| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/11/1996 | CN1130945A Field transmitter built-in test equipment |
| 09/10/1996 | US5555522 Semiconductor memory having redundant cells |
| 09/10/1996 | US5555498 Circuit and method for interfacing vehicle controller and diagnostic test instrument |
| 09/10/1996 | US5555212 Method and apparatus for redundancy word line replacement in a semiconductor memory device |
| 09/10/1996 | US5555201 Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including interactive system for hierarchical display of control and dataflow information |
| 09/10/1996 | US5554941 Self-testing method for irregular CMOS switching structures with high defect detection |
| 09/10/1996 | US5554940 Bumped semiconductor device and method for probing the same |
| 09/10/1996 | US5554939 Non-destructive measuring sensor for semiconductor wafer and method of manufacturing the same |
| 09/10/1996 | US5554938 For evaluating a capability of wiring material |
| 09/10/1996 | US5554931 Portable live line tool tester |
| 09/10/1996 | US5554928 Manufacturing defect analyzer |
| 09/10/1996 | US5553488 Diagnosis apparatus for vehicle control system |
| 09/10/1996 | US5553478 Hand-held compression tool |
| 09/10/1996 | CA2124910C Method and apparatus for including the states of nonscannable parts in a scan chain |
| 09/06/1996 | WO1996027138A1 Unipolar earth leakage recognition process for three phase mains |
| 09/06/1996 | WO1996027136A1 Adapter system for component boards, for use in a test device |
| 09/05/1996 | DE19540671A1 Remote diagnosis of power supply in electrographic printer or copier |
| 09/05/1996 | DE19507529A1 Switching circuit for testing flexible electric leads |
| 09/05/1996 | DE19506720C1 Testing procedure for contact between chip connection pins and printed conductor paths |
| 09/04/1996 | EP0730340A1 Fault detector for voltage source self-commutated power converter |
| 09/04/1996 | EP0730233A2 Apparatus for generating test pattern for sequential logic circuit of integrated circuit and method thereof |
| 09/04/1996 | EP0730232A2 Apparatus for generating test pattern for sequential logic circuit of integrated circuit and method thereof |
| 09/04/1996 | EP0730161A2 Method and device for testing the protection arrangements of a real star-delta network |
| 09/04/1996 | EP0730160A2 Partial discharge measuring arrangement |
| 09/04/1996 | EP0729652A1 Contact structure for interconnections, interposer, semiconductor assembly and method |
| 09/04/1996 | EP0729603A1 Atg test station |
| 09/04/1996 | EP0729585A1 A surface mount test point enabling hands free diagnostic testing of electronical circuits |
| 09/04/1996 | EP0729584A1 Device for electrically testing an electrical connection member |
| 09/04/1996 | EP0646249B1 Process for detecting abnormalities in a line to be examined |
| 09/04/1996 | EP0569136B1 Methods and apparatus for programming cellular programmable logic integrated circuits |
| 09/04/1996 | CN2234623Y Electric leakage protector detector |
| 09/04/1996 | CN1130257A Ic carrier |
| 09/03/1996 | USH1590 Portable aircraft instrumentation data simulator |
| 09/03/1996 | US5553236 Method and apparatus for testing a clock stopping/starting function of a low power mode in a data processor |
| 09/03/1996 | US5553144 Method and system for selectively altering data processing system functional characteristics without mechanical manipulation |
| 09/03/1996 | US5553082 Built-in self-test for logic circuitry at memory array output |
| 09/03/1996 | US5553025 Semiconductor memory device executing a memory test in a plurality of test modes |
| 09/03/1996 | US5553002 Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, using milestone matrix incorporated into user-interface |
| 09/03/1996 | US5552953 System for supplying power to an apparatus and method for the assessment of the lifetime and capacity of a power-storage device |
| 09/03/1996 | US5552880 Optical radiation probe |
| 09/03/1996 | US5552745 Self-resetting CMOS multiplexer with static output driver |
| 09/03/1996 | US5552744 High speed IDDQ monitor circuit |
| 09/03/1996 | US5552733 Precise and agile timing signal generator based on a retriggered oscillator |
| 09/03/1996 | US5552718 Electrical test structure and method for space and line measurement |
| 09/03/1996 | US5552716 Method of positioning an electrooptic probe of an apparatus for the measurement of voltage |
| 09/03/1996 | US5552715 Apparatus for low cost electromagnetic field susceptibility testing |
| 09/03/1996 | US5552713 Method and device for testing electrophysiology catheter |
| 09/03/1996 | US5552712 Method for in-place circuit integrity testing |
| 09/03/1996 | US5552704 Eddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected curves |
| 09/03/1996 | US5552701 Docking system for an electronic circuit tester |
| 09/03/1996 | US5552699 Method and apparatus for testing wires extending between a switch cabinet and remotely positioned field units |
| 09/03/1996 | US5552602 Electron microscope |
| 09/03/1996 | US5552567 Printed circuit board having a plurality of circuit board patterns |
| 09/03/1996 | US5552563 Shielded low noise multi-lead contact |
| 09/02/1996 | CA2167260A1 Partial-discharge measuring device |
| 08/29/1996 | WO1996026450A1 Laser/pin assembly with integrated burn-in assembly |
| 08/29/1996 | WO1996026449A1 Fault-detection method and apparatus for electrically heated glass panes |
| 08/29/1996 | WO1996026446A1 Manipulator for automatic test equipment test head |
| 08/29/1996 | WO1996018109A3 An integrated resistor for sensing electrical parameters |
| 08/29/1996 | DE4440167A1 Measuring lateral current distribution in semiconductor structural elements esp. photovoltaic solar cells |
| 08/29/1996 | DE19606637A1 Integrated circuit test device for e.g. semiconductor memory |
| 08/29/1996 | DE19605255A1 Monitoring circuit wiring patterns of PCBs |
| 08/29/1996 | DE19506432A1 Field source for electromagnetic compatibility testing of electronic appts. |
| 08/28/1996 | EP0729035A2 Source for testing EMC compatibility |
| 08/28/1996 | EP0729034A2 Test circuit and process for functional testing electronic circuits |
| 08/28/1996 | EP0728613A2 Assist device for use in electric vehicle |
| 08/28/1996 | EP0728399A1 Method and apparatus for inspecting printed circuit boards at different magnifications |
| 08/28/1996 | EP0420398B1 Method for acquiring data in a logic analyzer |
| 08/28/1996 | CN2234096Y Multi-core cable quick tracer |
| 08/28/1996 | CN1129809A Arc detection using current variation |
| 08/27/1996 | US5550993 Data processor with sets of two registers where both registers receive identical information and when context changes in one register the other register remains unchanged |
| 08/27/1996 | US5550951 Computer-implemented method |
| 08/27/1996 | US5550846 Circuit for generating an output sequence of values |
| 08/27/1996 | US5550845 Method for dynamic testing of digital logic circuits |
| 08/27/1996 | US5550844 Printed circuit board fault injection circuit |
| 08/27/1996 | US5550843 Programmable scan chain testing structure and method |
| 08/27/1996 | US5550841 Method for failure analysis of megachips using scan techniques |
| 08/27/1996 | US5550840 Noise suppression in large three state busses during test |
| 08/27/1996 | US5550839 Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays |
| 08/27/1996 | US5550838 Method for testing characteristics of a semiconductor memory device in a series of steps |
| 08/27/1996 | US5550782 Programmable logic array integrated circuits |
| 08/27/1996 | US5550762 Diagnostic system for electronic automotive system |
| 08/27/1996 | US5550749 High level circuit design synthesis using transformations |
| 08/27/1996 | US5550631 Insulation doping system for monitoring the condition of electrical insulation |
| 08/27/1996 | US5550629 Method and apparatus for optically monitoring an electrical generator |
| 08/27/1996 | US5550583 Inspection apparatus and method |
| 08/27/1996 | US5550485 Multifunction alternator testing device |
| 08/27/1996 | US5550484 Apparatus and method for inspecting thin film transistor |
| 08/27/1996 | US5550482 Probe device |
| 08/27/1996 | US5550481 Circuit board test fixture apparatus with cam rotably mounted in slidable cam block and method for making |
| 08/27/1996 | US5550479 Signal measuring apparatus and signal measuring method |
| 08/27/1996 | US5550477 Methods and apparatus for testing armature coils and coil lead connections using resistance measurements |
| 08/27/1996 | US5550476 Fault sensor device with radio transceiver |
| 08/27/1996 | US5550475 Programmable battery charge indicator |
| 08/27/1996 | US5550466 Hinged conduit for routing cables in an electronic circuit tester |
| 08/27/1996 | US5550445 Generator controller and controlling method for hybrid vehicle |
| 08/27/1996 | US5548884 Method of manufacturing a known good die array |
| 08/22/1996 | WO1996025672A1 Contact structure of a handler for an ic testing device |
| 08/22/1996 | WO1996025671A1 Method of determining an earth-fault current |
| 08/22/1996 | DE19604764A1 Semiconductor memory structure for DRAM, VSRAM and PSRAM |