Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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01/29/1997 | EP0755581A1 Overvoltage protection |
01/29/1997 | EP0755574A1 Semiconductor element with a passivated surface and method of producing it |
01/29/1997 | EP0755521A1 Process for checking the efficiency of an electric power station component |
01/29/1997 | EP0755520A1 Test liquid for checking the efficiency of electric power station components |
01/29/1997 | EP0755504A1 Programmable cable adaptor |
01/29/1997 | EP0568689B1 Electronic apparatus for measuring the activity of an oil transformer |
01/29/1997 | CN1141493A Method for estimating discharge capability of zinc oxide power element, method for screening element and systems for carrying out these methods |
01/29/1997 | CN1141436A Arrangement for testing cells, power supply circuit with same, and machine with such circuit |
01/29/1997 | CN1141435A Arrangement for testing integrated circuit by using first-in first-out storage unit |
01/29/1997 | CN1141434A Contact structure of treatment device used for IC testing apparatus |
01/29/1997 | CA2179424A1 Sensor including two entwined spiral electrodes |
01/28/1997 | US5598421 In a digital network |
01/28/1997 | US5598360 Automated system and corresponding method for testing electro-optic modules |
01/28/1997 | US5598345 Method and apparatus for inspecting solder portions |
01/28/1997 | US5598344 Method and system for creating, validating, and scaling structural description of electronic device |
01/28/1997 | US5598342 Cable tester |
01/28/1997 | US5598116 Of an input pulse signal |
01/28/1997 | US5598102 Method for detecting defects in semiconductor insulators |
01/28/1997 | US5598101 Circuit arrangement having a wear indicator to indicate end of service life |
01/28/1997 | US5598100 Device for and method of evaluating semiconductor integrated circuit |
01/28/1997 | US5598098 Electronic battery tester with very high noise immunity |
01/28/1997 | US5598096 Method and apparatus for testing an integrated circuit using controlled wirebonding and wirebonding removal |
01/28/1997 | US5598088 Method for determining the charge state of a battery, in particular a vehicle starter battery |
01/28/1997 | US5598087 System for monitoring residual capacity of battery |
01/28/1997 | US5598086 Peak voltage and peak slope detector for a battery charger circuit |
01/28/1997 | US5597737 Method for testing and burning-in a semiconductor wafer |
01/23/1997 | WO1997002574A1 Method of testing semiconductor memory and apparatus for implementing the method |
01/23/1997 | WO1997002530A1 Pc compatible modular based diagnostic system |
01/23/1997 | WO1997002493A2 A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing |
01/23/1997 | DE19627056A1 Vector based determining and obtaining also reproduction of wave shapes |
01/23/1997 | DE19527972A1 Leakage detecting and locating sensor for high voltage cable |
01/22/1997 | EP0755071A2 Semiconductor probe card device with a ball-bump |
01/22/1997 | EP0754940A2 Modular wireless diagnostic, test, and information system |
01/22/1997 | EP0754304A1 Device for checking the insulation condition of alternating-current-carrying lines or cables |
01/22/1997 | CN1140840A Ic插座测试器 Ic Socket Tester |
01/21/1997 | US5596742 Virtual interconnections for reconfigurable logic systems |
01/21/1997 | US5596587 Method and apparatus for preparing in-circuit test vectors |
01/21/1997 | US5596586 Failure simulation method |
01/21/1997 | US5596585 Performance driven BIST technique |
01/21/1997 | US5596584 Single clock scan latch |
01/21/1997 | US5596512 Method of determining the condition of a back-up battery for a real time clock |
01/21/1997 | US5596473 Electrical switches with current protection interfaced with a remote station and a portable local unit |
01/21/1997 | US5596288 Status register with asynchronous read and reset and method for providing same |
01/21/1997 | US5596283 Continuous motion electrical circuit interconnect test method and apparatus |
01/21/1997 | US5596280 Apparatus and method for testing circuits by the response of a phase-locked loop |
01/21/1997 | US5596278 Condition tester for a battery |
01/21/1997 | US5596270 IC transportation mechanism provided with a plurality of suction |
01/21/1997 | US5596262 Process for monitoring the charge level of a battery, and for informing the user of the battery when the monitored charge level is no longer reliable |
01/21/1997 | US5596261 Charge-status display system for an electric vehicle |
01/21/1997 | US5596260 Apparatus and method for determining a charge of a battery |
01/21/1997 | US5596223 Semiconductor device and method of selecting the same |
01/21/1997 | US5595917 Method for hydrogen treatment of field effect transistors for use in hermetically sealed packages |
01/16/1997 | WO1997001881A1 Diagnostic circuit protection device |
01/16/1997 | DE19525475A1 Isolating protection system protecting against overload in motor vehicle power cable using shape memory alloy device |
01/15/1997 | EP0753860A2 A semiconductor memory with a clocked access code for test mode entry |
01/15/1997 | EP0753178A1 Timing model and characterization system for logic simulation of integrated circuits which takes into account process, temperature and power supply variations |
01/15/1997 | EP0753138A1 Optical corona monitoring system |
01/15/1997 | EP0617856B1 Flashover between power lines suspended in parallel |
01/15/1997 | EP0474275B1 Automatic test equipment system using pin slice architecture |
01/15/1997 | CN2245219Y Electric transmission line single phase ground fault descrimination and selection line device |
01/15/1997 | CN2245218Y Detector for testing high voltage insulating dynamic characteristic |
01/15/1997 | CN1140352A Power supply circuit capable of eliminating memory effect of cell |
01/14/1997 | USRE35423 Method and apparatus for performing automated circuit board solder quality inspections |
01/14/1997 | US5594770 Method and apparatus for imaging obscured areas of a test object |
01/14/1997 | US5594741 Method for control of random test vector generation |
01/14/1997 | US5594670 Apparatus for measuring circuit constant of induction motor with vector control system and method therefor |
01/14/1997 | US5594646 Method and apparatus for self-diagnosis for an electronic control system for vehicles |
01/14/1997 | US5594359 Voltage generating circuit for IC test |
01/14/1997 | US5594355 Electrical contactor apparatus for testing integrated circuit devices |
01/14/1997 | US5594354 Method for measuring selected frequencies of a coupled-dual resonator crystal |
01/14/1997 | US5594349 Dielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and method |
01/14/1997 | US5594348 Surge testing method in decompressed atmosphere for a small-size electric machine and apparatus thereof |
01/14/1997 | US5594345 Battery capacity indicator for mobile medical equipment |
01/14/1997 | US5594273 Apparatus for performing wafer-level testing of integrated circuits where test pads lie within integrated circuit die but overly no active circuitry for improved yield |
01/14/1997 | US5594235 Automated surface acquisition for a confocal microscope |
01/14/1997 | US5593903 Method of forming contact pads for wafer level testing and burn-in of semiconductor dice |
01/14/1997 | US5593794 Moisture barrier composite film of silicon nitride and fluorocarbon polymer and its use with an on-cell tester for an electrochemical cell |
01/09/1997 | WO1997001103A1 Battery monitor |
01/09/1997 | WO1997001102A1 System for detecting faults in connections between integrated circuits and circuit board traces |
01/09/1997 | WO1997000729A1 System and method for detection and control of ungrounded parts in a production coating line |
01/09/1997 | WO1996034293A3 Process for monitoring a three-phase mains for a change in the tuning of the arc supression coil |
01/09/1997 | DE4336884C2 Schaltungsanordnung Circuitry |
01/09/1997 | DE19621439A1 Verfahren zur Leistungssteuerung und Vorrichtung für die Verwendung in einer Funkkommunikationsvorrichtung A method for controlling power and apparatus for use in a radio communication device |
01/08/1997 | EP0752706A1 Method to set an integrated circuit in a second operating mode |
01/08/1997 | EP0752677A2 Parametric tuning of an integrated circuit after fabrication |
01/08/1997 | EP0752657A2 Test mode access control circuit |
01/08/1997 | EP0752656A2 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
01/08/1997 | EP0752594A2 Contact structure for electrically connecting a testing board and die |
01/08/1997 | EP0752593A2 Method for the early recognition of failures of power semiconductor modules |
01/08/1997 | EP0752592A2 Method and system for detecting insulation faults |
01/08/1997 | EP0752588A2 Testing apparatus |
01/08/1997 | EP0752583A1 Device for detecting wiring defect of wiring substrate |
01/08/1997 | EP0752109A1 System for calibrating a line isolation monitor |
01/08/1997 | EP0752108A1 Monitor for an ungrounded system |
01/08/1997 | EP0752107A1 System for measuring line to ground impedance |
01/08/1997 | EP0641446B1 Testing process for the quality control of electromagnetically actuated switching devices |
01/08/1997 | CN2244732Y Recorder for starting electrical test of electric generator |
01/08/1997 | CN1139759A Diagnostic circuit for testing capacity of electric capacitor |
01/07/1997 | US5592659 Timing signal generator |
01/07/1997 | US5592615 Malfunctioning parts detecting device and a method of detecting malfunctioning parts |