Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
12/1996
12/03/1996US5581229 Communication system for a power distribution line
12/03/1996US5581195 Semiconductor chip holding device
12/03/1996US5581194 Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage
12/03/1996US5581190 Method and apparatus for testing RF devices
12/03/1996US5581177 Shaping ATE bursts, particularly in gallium arsenide
12/03/1996US5581176 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board
12/03/1996US5580262 Terminal adapter and relay combination
12/03/1996US5579826 Method for burn-in of high power semiconductor devices
11/1996
11/28/1996WO1996037931A1 Spring element electrical contact and methods
11/28/1996WO1996037839A1 Process for the computer-assisted measurement and testing of electric circuits, especially electronic modules, and testing station for implementing the process
11/28/1996WO1996037787A1 Monitoring process for a capacitor lead-through and a monitoring system therefor
11/28/1996WO1996037334A1 Method and apparatus for shaping spring elements
11/28/1996WO1996037333A1 Ribbon-like core interconnection elements
11/28/1996WO1996037332A1 Fabricating interconnects and tips using sacrificial substrates
11/28/1996WO1996037331A1 Wire bonding, severing, and ball forming
11/28/1996WO1996033419A3 Method of cleaning probe tips of probe cards and apparatus for implementing the method
11/28/1996DE19519230C1 Überwachungsverfahren für eine Kondensatordurchführung und eine Überwachungsanordnung hierzu Monitoring method for a capacitor bushing and a supervision order for this
11/28/1996DE19518729A1 Battery cell parameter measuring device
11/28/1996CA2222008A1 Method for computer-aided measurement and testing of electrical circuits, in particular of electronic assemblies, and a test rig for carrying out the method
11/27/1996EP0744033A1 An integrated resistor for sensing electrical parameters
11/27/1996EP0557488B1 Apparatus for checking the contamination condition of electric insulators
11/27/1996CN2241344Y Communication cable theft-proof alarm device
11/27/1996CN1136703A Electric switch with current protection for remote station and portable local device interface
11/27/1996CN1136665A Method and apparatus for automated docking of test head to device handler
11/26/1996US5579497 Devices and systems with parallel logic unit, and methods
11/26/1996US5579326 Method and apparatus for programming signal timing
11/26/1996US5579270 Flash EEPROM with auto-function for automatically writing or erasing data
11/26/1996US5579251 IC tester
11/26/1996US5579249 System for modeling an integrated chip package and method of operation
11/26/1996US5579236 Voltage/current measuring unit and method
11/26/1996US5579227 In a material handling vehicle
11/26/1996US5579218 Devices and systems with parallel logic unit, and methods
11/26/1996US5579145 Automated system and corresponding method for measuring receiver time delay of electro-optic modules
11/26/1996US5578998 Method and apparatus for predicting of lamp failure
11/26/1996US5578942 Super VCC detection circuit
11/26/1996US5578938 Semiconductor integrated circuit having a clock skew test circuit
11/26/1996US5578937 Instrument for analysis of electric motors based on slip-poles component
11/26/1996US5578936 Method and apparatus for automatically testing semiconductor diodes
11/26/1996US5578934 Method and apparatus for testing unpackaged semiconductor dice
11/26/1996US5578931 ARC spectral analysis system
11/26/1996US5578930 Manufacturing defect analyzer with improved fault coverage
11/26/1996US5578927 Measurement circuit for a modular system of cells electrically connected in series, in particular for electrical accumlator batteries
11/26/1996US5578919 Method of testing semiconductor device and test apparatus for the same
11/26/1996US5578821 Electron beam inspection system and method
11/26/1996US5578526 Method for forming a multi chip module (MCM)
11/21/1996WO1996036886A1 Addressable serial test system
11/21/1996WO1996036885A1 Bus connectivity verification technique
11/21/1996WO1996036884A1 Method and device for making connection
11/21/1996DE19541454A1 Gegenstückelement für elektrische Stecker Counterpart member for electrical plug
11/20/1996EP0743746A2 Digitally synchronized sweep signal source
11/20/1996EP0743736A1 Process for monitoring the capacity of a rechargeable battery
11/20/1996EP0743676A2 Semiconductor device checking method
11/20/1996EP0743533A2 Battery powered electronic device for exchanging information with a battery mailbox
11/20/1996EP0743532A2 Battery having a battery mailbox for exchanging information
11/20/1996EP0743530A2 A test apparatus for electronic components
11/20/1996EP0743529A1 Method and corresponding circuit for detecting an openload
11/20/1996EP0743527A2 Device testing system with cable pivot and method of installation
11/20/1996EP0662220B1 Decoupling of a high-frequency error signal from a high-frequency electromagnetic field in a large electric machine
11/20/1996CN2240733Y Digital display type wire tester
11/20/1996CN1136170A Checking device for wrong wire distribution of power supply
11/19/1996US5577099 Inductive amplifier having comb filter
11/19/1996US5577086 Clock signal generation circuit capable of operating at high speed with high frequency
11/19/1996US5577052 Scan based testing for analogue circuitry
11/19/1996US5576996 Semiconductor memory device having a variably write pulse width capability
11/19/1996US5576980 Serializer circuit for loading and shifting out digitized analog signals
11/19/1996US5576877 Automated system, and corresponding method, for measuring receiver signal detect threshold values of electro-optic modules
11/19/1996US5576831 Wafer alignment sensor
11/19/1996US5576695 Resistance-measurement based arrangement for monitoring integrity of travel path ground link in electronic components handling apparatus
11/19/1996US5576657 Variable reference voltage generator
11/19/1996US5576632 Neural network auto-associator and method for induction motor monitoring
11/19/1996US5576631 Electrical interface board
11/19/1996US5576630 Probe structure for measuring electric characteristics of a semiconductor element
11/19/1996US5576625 Test method and apparatus for testing a protective relay system
11/19/1996US5576618 Process and apparatus for comparing in real time phase differences between phasors
11/19/1996CA2060935C Performance evaluation system for electric filter
11/14/1996WO1996035972A1 Optical fiber interface for integrated circuit test system
11/14/1996WO1996035522A1 A method and device for sorting batteries
11/14/1996DE19517698A1 Determining self sufficiency of safety system in passenger transport vehicle
11/14/1996DE19517492A1 Analogue current interface for converting live-zero input signals
11/14/1996CA2220364A1 A method and device for sorting batteries
11/13/1996EP0742526A1 Method for simulating a circuit
11/13/1996EP0742423A1 Contactless electrical thin oxide measurements
11/13/1996EP0741915A1 Battery with strength indicator
11/13/1996EP0685087B1 Auto-test process for non-regular cmos circuit structures with high fault detection
11/13/1996EP0676073B1 System for checking the validity of a data carrier
11/13/1996EP0619936B1 A method and a device to measure electromagnetic radiation emitted from or received by a circuit card
11/13/1996EP0429673B1 Test pattern generator
11/13/1996CN1135794A A surface mount test point enabling hands free diagnostic testing of electronical circuits
11/13/1996CN1135690A Circuit of regulating radio-requency out-put voltage level by using low-frequency signal and identifying cable-connecting path between apparatus, and method thereof
11/13/1996CN1135608A Device for testing protection relay connected with non-magnetic sensor
11/13/1996CN1135607A Voltage-resistant test device
11/12/1996US5574853 Testing integrated circuit designs on a computer simulation using modified serialized scan patterns
11/12/1996US5574850 Circuitry and method for reconfiguring a flash memory
11/12/1996US5574849 Synchronized data transmission between elements of a processing system
11/12/1996US5574801 Method of inspecting an array of solder ball connections of an integrated circuit module
11/12/1996US5574769 Inductive amplifier having automatic gain control for butt set
11/12/1996US5574734 Test generation of sequential circuits using software transformations
11/12/1996US5574733 Scan-based built-in self test (BIST) with automatic reseeding of pattern generator
11/12/1996US5574731 Set/reset scan flip-flops
11/12/1996US5574730 Bussed test access port interface and method for testing and controlling system logic boards
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