1996 | US5510723 Diced semiconductor device handler |
| 04/23/1996 | US5510721 Method and adjustment for known good die testing using resilient conductive straps |
| 04/23/1996 | US5510719 Method for screening early failure of ceramic capacitor |
| 04/23/1996 | US5510705 Electrical test arrangement and apparatus |
| 04/23/1996 | US5510704 Powered testing of mixed conventional/boundary-scan logic |
| 04/22/1996 | CA2157960A1 Delay testing of high-performance digital components by a slow-speed tester |
| 04/18/1996 | WO1996011411A1 Bus for sensitive analog signals |