Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
07/2010
07/01/2010US20100164520 Method and apparatus for testing integrated circuit
07/01/2010US20100164516 Method for Extending the Diagnostic Capability of Current Regulators
07/01/2010US20100164482 Centering device for electronic components, particularly ics
06/2010
06/30/2010CN201518038U Ammeter with circuit breaker
06/30/2010CN201518035U Gas discharge lamp high-frequency reference device
06/30/2010CN201518034U Test voltage testing clip
06/30/2010CN201518033U Portable pressure equalizing cap
06/30/2010CN101765758A Utility monitoring device, system and method
06/30/2010CN101762784A High-power photoconductivity switch test device and application thereof
06/30/2010CN101762759A Flat-panel display tester
06/30/2010CN101762724A Test power supply
06/30/2010CN101762723A A probe card manufacturing method including sensing probe and the probe card, probe card inspection system
06/30/2010CN101344559B Signal source amplitude adjustment method in electromagnetic compatibility sensitivity test
06/29/2010CA2489706C Die level testing using machine grooved storage tray with vacuum channels
06/24/2010WO2010071277A1 Probe station
06/24/2010WO2010071276A1 Stage unit for a probe station and apparatus for testing a wafer including the same
06/23/2010CN201515020U Rapid puncturing connecting clamp for testing
06/23/2010CN201514525U Screen test device of LCM screen
06/23/2010CN201514453U Electric automatic test machine for two overlap capacitors
06/23/2010CN201514452U Structure with combined modules
06/23/2010CN201514425U Output polarity program-controlled convertor of measuring instrument
06/23/2010CN201514424U Spring probe (3) for testing semiconductor chip
06/23/2010CN201514423U Spring probe (2) for testing semiconductor chip
06/23/2010CN201514422U Spring probe (1) for testing semiconductor chip
06/23/2010CN201514421U Low-resistance test switch card for printed circuit boards
06/23/2010CN201514420U Silver-zinc battery patrolling clip
06/23/2010CN201514419U Insulator cap for replacing electric energy meter
06/23/2010CN1715933B Wide bandwidth attenuator input circuit for a measurement probe
06/23/2010CN101755216A Probe card
06/23/2010CN101750577A Semiconductor test system
06/23/2010CN101750574A Test control cabinet
06/23/2010CN101750525A Manufacture method of test socket and elastic test probe used by same
06/23/2010CN101750524A Special wire for electric metering
06/23/2010CN101750523A Elastic test probe and manufacturing method thereof
06/23/2010CN101750522A Wide bandwidth attenuator input circuit for a measurement probe
06/23/2010CN101750521A LED carrying piece and electrical property testing platform thereof
06/23/2010CN101750520A Method for sucking IC components
06/22/2010US7741860 Prober for testing magnetically sensitive components
06/22/2010US7741133 Resistance measurements of a helical coil
06/22/2010CA2351573C Voltage sensor
06/17/2010WO2010066713A1 Battery measuring terminal
06/17/2010US20100152605 Monitoring system and probe
06/17/2010US20100148809 Probe card for testing semiconductor device, probe card built-in probe system, and method for manufacturing probe card
06/17/2010US20100148759 Method and apparatus for indexing an adjustable test probe tip
06/17/2010US20100148756 Clamp meter with safe trigger mechanism
06/16/2010EP2196811A2 Device and method for measuring electrical flows
06/16/2010EP2195665A2 Stiffener assembly for use with testing devices
06/16/2010CN201508403U General-purpose fixture for tester of printed circuit board
06/16/2010CN201508399U Testing jig of tester special for testing wiring board
06/16/2010CN201508373U Three-phase current generator
06/16/2010CN201508372U Liquid ohmic load device with high voltage and high power
06/16/2010CN201508371U Microstrip type connecting testing clamp
06/16/2010CN201508370U Electromagnetism compatibility testing and mounting structure and system for hub motor of electric automobile
06/16/2010CN201508369U Test connection line for a logic analyzer
06/16/2010CN201508368U Testing machine blanking device
06/16/2010CN201508367U Detecting work table
06/16/2010CN201508366U Probe card protecting device
06/16/2010CN1954471B Earthing and overvoltage protection arrangement
06/16/2010CN1722535B Stud bump socket
06/16/2010CN101743482A Coated motor vehicle battery sensor element and method for producing a motor vehicle battery sensor element
06/16/2010CN101743481A Probe pin
06/16/2010CN101743480A An improved ball mounting apparatus and method
06/16/2010CN101740960A Electric connector
06/16/2010CN101740959A Electric connector
06/16/2010CN101739923A Alignment device for inspection substrate
06/16/2010CN101738806A Array backboard, probe used for testing array backboard and liquid crystal display panel
06/16/2010CN101738576A Method for testing integrated circuit having load impedance, device and system thereof
06/16/2010CN101738575A Integrated card (IC) tester capable of changing with different probe cards
06/16/2010CN101738574A Apparatus for testing semiconductor device and method for testing semiconductor device
06/16/2010CN101738573A Wafer tester and testing method thereof
06/16/2010CN101738556A Novel fault message display processing system
06/16/2010CN101738555A Method for detecting electric performance of wire holder for compressor and detection system thereof
06/16/2010CN101738520A Power-on information display apparatus
06/16/2010CN101738513A Power supply wire for test
06/16/2010CN101738512A Probe assembly arrangement
06/16/2010CN101738511A Manufacturing method and structure of probe card
06/16/2010CN101738510A Inspection probe
06/16/2010CN101738509A High-frequency vertical probe device
06/16/2010CN101738508A Probe tower and manufacturing method thereof
06/16/2010CN101738507A Test connecting wire for direct-current resistance, action waveforms and low-voltage impedance test
06/16/2010CN101738506A Push pole for match plate of test sorting machine
06/16/2010CN101738505A Test pallet
06/16/2010CN101738504A Medium optical sensing apparatus and high-precision semiconductor component detecting machine platform
06/16/2010CN101738503A Interface device and control method and aging test system thereof
06/16/2010CN101738502A Connection structure for reducing phase change of 35kV transformer in motion waveform test
06/16/2010CN101738501A Connection structure for reducing phase change of 35kV transformer in motion waveform test
06/16/2010CN101738500A Equipment for correcting user tray position and test processor
06/16/2010CN101459089B Transistor encapsulation method and construction, jumper wire board for tester table
06/16/2010CN101281211B Making tool for package test
06/16/2010CN101237105B Test connector
06/16/2010CN101187676B Selection circuit of multi-path input and double-path output
06/16/2010CN101051057B Method for sharing reference signal and reference signal arrangement system
06/15/2010US7737711 Test apparatus having pogo probes for chip scale package
06/15/2010US7737709 Methods for planarizing a semiconductor contactor
06/15/2010US7737707 Sheet-like probe, method of producing the probe, and application of the probe
06/10/2010WO2010064618A1 Probe card and method for manufacturing same
06/10/2010WO2010064487A1 Probe card
06/10/2010WO2010063588A1 Test adapter for computer chips
06/10/2010US20100145263 Syringe movement mechanism and control system therefor
06/10/2010CA2745740A1 Test adapter for computer chips
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