Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
07/2010
07/28/2010CN101788574A Test probe with retractable insulative sleeve
07/28/2010CN101788573A Probe card
07/28/2010CN101424702B Probe, test socket and tester thereof
07/28/2010CN101344537B General scarf joint tool for positioning ball lattice array packaging member to be measured
07/27/2010US7764075 High performance probe system
07/27/2010US7764062 Method and structure for variable pitch microwave probe assembly
07/27/2010US7761983 Method of assembling a wafer probe
07/22/2010WO2010082576A1 Contactor, method of manufacturing contactor, and connection device with contactor
07/22/2010WO2010082094A2 Method and apparatus for testing a semiconductor wafer
07/22/2010WO2010081834A1 Method for testing printed circuit boards
07/22/2010US20100182030 Knee Probe Having Reduced Thickness Section for Control of Scrub Motion
07/22/2010US20100182028 Probe Card
07/22/2010US20100182027 Test lead probe with retractable insulative sleeve
07/21/2010EP2209010A1 Probe card
07/21/2010CN201533451U Printed circuit board, spacing apparatus and test fixture used for printed circuit board
07/21/2010CN201532423U Integrated full auto tester of transformer loss parameter
07/21/2010CN201532405U Electric quantity indicator
07/21/2010CN201532404U Matrix switch circuit device for OLED test equipment
07/21/2010CN201532403U Rush current generator
07/21/2010CN201532402U Novel bipolar power supply
07/21/2010CN201532401U Electric probe
07/21/2010CN201532400U Improved structure of ICT needle bed
07/21/2010CN201532399U 3G antenna testing jig of notebook computer
07/21/2010CN201532398U Electrical equipment testing fixture head
07/21/2010CN201532397U Adjustable digital display direct current electronic load
07/21/2010CN101784901A Mobile high-voltage test set with housing
07/21/2010CN101782623A Polarity test method and device of surface adhesion type light-emitting diode
07/21/2010CN101782598A Probe adjustment platform of vertical probe card
07/21/2010CN101782597A Plug device used for memory bank detecting equipment
07/21/2010CN101782596A Connecting board for testing touch screen
07/21/2010CN101782384A Surface mount device (SMD) automatic conveying and positioning test mechanism
07/21/2010CN101151540B Microstructure probe card, and microstructure inspecting device and method
07/20/2010US7761308 Medical consultation management system
07/20/2010US7759959 Voltage sensing device and associated method
07/20/2010US7759953 Active wafer probe
07/15/2010WO2010079325A2 Method and apparatus for secure energy delivery
07/15/2010US20100178778 Radiofrequency contactor
07/15/2010US20100176834 Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
07/15/2010US20100176828 Reversible test probe and test probe tip
07/15/2010US20100176796 Apparatus for testing electrical characteristics
07/15/2010US20100176795 Oscilloscope probe
07/14/2010EP2206757A1 Adhesive sheet for inspection
07/14/2010CN201527869U Standard resistor
07/14/2010CN201527437U Three-phase partial discharge test power supply device
07/14/2010CN201527436U Dovetailed test line auxiliary device of aerial plug of circuit breaker
07/14/2010CN201527435U Six-degree-of-freedom adjusting device
07/14/2010CN201527434U Special sliding rail of electric energy metering vehicle
07/14/2010CN201527433U Charging/discharging and positioning correcting mechanism for printed circuit substrate
07/14/2010CN101776726A Signal receiving conditioner of UHF partial discharge detecting system
07/14/2010CN101776701A Electronic and circuit board detection card
07/14/2010CN101776700A Probe unit for inspecting display panel
07/14/2010CN101776491A Compact process transmitter
07/14/2010CN101773921A Test cell conditioner (tcc) surrogate cleaning device and method thereof
07/13/2010US7755348 Current sensor output measurement system and method
07/13/2010US7755274 Organic EL panel
07/08/2010WO2010076855A1 Probe, probe card with probe mounted thereon, method for mounting probe on probe card and method for removing probe mounted on probe card
07/08/2010WO2010045214A3 Circuit board testing using a probe
07/08/2010US20100171519 Probe and probe card for integrated circuit devices using the same
07/08/2010US20100171506 Explosion-proof detector assembly for a flame ionization detector (FID)
07/08/2010US20100171487 Electrosensing antibody-probe detection and measurement method
07/08/2010DE10162983B4 Kontaktfederanordnung zur elektrischen Kontaktierung eines Halbleiterwafers zu Testzwecken sowie Verfahren zu deren Herstellung For testing contact spring arrangement for making electrical contact of a semiconductor wafer as well as processes for their preparation
07/07/2010EP2204662A1 Device for hyperpolarising and dissolving solid material for NMR analyses
07/07/2010EP2204657A2 Multimeter with electronic excess voltage protection
07/07/2010EP2204656A1 Improved MEMS probe for probe cards for integrated circuits
07/07/2010CN201522546U Cable-uncoiling testing equipment
07/07/2010CN201522545U Independent testing machine station for testing semiconductor elements and test sorting system
07/07/2010CN201522534U Common integrated circuit open-short circuit tester
07/07/2010CN201522532U Testing device for residual voltage and electrical current distribution characteristic of whole lightning protector
07/07/2010CN201522517U Opening-type Hall current sensor
07/07/2010CN201522511U Error-proof inspection control module
07/07/2010CN201522510U Foldable combined turn changing device of alternating current path
07/07/2010CN201522509U High-frequency short arm probe card
07/07/2010CN201522508U Rectangular array conducting module
07/07/2010CN201522507U PCB testing device
07/07/2010CN201522506U Metering tank
07/07/2010CN201522505U Lead connection tool for power equipment high-voltage test
07/07/2010CN201522504U Rotary conduction fixture
07/07/2010CN1967262B Bracket and its production method
07/07/2010CN101769987A Detector device
07/07/2010CN101769964A Method, device and system for testing conducting resistance of packaged field-effect tube
07/07/2010CN101769948A Power supply device of test equipment
07/07/2010CN101769947A Detection impedance
07/07/2010CN101769946A Needle change method of sensor on point measurement machine and needle changer
07/07/2010CN101769945A Connection structure used for measuring DC resistance of transformer
07/07/2010CN101769944A Micro detection device used for detecting LED chip
07/07/2010CN101769943A Power absorption device and testing device with power absorption device
07/07/2010CN101769942A Electronic element overturning test device and method
07/07/2010CN101344538B High/low-voltage isolation circuit
07/06/2010US7750655 Multilayer substrate and probe card
07/06/2010US7750650 Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitry
07/06/2010US7750622 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture
07/06/2010US7750621 Clamp meter for measuring consumption of current and power of electrical product
07/06/2010US7749566 coating the plate with a colorant and ablating colorant adjacent holes, which are either populated or empty, the difference being easy to spot
07/06/2010US7748989 Conductive-contact holder and conductive-contact unit
07/06/2010CA2375326C Test probe and connector
07/01/2010WO2010075336A1 Coaxial connector
07/01/2010WO2010075325A1 Coaxial connector
07/01/2010WO2010075285A1 Coaxial connector
07/01/2010WO2010073460A1 Electrically connecting device for semiconductor device and contact used in the electrically connecting device
07/01/2010US20100164526 mems probe for probe cards for integrated circuits
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