| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/30/1996 | US5541861 Logic simulator |
| 07/30/1996 | US5541849 Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including estimation and comparison of timing parameters |
| 07/30/1996 | US5541840 Hand held automotive diagnostic service tool |
| 07/30/1996 | US5541553 Amplifier with a function for switching on and off the output signal |
| 07/30/1996 | US5541547 Test generator system for controllably inducing power pin latch-up and signal pin latch-up in a CMOS device |
| 07/30/1996 | US5541525 Carrier for testing an unpackaged semiconductor die |
| 07/30/1996 | US5541524 Burn-in technologies for unpackaged integrated circuits |
| 07/30/1996 | US5541523 System for detecting operability of an airbag squib resistor |
| 07/30/1996 | US5541521 EMI test system and decoupling network therefor, the decoupling network having series connected resonators with torroidal cores formed from a ferrite Composition |
| 07/30/1996 | US5541509 Electrical cable jacket and conductor eccentricity detector including energizing coil formed about a toroid core and movable pickup coil |
| 07/30/1996 | US5541505 Testing integrated circuits by consolidating a plurality of digital signals as a multilevel signal |
| 07/30/1996 | US5541504 Sequential connecting apparatus for automatic testing |
| 07/30/1996 | US5541490 Battery charger |
| 07/30/1996 | US5541489 Smart battery power availability feature based on battery-specific characteristics |
| 07/30/1996 | US5541416 Estimation method and apparatus for semiconductor light emitting element capable of inspecting by wafer |
| 07/25/1996 | WO1996022625A1 Battery energy monitoring circuits |
| 07/25/1996 | WO1996022541A1 Fault current sensor device with radio transceiver |
| 07/24/1996 | EP0723164A1 Prescaler IC testing method and test probe card |
| 07/24/1996 | EP0723163A1 Process and system for monitoring printed circuits before mounting the components |
| 07/24/1996 | EP0723162A1 Method and apparatus for automatically testing semiconductor diodes |
| 07/24/1996 | EP0723161A1 Trouble monitor device for bridge circuit |
| 07/24/1996 | EP0723157A1 Method and apparatus for determining and selectively displaying valid measurement information |
| 07/24/1996 | EP0722570A1 Device for regulating operating parameters and/or conditions in electrical factory equipment |
| 07/24/1996 | EP0688451A4 Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays |
| 07/24/1996 | CN1127444A Power-out reset system |
| 07/23/1996 | US5539919 Microcomputer having function to specify functional block having data to be monitored and to output data as an anaglog signal |
| 07/23/1996 | US5539878 Parallel testing of CPU cache and instruction units |
| 07/23/1996 | US5539753 Method and apparatus for output deselecting of data during test |
| 07/23/1996 | US5539702 Test apparatus for semi-conductor memory device |
| 07/23/1996 | US5539699 Flash memory testing apparatus |
| 07/23/1996 | US5539680 Computer system |
| 07/23/1996 | US5539652 Method for manufacturing test simulation in electronic circuit design |
| 07/23/1996 | US5539608 Electronic interlock for electromagnetic contactor |
| 07/23/1996 | US5539326 Method for testing the wiring or state of a liquid crystal display and thin film transistor |
| 07/23/1996 | US5539325 Testing and exercising individual, unsingulated dies on a wafer |
| 07/23/1996 | US5539324 Universal wafer carrier for wafer level die burn-in |
| 07/23/1996 | US5539321 Apparatus for measuring the crosstalk in a cable |
| 07/23/1996 | US5539318 Residual capacity meter for electric car battery |
| 07/23/1996 | US5539317 Circuit tester for Christmas tree light sets |
| 07/23/1996 | US5539306 Method and apparatus for testing electrical and electronic circuits |
| 07/23/1996 | US5539305 Calibration board for an electronic circuit tester |
| 07/23/1996 | US5539295 Device for indicating the state of a single-phase asynchronous motor |
| 07/23/1996 | US5538806 By depressing a selected area of the label a thermosensitive material displays whether the battery has capacity |
| 07/18/1996 | WO1996021936A1 Device for measuring voltages along solid-insulated bus bars in medium-voltage switchgear |
| 07/18/1996 | DE4208688C2 Umgehungs-Abtastpfad und integrierte Schaltungseinrichtung Bypass scan path and integrated circuit device |
| 07/18/1996 | DE19606451A1 Graphic presentation of electrical measurements using vacuum fluorescence |
| 07/18/1996 | DE19507959C1 Current measuring device for automobile onboard supply network |
| 07/17/1996 | EP0722092A1 Test appliance for protection relais linked to amagnetic sensors |
| 07/17/1996 | EP0722091A2 Test for determining polarity of electrolytic capacitors within electronic assemblies |
| 07/17/1996 | EP0722090A2 Supporting member for plane test objects |
| 07/17/1996 | EP0721722A1 Method of predicting voltages in telephone line measurement |
| 07/17/1996 | EP0721684A1 Method of generating a fault-indication signal |
| 07/17/1996 | EP0721591A1 A method and device for testing of an integrated circuit |
| 07/17/1996 | EP0505511B1 A zero power dissipation laser fuse signature circuit for redundancy in vlsi design |
| 07/17/1996 | EP0493013B1 Semiconductor integrated circuit having test circuit |
| 07/17/1996 | EP0340282B1 Two-mode driver circuit |
| 07/17/1996 | CN2231421Y Short fault addressing equipment for electric power line |
| 07/17/1996 | CN1126840A Testing method and equipment of contact drop |
| 07/17/1996 | CN1126831A Circuit and method of detecting actuator movement |
| 07/16/1996 | US5537390 Device for detecting residual capacity of secondary battery |
| 07/16/1996 | US5537331 Method of testing devices to be measured and testing system therefor |
| 07/16/1996 | US5537327 Method and apparatus for detecting high-impedance faults in electrical power systems |
| 07/16/1996 | US5537108 Method and structure for programming fuses |
| 07/16/1996 | US5537053 Integrated circuit |
| 07/16/1996 | US5537052 System and method for executing on board diagnostics and maintaining an event history on a circuit board |
| 07/16/1996 | US5537050 Process for inspecting electrodes using rotation alignment correction |
| 07/16/1996 | US5537044 Surge voltage generator for pulsing grounded and ungrounded electrical equipment |
| 07/16/1996 | US5537042 Method and system for unobtrusively measuring physical properties in electrochemical processes |
| 07/16/1996 | US5537030 Voltage regulator test set for the power distribution industry |
| 07/16/1996 | US5537029 For electronically displaying metered electrical energy |
| 07/16/1996 | US5537024 Circuit arrangement to detect a voltage |
| 07/16/1996 | US5536972 Power module |
| 07/16/1996 | US5536934 Light intensity deterioration detecting circuit with compensation for resistance errors |
| 07/16/1996 | US5535873 Article disposition apparatus |
| 07/16/1996 | US5535637 Variable volume test chamber |
| 07/11/1996 | WO1996021160A1 Transportable image emission microscope |
| 07/11/1996 | DE4441334C1 Verfahren zum Feststellen des Ortes eines Fehlers in einem vorgegebenen Überwachungsbereich eines mehrphasigen elektrischen Energieübertragungsleitungssystems A method for determining the location of a fault in a predetermined monitoring region of a polyphase electrical power transmission line system |
| 07/11/1996 | DE4440937A1 Field source for testing electromagnetic compatibility testing, using passive magnetic field probe |
| 07/11/1996 | DE19511887C1 Lamp fitting esp. for fluorescent lamp |
| 07/10/1996 | EP0728399A4 Method and apparatus for inspecting printed circuit boards at different magnifications |
| 07/10/1996 | EP0721292A1 Circuit for testing wire pairs |
| 07/10/1996 | EP0721237A2 Mass termination of signals from electronic systems to devices under test |
| 07/10/1996 | EP0721209A2 Method of testing semiconductor devices and conductive adhesive thereby used |
| 07/10/1996 | EP0721166A1 Method and system for the design verification of logic units and use in different environments |
| 07/10/1996 | EP0721163A1 Information processing apparatus with a mode setting circuit |
| 07/10/1996 | EP0721109A2 Multiplexing electronic test probe |
| 07/10/1996 | EP0721100A2 Cable testing system based on pulsed signal attenuation measurement |
| 07/10/1996 | EP0720539A1 Process and arrangement for detecting and reporting the electrical condition of voltage flashover fuses |
| 07/10/1996 | EP0617846B1 Device for improving the current output of a chargeable battery at low outside temperatures |
| 07/10/1996 | CN2230933Y Universal voltage tester |
| 07/10/1996 | CN1126392A Scannable latch and method of using the same |
| 07/10/1996 | CN1126320A Battery capacity meter and battery capacity calculation method |
| 07/09/1996 | US5535353 Address generating circuit for data compression |
| 07/09/1996 | US5535331 Data processing device |
| 07/09/1996 | US5535330 System and method for error location in printed wire assemblies by external power on self test (post) commands |
| 07/09/1996 | US5535223 Method and apparatus for the verification and testing of electrical circuits |
| 07/09/1996 | US5535222 Method and apparatus for controlling a plurality of systems via a boundary-scan port during testing |
| 07/09/1996 | US5535164 BIST tester for multiple memories |
| 07/09/1996 | US5535163 Semiconductor memory device for inputting and outputting data in a unit of bits |
| 07/09/1996 | US5535006 Method and system for evaluating integrity of adherence of a conductor bond to a mating surface of a substrate |