| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/28/1996 | US5522038 Testing mapped signal sources |
| 05/28/1996 | US5522034 Battery disconnection detecting apparatus |
| 05/28/1996 | US5521873 Semiconductor dynamic random access memory |
| 05/28/1996 | US5521870 Semiconductor memory device having a coincidence detection circuit and its test method |
| 05/28/1996 | US5521839 Deep level transient spectroscopy (DLTS) system and method |
| 05/28/1996 | US5521832 Method for checking an output stage and an electrical load triggered by the output stage for the presence of a fault |
| 05/28/1996 | US5521615 Display system for instruments |
| 05/28/1996 | US5521593 Method and apparatus for monitoring operating characteristics of semiconductor electric power switching circuits |
| 05/28/1996 | US5521586 Electronic apparatus |
| 05/28/1996 | US5521526 Method and a device for checking the condition of semiconductor valves |
| 05/28/1996 | US5521524 Method and system for screening reliability of semiconductor circuits |
| 05/28/1996 | US5521523 Probe card assembly and method of manufacturing probe card assembly |
| 05/28/1996 | US5521522 Probe apparatus for testing multiple integrated circuit dies |
| 05/28/1996 | US5521517 Method and apparatus for detecting an IC defect using a charged particle beam |
| 05/28/1996 | US5521516 Semiconductor integrated circuit fault analyzing apparatus and method therefor |
| 05/28/1996 | US5521513 Manufacturing defect analyzer |
| 05/28/1996 | US5521512 For determining impulse characteristics of a line under test |
| 05/28/1996 | US5521511 Method and device for testing integrated power devices |
| 05/28/1996 | US5521493 Semiconductor test system including a novel driver/load circuit |
| 05/28/1996 | US5521491 Phase detecting device for determining phase angle between two electrical signals |
| 05/28/1996 | US5521482 Method and apparatus for determining mechanical performance of polyphase electrical motor systems |
| 05/28/1996 | CA2146866C A method and a device for determining the distance from a measuring station to a fault on a transmission line |
| 05/23/1996 | WO1996015563A1 Smart battery device |
| 05/23/1996 | WO1996015551A1 Mounting electronic components to a circuit board |
| 05/23/1996 | WO1996015496A1 Self-resetting bypass control for scan test |
| 05/23/1996 | WO1996015495A1 Test apparatus/method for level sensitive scan designs |
| 05/23/1996 | WO1996015459A1 Mounting spring elements on semiconductor devices, and wafer-level testing methodology |
| 05/23/1996 | WO1996015458A1 Probe card assembly and kit, and methods of using same |
| 05/23/1996 | WO1996015437A1 Variable volume test chamber |
| 05/23/1996 | DE4434792C1 Dual-mode MOS integrated circuit with switched-input current mirror |
| 05/23/1996 | DE19540827A1 Determining ageing condition of battery e.g. for residual duration in electric vehicle traction batteries |
| 05/23/1996 | DE19531653A1 Single-chip microprocessor |
| 05/22/1996 | EP0713261A1 Phased array antenna management system and calibration method |
| 05/22/1996 | EP0713101A2 Remaining battery capacity meter and method for computing remaining capacity |
| 05/22/1996 | EP0713099A1 Method and structure for a fault-free input configuration control mechanism |
| 05/22/1996 | EP0713007A1 A spark plug voltage probe device for an internal combustion engine |
| 05/22/1996 | EP0712360A1 Circuitry for regulating braking systems with an antilocking system and/or a drive slip control |
| 05/22/1996 | EP0521912B1 Arcing fault detector |
| 05/22/1996 | CN2227842Y Synchronous motor parameter descriminator |
| 05/22/1996 | CN1122918A Semiconductor integrated circuit with testable unit block |
| 05/21/1996 | US5519719 Universal pattern generator |
| 05/21/1996 | US5519715 Full-speed microprocessor testing employing boundary scan |
| 05/21/1996 | US5519714 Testable scan path circuit operable with multi-phase clock |
| 05/21/1996 | US5519713 Integrated circuit having clock-line control and method for testing same |
| 05/21/1996 | US5519712 Current mode test circuit for SRAM |
| 05/21/1996 | US5519563 Protection circuit for electric cells from overcharge and overdischarge using a plurality of detection units of a single chip type |
| 05/21/1996 | US5519384 System for indicating fault condition on operator's electrostatic discharge protection equipment |
| 05/21/1996 | US5519383 Battery and starter circuit monitoring system |
| 05/21/1996 | US5519355 High speed boundary scan multiplexer |
| 05/21/1996 | US5519337 Motor monitoring method and apparatus using high frequency current components |
| 05/21/1996 | US5519336 Method for electrically characterizing the insulator in SOI devices |
| 05/21/1996 | US5519335 Electronic tester for testing Iddq in an integrated circuit chip |
| 05/21/1996 | US5519334 System and method for measuring charge traps within a dielectric layer formed on a semiconductor wafer |
| 05/21/1996 | US5519333 Elevated voltage level IDDQ failure testing of integrated circuits |
| 05/21/1996 | US5519332 Carrier for testing an unpackaged semiconductor die |
| 05/21/1996 | US5519327 Pulse circuit using a transmission line |
| 05/21/1996 | US5519325 Measuring apparatus for a passive element value using a current vector |
| 05/21/1996 | US5519324 Withstand voltage-testing apparatus |
| 05/21/1996 | US5519304 Circuit for measuring the state of charge of an electrochemical cell |
| 05/21/1996 | US5519300 Method and apparatus for analysis of polyphase electrical motor systems |
| 05/21/1996 | US5519193 Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation |
| 05/21/1996 | US5518835 Device for indicating the residual capacity of secondary cells |
| 05/17/1996 | WO1996014669A1 System for managing state of storage battery |
| 05/17/1996 | WO1996014659A1 Method for forming contact pins for semiconductor dice and interconnects |
| 05/17/1996 | WO1996014585A1 Method of locating a fault in a predetermined monitoring region of a miltiphase electrical power transmission system |
| 05/17/1996 | WO1996014555A1 Method and device for quantitatively determining the setting of an alternator |
| 05/15/1996 | EP0712208A2 Simulation by emulating level sensitive latches with edge trigger latches |
| 05/15/1996 | EP0712008A2 Apparatus for detecting battery voltage |
| 05/15/1996 | EP0712007A2 Battery operated electric razor or hair clippers |
| 05/15/1996 | EP0711447A1 Programmable logic device with verify circuitry for classifying fuse link states as validly closed, validly open or invalid |
| 05/15/1996 | EP0489146B1 Electrographic process utilizing fluorescent toner and filtered detector for generating an electrical image signal |
| 05/15/1996 | DE4440281A1 Optical detection device for arcing interference discharges in enclosed switchgear |
| 05/15/1996 | DE19541959A1 Control device for electric vehicle batteries |
| 05/15/1996 | DE19541816A1 Diagnosesystem für ein Kraftfahrzeug Diagnostic system for a motor vehicle |
| 05/15/1996 | DE19512947C1 Contacting device for HF and LF measurements on multi-pair, symmetrical data cables |
| 05/15/1996 | CN1122636A Temperature responsive battery tester |
| 05/15/1996 | CN1122453A Apparatus for measuring a pulse duration |
| 05/15/1996 | CN1122426A Portable lighting device having extemally attached voltage tester |
| 05/14/1996 | US5517637 Method for testing a test architecture within a circuit |
| 05/14/1996 | US5517515 Multichip module with integrated test circuitry disposed within interposer substrate |
| 05/14/1996 | US5517506 Method and data processing system for testing circuits using boolean differences |
| 05/14/1996 | US5517235 Method and apparatus for inspecting printed circuit boards at different magnifications |
| 05/14/1996 | US5517234 Automatic optical inspection system having a weighted transition database |
| 05/14/1996 | US5517128 Method and arrangement for charge carrier profiling in semiconductor structure by means of AFM scanning |
| 05/14/1996 | US5517127 Additive structure and method for testing semiconductor wire bond dies |
| 05/14/1996 | US5517126 For measuring electrical characteristics of an object to be tested |
| 05/14/1996 | US5517125 Reusable die carrier for burn-in and burn-in process |
| 05/14/1996 | US5517111 Automatic testing system for magnetoresistive heads |
| 05/14/1996 | US5517110 Contactless test method and system for testing printed circuit boards |
| 05/14/1996 | US5517109 Apparatus within an integrated circuit for automatically detecting a test mode of operation of the integrated circuit and selecting a test clock signal |
| 05/14/1996 | US5517108 Flip-flop circuit in a scanning test apparatus |
| 05/14/1996 | US5517107 On-chip variance detection for integrated circuit devices |
| 05/14/1996 | US5517036 Tape carrier, and test apparatus for the same |
| 05/14/1996 | US5517028 Electron beam apparatus for measuring a voltage of a sample |
| 05/14/1996 | US5516028 Process and system for temperature control and in-line testing of electronic, electromechanical and mechanical modules |
| 05/14/1996 | US5515910 Apparatus for burn-in of high power semiconductor devices |
| 05/09/1996 | WO1996013967A1 Programmable high density electronic testing device |
| 05/09/1996 | WO1996013888A1 Process for detecting a ground fault in an electric energy transmission line |
| 05/09/1996 | WO1996013732A1 Process for monitoring the wear of at least one contact in a switching device and switching device designed therefor |
| 05/09/1996 | WO1996013731A1 Semiconductor test chip with on-wafer switching matrix |