| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/02/1996 | EP0679261B1 Method and apparatus for measuring partial discharges in cables |
| 10/02/1996 | EP0676054B1 Process and device for finding the real output of an electric drive |
| 10/02/1996 | EP0605438B1 Battery-operated device |
| 10/02/1996 | DE19611544A1 Method and circuit for testing rechargeable batteries |
| 10/02/1996 | DE19511842A1 Verfahren und Schaltungsanordnung zur Überwachung einer Datenverarbeitungsschaltung Method and circuit arrangement for monitoring a data processing circuit |
| 10/02/1996 | DE19510332A1 Schaltungsanordnung und Verfahren zum Testen von nicht intermittierenden Gebern Circuit arrangement and method for testing non-intermittent donors |
| 10/02/1996 | CN2236662Y Intellectural monitor for electric power supply |
| 10/02/1996 | CN2236661Y Multifunctional electric measuring meter with sound and light indicators |
| 10/02/1996 | CN2236660Y Tester for polarity of secondary battery and circuits of vehicles |
| 10/02/1996 | CN1132554A A method and device for testing of an integrated circuit |
| 10/02/1996 | CN1132356A Meter for residual capacity of accumulator and calculating method for residual capacity |
| 10/02/1996 | CN1132355A Method and apparatus for predic remaining capacity and reserve time of battery on discharge |
| 10/02/1996 | CN1132354A 半导体集成电路器件 The semiconductor integrated circuit device |
| 10/01/1996 | US5561696 Method and apparatus for inspecting electrical connections |
| 10/01/1996 | US5561671 Self-diagnostic device for semiconductor memories |
| 10/01/1996 | US5561605 Arc detection using current variation |
| 10/01/1996 | US5561576 Step down transformer power supply with short circuit protection |
| 10/01/1996 | US5561387 Method for measuring gate insulation layer thickness |
| 10/01/1996 | US5561381 Method for testing a partially constructed electronic circuit |
| 10/01/1996 | US5561380 Fault detection system for electric automobile traction system having floating ground |
| 10/01/1996 | US5561378 Circuit probe for measuring a differential circuit |
| 10/01/1996 | US5561377 System for evaluating probing networks |
| 10/01/1996 | US5561372 Connector insertion inspection jig |
| 10/01/1996 | US5561367 Structure and method for testing wiring segments in an integrated circuit device |
| 10/01/1996 | US5561362 Remaining capacity meter and detection method for electric vehicle battery |
| 10/01/1996 | US5561361 For providing a source of electrical power to an electrical system |
| 10/01/1996 | US5561305 Method and apparatus for performing internal device structure analysis of a dual channel transistor by multiple-frequency Schubnikov-de Haas analysis |
| 10/01/1996 | US5560533 Mounted circuit board producing system |
| 09/26/1996 | WO1996029773A2 Method and apparatus for detection and control of thermal runaway in a battery under charge |
| 09/26/1996 | WO1996029649A1 Method and system for testing memory programming devices |
| 09/26/1996 | WO1996029610A2 Manufacturing defect analyzer with improved fault coverage |
| 09/26/1996 | WO1996029609A1 Circuitry and process for testing non-intermittent signal generators |
| 09/26/1996 | WO1996023319A3 Wafer level prediction of thin oxide reliability |
| 09/26/1996 | DE19610258A1 Integrated circuit fault location detection system using SEM semiconductor test system |
| 09/25/1996 | EP0733975A1 Binary data output interface |
| 09/25/1996 | EP0733910A1 Printed circuit board with built-in testing of connections to ICs |
| 09/25/1996 | EP0733909A1 Method and apparatus for local temperature sensing for use in performing high resolution in-situ measurement |
| 09/25/1996 | EP0733791A2 Method and apparatus for engine analysis |
| 09/25/1996 | EP0733203A1 Battery monitor adjusted by rate of current |
| 09/25/1996 | EP0475975B1 Computer-aided engine diagnostic system |
| 09/25/1996 | CN2236136Y Local-discharging detector |
| 09/25/1996 | CN2236135Y Fault detector for charge system of automobile |
| 09/25/1996 | CN1131985A Method of testing and electronic circuit compositing flipelop with master and slave |
| 09/25/1996 | CN1131816A Integrated circuit mount checker |
| 09/25/1996 | CN1131814A Intergrated circuit |
| 09/25/1996 | CN1131746A Device for inspecting wiring harness |
| 09/24/1996 | US5559996 Level converter including wave-shaping circuit and emulator microcomputer incorporating the level converter |
| 09/24/1996 | US5559811 Method for identifying untestable and redundant faults in sequential logic circuits. |
| 09/24/1996 | US5559744 Semiconductor integrated circuit device having a test mode setting circuit |
| 09/24/1996 | US5559739 Dynamic random access memory with a simple test arrangement |
| 09/24/1996 | US5559715 Timing model and characterization system for logic simulation of integrated circuits which takes into account process, temperature and power supply variations |
| 09/24/1996 | US5559500 Overcurrent sense circuit |
| 09/24/1996 | US5559444 Method and apparatus for testing unpackaged semiconductor dice |
| 09/24/1996 | US5559443 Jig for measuring the characteristics of a semiconductor, manufacturing method for the same, and usage of the same |
| 09/24/1996 | US5559440 Method and apparatus for testing telecommunications equipment having both analog and digital interfaces |
| 09/24/1996 | US5559427 Instrument and method for testing local area network cables |
| 09/24/1996 | US5559365 Semiconductor device including a plurality of leads each having two end portions extending downward and upward |
| 09/24/1996 | US5558541 Blind mate connector for an electronic circuit tester |
| 09/24/1996 | CA2057363C Arrangement for testing digital circuit devices having bidirectional outputs |
| 09/24/1996 | CA2057340C Arrangement for testing digital circuit devices having tri-state outputs |
| 09/19/1996 | WO1996028781A1 Integrated circuit arrangement |
| 09/19/1996 | WO1996028745A2 Timing generator with multiple coherent synchronized clocks |
| 09/19/1996 | WO1996028744A1 Circuit tester |
| 09/19/1996 | WO1996028743A1 Reflectometry methods for insulated pipes |
| 09/19/1996 | WO1996028725A1 Automatic testing system for magnetoresistive heads |
| 09/19/1996 | DE19610328A1 Integrated circuit test fixture for automatic test |
| 09/19/1996 | DE19609521A1 Photo-induced current detection scanning analyser for LSI pre-testing |
| 09/18/1996 | EP0732792A2 Protection against accidental contact for two power supply lines connected to a common load |
| 09/18/1996 | EP0731992A1 High-density interconnect technique |
| 09/18/1996 | CN2235623Y Micro-computer controlled multiple testing instrument for charging, discharging electric batteries |
| 09/18/1996 | CN1131477A Fault detector for voltage source self-commutated power converter |
| 09/18/1996 | CN1131278A Local discharge pulse sensor for coupled high voltage alive equipment |
| 09/17/1996 | US5557774 Method for making test environmental programs |
| 09/17/1996 | US5557651 Signal generator for tracing multiple transmission lines |
| 09/17/1996 | US5557620 Quiescent current testing of dynamic logic systems |
| 09/17/1996 | US5557573 Entire wafer stress test method for integrated memory devices and circuit therefor |
| 09/17/1996 | US5557571 Dynamic random access memory with internal testing switches |
| 09/17/1996 | US5557559 Universal burn-in driver system and method therefor |
| 09/17/1996 | US5557558 Microprocessor with self-diagnostic test function |
| 09/17/1996 | US5557557 Processor power profiler |
| 09/17/1996 | US5557531 Method and system for creating and validating low level structural description of electronic design from higher level, behavior-oriented description, including estimating power dissipation of physical implementation |
| 09/17/1996 | US5557216 System and method for testing electrical generators |
| 09/17/1996 | US5557211 Vacuum test fixture for printed circuit boards |
| 09/17/1996 | US5557209 Identification of pin-open faults by capacitive coupling through the integrated circuit package |
| 09/17/1996 | US5557208 Battery tester with stacked thermochromic elements |
| 09/17/1996 | US5557207 Street light testing kit |
| 09/17/1996 | US5557195 Method and apparatus for evaluating electrostatic discharge conditions |
| 09/17/1996 | US5556024 Process for separating an active/passive device from a device carrier |
| 09/12/1996 | DE19609085A1 Faulty block detection system in semiconductor equipment |
| 09/12/1996 | DE19508902A1 Equipment for testing backplanes of computers, TV or communications devices |
| 09/12/1996 | DE19508345A1 Circuit for checking re-chargeable electro-chemical cells |
| 09/12/1996 | DE19507809A1 Safe determination of electromagnetic compatibility and interference |
| 09/12/1996 | DE19507127A1 Adaptersystem für Baugruppen-Platinen, zu verwenden in einer Prüfeinrichtung To use adapter system for component boards at a test facility |
| 09/11/1996 | EP0731361A2 Apparatus for testing power performance of electric motor for electric vehicle |
| 09/11/1996 | EP0731360A2 Structure for testing bare integrated circuit devices |
| 09/11/1996 | EP0647312B1 Inspection of a dynamo-electric machine in a gap between a stator and a rotor |
| 09/11/1996 | EP0632901B1 Process for testing terminal resistances in ecl networks |
| 09/11/1996 | EP0471760B1 A method and an apparatus for testing the assembly of a plurality of electrical components on a substrate |
| 09/11/1996 | EP0396272B1 IC device including test circuit |
| 09/11/1996 | EP0366553B1 Test device and method for testing electronic device and semiconductor device having the test device |