Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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08/20/1992 | WO1991012532A3 Process and device for loading an adapter for a printed circuit tester |
08/18/1992 | US5140273 Electrode system to facilitate dielectric measurement of materials |
08/18/1992 | US5139445 Modular test adapter |
08/18/1992 | US5139437 Socket |
08/18/1992 | US5139021 Biological information measurement apparatus |
08/18/1992 | US5138968 Cross coil-shaped indicating instrument |
08/12/1992 | EP0498530A2 Electrical interconnect contact system |
08/11/1992 | CA1306286C Adjustment circuit and method for solid-state electricity meter |
08/05/1992 | EP0497478A2 Low impedance, high voltage protection circuit |
08/05/1992 | EP0496984A2 Measurement probe |
08/05/1992 | CN1017729B Process for preparation of electroforming emp shielding elements and its products |
08/04/1992 | US5136247 Apparatus and methods for calibrated work function measurements |
08/04/1992 | US5136238 Test fixture with diaphragm board with one or more internal grounded layers |
08/04/1992 | US5136237 Double insulated floating high voltage test probe |
08/04/1992 | US5136234 Digital high-voltage meter device |
08/04/1992 | US5136120 Technique for reducing electromagnetic interference |
08/04/1992 | CA1306028C Probeable electrical connector |
08/01/1992 | CA2040549A1 Multi-function, multi-mode switch for an instrument |
07/29/1992 | EP0496207A2 Testing device for integrated circuits |
07/28/1992 | US5134365 Probe card in which contact pressure and relative position of each probe end are correctly maintained |
07/28/1992 | US5134364 Elastomeric test probe |
07/28/1992 | US5134363 Arrangement for testing electrical printed-circuit boards |
07/22/1992 | EP0495380A2 Probe tip for electric test fixture |
07/22/1992 | EP0428681A4 Improved electrical connectors and ic chip tester embodying same |
07/22/1992 | CN1017566B Method and apparatus for generating reference nonlinear signal |
07/21/1992 | US5132613 Low inductance side mount decoupling test structure |
07/21/1992 | US5132607 Electrical field strength sensing probe |
07/21/1992 | US5132497 Magnetic shielding means for a current sensor of direct current switching apparatus |
07/21/1992 | US5132058 Molding, magnetism |
07/21/1992 | CA1305522C Modular electronic device |
07/15/1992 | EP0494428A2 Static electricity meter |
07/15/1992 | EP0494427A1 Electricity meter |
07/14/1992 | US5130644 Integrated circuit self-testing device and method |
07/14/1992 | US5130642 Hanging ammeter with removable battery cartridge |
07/14/1992 | US5130638 Portable receiver for detecting probe signal on low voltage line conductor |
07/14/1992 | CA1305219C Test jig for measuring the static characteristics of microwave 3-terminal active components |
07/10/1992 | CA2058070A1 Electronic electricity meter |
07/10/1992 | CA2058050A1 Electricity meter |
07/09/1992 | WO1992011539A1 Testing clip and circuit board contacting method |
07/07/1992 | US5128612 Disposable high performance test head |
07/07/1992 | US5127837 Electrical connectors and IC chip tester embodying same |
07/01/1992 | EP0493025A2 An active matrix substrate inspecting device |
07/01/1992 | EP0492867A2 Electrode probe |
07/01/1992 | CN2108929U Magnetic induction type electric meter |
06/30/1992 | US5126680 Probe for use in non-destructive measuring of electrical resistance of a high current electrical connection |
06/25/1992 | WO1992010866A1 Assembly for connecting a test device to an object to be tested |
06/25/1992 | DE4040312A1 Spring contact pin for contacting electrical or electronic test pieces e.g. PCB, integrated circuit - has doubled spiral spring coiled round section of shaft projecting from conductive sleeve |
06/24/1992 | EP0491567A1 Integrated sensor assembly |
06/24/1992 | EP0412119A4 Static-free interrogating connector for electric components |
06/24/1992 | CN2108365U Reflected bridge |
06/24/1992 | CN2108364U Coaxial load |
06/23/1992 | US5124647 Contact testing device |
06/23/1992 | US5124646 Universal probe card for use in a semiconductor chip die sorter test |
06/23/1992 | US5124645 Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor |
06/23/1992 | US5124643 Mounting of a pointer to the rotor of an air core meter |
06/23/1992 | US5124639 Probe card apparatus having a heating element and process for using the same |
06/23/1992 | US5123855 Zero insertion force connector for printed circuit boards |
06/23/1992 | US5123850 Non-destructive burn-in test socket for integrated circuit die |
06/23/1992 | CA1304130C Current measuring device |
06/20/1992 | CA2058024A1 Integrated sensor array |
06/16/1992 | US5122736 Apparatus for and method of pressing pins of an IC for testing |
06/16/1992 | US5122070 Electric test connector |
06/10/1992 | EP0489666A1 Connection set with test plug |
06/10/1992 | EP0489052A1 Device for the operational electrical testing of wired areas, especially printed circuit boards. |
06/09/1992 | CA1303237C Apparatus for testing circuit boards |
06/09/1992 | CA1303175C Static-free interrogating connector for electric components |
06/07/1992 | CA2056928A1 Test connector |
06/03/1992 | EP0488908A1 Permanent insulation monitor |
06/03/1992 | EP0288528B1 Testing device for electric printed circuit boards |
06/03/1992 | CN1061661A Digital wire searcher |
06/02/1992 | US5119020 Electrical cable assembly for a signal measuring instrument and method |
05/29/1992 | WO1992008992A1 Multi-purpose bond pad test die |
05/27/1992 | CN1016815B Universal test and control module and its system |
05/26/1992 | US5116244 Connector for coaxial cable |
05/26/1992 | US5115858 Micro-channel wafer cooling chuck |
05/21/1992 | DE4037052A1 Detector registering temporary change in current - has bistable magnetic core coupled to excitation, control and sensor coils |
05/20/1992 | CN2105073U Protector for guarding wattmeter obliquity |
05/20/1992 | CN2105072U Safety metering pen |
05/14/1992 | WO1992008144A1 Alignment of wafer test probes |
05/13/1992 | EP0485202A2 Use of STM-like system to measure node voltage on integrated circuits |
05/12/1992 | US5113171 High-frequency current-viewing resistor |
05/12/1992 | US5113133 Circuit board test probe |
05/12/1992 | US5113132 Probing method |
05/07/1992 | EP0561765A4 Novel method of making, testing and test device for integrated circuits. |
05/06/1992 | EP0484141A2 Method and apparatus for testing integrated circuits |
05/06/1992 | EP0483579A2 Nanometer scale probe for an atomic force microscope, and method for making the same |
05/05/1992 | US5110216 Fiberoptic techniques for measuring the magnitude of local microwave fields and power |
05/05/1992 | US5109981 Carrier and carrier system for flatpack integrated circuits |
05/05/1992 | US5109596 Adapter arrangement for electrically connecting flat wire carriers |
05/05/1992 | US5109595 Method of making a fiberoptic sensor of a microwave field |
04/30/1992 | DE4034160C1 Directional coupler for domestic microwave oven - has stripline structure terminated by HF diode and wave resistance |
04/29/1992 | EP0482425A1 Device for measuring current, especially current and voltage, on conductors of a single or multiphase system |
04/29/1992 | EP0482271A1 Current-to-voltage converter with low noise, wide bandwidth and high dynamic range |
04/28/1992 | US5108302 Mounting means for an electronic device packaging |
04/21/1992 | US5107206 Printed circuit board inspection apparatus |
04/21/1992 | US5106327 On-line drawout case relay and meter test device |
04/15/1992 | CN2101875U Internal magnetic support for magnetoelectric series meter |
04/14/1992 | US5105181 Method and electrical measuring apparatus for analyzing the impedance of the source of an actual alternating voltage |
04/14/1992 | US5105158 Dielectric microwave resonator probe |
04/14/1992 | US5105148 Replaceable tip test probe |