Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/1996
10/22/1996US5568493 Scan based testing for analog module within a mixed analog and digital circuit
10/22/1996US5568492 Circuit and method of JTAG testing multichip modules
10/22/1996US5568435 Circuit for SRAM test mode isolated bitline modulation
10/22/1996US5568434 Multi-bit testing circuit for semiconductor memory device
10/22/1996US5568408 Automatic repair data editing system associated with repairing system for semiconductor integrated circuit device
10/22/1996US5568407 Method and system for the design verification of logic units and use in different environments
10/22/1996US5568399 Method and apparatus for power outage determination using distribution system information
10/22/1996US5568380 In a data processing system
10/22/1996US5568076 Method of converting short duration input pulses to longer duration output pulses
10/22/1996US5568072 Circuit indicating the phase relation between several signals having the same frequency
10/22/1996US5568058 Automatic motor tester
10/22/1996US5568057 Method for performing a burn-in test
10/22/1996US5568056 Wafer prober
10/22/1996US5568055 Adiabatic conductor analyzer method and system
10/22/1996US5568054 Probe apparatus having burn-in test function
10/22/1996US5567165 Fluid actuated connector/carrier for electric part
10/22/1996CA2174606A1 Measuring system for partial discharges
10/22/1996CA2160720C Bad contact detecting device
10/22/1996CA2057339C Test interface for a digital circuit
10/17/1996WO1996032728A1 Circuit for sram test mode isolated bitline modulation
10/17/1996WO1996032678A1 Automatic parallel electronic component testing method and equipment
10/17/1996WO1996032654A1 Period generator for semiconductor testing device
10/17/1996WO1996032653A1 Method of measuring distances along a high-tension power-transmission line
10/17/1996WO1996032652A1 Distance measurement process
10/17/1996WO1996032651A1 Voltage detector
10/17/1996WO1996032302A1 Arrangement for triggering a personal protection system
10/17/1996DE19614365A1 Diagnostic system for measurement of 'back-up' capacitor in test of 'hold up' circuitry in vehicle airbag control system
10/17/1996DE19613611A1 Magazine for loading and transporting semiconductor devices for testing
10/17/1996DE19610462A1 Semiconductor device manipulation appts.
10/17/1996DE19522428C1 Test and current supply device for test items esp. for testing chips on wafer with several connection pads
10/17/1996DE19513441A1 High voltage test of transmission cables and fittings for electrical energy transfer
10/17/1996DE19510835C1 Method of testing drive circuit for fork-lift truck contg. externally excited DC machine
10/16/1996EP0738041A1 Electronic circuit comprising a comparator
10/16/1996EP0737913A1 Scannable last-in-first-out register stack
10/16/1996EP0737908A1 Computer system having remotely operated interactive display
10/16/1996EP0737337A1 Apparatus and method for testing integrated circuits
10/16/1996EP0676055B1 Circuit arrangement for monitoring a plurality of coils
10/16/1996EP0591149B1 Communications line testing
10/16/1996EP0501952B1 Battery monitoring system
10/16/1996CN2237854Y Multi-hole socket detector
10/16/1996CN1133522A Automatic defect detecting mechanism for techician carried test and communication device
10/15/1996US5566386 Nonvolatile semiconductor memory device having a status register and test method for the same
10/15/1996US5566303 Microcomputer with multiple CPU'S on a single chip with provision for testing and emulation of sub CPU's
10/15/1996US5566240 Method and apparatus for enhancing the quality of sound from electrically powered audio equipment
10/15/1996US5566188 Low cost timing generator for automatic test equipment operating at high data rates
10/15/1996US5566187 Method for identifying untestable faults in logic circuits
10/15/1996US5566186 Test control device
10/15/1996US5566185 Semiconductor integrated circuit
10/15/1996US5566088 Modular radio test system and method
10/15/1996US5566083 Method for analyzing voltage fluctuations in multilayered electronic packaging structures
10/15/1996US5566082 Method of detecting a fault section of busbar
10/15/1996US5565856 Abnormality detecting device for vehicle communication system and method of using same
10/15/1996US5565822 TEM waveguide arrangement
10/15/1996US5565801 Integrated circuit for independently testing individual analog internal functional blocks
10/15/1996US5565784 Coaxial cable testing and tracing device
10/15/1996US5565783 Fault sensor device with radio transceiver
10/15/1996US5565767 Base substrate of multichip module and method for inspecting the same
10/15/1996US5565766 Semiconductor circuit element device with arrangement for testing the device and method of test
10/15/1996US5564831 Method and apparatus for detecting the temperature of an environment
10/15/1996US5564183 Producing system of printed circuit board and method therefor
10/15/1996EP0746772A4 Reusable die carrier for burn-in and burn-in process
10/10/1996WO1996031755A1 Transition detection circuit
10/09/1996EP0737027A2 Integrated circuit testing board having constrained thermal expansion characteristics
10/09/1996EP0736777A2 Switch with measuring device
10/09/1996EP0736776A2 Searching electromagnetic disturbing source
10/09/1996EP0736775A2 Circuit for testing the connection of a reproduction set to a source of audio signals
10/09/1996EP0736773A2 Transmission line length measurement method and apparatus
10/09/1996EP0475631B1 A general purpose, reconfigurable system for processing serial bit streams
10/09/1996CN1132973A Electric power cut-off detection unit for monitor
10/09/1996CN1132860A Testing diagnosis equipment and method for servicing household appliance
10/09/1996CN1132859A Dielectric loss measuring method and equipment for high-voltage electrical equipment
10/09/1996CN1032983C Property measuring instrument for semiconductor device
10/08/1996US5563788 Vehicular self-test system of electronic component controlling device and a method for self-testing
10/08/1996US5563546 Selector circuit selecting and outputting voltage applied to one of first and second terminal in response to voltage level applied to first terminal
10/08/1996US5563524 Apparatus for testing electric circuits
10/08/1996US5563523 Circuit configuration for preparing analog signals for a boundary scan test process
10/08/1996US5563522 Microwave band probing apparatus
10/08/1996US5563521 Membrane connector with stretch induced micro scrub
10/08/1996US5563520 Probe system
10/08/1996US5563517 Dual channel d.c. low noise measurement system and test methodology
10/08/1996US5563509 Adaptable load board assembly for testing ICs with different power/ground bond pad and/or pin configurations
10/08/1996US5563508 Non-contact resistivity measurement apparatus and method using femtosecond laser pulses to create an electron flow
10/08/1996US5563507 Method of testing the interconnection between logic devices
10/08/1996US5563489 Starter contact integrity test
10/08/1996US5563409 Crosstalk measurement system and technique
10/08/1996US5563357 Instrument carrier and method for the inspection of a dynamoelectric machine in a gap between a stator and a rotor
10/07/1996CA2162099A1 Contactless test method and system for testing printed circuit boards
10/03/1996WO1996031039A1 Testing device for gmsk communication device
10/03/1996WO1996031002A1 Timing generator for automatic test equipment operating at high data rates
10/03/1996WO1996030994A1 Method and means for supervision of valve units
10/03/1996WO1996030834A1 System and method for generating pseudo-random instructions for design verification
10/03/1996WO1996030775A1 Process and circuit for monitoring a data processing circuit
10/03/1996WO1996030772A1 Interface apparatus for automatic test equipment
10/02/1996EP0735630A2 Lamp holder especially for fluorescent lamps
10/02/1996EP0735478A1 Variable configuration data processing system with automatic serial test interface connection configuration and bypass device
10/02/1996EP0735378A2 Method and arrangement for the analysis of the response of optically excited semiconductor materials
10/02/1996EP0735376A2 Metal detector coil resistance testing
10/02/1996EP0735375A2 Cable breakdown detection appliance
10/02/1996EP0735373A1 Method and apparatus for measuring a transfer impedance of shielded devices and common mode currents in shieldings
10/02/1996EP0734774A2 Method for operating an electrostatic precipitator
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