Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1997
01/29/1997EP0755581A1 Overvoltage protection
01/29/1997EP0755574A1 Semiconductor element with a passivated surface and method of producing it
01/29/1997EP0755521A1 Process for checking the efficiency of an electric power station component
01/29/1997EP0755520A1 Test liquid for checking the efficiency of electric power station components
01/29/1997EP0755504A1 Programmable cable adaptor
01/29/1997EP0568689B1 Electronic apparatus for measuring the activity of an oil transformer
01/29/1997CN1141493A Method for estimating discharge capability of zinc oxide power element, method for screening element and systems for carrying out these methods
01/29/1997CN1141436A Arrangement for testing cells, power supply circuit with same, and machine with such circuit
01/29/1997CN1141435A Arrangement for testing integrated circuit by using first-in first-out storage unit
01/29/1997CN1141434A Contact structure of treatment device used for IC testing apparatus
01/29/1997CA2179424A1 Sensor including two entwined spiral electrodes
01/28/1997US5598421 In a digital network
01/28/1997US5598360 Automated system and corresponding method for testing electro-optic modules
01/28/1997US5598345 Method and apparatus for inspecting solder portions
01/28/1997US5598344 Method and system for creating, validating, and scaling structural description of electronic device
01/28/1997US5598342 Cable tester
01/28/1997US5598116 Of an input pulse signal
01/28/1997US5598102 Method for detecting defects in semiconductor insulators
01/28/1997US5598101 Circuit arrangement having a wear indicator to indicate end of service life
01/28/1997US5598100 Device for and method of evaluating semiconductor integrated circuit
01/28/1997US5598098 Electronic battery tester with very high noise immunity
01/28/1997US5598096 Method and apparatus for testing an integrated circuit using controlled wirebonding and wirebonding removal
01/28/1997US5598088 Method for determining the charge state of a battery, in particular a vehicle starter battery
01/28/1997US5598087 System for monitoring residual capacity of battery
01/28/1997US5598086 Peak voltage and peak slope detector for a battery charger circuit
01/28/1997US5597737 Method for testing and burning-in a semiconductor wafer
01/23/1997WO1997002574A1 Method of testing semiconductor memory and apparatus for implementing the method
01/23/1997WO1997002530A1 Pc compatible modular based diagnostic system
01/23/1997WO1997002493A2 A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing
01/23/1997DE19627056A1 Vector based determining and obtaining also reproduction of wave shapes
01/23/1997DE19527972A1 Leakage detecting and locating sensor for high voltage cable
01/22/1997EP0755071A2 Semiconductor probe card device with a ball-bump
01/22/1997EP0754940A2 Modular wireless diagnostic, test, and information system
01/22/1997EP0754304A1 Device for checking the insulation condition of alternating-current-carrying lines or cables
01/22/1997CN1140840A Ic插座测试器 Ic Socket Tester
01/21/1997US5596742 Virtual interconnections for reconfigurable logic systems
01/21/1997US5596587 Method and apparatus for preparing in-circuit test vectors
01/21/1997US5596586 Failure simulation method
01/21/1997US5596585 Performance driven BIST technique
01/21/1997US5596584 Single clock scan latch
01/21/1997US5596512 Method of determining the condition of a back-up battery for a real time clock
01/21/1997US5596473 Electrical switches with current protection interfaced with a remote station and a portable local unit
01/21/1997US5596288 Status register with asynchronous read and reset and method for providing same
01/21/1997US5596283 Continuous motion electrical circuit interconnect test method and apparatus
01/21/1997US5596280 Apparatus and method for testing circuits by the response of a phase-locked loop
01/21/1997US5596278 Condition tester for a battery
01/21/1997US5596270 IC transportation mechanism provided with a plurality of suction
01/21/1997US5596262 Process for monitoring the charge level of a battery, and for informing the user of the battery when the monitored charge level is no longer reliable
01/21/1997US5596261 Charge-status display system for an electric vehicle
01/21/1997US5596260 Apparatus and method for determining a charge of a battery
01/21/1997US5596223 Semiconductor device and method of selecting the same
01/21/1997US5595917 Method for hydrogen treatment of field effect transistors for use in hermetically sealed packages
01/16/1997WO1997001881A1 Diagnostic circuit protection device
01/16/1997DE19525475A1 Isolating protection system protecting against overload in motor vehicle power cable using shape memory alloy device
01/15/1997EP0753860A2 A semiconductor memory with a clocked access code for test mode entry
01/15/1997EP0753178A1 Timing model and characterization system for logic simulation of integrated circuits which takes into account process, temperature and power supply variations
01/15/1997EP0753138A1 Optical corona monitoring system
01/15/1997EP0617856B1 Flashover between power lines suspended in parallel
01/15/1997EP0474275B1 Automatic test equipment system using pin slice architecture
01/15/1997CN2245219Y Electric transmission line single phase ground fault descrimination and selection line device
01/15/1997CN2245218Y Detector for testing high voltage insulating dynamic characteristic
01/15/1997CN1140352A Power supply circuit capable of eliminating memory effect of cell
01/14/1997USRE35423 Method and apparatus for performing automated circuit board solder quality inspections
01/14/1997US5594770 Method and apparatus for imaging obscured areas of a test object
01/14/1997US5594741 Method for control of random test vector generation
01/14/1997US5594670 Apparatus for measuring circuit constant of induction motor with vector control system and method therefor
01/14/1997US5594646 Method and apparatus for self-diagnosis for an electronic control system for vehicles
01/14/1997US5594359 Voltage generating circuit for IC test
01/14/1997US5594355 Electrical contactor apparatus for testing integrated circuit devices
01/14/1997US5594354 Method for measuring selected frequencies of a coupled-dual resonator crystal
01/14/1997US5594349 Dielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and method
01/14/1997US5594348 Surge testing method in decompressed atmosphere for a small-size electric machine and apparatus thereof
01/14/1997US5594345 Battery capacity indicator for mobile medical equipment
01/14/1997US5594273 Apparatus for performing wafer-level testing of integrated circuits where test pads lie within integrated circuit die but overly no active circuitry for improved yield
01/14/1997US5594235 Automated surface acquisition for a confocal microscope
01/14/1997US5593903 Method of forming contact pads for wafer level testing and burn-in of semiconductor dice
01/14/1997US5593794 Moisture barrier composite film of silicon nitride and fluorocarbon polymer and its use with an on-cell tester for an electrochemical cell
01/09/1997WO1997001103A1 Battery monitor
01/09/1997WO1997001102A1 System for detecting faults in connections between integrated circuits and circuit board traces
01/09/1997WO1997000729A1 System and method for detection and control of ungrounded parts in a production coating line
01/09/1997WO1996034293A3 Process for monitoring a three-phase mains for a change in the tuning of the arc supression coil
01/09/1997DE4336884C2 Schaltungsanordnung Circuitry
01/09/1997DE19621439A1 Verfahren zur Leistungssteuerung und Vorrichtung für die Verwendung in einer Funkkommunikationsvorrichtung A method for controlling power and apparatus for use in a radio communication device
01/08/1997EP0752706A1 Method to set an integrated circuit in a second operating mode
01/08/1997EP0752677A2 Parametric tuning of an integrated circuit after fabrication
01/08/1997EP0752657A2 Test mode access control circuit
01/08/1997EP0752656A2 Fail-fast, fail-functional, fault-tolerant multiprocessor system
01/08/1997EP0752594A2 Contact structure for electrically connecting a testing board and die
01/08/1997EP0752593A2 Method for the early recognition of failures of power semiconductor modules
01/08/1997EP0752592A2 Method and system for detecting insulation faults
01/08/1997EP0752588A2 Testing apparatus
01/08/1997EP0752583A1 Device for detecting wiring defect of wiring substrate
01/08/1997EP0752109A1 System for calibrating a line isolation monitor
01/08/1997EP0752108A1 Monitor for an ungrounded system
01/08/1997EP0752107A1 System for measuring line to ground impedance
01/08/1997EP0641446B1 Testing process for the quality control of electromagnetically actuated switching devices
01/08/1997CN2244732Y Recorder for starting electrical test of electric generator
01/08/1997CN1139759A Diagnostic circuit for testing capacity of electric capacitor
01/07/1997US5592659 Timing signal generator
01/07/1997US5592615 Malfunctioning parts detecting device and a method of detecting malfunctioning parts