Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1996
08/22/1996DE19503037C1 Digital circuit sequential error detection circuit
08/21/1996EP0727744A2 Apparatus for generating test pattern for sequential logic circuit of integrated circuit and method thereof
08/21/1996EP0727671A2 Method and apparatus for terahertz imaging
08/21/1996EP0727670A2 Phase difference measuring circuit
08/21/1996EP0727103A1 Apparatus for wiring a connector
08/21/1996EP0727048A1 System interface fault isolator test set
08/21/1996CN2233587Y Intelligent digital wire selector
08/21/1996CN1129495A Arrangement for detecting stator earth leakages in three-phase current machines
08/21/1996CN1032609C Method for measuring resistant current basic-wave of gap-less metal-oxide lightning arrester and apparatus thereof
08/20/1996US5548820 Antenna and feeder cable tester
08/20/1996US5548715 Method for analyzing a fault
08/20/1996US5548525 Method and apparatus for pin assignment in automatic circuit testers
08/20/1996US5548463 System for switching power and scrubbing power mixing devices for faults
08/20/1996US5548326 Efficient image registration
08/20/1996US5548224 Method and apparatus for wafer level prediction of thin oxide reliability
08/20/1996US5548223 Probe adapter for electronic device
08/20/1996US5548211 Dynamic fault imaging system using electron beam and method of analyzing fault
08/20/1996US5548210 System and procedure for the check-up solenoid valves
08/20/1996US5548207 For three-phase ac power equipment
08/20/1996US5547775 Circuit for preventing overcharge and overdischarge of secondary batteries
08/18/1996CA2169616A1 Circuit configuration for phase difference measurement
08/15/1996WO1996024856A1 Measuring system for enclosed high-voltage switchgear
08/15/1996WO1996024854A1 Top load socket for ball grid array devices
08/14/1996EP0726653A1 Bus maintenance circuit
08/14/1996EP0726472A2 Electronic battery monitoring system
08/14/1996EP0726471A2 Electro-optic voltage measurement apparatus
08/14/1996EP0726470A2 Electro-optic voltage measurement apparatus
08/14/1996EP0725994A1 Device for measuring the time element of a power switch
08/14/1996EP0725935A1 A device for the automatic control of joints in electrical high voltage lines
08/14/1996CN1128927A Testing circuit for loading terminals
08/13/1996USRE35313 Semiconductor integrated circuit with voltage limiter having different output ranges from normal operation and performing of aging tests
08/13/1996US5546408 Method for specifying a test sequence for a circuit
08/13/1996US5546407 Data transmission circuit for checking of memory device
08/13/1996US5546406 Cell architecture for built-in self-test of application specific integrated circuits
08/13/1996US5546405 Debug apparatus for an automated semiconductor testing system
08/13/1996US5546325 Automated system, and corresponding method, for testing electro-optic modules
08/13/1996US5546317 System for recognizing and managing electrochemical cells
08/13/1996US5546164 Communication control device connected to a plurality of image forming apparatuses and to a control device by public telephone network
08/13/1996US5546025 Low frequency discrimator using upper and lower thresholds
08/13/1996US5546015 Determining device and a method for determining a failure in a motor compressor system
08/13/1996US5546014 Method and device for setting the short circuit moment in electric motors, particularly in servomotors
08/13/1996US5546013 Array tester for determining contact quality and line integrity in a TFT/LCD
08/13/1996US5546012 Probe card assembly having a ceramic probe card
08/13/1996US5546010 Method for measuring a resistance value in an electrical apparatus
08/13/1996US5546003 Multi-cell battery monitoring system with single sensor wire
08/13/1996US5546002 Circuit for testing two switch or relay contacts simultaneously in automatic control systems
08/13/1996US5545969 Battery residual capacity displaying system with discharged electrical quantity computation section
08/13/1996US5545050 IC socket
08/13/1996US5545045 IC contactor
08/11/1996CA2142211A1 Device for verifying the wiring of an electrical receptacle for a towed vehicle
08/08/1996WO1996024069A1 Test device for flat electronic assemblies
08/08/1996DE19601862A1 Faulty block detector for semiconductor device testing
08/08/1996DE19506860C1 Verfahren zur Erfassung eines Erdschlußstromes A method for detecting a ground fault
08/08/1996DE19504731C1 Meßsystem für gekapselte Hochspannungsschaltanlagen Measurement system for encapsulated high-voltage switchgear
08/08/1996DE19503593A1 Electronic diagnosis system, e.g. CT
08/08/1996DE19503329A1 Testvorrichtung für elektronische Flachbaugruppen Testing apparatus for electronic printed circuit boards
08/07/1996EP0725469A1 Electrical switches with current protection interfaced with a remote station and a portable local unit
08/07/1996EP0725412A2 Safety device for a current line in vehicles
08/07/1996EP0724790A1 Apparatus comprising transient voltage suppression means
08/07/1996CN2232591Y Detecter for light of motor vehicle
08/07/1996CN1128608A Edge-connecting printed circuit board
08/07/1996CN1128417A High density and high current capacity pad-to-pad connector comprising of spring connector elements
08/07/1996CN1128399A Method for screening ceramic capacitors
08/07/1996CN1128356A Detection apparatus for cast-aluminium rotor of electric machine
08/07/1996CN1128355A A method of reducing the time for adjusting an electronic function in an article that presents dispersion from one article to another
08/06/1996US5544309 Data processing system with modified planar for boundary scan diagnostics
08/06/1996US5544175 Method and apparatus for the capturing and characterization of high-speed digital information
08/06/1996US5544174 Programmable boundary scan and input output parameter device for testing integrated circuits
08/06/1996US5544173 Delay test coverage without additional dummy latches in a scan-based test design
08/06/1996US5544123 Semiconductor memory device having a test circuit
08/06/1996US5544107 Diagnostic data port for a LSI or VLSI integrated circuit
08/06/1996US5544071 Critical path prediction for design of circuits
08/06/1996US5544069 Structure having different levels of programmable integrated circuits interconnected through bus lines for interconnecting electronic components
08/06/1996US5544067 In an ecad system
08/06/1996US5544066 Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including estimation and comparison of low-level design constraints
08/06/1996US5543995 Method and apparatus for protecting a power transmission line
08/06/1996US5543729 Testing apparatus and connector for liquid crystal display substrates
08/06/1996US5543728 Low leakage diode switches for a tester circuit for integrated circuits
08/06/1996US5543727 Run-in test system for PC circuit board
08/06/1996US5543726 Open frame gantry probing system
08/06/1996US5543723 Apparatus for electro-optic sampling measuring of electrical signals in integrated circuits with improved probe positioning accuracy
08/06/1996US5543718 Cable testing device
08/06/1996US5543716 Sparkplug voltage probe for use with an internal combustion engine by clamping sparkplug cables with an insulation base
08/06/1996US5543245 System and method for monitoring battery aging
08/06/1996CA2081221C Method of detecting insulation faults and spark tester for implementing the method
08/06/1996CA1338513C Methods, systems and apparatus for detecting changes in variables
08/02/1996WO1996026451A1 Bit error measuring instrument
08/01/1996WO1996023319A2 Wafer level prediction of thin oxide reliability
08/01/1996WO1996023233A1 Composite test system of semiconductor testing device
08/01/1996WO1996023218A1 Condition tester for a battery
08/01/1996WO1996023217A1 Multilayer moisture barrier for electrochemical cell tester
08/01/1996WO1996023216A1 Composite film moisture barrier for on-cell tester
08/01/1996DE19602517A1 Flip=flop controller with selective buffering for logic integrated circuit testing
08/01/1996CA2210228A1 Composite film moisture barrier for on-cell tester
07/1996
07/31/1996EP0723668A1 Arrangement for testing a gate oxide
07/31/1996CN2232145Y Movable high voltage insulation test meter
07/31/1996CN1127927A An auxiliary unit notably for indicating the state of circuit breakers
07/31/1996CN1127889A A partial discharge sensing device, in particular for use in a gas-insulated apparatus, and partial discharge measuring system using such a sensing device
07/30/1996US5541936 Diagnostic circuit
07/30/1996US5541935 Integrated circuit with test signal buses and test control circuits