| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/09/1996 | US5534996 Measurement apparatus for evaluating characteristics of light emitting devices |
| 07/09/1996 | US5534853 Electronic apparatus for measuring the parameters of an oil transformer |
| 07/09/1996 | US5534798 Multiplexer with level shift capabilities |
| 07/09/1996 | US5534788 Integrated resistor for sensing electrical parameters |
| 07/09/1996 | US5534786 Burn-in and test method of semiconductor wafers and burn-in boards for use in semiconductor wafer burn-in tests |
| 07/09/1996 | US5534784 Method for probing a semiconductor wafer |
| 07/09/1996 | US5534783 For obtaining a signal reproducing anomalies in a first line |
| 07/09/1996 | US5534774 Apparatus for a test access architecture for testing of modules within integrated circuits |
| 07/09/1996 | US5534772 Apparatus and method for monitoring radiation effects at different intensities |
| 07/09/1996 | US5534726 Semiconductor device provided with status detecting function |
| 07/09/1996 | US5534667 Printed circuit board having zig-zag contact arrangement |
| 07/09/1996 | US5534359 Silicon wafer with ridges and grooves, electron microscopes |
| 07/09/1996 | US5534112 Method for testing electrical properties of silicon single crystal |
| 07/09/1996 | US5533398 Method and apparatus for testing lead connections of electronic components |
| 07/04/1996 | WO1996020534A1 Programmable logic module and architecture for field programmable gate array device |
| 07/04/1996 | WO1996020513A1 Method and device for judging secondary cell to be connected to charger |
| 07/04/1996 | WO1996020444A1 Method and equipment for the automatic testing of electronic components |
| 07/04/1996 | WO1996020410A1 Cable partial discharge location pointer |
| 07/04/1996 | WO1996020409A1 High-speed test-pattern transfer apparatus for semiconductor testing |
| 07/04/1996 | DE19548984A1 System for fuse couplers in integrated circuit |
| 07/04/1996 | CA2197221A1 Programmable logic module and architecture for field programmable gate array device |
| 07/03/1996 | EP0720097A2 Method for identifying untestable & redundant faults in sequential logic circuits |
| 07/03/1996 | EP0720023A1 Test method for power integrated devices |
| 07/03/1996 | EP0719431A1 Scan test circuit using fast transmission gate switch |
| 07/03/1996 | EP0719418A1 Printed circuit board tester |
| 07/03/1996 | EP0719417A1 Field transmitter built-in test equipment |
| 07/03/1996 | EP0574485B1 Circuit arrangement for processing physiological measurement signals |
| 07/03/1996 | EP0558513B1 Test circuit for detection of malfunctions in an electric triggering device in a vehicle occupant protection device |
| 07/03/1996 | CN2230452Y Electronic photo-acoustic circuit detector for automobile |
| 07/03/1996 | CN1125898A Interface apparatus for automatic test equipment |
| 07/02/1996 | US5533197 Method to assess electromigration and hot electron reliability for microprocessors |
| 07/02/1996 | US5533032 Built-in self-test global clock drive architecture |
| 07/02/1996 | US5532983 Circuit design for point-to-point chip for high speed testing |
| 07/02/1996 | US5532927 Automotive diagnostic tool |
| 07/02/1996 | US5532739 Automated optical inspection apparatus |
| 07/02/1996 | US5532675 Alarm tester |
| 07/02/1996 | US5532618 Stress mode circuit for an integrated circuit with on-chip voltage down converter |
| 07/02/1996 | US5532614 Wafer burn-in and test system |
| 07/02/1996 | US5532612 Methods and apparatus for test and burn-in of integrated circuit devices |
| 07/02/1996 | US5532611 Miniature probe positioning actuator |
| 07/02/1996 | US5532610 Apparatus for testing semicondctor wafer |
| 07/02/1996 | US5532609 Wafer probe station having environment control enclosure |
| 07/02/1996 | US5532608 Ceramic probe card and method for reducing leakage current |
| 07/02/1996 | US5532602 Diagnostic circuit and method for amperometrically determining the current passing through a sensor |
| 07/02/1996 | US5532601 Circuit integrity test system |
| 07/02/1996 | US5532600 Method of and apparatus for evaluating reliability of metal interconnect |
| 07/02/1996 | US5532174 Wafer level integrated circuit testing with a sacrificial metal layer |
| 07/02/1996 | US5531145 Method for making IC card having severable mini chip card |
| 07/02/1996 | US5531022 Method of forming a three dimensional high performance interconnection package |
| 06/27/1996 | WO1996019734A1 Method and apparatus for semiconductor die testing |
| 06/27/1996 | DE4445596A1 Partial discharge measurement method for e.g. high voltage cable |
| 06/27/1996 | DE4443941A1 Quasi-real=time testing of sensor and wiring to measuring appts. |
| 06/26/1996 | EP0718917A2 Electrical interconnect contact system |
| 06/26/1996 | EP0718850A1 Integrated circuit memory test method and circuit |
| 06/26/1996 | EP0718614A2 Device for testing vehicles or for evaluating perturbations and/or failures of vehicle functions |
| 06/26/1996 | EP0717851A1 A method of testing and an electronic circuit comprising a flipflop with a master and a slave |
| 06/26/1996 | EP0717837A1 Corrosion resistant cable |
| 06/26/1996 | EP0381448B1 Apparatus and method for changing frequencies |
| 06/26/1996 | CN2230042Y On line instrument for testing attrition of insulation grid bipolar transistor |
| 06/26/1996 | CN2230041Y Instrument for locating fault in cable under earth or in hidden place |
| 06/26/1996 | CN2230040Y Instrument for testing groups of polarity of mutual inductor |
| 06/26/1996 | CN1125482A Process and device for testing an integrated circuit soldered on a board |
| 06/26/1996 | CN1125323A Open frame gantry probing system |
| 06/25/1996 | US5530805 Failure analysis device for memory devices |
| 06/25/1996 | US5530753 Methods and apparatus for secure hardware configuration |
| 06/25/1996 | US5530749 Methods and apparatus for secure hardware configuration |
| 06/25/1996 | US5530706 Non-destructive sampling of internal states while operating at normal frequency |
| 06/25/1996 | US5530449 Phased array antenna management system and calibration method |
| 06/25/1996 | US5530375 Method of testing circuits and/or burning-in chips |
| 06/25/1996 | US5530374 Method of identifying probe position and probing method in prober |
| 06/25/1996 | US5530373 Method and apparatus for determining and selectively displaying valid measurement information |
| 06/25/1996 | US5530372 Method of probing a net of an IC at an optimal probe-point |
| 06/25/1996 | US5530371 Probe card assembly |
| 06/25/1996 | US5530370 Testing apparatus for testing and handling a multiplicity of devices |
| 06/25/1996 | US5530367 Cable testing apparatus |
| 06/25/1996 | US5530366 Acoustic optical system for partial discharge detection and location |
| 06/25/1996 | US5530365 Process and apparatus for locating faults in cables, such as faults in underground cables |
| 06/25/1996 | US5530364 Cable partial discharge location pointer |
| 06/25/1996 | US5530363 DC ground fault detecting apparatus with an auto-null circuit and method |
| 06/25/1996 | US5530362 Method and system for determining exams remaining in battery powered mobile x-ray devices |
| 06/25/1996 | US5530361 Method and apparatus for measuring the state of charge of an electrochemical cell pulse producing a high discharge current |
| 06/25/1996 | US5530360 Apparatus and method for diagnosing faults in a vehicle electrical system |
| 06/25/1996 | US5530299 Method of determining mechanical parameters of an electric switching device |
| 06/20/1996 | WO1996019072A1 A method and apparatus for testing lines in a telecommunications network |
| 06/20/1996 | WO1996019005A1 True hysteresis window comparator |
| 06/20/1996 | WO1996018910A1 A method and apparatus for selecting modes of an integrated circuit |
| 06/20/1996 | WO1996018909A1 Monitoring system for insulated high voltage apparatus |
| 06/20/1996 | DE19602439A1 Non-destructive monitor system for HV network insulation |
| 06/20/1996 | DE19514082C1 Anordnung zur Auslösung einer Personenschutzanlage Arrangement for triggering a personal protection system |
| 06/20/1996 | CA2181712A1 Monitoring system for insulated high voltage apparatus |
| 06/19/1996 | EP0717471A2 High density and high current capacity pad-to-pad connector comprising of spring connector elements (SCE) |
| 06/19/1996 | EP0717287A2 Input and output boundary scan cells |
| 06/19/1996 | EP0716905A2 Method and apparatus for automated docking of a test head to a device handler |
| 06/19/1996 | EP0535207B1 Method and apparatus for testing an airbag restraint system with parallel sensors |
| 06/19/1996 | CN2229669Y Safe monitoring alarm for isolating transformer |
| 06/19/1996 | CN1124847A Abnormality detection method, abnormality detection apparatus, and power generating system using the same |
| 06/18/1996 | US5528610 Boundary test cell with self masking capability |
| 06/18/1996 | US5528604 Test pattern generation for an electronic circuit using a transformed circuit description |
| 06/18/1996 | US5528603 Apparatus and method for testing an integrated circuit using a voltage reference potential and a reference integrated circuit |
| 06/18/1996 | US5528601 Scannable latch for multiplexor control |