Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1996
11/12/1996US5574692 Memory testing apparatus for microelectronic integrated circuit
11/12/1996US5574654 Electrical parameter analyzer
11/12/1996US5574387 Radial basis function neural network autoassociator and method for induction motor monitoring
11/12/1996US5574386 Apparatus and method for creating detachable solder connections
11/12/1996US5574385 Testable solid state switch and related method
11/12/1996US5574384 Combined board construction for burn-in and burn-in equipment for use with combined board
11/12/1996US5574378 Insulation monitoring system for insulated high voltage apparatus
11/12/1996US5574355 Method and apparatus for detection and control of thermal runaway in a battery under charge
11/09/1996CA2167440A1 Dielectric breakdown detection circuit
11/09/1996CA2149997A1 Electrical current flow indicator
11/07/1996WO1996035250A1 Method and apparatus for detecting arcing in ac power systems by monitoring high frequency noise
11/07/1996WO1996035129A1 Method and apparatus for testing semiconductor dice
11/07/1996WO1996035128A1 Monitoring of internal partial discharges on a power transformer
11/07/1996DE19613615A1 Fault analysing appts. for semiconductor wafer
11/07/1996DE19520988C1 Fault analysis device for voltage supply appts.
11/06/1996EP0741303A2 Apparatus for detecting defects of wires in a wiring board
11/06/1996EP0741302A2 Trigger pulse generator for analysis of CMOS latch-up
11/06/1996EP0741301A2 Method and apparatus for testing RF devices
11/06/1996EP0741300A2 Test procedure for circuits in telecommunication networks
11/06/1996EP0740795A1 Reversible chip contacting device
11/06/1996CN2239655Y Regulating device of motor energy saving protector
11/06/1996CN2239628Y Character analyzing detecting device of semiconductor component
11/06/1996CN2239627Y Automotive circuit short-circuit detector
11/06/1996CN2239626Y Fast alarm for automotive lamp fault
11/06/1996CN1135268A Contact structure for interconnections, interposer, semiconductor assembly and method
11/06/1996CN1135046A Partial-discharge measuring device
11/06/1996CN1135041A Method and arrangement for response analysis of semiconductor materials with optical excitation
11/06/1996CN1134894A Assist device for use in electric vehicle
11/05/1996US5572666 System and method for generating pseudo-random instructions for design verification
11/05/1996US5572664 System for generating floating point test vectors
11/05/1996US5572535 Method and data processing system for verifying the correct operation of a tri-state multiplexer in a circuit design
11/05/1996US5572437 Method and system for creating and verifying structural logic model of electronic design from behavioral description, including generation of logic and timing models
11/05/1996US5572436 Method and system for creating and validating low level description of electronic design
11/05/1996US5572409 Apparatus including a programmable socket adapter for coupling an electronic component to a component socket on a printed circuit board
11/05/1996US5572160 Architecture for RF signal automatic test equipment
11/05/1996US5572143 Circuit testing device
11/05/1996US5572142 Apparatus and method for diagnosing presence or absence of breakage in electromagnetic coil means applicable to breakage diagnosis for stepping motor
11/05/1996US5572141 Memory metal hot plug connector and method
11/05/1996US5572139 Connector installation go/no-go test method
11/05/1996US5572136 Electronic battery testing device
11/05/1996US5572122 Apparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beam
11/05/1996US5571021 Emulator probe
10/1996
10/31/1996WO1996034294A1 Non-invasive digital communications test system
10/31/1996WO1996034293A2 Process for monitoring a three-phase mains for a change in the tuning of the arc supression coil
10/31/1996DE19616820A1 Magazine fitting frame for test manipulator for testing integrated circuit modules
10/31/1996DE19616810A1 Circuit board exchange mechanism for semiconductor test system
10/31/1996DE19616809A1 Test manipulator with rotating table for testing integrated circuits
10/31/1996DE19616212A1 Test probe station appts. for low noise measurement of wafer formed electronic device
10/31/1996DE19615919A1 Component loading and discharging appts. for semiconductor component handling device
10/31/1996DE19515865A1 Light power output testing and comparison arrangement for LED's
10/31/1996DE19515068A1 Arrangement for partial discharge detection in high voltage cables and connection elements
10/31/1996DE19510333C1 Circuit for testing opto-coupler having input, output, and control terminals
10/30/1996EP0740159A1 Measuring system for partial discharges
10/30/1996EP0739565A1 Subscriber line impedance measurement device and method
10/30/1996EP0739512A1 Self-resetting bypass control for scan test
10/30/1996EP0739482A1 Battery capacity indicator
10/30/1996CN2239036Y High-pressure searching unit special for high-pressure ignition coil
10/30/1996CN1134605A Pallet installation table for processor
10/30/1996CN1134553A Electric equipment fault diagnosis apparatus and its diagnosis method
10/30/1996CN1134549A Apparatus and method are disclosed for monitoring electrical cables for presence of moisture along cable
10/30/1996CN1134492A Process and device for contactless electronic control of flow of water in plumbing unit
10/29/1996US5570383 Timing hazard detector accelerator
10/29/1996US5570375 IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing
10/29/1996US5570374 Built-in self-test control network
10/29/1996US5570317 Memory circuit with stress circuitry for detecting defects
10/29/1996US5570294 Circuit configuration employing a compare unit for testing variably controlled delay units
10/29/1996US5570259 Circuit arrangement for controlling a load and for recognizing a line interruption
10/29/1996US5570255 Overcurrent preventing circuit
10/29/1996US5570058 Signal line testing circuit causing no delay in transmission of a normal data signal
10/29/1996US5570041 Programmable logic module and architecture for field programmable gate array device
10/29/1996US5570036 CMOS buffer circuit having power-down feature
10/29/1996US5570035 For providing a visible indication of a failure of an electronic circuit
10/29/1996US5570034 Using hall effect to monitor current during IDDQ testing of CMOS integrated circuits
10/29/1996US5570032 For burning-in and testing of a semiconductor integrated circuit
10/29/1996US5570031 Substrate surface potential measuring apparatus and plasma equipment
10/29/1996US5570029 Cable crosstalk measurement system
10/29/1996US5570028 Method for detecting faults in electrical cables and apparatus for implementing same
10/29/1996US5570027 Printed circuit board test apparatus and method
10/29/1996US5570011 Method for testing an electronic device using voltage imaging
10/29/1996US5570010 Method and apparatus for identifying objects using compound signal and a detector employing an electrical static coupling technique
10/29/1996US5569966 Electric vehicle propulsion system power bridge with built-in test
10/29/1996US5569951 Precision integrated resistors
10/29/1996US5569840 Screened electrical line control device
10/29/1996US5569233 Multi-layer female component for refastenable fastening device and method of making the same
10/29/1996US5568870 Device for testing and sorting small electronic components
10/24/1996WO1996033461A1 Automatic parallel electronic component testing method and equipment
10/24/1996WO1996033460A1 Automatic parallel electronic component testing method and equipment
10/24/1996WO1996033419A2 Method of cleaning probe tips of probe cards and apparatus for implementing the method
10/24/1996DE4041897C2 Integrierte Schaltkreiseinrichtung und Abtastpfadsystem Integrated circuit device and Abtastpfadsystem
10/24/1996DE19613616A1 Magazine transport apparatus for semiconductor testing equipment
10/24/1996DE19514695C1 Verfahren zum Durchführen von Distanzmessungen an einer elektrischen Hochspannungsübertragungsleitung A method for performing distance measurement at a high voltage electrical transmission line
10/24/1996DE19514514A1 Monitoring metal-encapsulated gas-insulated HV switch appts.
10/23/1996EP0739074A2 Power source miswiring detection apparatus
10/23/1996EP0739048A1 System for managing state of storage battery
10/23/1996EP0738975A1 Method and apparatus for scan testing with extended test vector storage
10/23/1996EP0571493B1 A method and an apparatus for charging a rechargeable battery
10/23/1996EP0401299B1 A method and a system for monitoring and controlling an electric motor
10/23/1996CN2238448Y Fully automatic Chinese characters display line fault tester
10/23/1996CN2238447Y Detecting device for testing motor-driven vehicle safety
10/22/1996US5568564 Image processing apparatus and method for inspecting defects of enclosures of semiconductor devices
1 ... 1361 1362 1363 1364 1365 1366 1367 1368 1369 1370 1371 1372 1373 1374 1375 1376 1377 1378 1379 1380 1381 ... 1523