| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/17/1996 | US5586043 Method and apparatus for monitoring differentials between signals |
| 12/17/1996 | US5585808 Test apparatus for testing the susceptibility of electronic equipment to electromagnetic radiation and for measuring electromagnetic radiation emitted by electronic equipment |
| 12/17/1996 | US5585738 Probe system having vertical height detection and double focal image pickup coinciding with probe contact in height adjustment |
| 12/17/1996 | US5585737 Semiconductor wafer probing method including arranging index regions that include all chips and minimize the occurrence of non-contact between a chip and a probe needle during chip verification |
| 12/17/1996 | US5585735 E-O probe with FOP and voltage detecting apparatus using the E-O probe |
| 12/17/1996 | US5585734 Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope |
| 12/17/1996 | US5585731 Test circuit of current-voltage conversion amplifier |
| 12/17/1996 | US5585728 Electronic battery tester with automatic compensation for low state-of-charge |
| 12/17/1996 | US5585701 Current mirror circuit constituted by FET (field effect transistor) and control system using the same |
| 12/17/1996 | US5585282 Process for forming a raised portion on a projecting contact for electrical testing of a semiconductor |
| 12/17/1996 | US5584395 High speed sorting apparatus for semiconductor device equipped with rotatable sorting drum |
| 12/12/1996 | WO1996039795A1 Multiple probing of an auxiliary test pad which allows for reliable bonding to a primary bonding pad |
| 12/12/1996 | WO1996039634A1 Ac power outlet ground integrity and wire test circuit device |
| 12/12/1996 | DE19530776C1 Monitoring method for staged load switching device |
| 12/12/1996 | CA2195937A1 Ac power outlet ground integrity and wire test circuit device |
| 12/11/1996 | EP0748100A2 A cable monitoring system with multiple branch terminations |
| 12/11/1996 | EP0748079A2 Communication path verification in a fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/11/1996 | EP0748053A2 Programmable array interconnect latch |
| 12/11/1996 | EP0747986A1 Method and device for judging secondary cell to be connected to charger |
| 12/11/1996 | EP0747930A1 Electronic device with multiple bonding wires, method of fabrication and method of testing bonding wire integrity |
| 12/11/1996 | EP0747905A1 Memory testing apparatus for microelectronic integrated circuit |
| 12/11/1996 | EP0747833A2 Fault-tolerant multiprocessor system |
| 12/11/1996 | EP0747821A2 Method for detecting divergence between a pair of duplexed, synchronized processor elements |
| 12/11/1996 | EP0747820A2 Method of synchronizing a pair of central processor units for duplex, lock-step operation |
| 12/11/1996 | EP0747803A2 Clock for a fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/11/1996 | EP0747717A2 Method and apparatus of testing an integrated circuit device |
| 12/11/1996 | EP0747716A2 Predictive waveform acquisition |
| 12/11/1996 | EP0747715A2 Multi-phase measuring |
| 12/11/1996 | EP0746772A1 Reusable die carrier for burn-in and burn-in process |
| 12/11/1996 | EP0438537B1 A device for monitoring and indicating a given minimum battery power reserve |
| 12/11/1996 | CN2242463Y High precision standard oil cup |
| 12/11/1996 | CN2242462Y induction type sound-light test pencil |
| 12/11/1996 | CN1137639A Semiconductor device and method for discriminating bad semiconductor devices from good ones |
| 12/10/1996 | US5584020 Fault simulator comprising a signal generating circuit and a simulation circuit implemented by hardware |
| 12/10/1996 | US5583948 Connecting element inspecting method and connecting element inspecting device |
| 12/10/1996 | US5583893 Method and apparatus for safely suspending and resuming operation of an electronic device |
| 12/10/1996 | US5583875 Automatic parametric self-testing and grading of a hardware system |
| 12/10/1996 | US5583874 10Base-T portable link tester |
| 12/10/1996 | US5583801 Voice troubleshooting system for computer-controlled machines |
| 12/10/1996 | US5583787 Method and data processing system for determining electrical circuit path delays |
| 12/10/1996 | US5583786 Apparatus and method for testing integrated circuits |
| 12/10/1996 | US5583767 Devices and systems with parallel logic unit, and methods notice |
| 12/10/1996 | US5583461 Internal clock signal generation circuit having external clock detection and a selectable internal clock pulse |
| 12/10/1996 | US5583447 Voltage probe with reverse impedance matching |
| 12/10/1996 | US5583446 For measuring high speed signals with a low speed measurement instrument |
| 12/10/1996 | US5583444 Voltage detection apparatus |
| 12/10/1996 | US5583441 Method and apparatus for automatically verifying faults and monitoring chips in a chip detection circuit |
| 12/10/1996 | US5583440 Method and apparatus for testing an auxiliary power system |
| 12/10/1996 | US5583434 Method and apparatus for monitoring armature position in direct-current solenoids |
| 12/10/1996 | US5583430 For testing an integrated circuit device |
| 12/10/1996 | US5582523 Connector inspecting apparatus |
| 12/10/1996 | US5582235 Temperature regulator for burn-in board components |
| 12/10/1996 | CA2074677C Vehicle lamp and circuit tester |
| 12/08/1996 | CA2178454A1 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/08/1996 | CA2178439A1 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/08/1996 | CA2178409A1 Apparatus for detecting divergence between a pair of duplexed synchronized processor elements |
| 12/08/1996 | CA2178407A1 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/08/1996 | CA2178406A1 Method of synchronizing a pair of central processor units for duplex lock step operation |
| 12/08/1996 | CA2178405A1 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/08/1996 | CA2178394A1 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/08/1996 | CA2178393A1 Router element for routing messages in a processing system |
| 12/08/1996 | CA2178391A1 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 12/05/1996 | WO1996038858A2 Method and probe card for testing semiconductor devices |
| 12/05/1996 | WO1996038736A1 Fault current recognition circuitry |
| 12/05/1996 | WO1996029773A3 Method and apparatus for detection and control of thermal runaway in a battery under charge |
| 12/05/1996 | WO1996029610A3 Manufacturing defect analyzer with improved fault coverage |
| 12/05/1996 | WO1996028745A3 Timing generator with multiple coherent synchronized clocks |
| 12/05/1996 | DE19520825A1 HV cable installation with corrosion protection monitoring circuit |
| 12/05/1996 | DE19519744A1 Test object insulation characteristics determn. method for esp. cable or cable system |
| 12/05/1996 | DE19518318A1 Electrical cable test and protection relay appts. for control of cable to electronic assembly part |
| 12/04/1996 | EP0746183A1 An electronic device for accurate identification at distance of malfunctions in lamps |
| 12/04/1996 | EP0745936A1 Improvements relating to memory designs for IC terminals |
| 12/04/1996 | EP0745935A1 Improvements relating to output boundary scan cells |
| 12/04/1996 | EP0745864A1 Diagnostic detection for hall effect digital gear tooth sensors and related method |
| 12/04/1996 | EP0745863A1 Electronic discharge detector for electrical apparatus |
| 12/04/1996 | EP0745862A2 Method and apparatus for determining insulating properties of test objects |
| 12/04/1996 | EP0745859A2 Configurable probe pads to facilitate parallel testing of integrated circuit devices |
| 12/04/1996 | EP0745293A1 Optical time domain reflectometry |
| 12/04/1996 | EP0745015A1 Multi-wavelength laser optic system for probe station and laser cutting |
| 12/04/1996 | EP0666481B1 Analog voltage output circuit |
| 12/04/1996 | EP0448619B1 Apparatus for protecting electrical systems |
| 12/04/1996 | CN2241888Y Battery voltage indicator |
| 12/04/1996 | CN2241887Y D.C. system earth-fault detecting device |
| 12/04/1996 | CN1137199A Flip-flop controller |
| 12/04/1996 | CN1137182A Battery powered electronic device for exchanging information with battery mailbox |
| 12/04/1996 | CN1137179A Battery having battery mailbox for exchanging information |
| 12/03/1996 | US5581742 Apparatus and method for emulating a microelectronic device by interconnecting and running test vectors on physically implemented functional modules |
| 12/03/1996 | US5581699 Computer system |
| 12/03/1996 | US5581698 Semiconductor integrated circuit device with test mode for testing CPU using external Signal |
| 12/03/1996 | US5581565 Measuring apparatus used for testing connections between at least two subassemblies |
| 12/03/1996 | US5581564 Diagnostic circuit |
| 12/03/1996 | US5581563 Design for testability technique of CMOS and BICMOS ICS |
| 12/03/1996 | US5581562 Integrated circuit device implemented using a plurality of partially defective integrated circuit chips |
| 12/03/1996 | US5581561 Random bit diagnostic for a high resolution measurement system |
| 12/03/1996 | US5581541 Electrical circuitry |
| 12/03/1996 | US5581510 Method of testing flash memory |
| 12/03/1996 | US5581491 High-throughput testing apparatus |
| 12/03/1996 | US5581463 Pay-per-use access to multiple electronic test capabilities and tester resources |
| 12/03/1996 | US5581452 Pulse width modulation inverter current detection method |
| 12/03/1996 | US5581434 Apparatus including a transient voltage suppressor |