Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
08/1992
08/20/1992WO1991012532A3 Process and device for loading an adapter for a printed circuit tester
08/18/1992US5140273 Electrode system to facilitate dielectric measurement of materials
08/18/1992US5139445 Modular test adapter
08/18/1992US5139437 Socket
08/18/1992US5139021 Biological information measurement apparatus
08/18/1992US5138968 Cross coil-shaped indicating instrument
08/12/1992EP0498530A2 Electrical interconnect contact system
08/11/1992CA1306286C Adjustment circuit and method for solid-state electricity meter
08/05/1992EP0497478A2 Low impedance, high voltage protection circuit
08/05/1992EP0496984A2 Measurement probe
08/05/1992CN1017729B Process for preparation of electroforming emp shielding elements and its products
08/04/1992US5136247 Apparatus and methods for calibrated work function measurements
08/04/1992US5136238 Test fixture with diaphragm board with one or more internal grounded layers
08/04/1992US5136237 Double insulated floating high voltage test probe
08/04/1992US5136234 Digital high-voltage meter device
08/04/1992US5136120 Technique for reducing electromagnetic interference
08/04/1992CA1306028C Probeable electrical connector
08/01/1992CA2040549A1 Multi-function, multi-mode switch for an instrument
07/1992
07/29/1992EP0496207A2 Testing device for integrated circuits
07/28/1992US5134365 Probe card in which contact pressure and relative position of each probe end are correctly maintained
07/28/1992US5134364 Elastomeric test probe
07/28/1992US5134363 Arrangement for testing electrical printed-circuit boards
07/22/1992EP0495380A2 Probe tip for electric test fixture
07/22/1992EP0428681A4 Improved electrical connectors and ic chip tester embodying same
07/22/1992CN1017566B Method and apparatus for generating reference nonlinear signal
07/21/1992US5132613 Low inductance side mount decoupling test structure
07/21/1992US5132607 Electrical field strength sensing probe
07/21/1992US5132497 Magnetic shielding means for a current sensor of direct current switching apparatus
07/21/1992US5132058 Molding, magnetism
07/21/1992CA1305522C Modular electronic device
07/15/1992EP0494428A2 Static electricity meter
07/15/1992EP0494427A1 Electricity meter
07/14/1992US5130644 Integrated circuit self-testing device and method
07/14/1992US5130642 Hanging ammeter with removable battery cartridge
07/14/1992US5130638 Portable receiver for detecting probe signal on low voltage line conductor
07/14/1992CA1305219C Test jig for measuring the static characteristics of microwave 3-terminal active components
07/10/1992CA2058070A1 Electronic electricity meter
07/10/1992CA2058050A1 Electricity meter
07/09/1992WO1992011539A1 Testing clip and circuit board contacting method
07/07/1992US5128612 Disposable high performance test head
07/07/1992US5127837 Electrical connectors and IC chip tester embodying same
07/01/1992EP0493025A2 An active matrix substrate inspecting device
07/01/1992EP0492867A2 Electrode probe
07/01/1992CN2108929U Magnetic induction type electric meter
06/1992
06/30/1992US5126680 Probe for use in non-destructive measuring of electrical resistance of a high current electrical connection
06/25/1992WO1992010866A1 Assembly for connecting a test device to an object to be tested
06/25/1992DE4040312A1 Spring contact pin for contacting electrical or electronic test pieces e.g. PCB, integrated circuit - has doubled spiral spring coiled round section of shaft projecting from conductive sleeve
06/24/1992EP0491567A1 Integrated sensor assembly
06/24/1992EP0412119A4 Static-free interrogating connector for electric components
06/24/1992CN2108365U Reflected bridge
06/24/1992CN2108364U Coaxial load
06/23/1992US5124647 Contact testing device
06/23/1992US5124646 Universal probe card for use in a semiconductor chip die sorter test
06/23/1992US5124645 Transmission electron microscope (TEM) power probe for in-situ viewing of electromigration and operation of an integrated circuit or microprocessor
06/23/1992US5124643 Mounting of a pointer to the rotor of an air core meter
06/23/1992US5124639 Probe card apparatus having a heating element and process for using the same
06/23/1992US5123855 Zero insertion force connector for printed circuit boards
06/23/1992US5123850 Non-destructive burn-in test socket for integrated circuit die
06/23/1992CA1304130C Current measuring device
06/20/1992CA2058024A1 Integrated sensor array
06/16/1992US5122736 Apparatus for and method of pressing pins of an IC for testing
06/16/1992US5122070 Electric test connector
06/10/1992EP0489666A1 Connection set with test plug
06/10/1992EP0489052A1 Device for the operational electrical testing of wired areas, especially printed circuit boards.
06/09/1992CA1303237C Apparatus for testing circuit boards
06/09/1992CA1303175C Static-free interrogating connector for electric components
06/07/1992CA2056928A1 Test connector
06/03/1992EP0488908A1 Permanent insulation monitor
06/03/1992EP0288528B1 Testing device for electric printed circuit boards
06/03/1992CN1061661A Digital wire searcher
06/02/1992US5119020 Electrical cable assembly for a signal measuring instrument and method
05/1992
05/29/1992WO1992008992A1 Multi-purpose bond pad test die
05/27/1992CN1016815B Universal test and control module and its system
05/26/1992US5116244 Connector for coaxial cable
05/26/1992US5115858 Micro-channel wafer cooling chuck
05/21/1992DE4037052A1 Detector registering temporary change in current - has bistable magnetic core coupled to excitation, control and sensor coils
05/20/1992CN2105073U Protector for guarding wattmeter obliquity
05/20/1992CN2105072U Safety metering pen
05/14/1992WO1992008144A1 Alignment of wafer test probes
05/13/1992EP0485202A2 Use of STM-like system to measure node voltage on integrated circuits
05/12/1992US5113171 High-frequency current-viewing resistor
05/12/1992US5113133 Circuit board test probe
05/12/1992US5113132 Probing method
05/07/1992EP0561765A4 Novel method of making, testing and test device for integrated circuits.
05/06/1992EP0484141A2 Method and apparatus for testing integrated circuits
05/06/1992EP0483579A2 Nanometer scale probe for an atomic force microscope, and method for making the same
05/05/1992US5110216 Fiberoptic techniques for measuring the magnitude of local microwave fields and power
05/05/1992US5109981 Carrier and carrier system for flatpack integrated circuits
05/05/1992US5109596 Adapter arrangement for electrically connecting flat wire carriers
05/05/1992US5109595 Method of making a fiberoptic sensor of a microwave field
04/1992
04/30/1992DE4034160C1 Directional coupler for domestic microwave oven - has stripline structure terminated by HF diode and wave resistance
04/29/1992EP0482425A1 Device for measuring current, especially current and voltage, on conductors of a single or multiphase system
04/29/1992EP0482271A1 Current-to-voltage converter with low noise, wide bandwidth and high dynamic range
04/28/1992US5108302 Mounting means for an electronic device packaging
04/21/1992US5107206 Printed circuit board inspection apparatus
04/21/1992US5106327 On-line drawout case relay and meter test device
04/15/1992CN2101875U Internal magnetic support for magnetoelectric series meter
04/14/1992US5105181 Method and electrical measuring apparatus for analyzing the impedance of the source of an actual alternating voltage
04/14/1992US5105158 Dielectric microwave resonator probe
04/14/1992US5105148 Replaceable tip test probe