| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/20/1997 | WO1997006444A1 Semiconductor wafer test and burn-in |
| 02/20/1997 | WO1997006443A1 Detection and location of current leakage paths and detection of oscillations |
| 02/20/1997 | DE4345246C2 Integrated circuit output driver for suppressing noise generation, e.g. in DRAM |
| 02/20/1997 | DE19531827A1 Meßsystem für elektrische Störungen in einer Hochspannungsschaltanlage A measuring system for electrical faults in a high-voltage switchgear |
| 02/20/1997 | DE19530587A1 Anordnung zum Überprüfen des Widerstandes einer an einem Übertrager angeschlossenen Last Arrangement for testing the resistance of a transformer connected to a load |
| 02/20/1997 | DE19530130A1 Verfahren und Vorrichtung für den Anschluß einer Vielzahl von Halbleiterchipkarten Method and apparatus for connecting a plurality of semiconductor chip cards |
| 02/20/1997 | CA2252103A1 Detection and location of current leakage paths and detection of oscillations |
| 02/19/1997 | EP0758771A1 An electronic circuit or board tester and a method of testing an electronic device |
| 02/19/1997 | EP0758454A1 Test system for equipped and unequipped printed circuit boards |
| 02/19/1997 | EP0708926B1 Adapter with solid body |
| 02/19/1997 | CN1143190A Automatic handler for IC test system, test tray stopping machanism and test tray transfrring method for automatic handler of IC test system |
| 02/18/1997 | US5604895 Method and apparatus for inserting computer code into a high level language (HLL) software model of an electrical circuit to monitor test coverage of the software model when exposed to test inputs |
| 02/18/1997 | US5604819 Determining offset between images of an IC |
| 02/18/1997 | US5604756 Testing device for concurrently testing a plurality of semiconductor memories |
| 02/18/1997 | US5604751 Time linearity measurement using a frequency locked, dual sequencer automatic test system |
| 02/18/1997 | US5604750 Method for voltage setup of integrated circuit tester |
| 02/18/1997 | US5604687 Thermal analysis system and method of operation |
| 02/18/1997 | US5604657 Relay circuit having a test switch and method of testing a relay circuit |
| 02/18/1997 | US5604447 Prescaler IC testing method and test probe card |
| 02/18/1997 | US5604446 Probe apparatus |
| 02/18/1997 | US5604445 Apparatus, and corresponding method, for stress testing semiconductor chips |
| 02/18/1997 | US5604444 Wafer probe station having environment control enclosure |
| 02/18/1997 | US5604443 Probe test apparatus |
| 02/18/1997 | US5604440 Method of testing a wire harness using a multicontact connector |
| 02/18/1997 | US5604439 Tractor/trailer lamp circuit continuity test device |
| 02/18/1997 | US5604437 Device for measuring circuit breaker wear |
| 02/18/1997 | US5604436 Christmas light string circuit tester |
| 02/18/1997 | US5604432 Test access architecture for testing of circuits modules at an intermediate node within an integrated circuit chip |
| 02/18/1997 | US5604049 Battery with tester label and method for producing it |
| 02/18/1997 | US5603619 Scalable test interface port |
| 02/18/1997 | CA2118818C Battery pack including static memory and a timer for charge management |
| 02/13/1997 | WO1997005651A1 Active matrix esd protection and testing scheme |
| 02/13/1997 | WO1997005501A2 Apparatus for and method of controlling and calibrating the phase of a coherent signal |
| 02/13/1997 | WO1997005500A1 Functional test process for a mechanical switching element |
| 02/13/1997 | WO1997005499A1 Method and apparatus for fast pattern generation |
| 02/13/1997 | WO1997005498A1 Low cost cmos tester |
| 02/13/1997 | WO1997005497A1 Method and apparatus for automated wafer level testing and reliability data analysis |
| 02/13/1997 | WO1997005496A1 Semiconductor device tester and semiconductor device testing system with a plurality of semiconductor device testers |
| 02/13/1997 | WO1997005495A1 Semiconductor device tester |
| 02/13/1997 | WO1997005494A1 Lan tester |
| 02/13/1997 | CA2227760A1 Functional test process for a mechanical switching element |
| 02/12/1997 | EP0758158A2 Electrostatic capacity measuring instrument for stator winding of electric rotating machine |
| 02/12/1997 | EP0758113A1 Test mode matrix circuit for an embedded microprocessor core |
| 02/12/1997 | EP0757870A1 Self-powered powerline sensor |
| 02/12/1997 | EP0673512B1 Charge-status indicator |
| 02/12/1997 | CN2247346Y Device for on-line monitoring transformer inner discharge |
| 02/12/1997 | CN2247345Y Sieving checking device for Christmas lamp string |
| 02/12/1997 | CN1142614A Peak voltage and peak slope detector for battery charger circuit |
| 02/11/1997 | US5602989 Bus connectivity verification technique |
| 02/11/1997 | US5602856 Test pattern generation for logic circuits with reduced backtracking operations |
| 02/11/1997 | US5602855 Integrated test circuit |
| 02/11/1997 | US5602492 Electrical test structure and method for measuring the relative locations of conducting features on an insulating substrate |
| 02/11/1997 | US5602491 Integrated circuit testing board having constrained thermal expansion characteristics |
| 02/11/1997 | US5602489 Switch potential electron beam substrate tester |
| 02/11/1997 | US5602488 Method and apparatus for adjusting sectional area ratio of metal-covered electric wire |
| 02/11/1997 | US5602482 Trailer systems tester |
| 02/11/1997 | US5602469 Apparatus for detecting the amplitude and phase of an a.c. signal |
| 02/11/1997 | US5602459 Fuel saving multi-battery charging system and method |
| 02/11/1997 | US5601740 Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires |
| 02/06/1997 | WO1997004459A1 Built in self test (bist) for multiple rams |
| 02/06/1997 | WO1997004373A1 A voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device |
| 02/06/1997 | WO1997004328A1 Memory defect analyzer for semiconductor memory tester |
| 02/06/1997 | WO1997004327A1 Semiconductor tester synchronized with external clock |
| 02/06/1997 | WO1997004326A1 A circuit provided with facilities for iddq-testing of a bias generator |
| 02/06/1997 | WO1997004325A1 Measuring circuit for detecting and locating incursions of water in pipe or cable installations |
| 02/06/1997 | WO1997004324A1 Prober and tester with compact interface for integrated circuits-containing wafer held docked in a vertical plane |
| 02/06/1997 | WO1997004323A1 Apparatus for detecting discontinuity of ground conductor and leak detector having function of detecting discontinuity of ground conductor |
| 02/05/1997 | EP0757499A2 Method and apparatus for testing the signature of decoders of compressed digital television signals |
| 02/05/1997 | EP0757422A2 Peak voltage and peak slope detector for a battery charger circuit |
| 02/05/1997 | EP0757414A2 Adapter with a carrier having a connection apparatus |
| 02/05/1997 | EP0757413A2 Adapter with a carrier having a connection apparatus |
| 02/05/1997 | EP0757318A2 A router element for routing messages in a processing system |
| 02/05/1997 | EP0757315A2 Fail-fast, fail-functional, fault-tolerant multiprocessor system |
| 02/05/1997 | EP0757254A2 Integrated circuit |
| 02/05/1997 | EP0756776A1 Stator manufacturing and testing method and apparatus |
| 02/05/1997 | CN1142283A Method and device for judging secondary cell to be connected to charger |
| 02/04/1997 | US5600788 Digital test and maintenance architecture |
| 02/04/1997 | US5600787 Method and data processing system for verifying circuit test vectors |
| 02/04/1997 | US5600757 Fuzzy rule-based system formed on a single semiconductor chip |
| 02/04/1997 | US5600734 Electron beam tester |
| 02/04/1997 | US5600658 Built-in self tests for large multiplier, adder, or subtractor |
| 02/04/1997 | US5600579 Hardware simulation and design verification system and method |
| 02/04/1997 | US5600578 Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results |
| 02/04/1997 | US5600566 Apparatus and method for monitoring state of battery |
| 02/04/1997 | US5600526 Load analysis system for fault detection |
| 02/04/1997 | US5600282 Low power consumption oscillator circuit |
| 02/04/1997 | US5600265 Programmable interconnect architecture |
| 02/04/1997 | US5600258 Method and apparatus for automated docking of a test head to a device handler |
| 02/04/1997 | US5600257 Semiconductor wafer test and burn-in |
| 02/04/1997 | US5600249 Determining contact quality of an impedance meter |
| 02/04/1997 | US5600248 Fault distance locator for underground cable circuits |
| 02/04/1997 | US5600229 System for monitoring energy performance of secondary battery, and method therefor |
| 02/04/1997 | US5600228 Power managing apparatus and method |
| 02/04/1997 | US5600215 Controller for electric vehicle |
| 02/04/1997 | US5600150 Method for obtaining three-dimensional data from semiconductor devices in a row/column array and control of manufacturing of same with data to eliminate manufacturing errors |
| 02/04/1997 | US5599636 Device for improving the current output of a chargeable battery at low outside temperature |
| 01/30/1997 | WO1997003365A2 Laser-induced metallic plasma for con-contact inspection |
| 01/30/1997 | DE19529013A1 Verfahren zur Funktionsprüfung eines mechanischen Schaltelementes Method for testing the function of a mechanical switching element |
| 01/29/1997 | EP0756287A2 A memory sensing circuit employing multi-current mirrors |
| 01/29/1997 | EP0756178A2 Power supply device characteristic measuring apparatus and method |