| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/07/1997 | US5592614 In an electrical circuit |
| 01/07/1997 | US5592562 Inspection system for cross-sectional imaging |
| 01/07/1997 | US5592496 Semiconductor test equipment |
| 01/07/1997 | US5592494 Semiconductor integrated circuit |
| 01/07/1997 | US5592493 Serial scan chain architecture for a data processing system and method of operation |
| 01/07/1997 | US5592427 Semiconductor memory having a sense amplifier with load transistors having different load characteristics |
| 01/07/1997 | US5592424 Semiconductor integrated circuit device |
| 01/07/1997 | US5592423 Semiconductor integrated circuit enabling external monitor and control of voltage generated in internal power supply circuit |
| 01/07/1997 | US5592422 Reduced pin count stress test circuit for integrated memory devices and method therefor |
| 01/07/1997 | US5592112 Motor current detection circuit |
| 01/07/1997 | US5592101 Electro-optic apparatus for measuring an electric field of a sample |
| 01/07/1997 | US5592100 Method for detecting an IC defect using charged particle beam |
| 01/07/1997 | US5592099 IC tester joined with ion beam tester and the detection method of the failure part of IC |
| 01/07/1997 | US5592097 Load open state detection using H-bridge driving circuit |
| 01/07/1997 | US5592094 Batterey discharge characteristics calculation method and remaining battery capacity measuring device |
| 01/07/1997 | US5592093 Electronic battery testing device loose terminal connection detection via a comparison circuit |
| 01/07/1997 | US5592077 Circuits, systems and methods for testing ASIC and RAM memory devices |
| 01/07/1997 | US5592069 Battery charger |
| 01/07/1997 | US5591984 Current sensing daisy-chain bypass arrangement |
| 01/07/1997 | CA2112817C Electrosurgical apparatus for laparoscopic and like procedures |
| 01/03/1997 | WO1997000478A1 Parallel testing of cpu cache and instruction units |
| 01/03/1997 | WO1997000452A2 Mura detection apparatus and method |
| 01/02/1997 | EP0751557A2 Wiring circuit board for mounting of semiconductor chip and method for the preparation thereof |
| 01/02/1997 | EP0751397A2 Test mode setting circuit of test circuit for semiconductor memory |
| 01/02/1997 | EP0751396A1 Monitoring the insulation in electric vehicles |
| 01/02/1997 | EP0750804A1 Battery energy monitoring circuits |
| 01/02/1997 | EP0623253B1 Monitoring system for batteries during charge and discharge |
| 01/02/1997 | DE19626103A1 Fault judgement system for detection of abnormalities in semiconductor device |
| 01/02/1997 | DE19625225A1 Timer for use in IC test unit for producing time signals with higher time resolution |
| 01/02/1997 | DE19625185A1 Precision pulse generator with jitter control circuit for integrated circuit test unit |
| 01/02/1997 | DE19523967A1 Earth current circuit-breaker for insulation monitoring of electric circuits |
| 01/02/1997 | DE19522839A1 Testing method for impulse counters in IC |
| 01/01/1997 | CN1139231A Propagation delay measuring circuit of signal for measuring |
| 12/31/1996 | US5590354 Microcontroller provided with hardware for supporting debugging as based on boundary scan standard-type extensions |
| 12/31/1996 | US5590275 Method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components |
| 12/31/1996 | US5590273 Microcontroller integrated circuit with read only memory containing a generic program |
| 12/31/1996 | US5590170 For electronic components |
| 12/31/1996 | US5590137 Semiconductor IC tester |
| 12/31/1996 | US5590136 Method for creating an in-circuit test for an electronic device |
| 12/31/1996 | US5590135 Testing a sequential circuit |
| 12/31/1996 | US5590079 Wafer burn-in test circuit of a semiconductor memory device |
| 12/31/1996 | US5589912 Camera with image stabilizing device |
| 12/31/1996 | US5589877 Signal processing circuit |
| 12/31/1996 | US5589788 For receiving an input signal |
| 12/31/1996 | US5589787 Cell for shift register |
| 12/31/1996 | US5589780 IC Analysis system and electron beam probe system and fault isolation method therefor |
| 12/31/1996 | US5589777 Circuit and method for testing a disk drive head assembly without probing |
| 12/31/1996 | US5589776 On a data bus |
| 12/31/1996 | US5589773 System and method for making electromagnetic measurements using a tiltable transverse electromagnetic cell and a fixed tilt sample holder |
| 12/31/1996 | US5589766 Field-testable integrated circuit and method of testing |
| 12/31/1996 | US5589765 Method for final testing of semiconductor devices |
| 12/31/1996 | US5589763 Coherent undersampling digitizer for use with automatic field test equipment |
| 12/31/1996 | US5589754 Method for determining a stator flux estimate for an asynchronous machine |
| 12/31/1996 | US5588797 IC tray handling apparatus and method |
| 12/27/1996 | EP0750215A2 Battery system for camera |
| 12/27/1996 | EP0749628A1 Device for monitoring the operation safety of power switches (diagnosis apparatus) |
| 12/27/1996 | EP0519017B1 Method and apparatus for calibration in a high speed rf measurement receiver |
| 12/27/1996 | EP0486654B1 Method for monitoring fuel cell performance |
| 12/25/1996 | CN2243665Y Electric motor and feedback dectector |
| 12/25/1996 | CN2243664Y Multifunctional inspector for household electric appliances |
| 12/25/1996 | CN1138898A Automatic handler and method of measuring devices using the same |
| 12/24/1996 | US5588142 Method for simulating a circuit |
| 12/24/1996 | US5588115 Redundancy analyzer for automatic memory tester |
| 12/24/1996 | US5588008 Method for generating test patterns for use with a scan circuit |
| 12/24/1996 | US5588006 Logic circuit having a control signal switching logic function and having a testing arrangement |
| 12/24/1996 | US5587919 Apparatus and method for logic optimization by redundancy addition and removal |
| 12/24/1996 | US5587916 Low voltage sensing circuits for battery powered devices having a micro-processor |
| 12/24/1996 | US5587665 Testing hot carrier induced degradation to fall and rise time of CMOS inverter circuits |
| 12/24/1996 | US5587664 Laser-induced metallic plasma for non-contact inspection |
| 12/24/1996 | US5587663 Method for measuring the inductance of each resonator of a coupled-dual resonator crystal |
| 12/24/1996 | US5587661 Device for indicating errors in a control line of an electric control units |
| 12/24/1996 | US5587660 Process for evaluating the remaining charge in an accumulator battery |
| 12/24/1996 | US5587610 Semiconductor device having a conductive layer with an aperture |
| 12/24/1996 | US5586900 Connector terminal test jig |
| 12/19/1996 | WO1996041207A1 Performance driven bist technique |
| 12/19/1996 | WO1996041206A1 Method and apparatus for testing a megacell in an asic using jtag |
| 12/19/1996 | WO1996041205A1 Method and apparatus for testing a megacell in an asic using jtag |
| 12/19/1996 | WO1996041204A1 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 12/19/1996 | WO1996041150A1 Insulation doping system for monitoring the condition of electrical insulation |
| 12/19/1996 | WO1996041149A1 Optical radiation probe |
| 12/19/1996 | WO1996041137A1 Automated surface acquisition for a confocal microscope |
| 12/19/1996 | DE19619916A1 Pulse rate generation circuit for semiconductor testing system |
| 12/19/1996 | DE19539926C1 Appts. for determining insulation damage in wound insulated wires esp. enamelled motor coil wires |
| 12/19/1996 | DE19526435A1 Schaltungsanordnung zur Fehlerstromerkennung Circuit arrangement for current detection error |
| 12/19/1996 | DE19521337A1 Demonstration and location of magnetic or electromagnetic fields |
| 12/19/1996 | DE19509831C1 Device for measuring insulation resistance between mains connection lines e.g for meter and tested equipment |
| 12/18/1996 | EP0749069A2 Synchronized data transmission between elements of a processing system |
| 12/18/1996 | EP0749016A1 Method of determining remaining capacity of a storage cell |
| 12/18/1996 | EP0749015A2 Method for detection of failed heater in a daisy chain connection |
| 12/18/1996 | EP0748535A1 Improved supply voltage detection circuit |
| 12/18/1996 | EP0748450A1 Printed circuit board test set with test adapter and method for setting the latter |
| 12/18/1996 | EP0696031B1 Programmable integrated memory with emulation means |
| 12/18/1996 | CN2243083Y Domestic cell voltage measurer with multiple luminescent diode to indicate |
| 12/18/1996 | CN1138390A System for managing state of storage battery |
| 12/18/1996 | CN1138254A Power control method and apparatus suitable for use in radio communication device |
| 12/18/1996 | CN1138165A Device testing system with cable pivot and method of installation |
| 12/17/1996 | US5586275 Devices and systems with parallel logic unit operable on data memory locations, and methods |
| 12/17/1996 | US5586130 Method and apparatus for detecting fault conditions in a vehicle data recording device to detect tampering or unauthorized access |
| 12/17/1996 | US5586125 Method for generating test vectors for characterizing and verifying the operation of integrated circuits |
| 12/17/1996 | US5586054 time-domain reflectometer for testing coaxial cables |