| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/06/1997 | US5627841 Integrated logic circuit with partial scan path circuit and partial scan path design method for same |
| 05/06/1997 | US5627840 Memory based interface |
| 05/06/1997 | US5627839 Scan cell output latches using switches and bus holders |
| 05/06/1997 | US5627772 By a computer |
| 05/06/1997 | US5627494 High side current sense amplifier |
| 05/06/1997 | US5627479 Method and apparatus for determining characteristic electrical material parameters of semi-conducting materials |
| 05/06/1997 | US5627478 Apparatus for disabling and re-enabling access to IC test functions |
| 05/06/1997 | US5627477 Semiconductor device and burn-in method thereof |
| 05/06/1997 | US5627475 Metal detector coil resistance testing |
| 05/06/1997 | US5627474 Continuity checker for allocating individual cores of multi-core cables |
| 05/06/1997 | US5627473 Connector inspection device |
| 05/06/1997 | US5627472 Condition tester for a battery |
| 05/06/1997 | US5627463 Automatic multi-function testing machine for electric appliances |
| 05/06/1997 | US5627453 For a rechargeable battery |
| 05/06/1997 | US5627101 Method of fabricating polysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures |
| 05/06/1997 | US5626978 Method for securing a tester device to a battery and the battery so produced |
| 05/06/1997 | CA2087448C Fault insertion |
| 05/06/1997 | CA2038846C Process for the suppression of current peaks during commutation of a brushless direct-current motor |
| 05/02/1997 | EP0770880A2 Means for testing the isolation of windings |
| 05/02/1997 | EP0770868A1 Process for controlling discs |
| 05/02/1997 | EP0739482A4 Battery capacity indicator |
| 05/01/1997 | WO1997015839A1 Battery monitor and method |
| 05/01/1997 | WO1997015838A1 Oscillation-based test strategy for analog and mixed-signal circuits |
| 05/01/1997 | WO1997015837A2 Flexibly suspended heat exchange head for a dut |
| 05/01/1997 | WO1997015836A1 Temporary connection of semiconductor die using optical alignment techniques |
| 05/01/1997 | WO1997015834A1 Arrangement for controlling a load connected to the secondary side of a transformer |
| 04/30/1997 | DE19644509A1 Semiconductor component handling and transport apparatus |
| 04/30/1997 | DE19644283A1 Delay time measuring device for circuit for testing semiconductor components |
| 04/30/1997 | DE19544926C1 Verfahren und Vorrichtung zum Überwachen des Abbrandes der Kontaktstücke bei einem Schaltgerät Method and device for monitoring the erosion of contact elements in a switching device |
| 04/30/1997 | DE19540103A1 Handling apparatus for testing electrical property of semiconductor wafer at temperature |
| 04/30/1997 | DE19539492A1 Determination of threshold of terminal voltage in batteries e.g. for watch |
| 04/30/1997 | DE19539458A1 Self-testing Hall sensor, e.g for vehicle steering angle monitor |
| 04/30/1997 | CN2253482Y Fault diagnostic instrument for electrical equipment |
| 04/30/1997 | CN1148908A Method and apparatus for processing batteries |
| 04/30/1997 | CN1148751A Electrostatic capacity metering device for stator winding of rotary motor |
| 04/30/1997 | CN1148688A Anomaly alarming device |
| 04/30/1997 | CN1148562A Integrated circuit conveying device |
| 04/29/1997 | US5625757 Printing system |
| 04/29/1997 | US5625667 Method of predicting voltages in telephone line measurement |
| 04/29/1997 | US5625631 Pass through mode for multi-chip-module die |
| 04/29/1997 | US5625630 Increasing testability by clock transformation |
| 04/29/1997 | US5625580 Hardware modeling system and method of use |
| 04/29/1997 | US5625566 Configuration dependent auto-biasing of bipolar transistor |
| 04/29/1997 | US5625317 For tuning a cutoff frequency |
| 04/29/1997 | US5625314 Self-calibrating multiplexer circuit |
| 04/29/1997 | US5625300 Separate IDDQ -testing of signal path and bias path in an IC |
| 04/29/1997 | US5625299 Multiple lead analog voltage probe with high signal integrity over a wide band width |
| 04/29/1997 | US5625298 Semi-conductor chip test probe |
| 04/29/1997 | US5625296 For detecting a voltage of a sample |
| 04/29/1997 | US5625295 Bipolar transistor circuit capable of high precision measurement of current amplification factor |
| 04/29/1997 | US5625292 System for measuring the integrity of an electrical contact |
| 04/29/1997 | US5625288 On-clip high frequency reliability and failure test structures |
| 04/29/1997 | US5625287 For an ic test system |
| 04/29/1997 | US5625285 AC power outlet ground integrity and wire test circuit device |
| 04/29/1997 | US5625283 For detecting a current of a predetermined value flowing in a wire |
| 04/29/1997 | US5625272 Battery charge/discharge control method for electric vehicle |
| 04/29/1997 | US5625177 High frequency switch and method of testing H-F apparatus |
| 04/25/1997 | CA2161292A1 Apparatus for monitoring electromagnetic emission levels |
| 04/24/1997 | WO1997014975A1 Electric current supply monitor |
| 04/24/1997 | WO1997014974A1 Testable circuit and method of testing |
| 04/24/1997 | WO1997014973A1 Method and apparatus for utilizing dielectric breakdown for indirect measurement purposes |
| 04/24/1997 | WO1997014972A1 Connecting condition examination apparatus, portable electronic equipment and connecting condition examination method |
| 04/24/1997 | WO1997011376A3 Condition tester for a battery |
| 04/24/1997 | DE19539064A1 Anordnung zum Kontrollieren einer an einem Übertrager sekundärseitig angeschlossenen Last Arrangement for controlling a secondary side connected to a transformer load |
| 04/24/1997 | DE19538858A1 Integrated circuit drive method with oscillator and evaluator |
| 04/24/1997 | DE19538792A1 Kontaktsonden-Anordnung zum elektrischen Verbinden einer Prüfeinrichtung mit den kreisförmigen Anschlußflächen eines Prüflings Contact probe arrangement for electrically connecting a testing device with the circular contact pads of a device under test |
| 04/24/1997 | DE19517373C2 Spannungserzeugungs-Schaltung zum Testen integrierter Schaltungen Voltage generating circuit for testing integrated circuits |
| 04/24/1997 | CA2235256A1 Method and apparatus for utilizing dielectric breakdown for indirect measurement purposes |
| 04/23/1997 | EP0769703A2 Method and apparatus for verifying test information on a backplane test bus |
| 04/23/1997 | EP0769150A1 Monitoring of internal partial discharges on a power transformer |
| 04/23/1997 | EP0727048A4 System interface fault isolator test set |
| 04/23/1997 | EP0715723A4 Measuring burst/sinusoidal waveform time span |
| 04/23/1997 | EP0570470B1 Battery tester |
| 04/23/1997 | EP0400876B1 Method and apparatus for testing circuit boards |
| 04/22/1997 | US5623620 Special test modes for a page buffer shared resource in a memory device |
| 04/22/1997 | US5623503 Method and apparatus for partial-scan testing of a device using its boundary-scan port |
| 04/22/1997 | US5623502 Testing of electronic circuits which typically contain asynchronous digital circuitry |
| 04/22/1997 | US5623501 Preprogramming testing in a field programmable gate array |
| 04/22/1997 | US5623500 Event qualified test architecture |
| 04/22/1997 | US5623499 Method and apparatus for generating conformance test data sequences |
| 04/22/1997 | US5623497 Bit error rate measurement apparatus |
| 04/22/1997 | US5623418 System and method for creating and validating structural description of electronic system |
| 04/22/1997 | US5623255 Testing wristlet seat |
| 04/22/1997 | US5623254 Drive circuit fault detection drive |
| 04/22/1997 | US5623215 Testing of semiconductor devices |
| 04/22/1997 | US5623214 Multiport membrane probe for full-wafer testing |
| 04/22/1997 | US5623210 Current detector for detecting battery charge remaining |
| 04/22/1997 | US5623202 Testing multiple IC in parallel by a single IC tester |
| 04/22/1997 | US5623199 Device for inspecting wiring harness |
| 04/22/1997 | US5623194 Apparatus for monitoring and controlling charging of a battery for a hybrid or electric vehicle |
| 04/22/1997 | US5623193 Electrical device such as an electrical shaver or hair cutter |
| 04/22/1997 | US5623145 Method and apparatus for terahertz imaging |
| 04/22/1997 | US5623104 Apparatus for testing power performance of electric motor for electric vehicle |
| 04/22/1997 | US5623008 Rubber composition for glass-run |
| 04/22/1997 | US5622789 Battery cell having an internal circuit for controlling its operation |
| 04/20/1997 | CA2187466A1 Method for inserting test points for full- and partial-scan built-in self-testing |
| 04/17/1997 | WO1997014214A1 Compensated delay locked loop timing vernier |
| 04/17/1997 | WO1997014205A1 Method for measuring fault currents in an inverter and inverter with controlled semiconductor switches |
| 04/17/1997 | WO1997014047A1 Non-contact electro-optic detection of photovoltages |
| 04/17/1997 | WO1997014046A1 Improved alternator/starter testing device |