Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/1997
03/12/1997EP0762134A2 Current magnitude sensing circuit
03/12/1997EP0762019A1 Method and apparatus for detecting an inter-terminal short circuit of a linear solenoid for an electronically controlled automatic transmission
03/12/1997EP0761492A1 Fail check device and method for AC motor control circuit
03/12/1997EP0760954A1 Phase noise detector
03/12/1997EP0606805B1 Test method for integrated circuit devices and related integrated device
03/12/1997EP0502210B1 Semiconductor integrated circuit device with testing-controlling circuit provided in input/output region
03/11/1997US5610927 Integrated circuit control
03/11/1997US5610926 Method & circuit for testing ic logic circuits
03/11/1997US5610925 Failure analyzer for semiconductor tester
03/11/1997US5610828 Graphical system for modelling a process and associated method
03/11/1997US5610826 Analog signal monitor circuit and method
03/11/1997US5610531 Testing method for semiconductor circuit levels
03/11/1997US5610530 Analog interconnect testing
03/11/1997US5610529 Probe station having conductive coating added to thermal chuck insulator
03/11/1997US5610526 Contact hazard meter having a human equivalent circuit
03/11/1997US5610525 Battery capacity detector
03/11/1997US5610511 Temperature responsive battery tester
03/11/1997US5610499 Multi-battery fuel saving and emission reduction system for automotive vehicles
03/11/1997US5610102 Method for co-registering semiconductor wafers undergoing work in one or more blind process modules
03/11/1997US5610081 Integrated circuit module fixing method for temperature cycling test
03/11/1997US5609489 Socket for contacting an electronic circuit during testing
03/09/1997CA2184968A1 Electrical system with arc protection
03/06/1997WO1997008832A1 Cmos buffer circuit having power-down feature
03/06/1997WO1997008563A1 Delay correcting circuit for semiconductor testing device
03/06/1997WO1997008562A1 Method of locating a single-phase ground fault in a power distribution network
03/06/1997WO1997005501A3 Apparatus for and method of controlling and calibrating the phase of a coherent signal
03/06/1997WO1997002493A3 A method for testing an electronic circuit by logically combining clock signals, and an electronic circuit provided with facilities for such testing
03/06/1997DE19533840C1 Classifying and assigning cable cores of multi-core electric cables e.g. for telephone, alarm or door bell systems
03/06/1997DE19532628A1 Verfahren zur Überprüfung eines Zündelements und dafür geeignetes elektronisches Gerät Method for checking an ignition element and ensure appropriate electronic device
03/05/1997EP0760104A1 Process and system for testing the correct position of printed circuit boards having contact islands and conductor paths in a testing device
03/05/1997EP0712360B1 Circuitry for regulating braking systems with an antilocking system and/or a drive slip control
03/05/1997EP0621953B1 Apparatus for testing wound components
03/05/1997EP0573408B1 Temperature-compensated apparatus for monitoring current having reduced sensitivity to supply voltage
03/05/1997EP0543506B1 Enhanced boundary-scan interconnect test diagnosis through utilization of board topology data
03/05/1997EP0388790B1 Method and apparatus for testing high pin count integrated circuits
03/05/1997CN2248878Y On site correcting and examining instrument for electric executor
03/05/1997CN2248778Y Multiple radio alarming monitoring device
03/05/1997CN1144423A Electronic equipment and method for enabling plural types of batteries to be selectively used
03/05/1997CN1144339A Accumulator voltage monitor
03/05/1997CN1144338A Method for detecting short-circuit fault current path and indicator
03/04/1997US5608816 Apparatus for inspecting a wiring pattern according to a micro-inspection and a macro-inspection performed in parallel
03/04/1997US5608736 Method and apparatus for a universal programmable boundary scan driver/sensor circuit
03/04/1997US5608558 Defect detection method and apparatus for active matrix substrate or active matrix liquid crystal panel and defect repairing method thereof
03/04/1997US5608453 Automatic optical inspection system having a weighted transition database
03/04/1997US5608403 Modulated radiation pulse concept for impairing electrical circuitry
03/04/1997US5608385 Device for determining state of electricity generation of solar battery
03/04/1997US5608338 Evaluating the lifetime and reliability of a TFT in a stress test using gate voltage and temperature measurements
03/04/1997US5608337 Method and apparatus of testing an integrated circuit device
03/04/1997US5608335 Method for the testing of integrated circuit chips and corresponding integrated circuit device
03/04/1997US5608334 Device testing system with cable pivot and method of installation
03/04/1997US5608329 Circuit test device
03/04/1997US5608328 Method and apparatus for pin-pointing faults in electric power lines
03/04/1997US5608325 Method of recalibrating a battery energy management processor
03/04/1997US5608324 Apparatus for detecting a remaining capacity of a battery in a portable data transmission/reception device
03/04/1997US5607818 Method for making interconnects and semiconductor structures using electrophoretic photoresist deposition
03/04/1997US5607789 Light transparent multilayer moisture barrier for electrochemical cell tester and cell employing same
03/04/1997US5607097 Component-mounted circuit board production system
03/04/1997CA2001776C Cognition device for battery residual capacity
03/02/1997CA2183715A1 Device and method for locating faults in a paired line
03/01/1997CA2165362A1 Method of detecting partial discharge using frequency spectrum analyzer
02/1997
02/27/1997WO1997007592A1 Mos master-slave flip-flop with reduced number of pass gates
02/27/1997WO1997007460A1 Process and device for connecting a plurality of semiconductor chip cards
02/27/1997WO1997007411A1 Measurement system for electric disturbances in a high-voltage switchboard plant
02/27/1997WO1997007410A1 Bare chip carrier, burn-in device using the same, and bare chip burn-in method
02/27/1997WO1997007385A2 A bidirectional load and source cycler
02/27/1997WO1997006979A2 System for checking the resistance of a load connected to a transformer
02/27/1997DE19633915A1 Fault analysing unit for use in semiconductor memory testing system
02/27/1997DE19532633A1 Circuit for monitoring blocking capacity in series-connected electronic circuit element
02/27/1997DE19527487C1 Circuit arrangement for testing functioning of current monitor circuit for power transistor
02/27/1997DE19515067C1 High voltage cable with arrangement for determining partial discharge to cable connection points
02/26/1997EP0759559A2 Test system for determining the orientation of components on a circuit board
02/26/1997EP0759558A2 Testing method for an analog input channel of an analog signal detecting circuit and the corresponding analog signal detecting circuit
02/26/1997EP0759221A1 Circuitry for detecting earth leakages in energy transmission cables
02/26/1997EP0759220A1 Detector for monitoring the integrity of a ground connection to an electrical appliance
02/26/1997EP0759174A1 Adapter system for component boards, for use in a test device
02/26/1997EP0340694B1 Test pattern generator
02/26/1997CN2248443Y Battery container
02/26/1997CN2248347Y Antitheft alarming device for power line
02/26/1997CN2248346Y Testing device for switch contact voltage drop
02/26/1997CN2248345Y Portable electric-control self-holding test instrument
02/26/1997CN1143832A Method for measuring leakage current in junction region of semiconductor device
02/26/1997CN1143750A Trace input device with remaining power informing function and method therefor
02/25/1997US5606568 Method and apparatus for performing serial and parallel scan testing on an integrated circuit
02/25/1997US5606567 Delay testing of high-performance digital components by a slow-speed tester
02/25/1997US5606566 Method and apparatus for streamlined concurrent testing of electrical circuits
02/25/1997US5606565 Method of applying boundary test patterns
02/25/1997US5606564 Test logic circuit and method for verifying internal logic of an integrated circuit
02/25/1997US5606527 Methods for detecting short-circuited signal lines in nonvolatile semiconductor memory and circuitry therefor
02/25/1997US5606518 Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results
02/25/1997US5606480 Detector for monitoring the integrity of a ground connection to an electrical appliance
02/25/1997US5606267 Programmable logic module and architecture for field programmable gate array device
02/25/1997US5606264 Moisture sensor for electronic modules
02/25/1997US5606262 Manipulator for automatic test equipment test head
02/25/1997US5606261 Retarding field electron-optical apparatus
02/25/1997US5606243 Battery state judging apparatus
02/25/1997US5606242 Smart battery algorithm for reporting battery parameters to an external device
02/25/1997US5605844 Inspecting method for semiconductor devices
02/20/1997WO1997006599A1 Efficient in-system programming structure and method for non-volatile programmable logic devices
02/20/1997WO1997006514A1 Electronic diagnostic system
02/20/1997WO1997006445A1 Display for the visual indication of the charge status of a rechargeable battery