| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/17/1997 | WO1997014044A1 Counter and a revolution stop detection apparatus using the counter |
| 04/17/1997 | DE19537734A1 Mounting-holding and positioning system for electric quality testing of wafer |
| 04/17/1997 | DE19536254C1 Humidity determination esp. for encapsulated switchgear assembly esp. when used in tropical region |
| 04/17/1997 | CA2207551A1 Improved alternator/starter testing device |
| 04/16/1997 | EP0768810A1 Ground fault detection and measurement system for airfield lighting system |
| 04/16/1997 | EP0768676A2 A semiconductor memory with sequential clocked access codes for test mode entry |
| 04/16/1997 | EP0768675A2 A semiconductor memory with a flag for indicating test mode |
| 04/16/1997 | EP0768538A1 Method, tester and circuit for applying a pulse trigger to a unit to be triggered |
| 04/16/1997 | EP0768536A1 Process for determining the mean current in an inductive load |
| 04/16/1997 | EP0768535A1 Method and apparatus for separating and analyzing composite AC/DC waveforms |
| 04/16/1997 | EP0768534A1 Method for fabrication of probe structure and circuit substrate therefor |
| 04/16/1997 | EP0768532A2 Acceleration sensor and method for producing the same, and shock detecting device using the same |
| 04/16/1997 | EP0767918A1 Shield integrity monitor |
| 04/16/1997 | EP0680612B1 Current surge indicator |
| 04/16/1997 | CN2252343Y Intelligence distribution transformer operation parameter test instrument |
| 04/16/1997 | CN1147887A Testing device for GMSK communication device |
| 04/16/1997 | CN1147638A Comprehensive motor and water pump test system |
| 04/15/1997 | US5621811 Learning method and apparatus for detecting and controlling solder defects |
| 04/15/1997 | US5621742 Method and apparatus for testing semiconductor integrated circuit devices |
| 04/15/1997 | US5621741 Method and apparatus for testing terminal connections of semiconductor integrated circuits |
| 04/15/1997 | US5621740 Output pad circuit for detecting short faults in integrated circuits |
| 04/15/1997 | US5621739 Method and apparatus for buffer self-test and characterization |
| 04/15/1997 | US5621651 Emulation devices, systems and methods with distributed control of test interfaces in clock domains |
| 04/15/1997 | US5621600 Method for testing an electrical conductor |
| 04/15/1997 | US5621521 Checking apparatus for array electrode substrate |
| 04/15/1997 | US5621348 Output driver circuit for suppressing noise generation and integrated circuit device for burn-in test |
| 04/15/1997 | US5621333 For use in testing an electronic device |
| 04/15/1997 | US5621328 Connector having a spacer detection structure |
| 04/15/1997 | US5621327 System and method for testing and fault isolation of high density passive boards and substrates |
| 04/15/1997 | US5621326 Fault diagnosis device for passenger protection apparatus |
| 04/15/1997 | US5621313 Wafer probing system and method that stores reference pattern and movement value data for different kinds of wafers |
| 04/15/1997 | US5621309 Method for detecting a failed ZnO disk in a surge arrester network |
| 04/15/1997 | US5621298 Power supply with automatic charge measuring capability |
| 04/15/1997 | US5621158 Measurement value judging method |
| 04/15/1997 | US5620346 Connector and connector testing apparatus |
| 04/15/1997 | US5620327 Antistatic socket apparatus |
| 04/12/1997 | WO1997046071A1 Sucked material detector, sucked material detecting method using the same detector, shift detecting method using the same detector, and cleaning method using the same detector |
| 04/10/1997 | WO1997013310A1 Power management system |
| 04/10/1997 | WO1997013301A1 Test socket for leadless ic device |
| 04/10/1997 | WO1997013226A1 Enhanced security semiconductor device, semiconductor circuit arrangement, and method of production thereof |
| 04/10/1997 | WO1997013158A1 Wafer defect management system |
| 04/10/1997 | WO1997013157A1 Ic tester and method of locating defective portions of ic |
| 04/10/1997 | WO1997003365A3 Laser-induced metallic plasma for con-contact inspection |
| 04/10/1997 | DE19549246C1 Electromagnetic wave generation and reception method for immunity testing |
| 04/10/1997 | DE19537402A1 Qualitative and quantitative assessment of complex electric generators for welding processes |
| 04/09/1997 | EP0767492A2 Integrated circuit test system |
| 04/09/1997 | EP0767133A2 Elevator drive fault detector |
| 04/09/1997 | EP0766829A2 Method of cleaning probe tips of probe cards and apparatus for implementing the method |
| 04/09/1997 | EP0721684B1 Method of generating a fault-indication signal |
| 04/09/1997 | EP0657033B1 Detecting faults in power lines |
| 04/09/1997 | CN2251728Y Pollution-controlling equipment operation monitor |
| 04/08/1997 | US5619511 Dynamic scan circuit and method for using the same |
| 04/08/1997 | US5619509 Apparatus and methods for testing transmission equipment and a self-test method |
| 04/08/1997 | US5619463 Integrated circuit device and test method therefor |
| 04/08/1997 | US5619462 Fault detection for entire wafer stress test |
| 04/08/1997 | US5619417 Battery monitoring system for an electric vehicle |
| 04/08/1997 | US5619392 Method and device for protecting busbars |
| 04/08/1997 | US5619157 Synchronizing circuit with dynamic and static latch circuitry |
| 04/08/1997 | US5619146 Switching speed fluctuation detecting apparatus for logic circuit arrangement |
| 04/08/1997 | US5619145 Probe apparatus and method for inspecting object using the probe apparatus |
| 04/08/1997 | US5619118 Method and an apparatus for charging a rechargeable battery |
| 04/08/1997 | US5619117 Battery pack having memory |
| 04/08/1997 | US5617945 Device transfer mechanism for IC test handler |
| 04/03/1997 | WO1997012310A2 Digital trimming of on-chip analog components |
| 04/03/1997 | WO1997012255A1 Period generator |
| 04/03/1997 | WO1997012254A1 Parallel processing integrated circuit tester |
| 04/03/1997 | DE19638633A1 Fault locating system for semiconductors |
| 04/03/1997 | DE19536226A1 Testbare Schaltungsanordnung mit mehreren identischen Schaltungsblöcken Testable circuit with several identical circuit blocks |
| 04/03/1997 | DE19529437C1 Display zur optischen Anzeige des Ladezustands einer wiederaufladbaren Batterie Display for visual indication of the charge state of a rechargeable battery |
| 04/02/1997 | EP0766259A2 Dynamic random access memory |
| 04/02/1997 | EP0766118A2 Active-matrix type liquid crystal display device and method of compensating for defective pixel |
| 04/02/1997 | EP0766092A1 Testable circuit with multiple identical circuit blocks |
| 04/02/1997 | EP0765256A1 Anti-theft battery |
| 04/02/1997 | EP0737337A4 Apparatus and method for testing integrated circuits |
| 04/02/1997 | EP0489510B1 Active distributed programmable line termination for in-circuit automatic test receivers |
| 04/02/1997 | EP0286648B2 System for diagnosing anomalies or breakdowns in a plurality of types of electronic control systems installed in motor vehicles |
| 04/02/1997 | CN2251145Y Line checker with oscillator |
| 04/02/1997 | CN2251144Y Disc type isolator flash over recording indicator |
| 04/01/1997 | US5617574 Data processing device or system |
| 04/01/1997 | US5617431 Method and apparatus to reuse existing test patterns to test a single integrated circuit containing previously existing cores |
| 04/01/1997 | US5617430 Testing system interconnections using dynamic configuration and test generation |
| 04/01/1997 | US5617428 Scan test circuit and semiconductor integrated circuit device with scan test circuit |
| 04/01/1997 | US5617427 Method for generating test sequences for detecting faults in target scan logical blocks |
| 04/01/1997 | US5617426 Clocking mechanism for delay, short path and stuck-at testing |
| 04/01/1997 | US5617420 Connection system |
| 04/01/1997 | US5617366 Method and apparatus for a test control circuit of a semiconductor memory device |
| 04/01/1997 | US5617340 Method and reference standards for measuring overlay in multilayer structures, and for calibrating imaging equipment as used in semiconductor manufacturing |
| 04/01/1997 | US5617324 Remaining battery capacity measuring method and apparatus |
| 04/01/1997 | US5617310 Multiple operation mode microcontroller |
| 04/01/1997 | US5617285 Circuit configuration for detecting undervoltage |
| 04/01/1997 | US5617238 Automated system, and corresponding method, for measuring transmitter duty cycle distortion of electro-optic modules |
| 04/01/1997 | US5617237 Automated system, and corresponding method, for measuring transmitter extinction ratio of electro-optic modules |
| 04/01/1997 | US5617046 Generation of a diagnostic signal when the current through a power transistor reaches a level close to a limit current |
| 04/01/1997 | US5617044 Comparator circuit |
| 04/01/1997 | US5617039 Auxiliary power unit testing device |
| 04/01/1997 | US5617038 Method and system for screening reliability of semiconductor circuits |
| 04/01/1997 | US5617037 Mixed analog and digital integrated circuit having a comparator to compare original digital data with data having undergone successive D/A and A/D conversion and level shifting |
| 04/01/1997 | US5617036 Laser/pin assembly with integrated burn-in assembly |
| 04/01/1997 | US5617035 Method of delivering an electrical signal to an integrated device |
| 04/01/1997 | US5617033 Method and apparatus for electrically testing multi-core cable |